| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 06/13/2007 | CN1979687A Full detecting method for inlaid flash memory of simplified base pin |
| 06/13/2007 | CN1979686A Safety detecting method for system integrated chip with built-in non-volatile memory |
| 06/13/2007 | CN1979685A Method for detecting system intelegrated chip with built-in multiple blook of non-volatile memory |
| 06/13/2007 | CN1979680A Information reading apparatus, method and corresponding medium |
| 06/12/2007 | US7231585 Error correction for flash memory |
| 06/12/2007 | US7231582 Method and system to encode and decode wide data words |
| 06/12/2007 | US7231580 Nonvolatile memory apparatus and data processing system |
| 06/12/2007 | US7231573 Delay management system |
| 06/12/2007 | US7231564 Data block location verification |
| 06/12/2007 | US7231563 Method and apparatus for high speed testing of latch based random access memory |
| 06/12/2007 | US7231562 Memory module, test system and method for testing one or a plurality of memory modules |
| 06/12/2007 | US7231552 Method and apparatus for independent control of devices under test connected in parallel |
| 06/12/2007 | US7230872 Efficent column redundancy techniques |
| 06/12/2007 | US7230861 Semiconductor integrated circuit |
| 06/12/2007 | US7230859 Nonvolatile memory |
| 06/12/2007 | US7230852 Non-volatile semiconductor memory device allowing efficient programming operation and erasing operation in short period of time |
| 06/12/2007 | US7230442 Semi-conductor component testing process and system for testing semi-conductor components |
| 06/12/2007 | US7229858 Semiconductor wafer and semiconductor device manufacturing method using the same |
| 06/07/2007 | WO2007065155A2 Rewrite strategy and methods and systems for error correction in high-density recording |
| 06/07/2007 | WO2007063784A1 Semiconductor memory test apparatus with error classification means and related test method |
| 06/07/2007 | US20070130496 Apparatus, method and computer program product for reading information stored in storage medium, and storage medium for storing information based on charge amount |
| 06/07/2007 | US20070130488 Semiconductor device and data storage apparatus |
| 06/07/2007 | US20070127300 Bun-in test method semiconductor memory device |
| 06/07/2007 | US20070127280 Deterministic addressing of nanoscale devices assembled at sublithographic pitches |
| 06/06/2007 | EP1606824B1 Test for weak sram cells |
| 06/06/2007 | EP1563512B1 2t2c signal margin test mode using resistive element |
| 06/06/2007 | EP1377981B1 Method and system to optimize test cost and disable defects for scan and bist memories |
| 06/06/2007 | EP1214713B1 Architecture, method(s) and circuitry for low power memories |
| 06/06/2007 | CN1975935A External storing performance testing method and apparatus |
| 06/06/2007 | CN1975934A A semiconductor integlated circuit having test function and manufacturing method |
| 06/06/2007 | CN1320650C Semiconductor device, system device using it, and manufacturing method of a semiconductor device |
| 06/06/2007 | CN1320621C Delay time insertion based on event testing system |
| 06/05/2007 | US7228487 Data buffering system and method for optical recording device |
| 06/05/2007 | US7228477 Apparatus and method for testing circuit units to be tested |
| 06/05/2007 | US7228473 Integrated module having a plurality of separate substrates |
| 06/05/2007 | US7228471 System and method for testing a data storage device without revealing memory content |
| 06/05/2007 | US7228470 Semiconductor testing circuit, semiconductor storage device, and semiconductor testing method |
| 06/05/2007 | US7228469 Portable information device, method for recovering data in portable information device, and computer product |
| 06/05/2007 | US7228468 Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification |
| 06/05/2007 | US7228467 Correcting data having more data blocks with errors than redundancy blocks |
| 06/05/2007 | US7228381 Storage system using fast storage device for storing redundant data |
| 06/05/2007 | US7228262 Semiconductor integrated circuit verification system |
| 06/05/2007 | US7227801 Semiconductor memory device with reliable fuse circuit |
| 06/05/2007 | US7227785 Memory devices with page buffer having dual registers and method of using the same |
| 06/05/2007 | US7227774 MRAM integrated circuits, MRAM circuits, and systems for testing MRAM integrated circuits |
| 06/05/2007 | US7227733 Method and apparatus providing final test and trimming for a power supply controller |
| 06/05/2007 | US7227351 Apparatus and method for performing parallel test on integrated circuit devices |
| 06/05/2007 | US7227221 Multiple bit chalcogenide storage device |
| 06/05/2007 | US7227170 Multiple bit chalcogenide storage device |
| 05/31/2007 | WO2007060763A1 Semiconductor device |
| 05/31/2007 | WO2007060738A1 Semiconductor device |
| 05/31/2007 | WO2006124244A3 Redundant column read in a memory array |
| 05/31/2007 | WO2006057793A3 Predictive error correction code generation facilitating high-speed byte-write in a semiconductor memory |
| 05/31/2007 | WO2006007264A3 Simultaneous external read operation during internal programming in a flash memory device |
| 05/31/2007 | US20070124650 Disk controller |
| 05/31/2007 | US20070124649 Signal processing apparatus, signal processing method and storage system |
| 05/31/2007 | US20070124648 Data protection method |
| 05/31/2007 | US20070124647 Method and system for a non-volatile memory with multiple bits error correction and detection for improving production yield |
| 05/31/2007 | US20070124630 Semiconductor device having adaptive power function |
| 05/31/2007 | US20070124629 Embedded testing circuit for testing a dual port memory |
| 05/31/2007 | US20070124628 Methods of memory bitmap verification for finished product |
| 05/31/2007 | US20070121397 Output circuit, semiconductor memory device having the same, and method of expanding a valid output data window |
| 05/31/2007 | US20070121396 Semiconductor memory device and method for operating a semiconductor memory device |
| 05/31/2007 | US20070120237 Semiconductor integrated circuit |
| 05/31/2007 | US20070120202 Semiconductor Integrated Circuit Device and Method of Testing the Same |
| 05/31/2007 | US20070120125 Semiconductor Integrated Circuit Device and Method of Testing the Same |
| 05/31/2007 | DE19952272B4 Verfahren und System zum Prüfen von auf eingebetteten Bausteinen basierenden integrierten Systemchip-Schaltungen Method and system for testing based on embedded devices integrated system chip circuits |
| 05/31/2007 | DE102006054161A1 Eingebettete Testschaltung zum Testen eines Dual-Port-Speichers Embedded test circuit for testing a dual-port memory |
| 05/31/2007 | DE102005056930A1 Halbleiter-Bauelement-Test-Verfahren, Halbleiter-Bauelement-Testgerät, sowie zwischen ein Testgerät und ein zu testendes Halbleiter-Bauelement geschaltete Einrichtung A semiconductor device testing method, semiconductor device tester as well as connected between a test apparatus and a semiconductor device to be tested device |
| 05/31/2007 | DE102005056279A1 Test-Vorrichtung und Verfahren zum Testen von elektronischen Bauelementen Test Apparatus and method for testing electronic components |
| 05/30/2007 | EP1791133A1 A method of sharing testing components for multiple embedded memories and the memory system incorporating the same |
| 05/30/2007 | CN1973334A Non-volatile memory and method with control data management |
| 05/30/2007 | CN1971763A Self-examining device and method of ROM |
| 05/30/2007 | CN1971758A Data carrier system and data saving/restoring method thereof |
| 05/30/2007 | CN1319150C Observable register transmission stage covering analyzing and excitation producing method |
| 05/30/2007 | CN1319072C Memory module and memory component with built-in self test function and related testing method |
| 05/30/2007 | CN1318972C Method, system and high-speed storage for autonomous error recovery for memory devices |
| 05/29/2007 | US7225390 Semiconductor memory device provided with error correcting code circuitry |
| 05/29/2007 | US7225379 Circuit and method for testing semiconductor device |
| 05/29/2007 | US7225375 Method and apparatus for detecting array degradation and logic degradation |
| 05/29/2007 | US7225372 Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory |
| 05/29/2007 | US7225371 Method and apparatus for storing and retrieving multiple point-in-time consistent data sets |
| 05/29/2007 | US7225311 Method and apparatus for coordinating memory operations among diversely-located memory components |
| 05/29/2007 | US7225292 Memory module with termination component |
| 05/29/2007 | US7224627 Integrated semiconductor circuit and method for testing the same |
| 05/29/2007 | US7224597 Ferroelectric memory device, electronic apparatus |
| 05/29/2007 | US7223696 Methods for maskless lithography |
| 05/24/2007 | WO2007058624A1 A controller for non-volatile memories, and methods of operating the memory controller |
| 05/24/2007 | WO2007011677B1 Apparatus, system and method for accessing persistent files in non-execute-in-place flash memory |
| 05/24/2007 | WO2006057794A3 Transparent error correcting memory that supports partial-word write |
| 05/24/2007 | US20070118789 Decoding device in optical disc drive and related decoding method thereof |
| 05/24/2007 | US20070115736 Semiconductor memory device having a single input terminal to select a buffer and method of testing the same |
| 05/24/2007 | US20070115735 Semiconductor integrated circuits and test methods thereof |
| 05/24/2007 | US20070115734 Method of operating an integrated circuit tester employing a float-to-ratio conversion with denominator limiting |
| 05/24/2007 | DE19808988B4 Target-Eingabe/Ausgabesystem zum Koppeln eines auf Hardwarelogik basierenden Emulators an ein Target-System Target input / output system for coupling a hardware-based logic emulator to a target system |
| 05/24/2007 | DE102005046588A1 Vorrichtung und Verfahren zum Test und zur Diagnose digitaler Schaltungen Apparatus and method for testing and diagnosis of digital circuits |
| 05/23/2007 | EP1254461B1 Testable rom chip for a data memory redundant logic |
| 05/23/2007 | CN1968026A Semiconductor integrated circuits and test methods thereof |
| 05/23/2007 | CN1967723A Self-testing IC based on 3D memorizer |
| 05/22/2007 | US7222282 Embedded micro computer unit (MCU) for high-speed testing using a memory emulation module and a method of testing the same |