| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/19/2007 | US20070168790 Apparatus and method for reducing test resources in testing drams |
| 07/19/2007 | US20070168784 Multilevel semiconductor memory, write/read method thereto/therefrom and storage medium storing write/read program |
| 07/19/2007 | US20070168783 ROM redundancy in ROM embedded DRAM |
| 07/19/2007 | US20070168782 External storage device and memory access control method thereof |
| 07/19/2007 | US20070168781 Fully-buffered dual in-line memory module with fault correction |
| 07/19/2007 | US20070168780 Memory with test mode output |
| 07/19/2007 | US20070168779 Testing of a CAM |
| 07/19/2007 | US20070168778 Apparatus and methods for testing memory devices |
| 07/19/2007 | US20070168777 Error detection and correction in a CAM |
| 07/19/2007 | US20070168776 Systems and methods for improved memory scan testability |
| 07/19/2007 | US20070168775 Programmable Memory Test Controller |
| 07/19/2007 | US20070168774 Method for error test, recordation and repair |
| 07/19/2007 | US20070168773 Semiconductor memory unit with repair circuit |
| 07/19/2007 | US20070168772 Circuits and methods for repairing defects in memory devices |
| 07/19/2007 | US20070168771 Circuits and methods for repairing defects in memory devices |
| 07/19/2007 | US20070165481 Method for performing a burn-in test |
| 07/19/2007 | US20070165472 Method and apparatus for evaluating and optimizing a signaling system |
| 07/19/2007 | US20070165471 Internally asymmetric method for evaluating static memory cell dynamic stability |
| 07/19/2007 | US20070165470 Semiconductor device generating a test voltage for a wafer burn-in test and method thereof |
| 07/19/2007 | US20070165469 Test parallelism increase by tester controllable switching of chip select groups |
| 07/19/2007 | US20070165468 Semiconductor memory device |
| 07/19/2007 | US20070165467 Semiconductor integrated circuit device |
| 07/19/2007 | US20070165466 Memory device comprising fuse memory elements |
| 07/19/2007 | US20070165465 Repair i/o fuse circuit of semiconductor memory device |
| 07/19/2007 | US20070164778 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
| 07/19/2007 | DE10296952B4 Vorrichtung und Verfahren zum Prüfen einer Halbleitervorrichtung Apparatus and method for testing a semiconductor device |
| 07/19/2007 | DE102006049205A1 Chipspezifische Ausführung eines Testmodus an einem Speichermodul Chip-specific version of a test mode in a memory module |
| 07/19/2007 | DE102006048856A1 Reparatur einer Halbleiterspeichervorrichtung über einen externen Befehl Repairing a semiconductor memory device using an external command |
| 07/19/2007 | CA2636237A1 Method and apparatus for recording high-speed input data into a matrix of memory devices |
| 07/18/2007 | EP1808863A1 Method and apparatus for recording high-speed input data into a matrix of memory devices |
| 07/18/2007 | CN1327522C Semiconductor device with unloading circuit for removing defect part |
| 07/18/2007 | CN101002283A Semiconductor storage device and redundancy control method for semiconductor storage device |
| 07/18/2007 | CN101002282A Semiconductor storage device and redundancy method for semiconductor storage device |
| 07/18/2007 | CN101002271A Semiconductor storage device and semiconductor storage device control method |
| 07/17/2007 | US7246301 Method for storage array error correction |
| 07/17/2007 | US7246291 Method for localization and generation of short critical sequence |
| 07/17/2007 | US7246289 Memory integrity self checking in VT/TU cross-connect |
| 07/17/2007 | US7246285 Method of automatic fault isolation in a programmable logic device |
| 07/17/2007 | US7246284 Integration type input circuit and method of testing it |
| 07/17/2007 | US7246281 Enhancements to data integrity verification mechanism |
| 07/17/2007 | US7246280 Memory module with parallel testing |
| 07/17/2007 | US7246279 Static random access memory (SRAM) unit and method for operating the same |
| 07/17/2007 | US7246278 Apparatus for testing a memory module |
| 07/17/2007 | US7246277 Test bus architecture for embedded RAM and method of operating same |
| 07/17/2007 | US7246275 Method and apparatus for managing data integrity of backup and disaster recovery data |
| 07/17/2007 | US7246268 Method and apparatus for dynamic degradation detection |
| 07/17/2007 | US7246140 Method and apparatus for storage system to provide distributed data storage and protection |
| 07/17/2007 | US7245690 Shift register and electronic device using the same |
| 07/17/2007 | US7245547 Power detector for use in a nonvolatile memory device and method thereof |
| 07/17/2007 | US7245542 Memory device having open bit line cell structure using burn-in testing scheme and method therefor |
| 07/17/2007 | US7245140 Parameter measurement of semiconductor device from pin with on die termination circuit |
| 07/12/2007 | WO2007078830A2 Repair bits for low voltage cache |
| 07/12/2007 | US20070162826 Method for detecting error correction defects |
| 07/12/2007 | US20070162825 Unidirectional error code transfer for a bidirectional data link |
| 07/12/2007 | US20070162795 Test apparatus and test method |
| 07/12/2007 | US20070162794 Semiconductor memory test device and method thereof |
| 07/12/2007 | US20070162793 Multiple embedded memories and testing components for the same |
| 07/12/2007 | US20070162792 Method for increasing the manufacturing yield of programmable logic devices |
| 07/12/2007 | US20070162791 Information recording medium, information recording method and information recording/reproduction system |
| 07/12/2007 | US20070162790 Recording medium having spare area for defect management and information on defect management, and method of allocating spare area and method of managing defects |
| 07/12/2007 | US20070159899 Balanced sense amplifier circuits |
| 07/12/2007 | US20070159898 Method and apparatus for increasing yield in a memory circuit |
| 07/12/2007 | US20070159897 Method and apparatus for preventing permanent data loss due to single failure of a fault tolerant array |
| 07/12/2007 | DE10344641B4 Signal-Test-Verfahren beim Test von Halbleiter-Bauelementen, sowie Test-Gerät Test signal in the test process of semiconductor devices, as well as test device |
| 07/12/2007 | DE102006053387A1 Speichervorrichtung, die Testergebnisse an mehrere Ausgangsanschlussflächen liefert Memory device that provides the test results to a plurality of output pads |
| 07/12/2007 | DE102006053386A1 Integrierte Schaltung mit Testschaltung An integrated circuit comprising test circuitry |
| 07/12/2007 | DE102004015831B4 Integrierte Schaltung und Verfahren Integrated circuit and method |
| 07/11/2007 | EP1685570B1 Refresh for dynamic cells by identifying those with weak retention and refreshing them more often than those with normal retention |
| 07/11/2007 | EP1665287B1 Management of defective blocks in flash memories |
| 07/11/2007 | EP1665286B1 Integrated circuit and a method of cache remapping |
| 07/11/2007 | EP1500109B1 Redundancy in chained memory architectures |
| 07/11/2007 | CN2922056Y Flash memory data access reliability raising device |
| 07/11/2007 | CN1996496A Method for the concurrent multi-group data processing of single ECC circuit |
| 07/11/2007 | CN1996035A Device with programmable scan chain for use in multi-chip assembly and programming method therefor |
| 07/11/2007 | CN1326147C Non-volatile memories, microcontroller and method of using they |
| 07/10/2007 | US7243290 Data encoding for fast CAM and TCAM access times |
| 07/10/2007 | US7243277 Method of combining multilevel memory cells for an error correction scheme |
| 07/10/2007 | US7243276 Method for performing a burn-in test |
| 07/10/2007 | US7243275 Smart verify for multi-state memories |
| 07/10/2007 | US7243274 Semiconductor device |
| 07/10/2007 | US7243273 Memory testing device and method |
| 07/10/2007 | US7243166 External storage subsystem |
| 07/10/2007 | US7242611 Nonvolatile semiconductor memory device for writing multivalued data |
| 07/10/2007 | US7242601 Deterministic addressing of nanoscale devices assembled at sublithographic pitches |
| 07/10/2007 | US7242012 Lithography device for semiconductor circuit pattern generator |
| 07/05/2007 | WO2006002334A3 Intelligent probe chips/heads |
| 07/05/2007 | US20070153599 Method for evaluating leakage effects on static memory cell access time |
| 07/05/2007 | US20070153598 Measuring method for a semiconductor memory, and semiconductor memory |
| 07/05/2007 | US20070153597 Built-in memory current test circuit |
| 07/05/2007 | US20070153596 Test mode for IPP current measurement for wordline defect detection |
| 07/05/2007 | US20070153595 Apparatus and method for repairing a semiconductor memory |
| 07/05/2007 | US20070152743 256 Meg dynamic random access memory |
| 07/04/2007 | EP1804166A2 Memory device and information processing apparatus |
| 07/04/2007 | CN1992297A Method of executing an electrical function on integrated circuit and structure of integrated circuit |
| 07/04/2007 | CN1992087A Parts testing device and method and interface apparatus thereof |
| 07/04/2007 | CN1992084A Nonvolatile memory and writing method thereof, and semiconductor device |
| 07/04/2007 | CN1324707C Semiconductor integrated circuits |
| 07/03/2007 | US7240277 Memory error detection reporting |
| 07/03/2007 | US7240275 Logical data block, magnetic random access memory, memory module, computer system and method |
| 07/03/2007 | US7240272 Method and system for correcting errors in a memory device |