| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 02/21/2008 | WO2008005944A3 Systems and methods for alignment of laser beam (s) for semiconductor link processing |
| 02/21/2008 | WO2008005695A3 Memory device with speculative commands to memory core |
| 02/21/2008 | US20080046802 Memory controller and method of controlling memory |
| 02/21/2008 | US20080046798 Method and system for reducing volatile dram power budget |
| 02/21/2008 | US20080046788 Semiconductor memory device |
| 02/21/2008 | US20080046780 Nonvolatile memory |
| 02/21/2008 | US20080046759 ID installable LSI, secret key installation method, LSI test method, and LSI development method |
| 02/21/2008 | US20080046643 Memory card |
| 02/21/2008 | US20080043551 Electrical fuse circuit, memory device and electronic part |
| 02/21/2008 | US20080043550 Semiconductor memory device |
| 02/20/2008 | EP1890298A1 Test method for semiconductor memory circuit |
| 02/20/2008 | EP1890297A1 Test method for semiconductor memory circuit |
| 02/20/2008 | EP1890294A2 Buffered memory module with configurable interface width |
| 02/20/2008 | EP1890239A1 Memory contoller and method of controlling memory |
| 02/20/2008 | EP1889294A1 One-time programmable crosspoint memory with a diode as an antifuse |
| 02/20/2008 | CN201025531Y BCH coding random error detection and correction device |
| 02/20/2008 | CN101128882A Single wafer magnetic resistance type memory |
| 02/20/2008 | CN101128803A Enabling special modes within a digital device |
| 02/20/2008 | CN101127246A Electric fuse circuit and electronic component |
| 02/20/2008 | CN101127245A Electrical fuse circuit, memory device and electronic part |
| 02/20/2008 | CN101127244A Semiconductor memory device containing antifuse write voltage generation circuit |
| 02/20/2008 | CN101127243A Memory controller and method of controlling memory |
| 02/20/2008 | CN101127242A Semiconductor memory and system |
| 02/20/2008 | CN100370614C Semiconductor integrated circuit device and method for controlling semiconductor integrated circuit device |
| 02/19/2008 | US7334179 Method and system for detecting and correcting errors while accessing memory devices in microprocessor systems |
| 02/19/2008 | US7334174 Semiconductor integrated circuit device and error detecting method therefor |
| 02/19/2008 | US7334170 Method for resolving parameters of DRAM |
| 02/19/2008 | US7334168 Semiconductor integrated circuit which properly executes an operational test of a circuit under test in the semiconductor integrated circuit |
| 02/19/2008 | US7334159 Self-testing RAM system and method |
| 02/19/2008 | US7333385 Semiconductor memory device having the operating voltage of the memory cell controlled |
| 02/19/2008 | US7333384 Techniques for storing accurate operating current values |
| 02/19/2008 | US7333377 Test mode control device using nonvolatile ferroelectric memory |
| 02/19/2008 | US7333376 Test mode control device using nonvolatile ferroelectric memory |
| 02/19/2008 | US7333375 Repair control circuit of semiconductor memory device with reduced size |
| 02/19/2008 | US7333374 Semiconductor memory device capable of replacing defective memory cell with redundant memory cell, and electronic equipment |
| 02/19/2008 | US7333360 Apparatus for pulse testing a MRAM device and method therefore |
| 02/14/2008 | WO2008019252A1 Systems and methods for distinguishing reflections of multiple laser beams for calibration for semiconductor structure processing |
| 02/14/2008 | US20080040646 Raid environment incorporating hardware-based finite field multiplier for on-the-fly xor |
| 02/14/2008 | US20080040645 Error Correction For Disk Storage Media |
| 02/14/2008 | US20080040531 Data storage device |
| 02/14/2008 | US20080037341 Enabling memory redundancy during testing |
| 02/14/2008 | US20080037340 Apparatus for testing a memory of an integrated circuit |
| 02/14/2008 | US20080037339 Memory array for an integrated circuit |
| 02/14/2008 | US20080037325 On-chip ee-prom programming waveform generation |
| 02/14/2008 | US20080037319 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 02/14/2008 | US20080037318 Thin film magnetic memory device having redundant configuration |
| 02/14/2008 | DE60220511T2 Verfahren und system zur optimierung der testkosten und deaktivierungsdefekte für scan- und bist-speicher Method and system for optimizing the test cost and deactivation defective for scan- and are mem |
| 02/14/2008 | DE102007034277A1 Vorrichtung und Verfahren zum Erzeugen von Test-Strukturdaten zum Testen eines Halbleiterbauelements Apparatus and method for generating test data structure for testing a semiconductor device |
| 02/14/2008 | DE102007033785A1 Speichersteuereinheit, DDR-Speichersteuereinheit und Verfahren zum Testen einer Speichersteuereinheit Memory controller, DDR memory control unit and method for testing a memory controller |
| 02/13/2008 | EP1887582A2 Semiconductor memory with redundant rows and columns and a flexible redundancy architecture |
| 02/13/2008 | EP1886351A2 Apparatus and methods for maintaining integrated circuit performance at reduced power |
| 02/13/2008 | EP1886321A1 Memory device with row shifting for defective row repair |
| 02/13/2008 | EP1886155A2 Memory device and method having a data bypass path to allow rapid testing and calibration |
| 02/13/2008 | EP1029278B1 Moving sequential sectors within a block of information in a flash memory mass storage architecture |
| 02/13/2008 | CN101124639A System and method of accessing non-volatile computer memory |
| 02/13/2008 | CN101123123A Semiconductor memory device capable of changing ecc code length |
| 02/13/2008 | CN100369225C Testing apparatus, system and method for testing contact between semiconductor and carrier |
| 02/13/2008 | CN100369159C Detection method of flash storage |
| 02/13/2008 | CN100368818C Test module and test method in use for electrical erasable memory built in chip |
| 02/12/2008 | US7331011 Semiconductor integrated circuit device |
| 02/12/2008 | US7331010 System, method and storage medium for providing fault detection and correction in a memory subsystem |
| 02/12/2008 | US7330932 Disk array with spare logic drive created from space physical drives |
| 02/12/2008 | US7330909 External storage subsystem |
| 02/12/2008 | US7330385 Integrated semiconductor memory device with adaptation of the evaluation characteristic of sense amplifiers |
| 02/12/2008 | US7330383 Semiconductor device with a plurality of fuse elements and method for programming the device |
| 02/12/2008 | US7330045 Semiconductor test apparatus |
| 02/07/2008 | US20080034335 Design Structures Incorporating Semiconductor Device Structures with Reduced Junction Capacitance and Drain Induced Barrier Lowering |
| 02/07/2008 | US20080034269 Apparatus and method for recording data in information recording medium to which extra ecc is applied or reproducing data from the medium |
| 02/07/2008 | US20080034259 Data recorder |
| 02/07/2008 | US20080034130 Buffered Memory Having A Control Bus And Dedicated Data Lines |
| 02/07/2008 | US20080031061 System and method for initiating a bad block disable process in a non-volatile memory |
| 02/07/2008 | US20080031055 Semiconductor memory device capable of performing low-frequency test operation and method for testing the same |
| 02/07/2008 | DE102007034279A1 Tester zum Testen einer Halbleitervorrichtung Tester for testing a semiconductor device |
| 02/06/2008 | CN101120417A Erased sector detection mechanisms |
| 02/06/2008 | CN101118788A Memory controller automatization testing method and apparatus |
| 02/06/2008 | CN100367412C Semiconductor memory device |
| 02/06/2008 | CN100367355C Method and apparatus for testing tunnel magnetoresistive effect element |
| 02/06/2008 | CN100367236C Storage system comprising means managing a storage unit with anti-wear and anti-wear management of a storage unit |
| 02/05/2008 | US7328392 Disk array system |
| 02/05/2008 | US7328388 Built-in self-test arrangement for integrated circuit memory devices |
| 02/05/2008 | US7328382 Memory BISR controller architecture |
| 02/05/2008 | US7328381 Testing system and method for memory modules having a memory hub architecture |
| 02/05/2008 | US7328380 Memory scrubbing logic |
| 02/05/2008 | US7328379 Look-up table for use with redundant memory |
| 02/05/2008 | US7328378 Repair techniques for memory with multiple redundancy |
| 02/05/2008 | US7328365 System and method for providing error check and correction in memory systems |
| 02/05/2008 | US7327766 Circuit configuration for receiving a data signal |
| 02/05/2008 | US7327647 Method and apparatus for generating the wobble clock signal |
| 02/05/2008 | US7327624 Storage device employing a flash memory |
| 02/05/2008 | US7327605 High bandwidth datapath load and test of multi-level memory cells |
| 01/31/2008 | WO2008013340A1 Low power deterministic bist using split lfsr |
| 01/31/2008 | US20080028278 Circuit architecture protected against perturbations |
| 01/31/2008 | US20080026510 Nonvolatile memory cell comprising a reduced height vertical diode |
| 01/31/2008 | US20080025118 Method for using a mixed-use memory array |
| 01/31/2008 | US20080025115 Method and system for testing semiconductor memory device using internal clock signal of semiconductor memory device as data strobe signal |
| 01/31/2008 | DE102006035076A1 Integrated semiconductor memory e.g. volatile RAM, has redundant data lines interconnected with data distributor cable over switching unit e.g. transistor, such that redundant data line or group of redundant data lines is selected |
| 01/31/2008 | DE102006019075B4 Integrierte Schaltung zur Speicherung eines Datums An integrated circuit for storing a datum |
| 01/30/2008 | CN101114530A Method and apparatus for accessing nonvolatile memory with read error by changing read reference current |
| 01/30/2008 | CN101114529A Integrated semiconductor memory and method for operating an integrated semiconductor memory |
| 01/30/2008 | CN101114528A Memory system |