Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
03/1977
03/01/1977US4010450 Fail soft memory
02/1977
02/08/1977US4007452 Wafer scale integration system
01/1977
01/18/1977US4004222 Test system for semiconductor memory cell
01/04/1977US4001673 Method of testing and repairing magnetic bubble domain chip
11/1976
11/30/1976US3995261 Reconfigurable memory
11/30/1976US3995215 Test technique for semiconductor memory array
11/16/1976US3992702 Code conversion arrangements for addresses to faulty memory locations
11/02/1976US3990058 Multiple loop shift register having redundancy
11/02/1976US3989894 Synchronism error detecting and correcting system for a circulating memory
10/1976
10/12/1976US3986179 Fault-tolerant CCD memory chip
10/12/1976US3986171 Storage system comprising a main store and a buffer store
09/1976
09/28/1976US3983537 Reliability of random access memory systems
07/1976
07/27/1976US3972033 Parity check system in a semiconductor memory
07/20/1976US3970993 Cooperative-word linear array parallel processor
07/13/1976US3969618 On line PROM handling system
06/1976
06/08/1976US3962687 Method of inspection of semiconductor memory device
06/01/1976US3961254 Testing embedded arrays
06/01/1976US3961252 Testing embedded arrays
06/01/1976US3961251 Testing embedded arrays
04/1976
04/13/1976US3950729 Shared memory for a fault-tolerant computer
03/1976
03/16/1976US3944800 Memory diagnostic arrangement
02/1976
02/24/1976US3940740 Method for providing reconfigurable microelectronic circuit devices and products produced thereby
02/24/1976US3940601 Apparatus for locating faults in a working storage
01/1976
01/13/1976US3932845 Specialized digital computer with divided memory and arithmetic units