| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 08/09/2007 | US20070183214 Semiconductor device undergoing defect detection test |
| 08/09/2007 | US20070182603 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
| 08/09/2007 | DE102006004247A1 Integrated circuit arrangement e.g. linear sensor, for analog application, has memory implementing evaluation of storage characteristic of one of memory cells based on test signal to output evaluation signal, which indicates characteristic |
| 08/08/2007 | EP1816570A2 Integrated circuit I/O using a high performance bus interface |
| 08/08/2007 | EP1816569A2 Integrated circuit I/O using a high performance bus interface |
| 08/08/2007 | EP1815339A2 Transparent error correcting memory that supports partial-word write |
| 08/08/2007 | EP1815338A2 Predictive error correction code generation facilitating high-speed byte-write in a semiconductor memory |
| 08/08/2007 | CN2932565Y Memory quality test device |
| 08/08/2007 | CN1331379C Flash memory apparatus having single body type rotary cover |
| 08/08/2007 | CN1331207C Method for evaluating semiconductor device error and system for supporting the same |
| 08/08/2007 | CN1331157C Semiconductor storage device with testing and redundant function |
| 08/08/2007 | CN1331156C Semiconductor storage device |
| 08/08/2007 | CN101015023A Cross-point ferroelectric memory that reduces the effects of bit line to word line shorts |
| 08/08/2007 | CN101015019A Apparatus and method for selectively configuring a memory device using a bi-stable relay |
| 08/08/2007 | CN101014941A Memory command delay balancing in a daisy-chained memory topology |
| 08/08/2007 | CN101014868A Remote bist for high speed test and redundancy calculation |
| 08/08/2007 | CN101013602A Semiconductor storage device |
| 08/07/2007 | US7254768 Memory command unit throttle and error recovery |
| 08/07/2007 | US7254762 Semiconductor integrated circuit |
| 08/07/2007 | US7254758 Method and apparatus for testing circuit units to be tested with different test mode data sets |
| 08/07/2007 | US7254757 Flash memory test system and method capable of test time reduction |
| 08/07/2007 | US7254756 Data compression read mode for memory testing |
| 08/07/2007 | US7254754 Raid 3+3 |
| 08/07/2007 | US7254753 Circuit and method for configuring CAM array margin test and operation |
| 08/07/2007 | US7254525 Method and apparatus for automated analysis of hard disk drive performance |
| 08/07/2007 | US7254071 Flash memory devices with trimmed analog voltages |
| 08/07/2007 | US7254070 Semiconductor memory device with redundancy circuit |
| 08/07/2007 | US7254069 Semiconductor memory device storing redundant replacement information with small occupation area |
| 08/07/2007 | US7254058 Thin film magnetic memory device provided with program element |
| 08/07/2007 | US7254055 Initial firing method and phase change memory device for performing firing effectively |
| 08/02/2007 | WO2007086214A1 Tester and selector |
| 08/02/2007 | WO2005121961A3 Memory hub tester interface and method for use thereof |
| 08/02/2007 | US20070180348 Row-diagonal parity technique for enabling efficient recovery from double failures in a storage array |
| 08/02/2007 | US20070180347 Data input method and apparatus, and liquid crystal display device using the same |
| 08/02/2007 | US20070177441 Memory device having redundancy fuse blocks arranged for testing |
| 08/02/2007 | US20070177440 Method for multiple step programming a memory cell |
| 08/01/2007 | EP1563510B1 2t2c signal margin test mode using a defined charge exchange between bl and /bl |
| 08/01/2007 | EP1450259B1 Flash memory |
| 08/01/2007 | CN1329925C Semiconductor device |
| 08/01/2007 | CN1329830C Methods for storing data in non-volatile memories |
| 08/01/2007 | CN101009142A Method and apparatus for selectively connecting and setting each chip of semiconductor wafer |
| 08/01/2007 | CN101009141A 半导体存储设备 Semiconductor memory device |
| 07/31/2007 | US7251773 Beacon to visually locate memory module |
| 07/31/2007 | US7251772 Circuit arrangement having a number of integrated circuit components on a carrier substrate and method for testing a circuit arrangement of this type |
| 07/31/2007 | US7251766 Test method and test circuit for electronic device |
| 07/31/2007 | US7251760 Method for creating defect management information in an recording medium, and apparatus and medium based on said method |
| 07/31/2007 | US7251759 Method and apparatus to compare pointers associated with asynchronous clock domains |
| 07/31/2007 | US7251758 Semiconductor device testing apparatus, system, and method for testing the contacting with semiconductor devices positioned one upon the other |
| 07/31/2007 | US7251757 Memory testing |
| 07/31/2007 | US7251756 Method and apparatus for increasing fuse programming yield through preferred use of duplicate data |
| 07/31/2007 | US7251712 Semiconductor memory device |
| 07/31/2007 | US7251190 Non-volatile semiconductor memory device |
| 07/31/2007 | US7251181 Techniques for storing accurate operating current values |
| 07/31/2007 | US7251155 Device and method having a memory array storing each bit in multiple memory cells |
| 07/31/2007 | US7250809 Boosted voltage generator |
| 07/31/2007 | US7250783 Current mirror multi-channel leakage current monitor circuit and method |
| 07/26/2007 | WO2007041185A3 Reconfigurable memory block redundancy to repair defective input/output lines |
| 07/26/2007 | US20070174756 Reproducing circuit |
| 07/26/2007 | US20070174746 Tuning core voltages of processors |
| 07/26/2007 | US20070174744 Semiconductor memory device storing repair information avoiding memory cell of fail bit and operating method thereof |
| 07/26/2007 | US20070174622 Protection of data of a memory associated with a microprocessor |
| 07/26/2007 | US20070171759 Semiconductor memory device, system and method of testing same |
| 07/26/2007 | US20070171743 Semiconductor memory device capable of writing different data in cells coupled to one word line during burn-in test |
| 07/26/2007 | US20070171742 Semiconductor memory device having an open bit line structure, and method of testing the same |
| 07/26/2007 | US20070171741 Method of curing analog device fail through fast transistor |
| 07/26/2007 | US20070171740 Semiconductor memory module and semiconductor memory device |
| 07/26/2007 | US20070171739 Semiconductor memory devices and methods of testing for failed bits of semiconductor memory devices |
| 07/26/2007 | US20070171738 Semiconductor memory device |
| 07/26/2007 | US20070171737 Semiconductor storage device |
| 07/26/2007 | US20070171736 Method and apparatus for repairing a shorted tunnel device |
| 07/26/2007 | US20070171691 Semiconductor device with electrically broken fuse and its manufacture method |
| 07/26/2007 | DE102006041963A1 Halbleiter-Speicherelement A semiconductor memory element |
| 07/25/2007 | EP1811525A2 Disabling faulty flash memory dies |
| 07/25/2007 | EP1766632A4 System and method for testing a data storage device without revealing memory content |
| 07/25/2007 | CN101006521A Test device and test method |
| 07/25/2007 | CN101006520A Non-volatile semiconductor device and method for automatically correcting non-volatile semiconductor device erase operation failure |
| 07/25/2007 | CN101004954A Method and apparatus for increasing yield in a memory circuit |
| 07/25/2007 | CN101004953A Disabling faulty flash memory dies |
| 07/24/2007 | US7249308 Algorithm to test LPAR I/O subsystem's adherence to LPAR I/O firewalls |
| 07/24/2007 | US7249301 Semiconductor circuit and method for testing, monitoring and application-near setting of a semiconductor circuit |
| 07/24/2007 | US7249300 Integrated circuit device including a scan test circuit and methods of testing the same |
| 07/24/2007 | US7249296 Semiconductor integrated circuit |
| 07/24/2007 | US7249295 Test circuit for semiconductor device |
| 07/24/2007 | US7249294 Semiconductor memory device with reduced package test time |
| 07/24/2007 | US7249289 Method of deciding error rate and semiconductor integrated circuit device |
| 07/24/2007 | US7248524 Operating temperature optimization in a ferroelectric or electret memory |
| 07/24/2007 | US7248523 Static random access memory (SRAM) with replica cells and a dummy cell |
| 07/24/2007 | US7248516 Data compression read mode for memory testing |
| 07/24/2007 | US7248515 Non-volatile memory with test rows for disturb detection |
| 07/24/2007 | US7248514 Semiconductor memory device |
| 07/24/2007 | US7248513 Semiconductor memory device having memory block configuration |
| 07/24/2007 | US7248503 Semiconductor nonvolatile storage device |
| 07/19/2007 | WO2007080031A1 Method and apparatus for recording high-speed input data into a matrix of memory devices |
| 07/19/2007 | US20070169080 Methods and apparatus for use in updating application programs in memory of a network device |
| 07/19/2007 | US20070168840 Memory block quality identification in a memory device |
| 07/19/2007 | US20070168839 Interface apparatus for connecting a device and a host system, and method of controlling the interface apparatus |
| 07/19/2007 | US20070168838 Reproduction apparatus and method for reproducing a unique medium identifier |
| 07/19/2007 | US20070168837 Method for implementing error-correction codes in flash memory |
| 07/19/2007 | US20070168836 Repair bits for a low voltage cache |
| 07/19/2007 | US20070168806 Scan path circuit and semiconductor integrated circuit comprising the scan path circuit |