| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 01/08/2008 | US7317645 Redundancy repair circuit and a redundancy repair method therefor |
| 01/08/2008 | US7317323 Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components |
| 01/03/2008 | WO2008002903A2 Data validation and classification in optical analysis systems |
| 01/03/2008 | WO2008002513A2 Integrated circuit having memory array including ecc and/or column redundancy, and method of programming, controlling and/or operating same |
| 01/03/2008 | WO2008001543A1 Semiconductor testing apparatus and semiconductor memory testing method |
| 01/03/2008 | WO2007112201B1 Non-volatile memory and method with redundancy data buffered in data latches for defective locations |
| 01/03/2008 | US20080005645 Magnetic disk control apparatus, magnetic disk apparatus, and method of correcting read error |
| 01/03/2008 | US20080005644 Systems, methods and computer program products for utilizing a spare lane for additional checkbits |
| 01/03/2008 | US20080005631 Memory module with parallel testing |
| 01/03/2008 | US20080005630 Memory device testing system and method using compressed fail data |
| 01/03/2008 | US20080002493 Dual in-line memory module, memory test system, and method for operating the dual in-line memory module |
| 01/03/2008 | US20080002491 Semiconductor memory device capable of effectively testing failure of data |
| 01/03/2008 | US20080002490 Semiconductor memory device with internal voltage generator and method for driving the same |
| 01/03/2008 | US20080002489 Method for testing memory under worse-than-normal conditions |
| 01/03/2008 | US20080002488 Semiconductor device and memory circuit including a redundancy arrangement |
| 01/03/2008 | US20080002486 Method for accessing a memory |
| 01/03/2008 | DE112005003425T5 Einzelchip mit magnetoresistivem Speicher Single chip magnetoresistive memory |
| 01/02/2008 | EP1873787A1 Automatic regulation method for the reference sources in a non volatile memory device and corresponding memory device |
| 01/02/2008 | EP1671328A4 Accelerated life test of mram celles |
| 01/02/2008 | CN101097784A Improving reliability, availability, and serviceability in a memory device |
| 01/02/2008 | CN101097783A Method for testing memory |
| 01/02/2008 | CN100359608C Storage test circuit |
| 01/02/2008 | CN100359604C Semiconductor storage device |
| 01/02/2008 | CN100359596C Semiconductor memory having enhanced testing power |
| 01/02/2008 | CN100359473C Memory rewind and reconstruction for hardware emulator |
| 01/01/2008 | US7315993 Verification of RRAM tiling netlist |
| 01/01/2008 | US7315976 Method for using CRC as metadata to protect against drive anomaly errors in a storage array |
| 01/01/2008 | US7315971 Systems and methods for improved memory scan testability |
| 01/01/2008 | US7315970 Semiconductor device to improve data retention characteristics of DRAM |
| 01/01/2008 | US7315969 Memory module with a test device |
| 01/01/2008 | US7315870 Memory controller, flash memory system, and method for recording data on flash memory |
| 01/01/2008 | US7315792 Temperature detector providing multiple detected temperature points using single branch and method of detecting shifted temperature |
| 01/01/2008 | US7315479 Redundant memory incorporating serially-connected relief information storage |
| 12/27/2007 | US20070300133 Method for recovering data in a tape drive system |
| 12/27/2007 | US20070300132 Apparatus and method for defect replacement |
| 12/27/2007 | US20070300131 Register file cell with soft error detection and circuits and methods using the cell |
| 12/27/2007 | US20070300130 Method of Error Correction Coding for Multiple-Sector Pages in Flash Memory Devices |
| 12/27/2007 | US20070300129 System, method and storage medium for providing fault detection and correction in a memory subsystem |
| 12/27/2007 | US20070300128 A method and apparatus of defect areas management |
| 12/27/2007 | US20070300105 Memory hub tester interface and method for use thereof |
| 12/27/2007 | US20070300100 Error correction scheme for memory |
| 12/27/2007 | US20070300014 Debug port for on-die DRAM |
| 12/27/2007 | US20070297266 Synchronous global controller for enhanced pipelining |
| 12/27/2007 | US20070297255 Semiconductor memory tester |
| 12/27/2007 | US20070297254 Method to Identify or Screen VMIN Drift on Memory Cells During Burn-In or Operation |
| 12/27/2007 | US20070297253 Measuring circuit for qualifying a memory located on a semiconductor device |
| 12/27/2007 | US20070297252 Integrated circuit having memory array including ECC and/or column redundancy, and method of programming, controlling and/or operating same |
| 12/27/2007 | US20070297251 Semiconductor memory device having memory block configuration |
| 12/27/2007 | US20070297230 Non-volatile memory structure |
| 12/27/2007 | DE10318771B4 Integrierte Speicherschaltung mit einer Redundanzschaltung sowie ein Verfahren zum Ersetzen eines Speicherbereichs An integrated circuit memory having a redundancy circuit and a method for replacing a memory area |
| 12/27/2007 | DE102006028483A1 Memory accessing method involves accessing memory cell arranged in cell field elements of memory and address of relevant cell field elements lies at activation device of memory |
| 12/27/2007 | DE102005004379B4 Speicherbauelement und Verfahren zum Testen von Speicherbauelementen mit reparaturfähiger Redundanz Memory device and method for testing memory devices with redundancy repairable |
| 12/26/2007 | EP1869543A1 Method and system for storing logical data blocks into flash-blocks in multiple non-volatile memories which are connected to at least one common data i/o bus |
| 12/26/2007 | CN101095060A Adaptive memory calibration using bins |
| 12/26/2007 | CN100358048C Semiconductor memory capable of realizing redundant unit array correct alternation |
| 12/25/2007 | US7313749 System and method for applying error correction code (ECC) erasure mode and clearing recorded information from a page deallocation table |
| 12/25/2007 | US7313741 Integrated semiconductor memory |
| 12/25/2007 | US7313740 Internally generating patterns for testing in an integrated circuit device |
| 12/25/2007 | US7313739 Method and apparatus for testing embedded cores |
| 12/25/2007 | US7313733 System and method of improving memory yield in frame buffer memory using failing memory location |
| 12/25/2007 | US7313732 Memory arrangement in a computer system |
| 12/25/2007 | US7313723 Self-reparable semiconductor and method thereof |
| 12/25/2007 | US7313048 Reset detection circuit in semiconductor integrated circuit |
| 12/25/2007 | US7313039 Method for analyzing defect of SRAM cell |
| 12/25/2007 | US7313037 RFID system including a memory for correcting a fail cell and method for correcting a fail cell using the same |
| 12/25/2007 | US7313035 Methods and apparatus for improved memory access |
| 12/25/2007 | US7313022 Non-volatile semiconductor memory |
| 12/25/2007 | US7312109 Methods for fabricating fuse programmable three dimensional integrated circuits |
| 12/23/2007 | CA2585094A1 Software and methods to detect and correct data structure |
| 12/21/2007 | WO2007146849A1 Transparent test method and scan flip-flop |
| 12/21/2007 | WO2006104584A3 Memory having a portion that can be switched between use as data and use as error correction code (ecc) |
| 12/20/2007 | US20070294609 Recording medium, recording method and apparatus, reproducing method and apparatus, data transmitting method, and data decrypting method |
| 12/20/2007 | US20070294608 Plasma process power delivery system and method with event-controlled data storage |
| 12/20/2007 | US20070294462 Memory device including self-id information |
| 12/20/2007 | US20070291563 Method and apparatus for improving yield in semiconductor devices by guaranteeing health of redundancy information |
| 12/20/2007 | US20070291562 Internally asymmetric methods and circuits for evaluating static memory cell dynamic stability |
| 12/20/2007 | US20070291560 Method and system for improving reliability of memory device |
| 12/19/2007 | CN101091223A Bias application method of storage and storage |
| 12/19/2007 | CN101090000A Memory and its redundant repair method |
| 12/19/2007 | CN101089999A 半导体存储装置 The semiconductor memory device |
| 12/19/2007 | CN101089824A Method for solving failure problem of self testing built-in central process unit |
| 12/19/2007 | CN100356543C Semiconductor device and method for producing the same |
| 12/19/2007 | CN100356481C Test device for masiac storage |
| 12/19/2007 | CN100356479C Nonvolatile semiconductor storage equipment providing suitable programming voltage |
| 12/19/2007 | CN100356337C Data detection system and method of read only memory in basic input/output system |
| 12/18/2007 | US7310764 Digital video disk and player and associated methods with proprietary format |
| 12/18/2007 | US7310757 Error detection on programmable logic resources |
| 12/18/2007 | US7310753 Internal signal test device and method thereof |
| 12/18/2007 | US7310752 System and method for on-board timing margin testing of memory modules |
| 12/18/2007 | US7310748 Memory hub tester interface and method for use thereof |
| 12/18/2007 | US7310648 System for compression of physiological signals |
| 12/18/2007 | US7310278 Method and apparatus for in-system redundant array repair on integrated circuits |
| 12/18/2007 | US7310259 Access circuit and method for allowing external test voltage to be applied to isolated wells |
| 12/13/2007 | WO2006124428A3 Apparatus and method for channel interleaving in communications system |
| 12/13/2007 | US20070288830 Information processing system, information processing device, information processing method, and program |
| 12/13/2007 | US20070288817 Semiconductor integrated circuit and a method of testing the same |
| 12/13/2007 | US20070288812 Parallel bit test circuit and method for semiconductor memory device |
| 12/13/2007 | US20070288811 System and method for testing a data storage device without revealing memory content |
| 12/13/2007 | US20070288810 Semiconductor memory, and testing method thereof |
| 12/13/2007 | US20070288809 Method for updating nonvolatile memory |