| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/01/2008 | US7395464 Memory circuit having a controllable output drive |
| 07/01/2008 | US7395168 Method for evaluating semiconductor device error and system for supporting the same |
| 07/01/2008 | US7394709 Memory device |
| 07/01/2008 | US7394691 Semiconductor memory device which prevents destruction of data |
| 07/01/2008 | US7394688 Nonvolatile memory |
| 07/01/2008 | US7394476 Methods and systems for thermal-based laser processing a multi-material device |
| 06/26/2008 | WO2008077125A1 Erasing flash memory using adaptive drain and/or gate bias |
| 06/26/2008 | WO2008076912A1 Method and device for testing memory |
| 06/26/2008 | WO2008023297A3 Circuit arrangement and method for data processing |
| 06/26/2008 | WO2007065155A3 Rewrite strategy and methods and systems for error correction in high-density recording |
| 06/26/2008 | US20080155380 Increasing the Effectiveness of Error Correction Codes and Operating Multi-Level Memory Systems by Using Information About the Quality of the Stored Data |
| 06/26/2008 | US20080155379 Data Storage Device And Data Processing Method |
| 06/26/2008 | US20080155377 Method and apparatus for high speed optical recording |
| 06/26/2008 | US20080155363 Bist circuit device and self test method thereof |
| 06/26/2008 | US20080155362 Test Structure for Characterizing Multi-Port Static Random Access Memory and Register File Arrays |
| 06/26/2008 | US20080155138 Datapipe cpu register array |
| 06/26/2008 | US20080151661 Semiconductor integrated circuit device comprising mos transistor having charge storage layer and method for testing semiconductor memory device |
| 06/26/2008 | US20080151659 Semiconductor memory device |
| 06/26/2008 | US20080151653 Semiconductor memory device |
| 06/26/2008 | US20080151625 Non-volatile semiconductor memory device allowing efficient programming operation and erasing operation in short period of time |
| 06/26/2008 | DE102007060266A1 Verfahren und Vorrichtung zum selektiven Nutzen von Informationen in einem Halbleiterbauteil Method and apparatus for selectively using information in a semiconductor device |
| 06/26/2008 | DE102007058928A1 Verfahren und Halbleiterspeicher mit einer Einrichtung zur Erkennung von Adressierungsfehlern The method and semiconductor memory having a device for detecting addressing errors |
| 06/25/2008 | CN101208755A Apparatus, system, and method for accessing persistent files in non-execute-in-place flash memory |
| 06/25/2008 | CN101206924A Control method of flash memory |
| 06/25/2008 | CN101206921A Method for reducing storage unit write-in disorder |
| 06/25/2008 | CN101206920A Method for reducing storage unit write-in disorder |
| 06/24/2008 | US7392515 Program components having multiple selectable implementations |
| 06/24/2008 | US7392465 Testing ram address decoder for resistive open defects |
| 06/24/2008 | US7392457 Memory storage device having a nonvolatile memory and memory controller with error check operation mode |
| 06/24/2008 | US7392456 Predictive error correction code generation facilitating high-speed byte-write in a semiconductor memory |
| 06/24/2008 | US7392444 Non-volatile memory evaluating method and non-volatile memory |
| 06/24/2008 | US7392443 Method and apparatus for testing DRAM memory chips in multichip memory modules |
| 06/24/2008 | US7392442 Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol |
| 06/24/2008 | US7391663 Structure and method for measuring the channel boosting voltage of NAND flash memory at a node between drain/source select transistor and adjacent flash memory cell |
| 06/24/2008 | US7391662 Semiconductor memory device with redundancy circuit |
| 06/24/2008 | US7391660 Address path circuit with row redundant scheme |
| 06/24/2008 | US7391659 Method for multiple step programming a memory cell |
| 06/19/2008 | WO2008042598A3 Involatile memory with soft-input,soft-output (siso) decoder, statistical unit and adaptive operation |
| 06/19/2008 | WO2008039692A3 Memory with cell population distribution assisted read margining |
| 06/19/2008 | WO2008026204A3 Logical super block mapping for nand flash memory |
| 06/19/2008 | US20080148130 Method and apparatus of cache assisted error detection and correction in memory |
| 06/19/2008 | US20080148116 Method for memory cell characterization using universal structure |
| 06/19/2008 | US20080148114 Redundancy programming for a memory device |
| 06/19/2008 | US20080148113 Recording medium having spare area for defect management and information on defect management, and method of allocating spare area and method of managing defects |
| 06/19/2008 | US20080144412 Method and device for testing memory |
| 06/19/2008 | US20080144409 Byte writeable memory with bit-column voltage selection and column redundancy |
| 06/19/2008 | US20080144408 Asynchronous, high-bandwidth memory component using calibrated timing elements |
| 06/19/2008 | US20080144363 Method of testing pram device |
| 06/19/2008 | US20080143542 Removable memory media with integral indicator light |
| 06/19/2008 | US20080143406 Apparatus and method for adjusting slew rate in semiconductor memory device |
| 06/19/2008 | DE102006059744A1 Halbleiter-Speicherbauelement mit redudanten Speicherzellen, und Verfahren zum Betrieb eines Halbleiter-Speicherbauelements A semiconductor memory device with memory cells redudanten, and method of operating a semiconductor memory device |
| 06/19/2008 | DE102006059743A1 Halbleiter-Bauelement, insbesondere DRAM, mit mehreren einmal-programmierbaren Elementen Semiconductor component, in particular DRAM, having a plurality of one-time programmable elements |
| 06/18/2008 | CN101202117A System and method for testing NVM chip |
| 06/18/2008 | CN101202116A Semiconductor memory device and method for repairing the same |
| 06/18/2008 | CN101202115A Method for implementing test mode of embedded non-volatility memory chip |
| 06/18/2008 | CN101202109A Non-volatile semiconductor memory system and corresponding programming method |
| 06/18/2008 | CN101202107A Nand flash memory device with ecc protected reserved area for non volatile storage of redundancy data |
| 06/18/2008 | CN101201793A Method for distributing and testing memory |
| 06/17/2008 | US7389467 Method of error correction coding, and apparatus for and method of recording data using the coding method |
| 06/17/2008 | US7389459 Provision of debug via a separate ring bus in a data processing apparatus |
| 06/17/2008 | US7389458 Method and apparatus for the memory self-test of embedded memories in semiconductor chips |
| 06/17/2008 | US7389451 Memory redundancy with programmable control |
| 06/17/2008 | US7388796 Method for testing memory under worse-than-normal conditions |
| 06/17/2008 | US7388393 Semiconductor test apparatus |
| 06/12/2008 | WO2008068706A1 Method and device for reconfiguration of reliability data in flash eeprom storage pages |
| 06/12/2008 | WO2008068290A1 Method and semiconductor memory with a device for detecting addressing errors |
| 06/12/2008 | US20080141100 Semiconductor memory device having single-level cells and multi-level cells and method of driving the semiconductor memory device |
| 06/12/2008 | US20080141082 Test mode multi-byte programming with internal verify and polling function |
| 06/12/2008 | US20080141081 Recording medium having spare area for defect management and information on defect management, and method of allocating spare area and method of managing defects |
| 06/12/2008 | US20080141067 Memory device and method of controlling access to such a memory device |
| 06/12/2008 | US20080137456 Method of testing memory device |
| 06/12/2008 | US20080137455 Storage Cell Design Evaluation Circuit Including a Wordline Timing and Cell Access Detection Circuit |
| 06/12/2008 | US20080137454 Semiconductor memory device and method for repairing the same |
| 06/12/2008 | US20080137446 Semiconductor integrated circuit and relief method and test method of the same |
| 06/12/2008 | DE102007058418A1 Fehlerkorrektur in Speicherbauteilen Error correction in memory devices |
| 06/11/2008 | CN101197196A Method for detecting electrical property of flash memory unit |
| 06/11/2008 | CN101197195A Data coding and decoding method and device in NOT-AND flash memory device |
| 06/11/2008 | CN101197194A Memory device detecting method |
| 06/11/2008 | CN101196546A Method for different IP products executing burn-in test and test board used for it |
| 06/11/2008 | CN100394513C Dynamic RAM chip testing method and circuit |
| 06/10/2008 | US7386851 System and method for implementing dynamic lifetime reliability extension for microprocessor architectures |
| 06/10/2008 | US7386818 Efficient modeling of embedded memories in bounded memory checking |
| 06/10/2008 | US7386771 Repair of memory hard failures during normal operation, using ECC and a hard fail identifier circuit |
| 06/10/2008 | US7386770 Information reproduction apparatus for reproducing defect management information from defect management area sets, and an information recording apparatus for replacing defect management information |
| 06/10/2008 | US7386769 On chip diagnosis block with mixed redundancy |
| 06/10/2008 | US7386768 Memory channel with bit lane fail-over |
| 06/10/2008 | US7386766 Address generation apparatus for turbo interleaver and deinterleaver in W-CDMA systems |
| 06/10/2008 | US7386650 Memory test circuit with data expander |
| 06/10/2008 | US7385863 Semiconductor memory device |
| 06/10/2008 | US7385856 Non-volatile memory device and inspection method for non-volatile memory device |
| 06/10/2008 | US7385835 Membrane 3D IC fabrication |
| 06/05/2008 | WO2008064479A1 Circuit and method for testing multi-device systems |
| 06/05/2008 | US20080134004 Recording and/or reproducing apparatus and method |
| 06/05/2008 | US20080133987 Compressing test responses using a compactor |
| 06/05/2008 | US20080133986 Error correction for flash memory |
| 06/05/2008 | US20080133985 Semiconductor device and testing method for same |
| 06/05/2008 | US20080133984 Method for Inspecting the Electrical Performance of a Flash Memory Cell |
| 06/05/2008 | US20080133788 External storage subsystem |
| 06/05/2008 | US20080133448 Techniques For Enhancing the Functionality of File Systems |
| 06/05/2008 | US20080130387 Method for evaluating memory cell performance |