| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 04/02/2008 | CN101156129A Method and system for storing logical data blocks into flash-blocks in multiple non-volatile memories which are connected to at least one common data i/o bus |
| 04/02/2008 | CN101154626A Method of identifying and/or programming an integrated circuit |
| 04/02/2008 | CN101154469A Semiconductor device |
| 04/02/2008 | CN101154468A Test method for embedded memory chip |
| 04/02/2008 | CN101154465A Nonvolatile semiconductor memory device |
| 04/02/2008 | CN101154461A Nonvolatile semiconductor memory device |
| 04/02/2008 | CN101154459A Nonvolatile semiconductor memory device |
| 04/02/2008 | CN101154448A Page buffer circuit of memory device and program method |
| 04/02/2008 | CN101154444A Method of programming a phase change memory device |
| 04/02/2008 | CN100378704C Method and apparatus for optimizing timing for a multi-drop bus |
| 04/01/2008 | US7353442 On-chip and at-speed tester for testing and characterization of different types of memories |
| 04/01/2008 | US7353438 Transparent error correcting memory |
| 04/01/2008 | US7353437 System and method for testing a memory for a memory failure exhibited by a failing memory |
| 04/01/2008 | US7353424 Storage device, data processing system and data writing and readout method |
| 04/01/2008 | US7353400 Secure program execution depending on predictable error correction |
| 04/01/2008 | US7353328 Memory testing |
| 04/01/2008 | US7352639 Method and apparatus for increasing yield in a memory circuit |
| 04/01/2008 | US7352620 Non-volatile semiconductor device and method for automatically recovering erase failure in the device |
| 04/01/2008 | US7352199 Memory card with enhanced testability and methods of making and using the same |
| 03/27/2008 | US20080077842 Memory with Cell Population Distribution Assisted Read Margining |
| 03/27/2008 | US20080077841 Methods of Cell Population Distribution Assisted Read Margining |
| 03/27/2008 | US20080077840 Memory system and method for storing and correcting data |
| 03/27/2008 | US20080077831 Semiconductor integrated circuit, BIST circuit, design program of BIST circuit, design device of BIST circuit and test method of memory |
| 03/27/2008 | US20080077830 Internal signal monitoring device in semiconductor memory device and method for monitoring the same |
| 03/27/2008 | US20080077829 Systems and Methods for Generating Erasure Flags |
| 03/27/2008 | US20080077827 Test method for semiconductor device |
| 03/27/2008 | US20080077349 Semiconductor testing device |
| 03/27/2008 | US20080074941 Semiconductor Device, Nonvolatile Semiconductor Memory, System Including A Plurality Of Semiconductor Devices Or Nonvolatile Semiconductor Memories, Electric Card Including Semiconductor Device Or Nonvolatile Semiconductor Memory, And Electric Device With Which This Electric Card Can Be Used |
| 03/27/2008 | US20080074938 Semiconductor memory and testing method of same |
| 03/27/2008 | US20080074925 Nonvolatile memory device including circuit formed of thin film transistors |
| 03/27/2008 | DE102004015269B4 Integrierte Schaltung zur Ermittelung einer Spannung An integrated circuit for determining a voltage |
| 03/27/2008 | DE10136700B4 Verfahren zum Testen einer zu testenden Schaltungseinheit und Testvorrichtung A method of testing a circuit under test unit and test device |
| 03/27/2008 | DE10041688B4 Integrierter Speicher mit Speicherzellen in mehreren Speicherzellenblöcken und Verfahren zum Betrieb eines solchen Speichers Integrated memory having memory cells in a plurality of memory cell blocks and method for operating such a memory, |
| 03/26/2008 | EP1903578A1 Semiconductor memory device and method of controlling timing |
| 03/26/2008 | CN101149977A Voltage monitoring device in semiconductor memory device |
| 03/26/2008 | CN101149976A Internal signal monitoring device in semiconductor memory device and method for monitoring the same |
| 03/26/2008 | CN101149664A Solid state hard disc and method for processing its management data |
| 03/26/2008 | CN100377302C Semiconductor device producing system and method |
| 03/26/2008 | CN100377260C Dynamic memory and method for testing dynamic memory |
| 03/25/2008 | US7350137 Method and circuit for error correction in CAM cells |
| 03/25/2008 | US7350135 Checksum writing method and checksum checking apparatus |
| 03/25/2008 | US7350134 Method and apparatus of reloading erroneous configuration data frames during configuration of programmable logic devices |
| 03/25/2008 | US7350120 Buffered memory module and method for testing same |
| 03/25/2008 | US7350119 Compressed encoding for repair |
| 03/25/2008 | US7350109 System and method for testing a memory using DMA |
| 03/25/2008 | US7350010 Method and an apparatus for switching root cells for a computer system without requiring the computer system to be re-booted |
| 03/25/2008 | US7349278 DRAM and method for partially refreshing memory cell array |
| 03/25/2008 | US7349273 Access circuit and method for allowing external test voltage to be applied to isolated wells |
| 03/25/2008 | US7348789 Integrated circuit device with on-chip setup/hold measuring circuit |
| 03/25/2008 | US7348595 Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device |
| 03/20/2008 | WO2008033679A2 Non-volatile memory and method for reduced erase/write cycling during trimming of initial programming voltage |
| 03/20/2008 | US20080072120 Variable Strength ECC |
| 03/20/2008 | US20080072119 Allowable bit errors per sector in memory devices |
| 03/20/2008 | US20080072118 Yield-Enhancing Device Failure Analysis |
| 03/20/2008 | US20080072117 Programming a memory device having error correction logic |
| 03/20/2008 | US20080070330 Fabrication method of semiconductor integrated circuit device |
| 03/20/2008 | US20080068918 Semiconductor memory device capable of relieving defective bits found after packaging |
| 03/20/2008 | US20080068916 Semiconductor memory device |
| 03/20/2008 | US20080068906 Method and apparatus for testing a memory device |
| 03/20/2008 | US20080068905 Reparable semiconductor memory device |
| 03/20/2008 | DE102006040821A1 Integrated circuit testing method for semiconductor substrate, involves evaluating determined value of comparison signal based on parameter, and outputting error signal if determined value does not correspond to parameter |
| 03/19/2008 | EP1901309A1 Method of fixing read evaluation time in a non volatile nand type memory device |
| 03/19/2008 | EP1900104A2 Apparatus and method for channel interleaving in communications system |
| 03/19/2008 | CN101147206A Test device and test method |
| 03/19/2008 | CN101147205A Testing apparatus and testing method |
| 03/19/2008 | CN101147204A Tester and selector |
| 03/19/2008 | CN101145575A Non-volatile memory unit and array |
| 03/19/2008 | CN101145402A Flash memory card test device and method |
| 03/19/2008 | CN101145401A Semiconductor memory device, memory system having semiconductor memory device, and method for testing memory system |
| 03/19/2008 | CN101145400A Embedded memory SOC mapping realization method |
| 03/19/2008 | CN101145136A Processor memory array having memory macros and its protecting method |
| 03/18/2008 | US7346831 Parity assignment technique for parity declustering in a parity array of a storage system |
| 03/18/2008 | US7346830 Usage of an SDRAM as storage for correction and track buffering in frontend ICs of optical recording or reproduction devices |
| 03/18/2008 | US7346829 Semiconductor device and testing method for same |
| 03/18/2008 | US7346818 Method and apparatus for redundant location addressing using data compression |
| 03/18/2008 | US7346817 Method and apparatus for generating and detecting initialization patterns for high speed DRAM systems |
| 03/18/2008 | US7346816 Method and system for testing memory using hash algorithm |
| 03/18/2008 | US7346815 Mechanism for implementing redundancy to mask failing SRAM |
| 03/18/2008 | US7346789 Multimedia reproducing apparatus having function for efficient use of memory |
| 03/18/2008 | US7346712 Semiconductor integrated circuit apparatus and circuit board and information readout method |
| 03/18/2008 | US7345935 Semiconductor wafer and method for testing ferroelectric memory device |
| 03/18/2008 | US7345516 Apparatus and method for adjusting slew rate in semiconductor memory device |
| 03/13/2008 | WO2008029457A1 Nonvolatile memory |
| 03/13/2008 | WO2008029434A1 Semiconductor storage device and semiconductor storage device test method |
| 03/13/2008 | WO2008028853A1 Circuit configuration, and method for the operation of a circuit configuration |
| 03/13/2008 | US20080065938 System, method and storage medium for testing a memory module |
| 03/13/2008 | US20080065937 Nand flash memory device with ecc protected reserved area for non-volatile storage of redundancy data |
| 03/13/2008 | US20080062789 Memory diagnosis test circuit and test method using the same |
| 03/13/2008 | US20080062788 Parallel bit test circuit and method |
| 03/13/2008 | US20080062787 Method of detecting bit line bridge by selectively floating even-or odd-numbered bit lines of memory device |
| 03/13/2008 | US20080062786 Apparatus and method for providing atomicity with respect to request of write operation for successive sector |
| 03/13/2008 | US20080062785 Non-Volatile Memory With Reduced Erase/Write Cycling During Trimming of Initial Programming Voltage |
| 03/13/2008 | US20080062784 Semiconductor memory |
| 03/13/2008 | US20080062783 Design structure for in-system redundant array repair in integrated circuits |
| 03/13/2008 | US20080062770 Non-Volatile Memory With Linear Estimation of Initial Programming Voltage |
| 03/13/2008 | US20080062761 Defective block isolation in a non-volatile memory system |
| 03/13/2008 | US20080062746 SRAM static noise margin test structure suitable for on chip parametric measurements |
| 03/13/2008 | US20080062741 Phase change random access memory and method of testing the same |
| 03/13/2008 | DE102006040644A1 Korrekturverfahren für einen neu-programmierbaren Mikroprozessor Correction method for a new programmable microprocessor |
| 03/13/2008 | DE102006019426B4 Speichermodulsteuerung, Speichersteuerung und entsprechende Speicheranordnung sowie Verfahren zur Fehlerkorrektur Memory module controller, memory controller and respective memory device and method for error correction |