| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 04/22/2008 | US7362631 Semiconductor memory device capable of controlling drivability of overdriver |
| 04/22/2008 | US7362630 Semiconductor memory |
| 04/22/2008 | US7362629 Redundant circuit for semiconductor memory device |
| 04/22/2008 | US7362628 Semiconductor memory and redundancy repair method |
| 04/22/2008 | US7362626 Asynchronous, high-bandwidth memory component using calibrated timing elements |
| 04/22/2008 | US7362618 Flash EEprom system |
| 04/17/2008 | WO2008021045A3 System and method for correcting errors in non-volatile memory using product codes |
| 04/17/2008 | US20080092017 Erasure pointer error correction |
| 04/17/2008 | US20080092016 Memory system and method using partial ECC to achieve low power refresh and fast access to data |
| 04/17/2008 | US20080092015 Nonvolatile memory with adaptive operation |
| 04/17/2008 | US20080092014 Methods of Adapting Operation of Nonvolatile Memory |
| 04/17/2008 | US20080091990 Controlled reliability in an integrated circuit |
| 04/17/2008 | US20080091979 Semiconductor memory device and test method |
| 04/17/2008 | US20080091969 Semiconductor integrated circuit including memory macro |
| 04/17/2008 | US20080089167 Semiconductor memory and memory module |
| 04/17/2008 | US20080089161 Method for testing flash memory power loss recovery |
| 04/17/2008 | US20080089160 Semiconductor device |
| 04/17/2008 | US20080089153 Semiconductor memory device and method thereof |
| 04/17/2008 | US20080089152 Semiconductor memory device |
| 04/17/2008 | DE112006000162T5 Prüfvorrichtung und Prüfverfahren Tester and test methods |
| 04/17/2008 | DE102006048401A1 System und Verfahren zum Speichern und Lesen von Informationen System and method for storing and reading information |
| 04/17/2008 | DE102006046359A1 Halbleiterspeicher und Verfahren zum Testen von Halbleiterspeichern A semiconductor memory and method for testing semiconductor memories |
| 04/17/2008 | DE102004052612B4 Halbleiterspeicherbaustein, Halbleiterspeichermodul und Verfahren zur Übertragung von Schreibdaten zu Halbleiterspeicherbausteinen Semiconductor memory device, the semiconductor memory module and method for transmitting write data to semiconductor memory chips |
| 04/17/2008 | DE102004039393B4 Verfahren zum Testen einer Speichervorrichtung und Speichervorrichtung zur Durchführung des Verfahrens A method of testing a storage device and storage device for implementing the method |
| 04/17/2008 | DE102004021267B4 Verfahren zum Testen eines Speicherbausteins und Prüfanordnung A method for testing a memory device, and setup |
| 04/16/2008 | EP1911038A1 Apparatus and method for repairing a semiconductor memory |
| 04/16/2008 | EP1825479A4 Programmable memory built-in-self-test (mbist) method and apparatus |
| 04/16/2008 | CN101163977A Integrated circuit testing module |
| 04/16/2008 | CN101162612A Semiconductor memory device |
| 04/16/2008 | CN100382202C Method and device for dynamically hiding memory defect |
| 04/15/2008 | US7360205 Minimizing interaction costs among components of computer programs |
| 04/15/2008 | US7360145 Information storage medium on which drive data is recorded, and method of recording information on the information storage medium |
| 04/15/2008 | US7360144 Multi-bit nonvolatile ferroelectric memory device having fail cell repair circuit and repair method thereof |
| 04/15/2008 | US7360136 Increasing the effectiveness of error correction codes and operating multi-level memory systems by using information about the quality of the stored data |
| 04/15/2008 | US7360132 System and method for memory chip kill |
| 04/15/2008 | US7360131 Printer controller having tamper resistant shadow memory |
| 04/15/2008 | US7360130 Memory with integrated programmable controller |
| 04/15/2008 | US7360129 Simultaneous switch test mode |
| 04/15/2008 | US7360128 Method of testing memory device |
| 04/15/2008 | US7360126 Method of and apparatus for managing disc defects using temporary defect management information (TDFL) and temporary defect management information (TDDS), and disc having the TDFL and TDDS |
| 04/15/2008 | US7360116 Built-in self test circuit |
| 04/15/2008 | US7359822 Testing device |
| 04/15/2008 | US7359278 Method for producing an integrated memory module |
| 04/15/2008 | US7359274 Semiconductor memory device |
| 04/15/2008 | US7359265 Data flow scheme for low power DRAM |
| 04/15/2008 | US7359260 Repair of memory cells |
| 04/15/2008 | CA2389986C Architecture with multi-instance redundancy implementation |
| 04/15/2008 | CA2137742C Transaction data storing method and device |
| 04/10/2008 | WO2008041537A1 Generation device, generation method, program and recording medium |
| 04/10/2008 | US20080086677 Adaptive systems and methods for storing and retrieving data to and from memory cells |
| 04/10/2008 | US20080086663 Test pattern generating circuit and semiconductor memory device having the same |
| 04/10/2008 | US20080084772 Semiconductor device |
| 04/10/2008 | US20080084771 Semiconductor device |
| 04/10/2008 | DE102007045851A1 Elektronische Vorrichtung, Verfahren zum Betreiben einer elektronischen Vorrichtung, Speicherschaltung und Verfahren zum Betreiben einer Speicherschaltung An electronic device, method of operating an electronic device, memory circuit and method of operating a memory circuit |
| 04/10/2008 | DE102007001023A1 Spannungsüberwachungseinrichtung in einer Halbleiterspeichereinrichtung Voltage monitoring device in a semiconductor memory device |
| 04/10/2008 | DE102005015319B4 Elektrisches System mit fehlerhaften Speicherbereichen und Verfahren zum Testen von Speicherbereichen Electrical system with faulty memory areas and method for testing memory areas |
| 04/10/2008 | DE102005013900B4 Vorrichtung und Verfahren zum Testen von Halbleitervorrichtungen Apparatus and method for testing semiconductor devices |
| 04/09/2008 | EP1908078A2 Adaptive archival format |
| 04/09/2008 | EP1444699B1 Method for the reconfiguration of a memory |
| 04/09/2008 | CN101159169A End of life prediction of flash memory |
| 04/09/2008 | CN101159165A Nonvolatile memory device and method of operating the same |
| 04/09/2008 | CN100380807C Scanning path circuit and semiconductor IC containing said scanning path circuit |
| 04/09/2008 | CN100380654C Interconnection structure and methods |
| 04/09/2008 | CN100380529C Nonvolatile memory |
| 04/09/2008 | CN100380528C Semiconductor device beyond misrecognition of occuring cut-off of fuse |
| 04/09/2008 | CN100380342C Penalty free address decoding scheme |
| 04/08/2008 | US7356755 Error correction for multi-level cell memory with overwrite capability |
| 04/08/2008 | US7356753 Method and apparatus for error code correction |
| 04/08/2008 | US7356744 Method and system for optimizing testing of memory stores |
| 04/08/2008 | US7356743 RRAM controller built in self test memory |
| 04/08/2008 | US7356742 Method and apparatus for testing a memory device in quasi-operating conditions |
| 04/08/2008 | US7356741 Modular test controller with BIST circuit for testing embedded DRAM circuits |
| 04/08/2008 | US7356639 Configurable width buffered module having a bypass circuit |
| 04/08/2008 | US7356435 Semiconductor test apparatus and control method therefor |
| 04/08/2008 | US7356430 Methods and apparatus for data analysis |
| 04/08/2008 | US7355910 Semiconductor memory device with shift redundancy circuits |
| 04/08/2008 | US7355908 Nonvolatile storage device and self-redundancy method for the same |
| 04/08/2008 | US7355901 Synchronous output buffer, synchronous memory device and method of testing access time |
| 04/03/2008 | WO2008039546A1 Memory system and method for storing and correcting data |
| 04/03/2008 | WO2007050608A3 Testing and recovery in a multilayer device |
| 04/03/2008 | US20080082900 Semiconductor memory apparatus capable of detecting error in data input and output |
| 04/03/2008 | US20080082899 Memory cell supply voltage control based on error detection |
| 04/03/2008 | US20080082898 Electronic device, method for operating an electronic device, memory circuit and method of operating a memory circuit |
| 04/03/2008 | US20080082897 Soft-Input Soft-Output Decoder for Nonvolatile Memory |
| 04/03/2008 | US20080082874 FBM generation device and FBM generation method |
| 04/03/2008 | US20080082873 Minimum memory operating voltage technique |
| 04/03/2008 | US20080082872 Memory controller, memory system, and data transfer method |
| 04/03/2008 | US20080082869 Memory control unit |
| 04/03/2008 | US20080080284 Method and apparatus for refreshing memory cells of a memory |
| 04/03/2008 | US20080080277 Method and system of analyzing failure in semiconductor integrated circuit device |
| 04/03/2008 | US20080080276 Clock frequency doubler method and apparatus for serial flash testing |
| 04/03/2008 | US20080080275 Multi-chip and repairing method thereof |
| 04/03/2008 | US20080080274 Method and apparatus for in-system redundant array repair on integrated circuits |
| 04/03/2008 | US20080080265 Semiconductor memory and method for testing semiconductor memories |
| 04/03/2008 | US20080080241 Method for recycling flash memory |
| 04/03/2008 | US20080079450 Intelligent probe chips/heads |
| 04/03/2008 | DE102006024016B4 Speicher mit einem Ausgangsregister für Testdaten und Verfahren zum Testen eines Speichers Memory having an output register for test data and method for testing a memory |
| 04/03/2008 | DE102004022326B4 Verfahren zum Testen eines integrierten Halbleiterspeichers A method for testing an integrated semiconductor memory, |
| 04/02/2008 | EP1905044A1 Apparatus, system and method for accessing persistent files in non-execute-in-place flash memory |
| 04/02/2008 | EP1839394A4 Error protecting groups of data words |