| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 06/05/2008 | US20080130386 Circuit and method for testing multi-device systems |
| 06/05/2008 | US20080130385 Method and system for in-situ parametric SRAM diagnosis |
| 06/05/2008 | DE102006056560A1 Parameter's e.g. reference voltage, target value determining method for e.g. dynamic RAM, involves determining target values for parameter to be trimmed for respective temperatures, where values and temperatures differ from each other |
| 06/05/2008 | DE102004032707B4 Datenträger und Verfahren zum Testen eines Datenträgers Data carriers and method for testing a data carrier |
| 06/04/2008 | EP1927203A2 Strobe technique for test of digital signal timing |
| 06/04/2008 | EP1620859B1 Reference current generator, and method of programming, adjusting and/or operating same |
| 06/04/2008 | CN201069658Y Memory testing device |
| 06/04/2008 | CN101191815A Circuit of detecting power-up and power-down |
| 06/04/2008 | CN100392766C Reducing memory failures in integrated circuits |
| 06/04/2008 | CN100392762C Method and circuit for transmitting address information |
| 06/04/2008 | CN100392610C A high reliability memory module with a fault tolerant address and command bus |
| 06/03/2008 | US7383492 First-in/first-out (FIFO) information protection and error detection method and apparatus |
| 06/03/2008 | US7383476 System architecture and method for three-dimensional memory |
| 06/03/2008 | US7383475 Design structure for memory array repair where repair logic cannot operate at same operating condition as array |
| 06/03/2008 | US7382674 Static random access memory (SRAM) with clamped source potential in standby mode |
| 06/03/2008 | US7382671 Method for detecting column fail by controlling sense amplifier of memory device |
| 06/03/2008 | US7382389 Methods and systems for thermal-based laser processing a multi-material device |
| 06/03/2008 | US7382152 I/O interface circuit of integrated circuit |
| 06/03/2008 | US7381575 Device and method for detecting alignment of active areas and memory cell structures in DRAM devices |
| 05/29/2008 | US20080126913 Methods and systems for managing corrupted meta-data in a computer system or network |
| 05/29/2008 | US20080126911 Memory wrap test mode using functional read/write buffers |
| 05/29/2008 | US20080126894 Semiconductor integrated circuit which properly executes an operational test of a circuit under test in the semiconductor integrated circuit |
| 05/29/2008 | US20080126893 Method of refreshing a dynamic random access memory and corresponding dynamic random access memory device, in particular incorporated into a cellular mobile telephone |
| 05/29/2008 | US20080126892 Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces |
| 05/29/2008 | US20080126890 Autonomic Parity Exchange |
| 05/29/2008 | US20080126863 Testing DRAM Chips with a PC Motherboard Attached to a Chip Handler by a Solder-Side Adaptor Board with an Advanced-Memory Buffer (AMB) |
| 05/29/2008 | DE102007049002A1 Verfahren und Vorrichtung zur Vergrösserung von Taktfrequenz und Datenrate für Halbleiterbausteine Method and apparatus for Enlargement of clock frequency and data rate for semiconductor devices |
| 05/29/2008 | DE102007046954A1 Steuerung der Spannungsversorgung einer Speicherzelle aufgrund von Fehlerermittlung Controlling the voltage supply of a memory cell due to error detection |
| 05/29/2008 | DE10154648B4 Subwortleitungstreiber Subwortleitungstreiber |
| 05/28/2008 | EP1924914A2 Data processing system and a method for the operation thereof |
| 05/28/2008 | EP1815339A4 Transparent error correcting memory that supports partial-word write |
| 05/28/2008 | EP1815338A4 Predictive error correction code generation facilitating high-speed byte-write in a semiconductor memory |
| 05/28/2008 | CN101189683A Method and apparatus for programming a memory array |
| 05/28/2008 | CN100390904C Method and device for testing semiconductor memory |
| 05/28/2008 | CN100390903C Semiconductor memory device and method for correcting memory cell data |
| 05/28/2008 | CN100390557C Integrated circuit with embedded identification code |
| 05/27/2008 | US7380200 Soft error detection and correction by 2-dimensional parity |
| 05/27/2008 | US7380198 System and method for detecting write errors in a storage device |
| 05/27/2008 | US7380183 Semiconductor circuit apparatus and scan test method for semiconductor circuit |
| 05/27/2008 | US7380182 Method and apparatus for checking output signals of an integrated circuit |
| 05/27/2008 | US7380180 Method, system, and apparatus for tracking defective cache lines |
| 05/27/2008 | US7380179 High reliability memory module with a fault tolerant address and command bus |
| 05/27/2008 | US7379412 Methods for writing and reading highly resolved domains for high density data storage |
| 05/27/2008 | US7379379 Storage device employing a flash memory |
| 05/27/2008 | US7379366 Thin film magnetic memory device capable of conducting stable data read and write operations |
| 05/27/2008 | US7379361 Fully-buffered memory-module with redundant memory buffer in serializing advanced-memory buffer (AMB) for repairing DRAM |
| 05/27/2008 | US7379359 Nonvolatile semiconductor memory |
| 05/27/2008 | US7379357 Semiconductor memory device having advanced repair circuit |
| 05/27/2008 | US7379349 Simultaneous and selective memory macro testing |
| 05/27/2008 | US7379332 Systems-on-chips including programmed memory cells and programmable and erasable memory cells |
| 05/27/2008 | US7378863 Synchronous semiconductor device, and inspection system and method for the same |
| 05/22/2008 | WO2008024688A3 Method, apparatus and system relating to automatic cell threshold voltage measurement |
| 05/22/2008 | US20080120059 Test apparatus and test method |
| 05/22/2008 | US20080118229 ITERATIVE CODE SYSTEM FOR STREAMING HDDs |
| 05/22/2008 | US20080117697 System that prevents reduction in data retention |
| 05/22/2008 | US20080117696 Method for repairing defects in memory and related memory system |
| 05/22/2008 | US20080117692 Semiconductor memory device having the operating voltage of the memory cell controlled |
| 05/22/2008 | US20080117681 Detection and correction of defects in semiconductor memories |
| 05/21/2008 | EP1738375B1 Method for detecting resistive-open defects in semiconductor memories |
| 05/21/2008 | CN101183565A Data verification method for storage medium |
| 05/21/2008 | CN101183564A System that prevents reduction in data retention |
| 05/21/2008 | CN101183563A Memory system including flash memory and method of operating the same |
| 05/21/2008 | CN101183550A Write-once type optical disc, and method and apparatus for managing defective areas on write-once type optical disc |
| 05/20/2008 | US7376888 Interleaved recording of separated error correction encoded information |
| 05/20/2008 | US7376887 Method for fast ECC memory testing by software including ECC check byte |
| 05/20/2008 | US7376886 Method and related apparatus for data error checking |
| 05/20/2008 | US7376872 Testing embedded memory in integrated circuits such as programmable logic devices |
| 05/20/2008 | US7376871 CAM test structures and methods therefor |
| 05/20/2008 | US7376857 Method of timing calibration using slower data rate pattern |
| 05/20/2008 | US7376026 Integrated semiconductor memory having sense amplifiers selectively activated at different timing |
| 05/20/2008 | US7376010 Nonvolatile semiconductor memory device having protection function for each memory block |
| 05/20/2008 | US7376003 Magnetic random access memory |
| 05/15/2008 | US20080115043 Semiconductor memory system and signal processing system |
| 05/15/2008 | US20080115039 Destination indication to aid in posted write buffer loading |
| 05/15/2008 | US20080115017 Detection and correction of block-level data corruption in fault-tolerant data-storage systems |
| 05/15/2008 | US20080112242 Multichip and method of testing the same |
| 05/15/2008 | US20080112241 Integrated circuit device |
| 05/15/2008 | US20080112240 Memory device and method of repairing the same |
| 05/15/2008 | US20080112239 Repair fuse circuit for storing i/o repair information therein |
| 05/15/2008 | US20080112238 Hybrid flash memory device and method for assigning reserved blocks thereof |
| 05/15/2008 | US20080112237 Method and Enhanced SRAM Redundancy Circuit for Reducing Wiring and Required Number of Redundant Elements |
| 05/15/2008 | US20080112205 Circuit and method for patching for program ROM |
| 05/15/2008 | DE60035915T2 Einrichtung und Verfahren zur Prüfung eines nichtflüchtigen wiederprogrammierbaren Speichers Apparatus and method for testing a non-volatile reprogrammable memory |
| 05/15/2008 | DE102007051061A1 Nonvolatile semiconductor memory system for use in e.g. cellular telephone, has memory array with multi-bit memory cells, and memory controller with repair unit repairing bit error in i-bit data stored in repair memory |
| 05/15/2008 | DE102006027448B4 Schaltungsanordnung Circuitry |
| 05/15/2008 | DE102004027854B4 Testvorrichtung und Verfahren zum Testen von zu testenden Schaltungseinheiten A test device and method for testing the circuit under test units |
| 05/14/2008 | CN101178943A Memory and method for reading error detection thereof |
| 05/14/2008 | CN101178942A Abrasion wear process method and device of data block |
| 05/14/2008 | CN101178941A Method for dynamically estimating memory body characteristic ineffective cause of defect |
| 05/13/2008 | US7373583 ECC flag for testing on-chip error correction circuit |
| 05/13/2008 | US7373564 Semiconductor memory |
| 05/13/2008 | US7373562 Memory circuit comprising redundant memory areas |
| 05/13/2008 | US7373547 Self-reparable semiconductor and method thereof |
| 05/13/2008 | US7372761 Semiconductor device, nonvolatile semiconductor memory, system including a plurality of semiconductor devices or nonvolatile semiconductor memories, electric card including semiconductor device or nonvolatile semiconductor memory, and electric device with which this electric card can be used |
| 05/13/2008 | US7372751 Using redundant memory for extra features |
| 05/13/2008 | US7372750 Integrated memory circuit and method for repairing a single bit error |
| 05/13/2008 | US7372251 Semiconductor integrated circuit and memory test method |
| 05/08/2008 | US20080109706 Error correction method and apparatus for optical information storage medium recording/reproducing apparatus |
| 05/08/2008 | US20080109705 Memory system and method using ECC with flag bit to identify modified data |
| 05/08/2008 | US20080109704 Data allocation in memory chips |