Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
03/2015
03/05/2015WO2015030834A1 Increased refresh interval and energy efficiency in a dram
03/05/2015WO2015030793A1 Reduction of power consumption in flash memory
03/05/2015WO2015027678A1 Bad track repairing method and apparatus
03/05/2015US20150067449 Flash subsystem organized into pairs of upper and lower page locations
03/05/2015US20150067448 Method of operating memory device and methods of writing and reading data in memory device
03/05/2015US20150067421 Dispersed storage with variable slice length and methods for use therewith
03/05/2015US20150067420 Memory module errors
03/05/2015US20150067419 Bad Block Reconfiguration in Nonvolatile Memory
03/05/2015US20150063045 Device and method to perform a parallel memory test
03/05/2015US20150063039 Redundancy in stacked memory structure
03/05/2015US20150063030 Method of testing non-volatile memory device and method of managing non-volatile memory device
03/05/2015US20150063013 Semiconductor memory device
03/05/2015US20150063010 Negative bias thermal instability stress testing for static random access memory (sram)
03/05/2015US20150062997 Fuse information storage circuit of semiconductor apparatus
03/03/2015US8972824 Systems and methods for transparently varying error correction code strength in a flash drive
03/03/2015US8972823 Error correcting for improving reliability by combination of storage system and flash memory device
03/03/2015US8972822 Memory module and semiconductor storage device
03/03/2015US8972821 Encode and multiplex, register, and decode and error correction circuitry
03/03/2015US8972775 Memory device and method of managing memory data error including determining verification voltages and changing threshold voltages based on a corrected error bit
03/03/2015US8972675 Efficient post write read in three dimensional nonvolatile memory
03/03/2015US8971138 Method of screening static random access memory cells for positive bias temperature instability
03/03/2015US8971137 Bit based fuse repair
03/03/2015US8971134 Memory controller comprising adjustable transmitter impedance
03/03/2015US8971122 Group based read reference voltage management in flash memory
03/03/2015US8971119 Select transistor tuning
03/03/2015US8971099 Method of measuring threshold voltage of MOS transistor in SRAM array
03/03/2015US8971098 Latch-based array with enhanced read enable fault testing
03/03/2015US8971094 Replacement of a faulty memory cell with a spare cell for a memory circuit
03/03/2015US8970236 Internal voltage generating circuit for preventing voltage drop of internal voltage
02/2015
02/26/2015WO2015027023A1 Reconfigurable memory interface circuit to support a built-in memory scan chain
02/26/2015WO2015026489A1 Memory system with application of delays in programming cycles to comply with target programming time
02/26/2015US20150058701 Flash memory controller and method of data transmission between flash memories
02/26/2015US20150058698 Data recovery from blocks with gate shorts
02/26/2015US20150058685 Method and system of testing semiconductor memory
02/26/2015US20150058684 Test method, information processing device, and non-transitory computer-readable storage medium
02/26/2015US20150058662 Methods for Accessing a Storage Unit of a Flash Memory and Apparatuses using the Same
02/26/2015US20150058661 Methods for Accessing a Storage Unit of a Flash Memory and Apparatuses using the Same
02/24/2015US8966350 Providing reliability metrics for decoding data in non-volatile storage
02/24/2015US8966344 Data protecting method, memory controller and memory storage device
02/24/2015US8966343 Solid-state drive retention monitor using reference blocks
02/24/2015US8966342 Probabilistic error correction in multi-bit-per-cell flash memory
02/24/2015US8966341 Utilizing a dispersed storage network access token module to access a dispersed storage network memory
02/24/2015US8966331 Test circuit of semiconductor memory apparatus and semiconductor memory system including the same
02/24/2015US8966330 Bad block reconfiguration in nonvolatile memory
02/24/2015US8966329 Fast parallel test of SRAM arrays
02/24/2015US8966326 Error detecting circuit and semiconductor apparatus including the same
02/24/2015US8966193 Addressing, command protocol, and electrical interface for non-volatile memories utilized in recording usage counts sensor
02/24/2015US8964496 Apparatuses and methods for performing compare operations using sensing circuitry
02/24/2015US8964495 Memory operation upon failure of one of two paired memory devices
02/24/2015US8964494 memories and methods for repair in open digit memory architectures
02/24/2015US8964493 Defective memory column replacement with load isolation
02/24/2015US8964484 For test (DFT) read speed through transition detector in built-in self-test (BIST) sort
02/24/2015US8964471 Secure memory which reduces degradation of data
02/24/2015US8964469 Off-die charge pump that supplies multiple flash devices
02/24/2015US8964465 Fractional bits in memory cells
02/24/2015US8963053 Programmable delay introducing circuit in self-timed memory
02/19/2015US20150052409 Flexible interrupt generation mechanism
02/19/2015US20150049564 Semiconductor device enabling refreshing of redundant memory cell instead of defective memory cell
02/19/2015US20150049554 Memory system including a memory device, and methods of operating the memory system and the memory device
02/19/2015US20150049547 Method controlling read sequence of nonvolatile memory device and memory system performing same
02/19/2015US20150049546 Method of programming fuse cells and repairing memory device using the programmed fuse cells
02/19/2015US20150049539 Replacement of a faulty memory cell with a spare cell for a memory circuit
02/19/2015US20150049538 Storage control device, storage device, information processing system, and storage control method
02/19/2015DE102010030745B4 Nicht-flüchtiger Speicher zum Speichern von Speicher-Umabbildungs-Informationen Non-volatile memory for storing memory information Umabbildungs
02/17/2015US8959417 Providing low-latency error correcting code capability for memory
02/17/2015US8959416 Memory defect management using signature identification
02/17/2015US8959415 Memory system and memory controller
02/17/2015US8959404 Method for controlling access operations of a flash memory, and associated flash memory device and flash memory controller
02/17/2015US8959280 Super-endurance solid-state drive with endurance translation layer (ETL) and diversion of temp files for reduced flash wear
02/17/2015US8958258 Semiconductor device and test method thereof
02/12/2015US20150046773 Read request processing apparatus
02/12/2015US20150046771 Operating method of error correction code decoder and memory controller including the error correction code decoder
02/12/2015US20150046770 Sensing parameter management in non-volatile memory storage system to compensate for broken word lines
02/12/2015US20150046762 Data Storage Device and Method for Restricting Access Thereof
02/12/2015US20150046761 System and method for generating field replaceable unit information files
02/12/2015US20150043292 Memory, memory system including the same and method for operating memory
02/12/2015US20150043291 Method for testing semiconductor apparatus and test system using the same
02/12/2015US20150043290 Memory module
02/12/2015US20150043289 Semiconductor memory device
02/12/2015US20150043276 Systems and methods of storing data
02/12/2015US20150043266 Enhanced temperature range for resistive type memory circuits with pre-heat operation
02/12/2015DE10326088B4 Autoeinstellung einer Selbstauffrischfrequenz Auto setting a Selbstauffrischfrequenz
02/12/2015DE102006033649B4 Speicherbauelement und Verfahren zum Konfigurieren eines Speicherbauelements Memory device and method for configuring a memory device
02/11/2015EP2834817A1 Memory with redundant sense amplifier
02/11/2015CN104350472A 试验系统及服务器 Test systems and servers
02/11/2015CN104347122A 一种消息式内存模组的访存方法和装置 A method and apparatus to fetch messages Memory modules
02/11/2015CN104347121A 一种闪存可靠性的筛选测试方法 One kind of flash memory reliability screening test method
02/11/2015CN104347120A 实现存储器测试仪提高同测数的方法 Way to achieve the same number of memory testers measured increase
02/11/2015CN101273414B 用于修补缺陷输入/输出线的可重配置存储器块冗余 Reconfigurable memory blocks used to repair defective redundant input / output lines
02/10/2015US8954825 Apparatuses and methods including error correction code organization
02/10/2015US8954824 Error detection or correction of stored signals after one or more heat events in one or more memory devices
02/10/2015US8954823 Redundant data storage schemes for multi-die memory systems
02/10/2015US8954822 Data encoder and decoder using memory-specific parity-check matrix
02/10/2015US8954821 Memory device having address and command selectable capabilities
02/10/2015US8954819 Method and apparatus for reading a disc
02/10/2015US8954813 Memory system and test method thereof
02/10/2015US8954806 Single event-upset controller wrapper that facilitates fault injection
02/10/2015US8954803 Programmable test engine (PCDTE) for emerging memory technologies
02/10/2015US8954654 Virtual memory device (VMD) application/driver with dual-level interception for data-type splitting, meta-page grouping, and diversion of temp files to ramdisks for enhanced flash endurance
02/10/2015US8954649 Garbage collection in storage devices based on flash memories
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