| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 03/12/2008 | EP1898427A2 Test method for semiconductor memory device and semiconductor memory device therefor |
| 03/12/2008 | EP1756739A4 Efficient modeling of embedded memories in bounded memory checking |
| 03/12/2008 | EP1509924B1 Semiconductor memory device with test mode to monitor internal timing control signals at i/o terminals |
| 03/12/2008 | EP0992994B1 Optical disc recording/reproducing method, optical disc, and optical disc device |
| 03/12/2008 | CN201036009Y Error-correcting information processing apparatus in BCH error-correcting technique |
| 03/12/2008 | CN201036008Y Check code writing device in BCH error correction technique |
| 03/12/2008 | CN101140809A Flash controller supporting pipelined error-correcting code and configurable operations and control method thereof |
| 03/12/2008 | CN101140808A Error correcting information processing method in BCH error correcting technology and processing equipment thereof |
| 03/12/2008 | CN101140807A Verify code write-in method and write device thereof in BCH error correcting technology |
| 03/12/2008 | CN100375199C Semiconductor integrated circuit device |
| 03/12/2008 | CN100375198C Semiconductor device equiped with memory and logical chips for testing memory ships |
| 03/12/2008 | CN100375197C Method for testing non-volatile memory |
| 03/12/2008 | CN100375196C Method for reading semiconductor die information in a parallel test and burn-in system |
| 03/12/2008 | CN100375194C Semiconductor integrated circuit device |
| 03/11/2008 | US7343546 Method and system for syndrome generation and data recovery |
| 03/11/2008 | US7343545 Method for processing noise interference |
| 03/11/2008 | US7343544 Optical disk playback apparatus and data playback method therefor |
| 03/11/2008 | US7343536 Scan based automatic test pattern generation (ATPG) test circuit, test method using the test circuit, and scan chain reordering method |
| 03/11/2008 | US7343535 Embedded testing capability for integrated serializer/deserializers |
| 03/11/2008 | US7343534 Method for deferred data collection in a clock running system |
| 03/11/2008 | US7343533 Hub for testing memory and methods thereof |
| 03/11/2008 | US7343532 Testing memory units in a digital circuit |
| 03/11/2008 | US7342843 Semiconductor integrated circuit device |
| 03/06/2008 | WO2008005781A3 Improving reliability, availability, and serviceability in a memory device |
| 03/06/2008 | WO2007134253A3 Use of alternative value in cell detection |
| 03/06/2008 | WO2007134247A3 Dynamic cell bit resolution |
| 03/06/2008 | US20080059865 Apparatus and method for generating a galois-field syndrome |
| 03/06/2008 | US20080059861 Adaptive error resilience for streaming video transmission over a wireless network |
| 03/06/2008 | US20080059852 Memory card and its initial setting method |
| 03/06/2008 | US20080059851 Semiconductor apparatus and testing method |
| 03/06/2008 | US20080059850 Self programmable shared bist for testing multiple memories |
| 03/06/2008 | US20080059849 Semiconductor device |
| 03/06/2008 | US20080059105 Memory-daughter-card-testing apparatus and method |
| 03/06/2008 | US20080059103 System and Method for Implementing a Programmable DMA Master With Date Checking Utilizing a Drone System Controller |
| 03/06/2008 | US20080056036 Semiconductor memory device |
| 03/06/2008 | US20080056035 Method and apparatus for adaptive programming of flash memory, flash memory devices, and systems including flash memory having adaptive programming capability |
| 03/06/2008 | US20080056034 Redundancy program circuit and methods thereof |
| 03/06/2008 | US20080056033 Semiconductor memory device |
| 03/06/2008 | US20080056032 Test method for semiconductor memory device and semiconductor memory device therefor |
| 03/06/2008 | US20080056025 Semiconductor storage device |
| 03/06/2008 | US20080055989 Memory system including flash memory and method of operating the same |
| 03/06/2008 | US20080055986 Semiconductor memory device having faulty cells |
| 03/06/2008 | DE112004002723T5 Prüfvorrichtung und -verfahren für eine Halbleitervorrichtung Tester and method for a semiconductor device |
| 03/06/2008 | DE112004002576T5 Management externer Speicheraktualisierung zur Fehlererfassung in redundanten Multithreading-Systemen unter Verwendung einer spekulativen Speicherunterstützung Management of external memory update for error detection in redundant multithreading systems using a speculative memory support |
| 03/05/2008 | EP1895546A1 Semiconductor memory and system |
| 03/05/2008 | EP1894208A1 Method and apparatus for programming a memory array |
| 03/05/2008 | EP1665404A4 Multiple bit chalcogenide storage device |
| 03/05/2008 | CN101136253A Test method for semiconductor memory device and semiconductor memory device therefor |
| 03/05/2008 | CN101136252A Repair circuitry and method for preventing electrical fuse from being burned during static discharge testing |
| 03/05/2008 | CN101136251A Degeneration technique for designing memory devices |
| 03/04/2008 | US7340665 Shared redundancy in error correcting code |
| 03/04/2008 | US7340658 Technique for combining scan test and memory built-in self test |
| 03/04/2008 | US7340653 Method for testing a memory device |
| 03/04/2008 | US7340558 Multisection memory bank system |
| 03/04/2008 | US7340313 Monitoring device for monitoring internal signals during initialization of an electronic circuit |
| 03/04/2008 | US7339844 Memory device fail summary data reduction for improved redundancy analysis |
| 03/04/2008 | US7339843 Methods and circuits for programming addresses of failed memory cells in a memory device |
| 03/04/2008 | US7339831 Non-volatile semiconductor memory device allowing efficient programming operation and erasing operation in short period of time |
| 02/28/2008 | WO2008023334A2 Method for testing a static random access memory |
| 02/28/2008 | WO2007133963A3 Nonvolatile memory with convolutional coding for error correction |
| 02/28/2008 | US20080052602 Writing and reading of data in probe-based data storage devices |
| 02/28/2008 | US20080052601 Writing and reading of data in probe-based data storage devices |
| 02/28/2008 | US20080052600 Data corruption avoidance in DRAM chip sparing |
| 02/28/2008 | US20080052599 Dynamic electronic correction code feedback to extend memory device lifetime |
| 02/28/2008 | US20080052598 Memory multi-bit error correction and hot replace without mirroring |
| 02/28/2008 | US20080052571 Memory test system including semiconductor memory device suitable for testing an on-die termination, and method thereof |
| 02/28/2008 | US20080052570 Memory device testable without using data and dataless test method |
| 02/28/2008 | US20080052568 System and Method for Managing Mirrored Memory Transactions and Error Recovery |
| 02/28/2008 | US20080052567 Semiconductor memory device and method thereof |
| 02/28/2008 | US20080052565 Data read-out circuit in semiconductor memory device and method of data reading in semiconductor memory device |
| 02/28/2008 | US20080049527 Method for testing memory device |
| 02/28/2008 | US20080049526 Semiconductor memory device with data and local redundancy memory cell arrays, and redundancy method thereof |
| 02/28/2008 | US20080049525 Integrated Semiconductor Memory and Method for Operating an Integrated Semiconductor Memory |
| 02/28/2008 | US20080049523 Line defect detection circuit for detecting weak line |
| 02/28/2008 | US20080049514 Memory device with a managing microprocessor system and an architecture of fail search and automatic redundancy |
| 02/28/2008 | US20080048703 Semiconductor integrated circuit and testing method of same |
| 02/28/2008 | DE102007038114A1 Error correction circuit for correction of error in memory cell e.g. read only memory, has main control unit is formed for determining definite error location based on error type and output is determined by two error locating detectors |
| 02/28/2008 | DE102007032273A1 Direktzugriffsspeicher mit Prüfschaltung Random access memory with test circuit |
| 02/28/2008 | DE102006019507B4 Integrierter Halbleiterspeicher mit Testfunktion und Verfahren zum Testen eines integrierten Halbleiterspeichers Integrated semiconductor memory with test function and method for testing an integrated semiconductor memory, |
| 02/27/2008 | EP1892726A2 Semiconductor integrated circuit and test method thereof |
| 02/27/2008 | EP1892725A2 Semiconductor integrated circuit and testing method of same |
| 02/27/2008 | EP1891661A1 Test cells for semiconductor yield improvement |
| 02/27/2008 | CN101131999A Semiconductor integrated circuit and testing method of same |
| 02/27/2008 | CN101131876A Error correction circuit and method, and semiconductor memory device including the circuit |
| 02/27/2008 | CN101131875A Register testing method and system |
| 02/27/2008 | CN101131874A Semiconductor integrated circuit and test method thereof |
| 02/27/2008 | CN101131870A Flash memory devices including block information blocks and methods of operating same |
| 02/27/2008 | CN100371727C Electronic circuit and method for testing |
| 02/26/2008 | US7337381 Memory tester having defect analysis memory with two storage sections |
| 02/26/2008 | US7337378 Semiconductor integrated circuit and burn-in test method thereof |
| 02/26/2008 | US7336559 Delay-locked loop, integrated circuit having the same, and method of driving the same |
| 02/26/2008 | US7336537 Handling defective memory blocks of NAND memory devices |
| 02/26/2008 | US7336536 Handling defective memory blocks of NAND memory devices |
| 02/26/2008 | US7336529 Thin film magnetic memory device storing program information efficiently and stably |
| 02/26/2008 | US7336081 Cell evaluation device including short circuit detector |
| 02/26/2008 | US7335957 Semiconductor memory integrated circuit and layout method of the same |
| 02/21/2008 | WO2008022094A2 Data storage device |
| 02/21/2008 | WO2008021989A2 Error correction for disk storage media |
| 02/21/2008 | WO2008021045A2 System and method for correcting errors in non-volatile memory using product codes |
| 02/21/2008 | WO2008020555A1 Test device and test method |