| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 01/30/2008 | CN101114527A Semiconductor device |
| 01/30/2008 | CN100366048C Electro-optical device, precharge method thereof, image processing circuit, and electronic apparatus |
| 01/30/2008 | CN100365789C Method and apparatus for testing defective portion of semiconductor device |
| 01/30/2008 | CN100365787C Writing buffer-supporting FLASH internal unit testing metod |
| 01/30/2008 | CN100365729C Optical disc recording/reproducing method, optical disc, and optical disc device |
| 01/29/2008 | US7325182 Method and circuit arrangement for testing electrical modules |
| 01/29/2008 | US7325179 Storage system comprising logical circuit configured in accordance with information in memory on PLD |
| 01/29/2008 | US7325178 Programmable built in self test of memory |
| 01/29/2008 | US7325177 Test circuit and method for multilevel cell flash memory |
| 01/29/2008 | US7325176 System and method for accelerated information handling system memory testing |
| 01/29/2008 | US7324392 ROM-based memory testing |
| 01/29/2008 | US7324370 System and method for determining the value of a memory element |
| 01/24/2008 | US20080022189 Use of ECC with iterative decoding for iterative and non-iterative decoding in a read channel for a disk drive |
| 01/24/2008 | US20080022188 Memory card and memory controller |
| 01/24/2008 | US20080022187 Memory device that reflects back error detection signals |
| 01/24/2008 | US20080022186 Fully-Buffered Memory-Module with Error-Correction Code (ECC) Controller in Serializing Advanced-Memory Buffer (AMB) that is transparent to Motherboard Memory Controller |
| 01/24/2008 | US20080022167 Real-time optimized testing of semiconductor device |
| 01/24/2008 | US20080022166 Method and system for testing memory modules |
| 01/24/2008 | US20080022164 Apparatus for formatting information storage medium |
| 01/24/2008 | US20080022163 Storage system and data protection method therefor |
| 01/24/2008 | US20080022149 Enabling memory redundancy during testing |
| 01/24/2008 | US20080019198 Fully-Buffered Memory-Module with Redundant Memory Buffer in Serializing Advanced-Memory Buffer (AMB) for Repairing DRAM |
| 01/24/2008 | US20080019176 Nonvolatile semiconductor memory device for writing multivalued data |
| 01/24/2008 | US20080019169 Active Compensation for Operating Point Drift in MRAM Write Operation |
| 01/24/2008 | US20080017912 Non-volatile memory cell with embedded antifuse |
| 01/23/2008 | EP1881505A1 Memory device with embedded microprocessor for autonomously searching and repairing failures |
| 01/23/2008 | EP1880392A2 Method and apparatus for transmitting data |
| 01/23/2008 | CN101110271A Production and test approach for internal memory performance |
| 01/23/2008 | CN100364015C Testing method of multiport storage |
| 01/23/2008 | CN100364014C Method and device for testing semiconductor memory devices |
| 01/23/2008 | CN100364013C Method for storing check code in memory and its device |
| 01/23/2008 | CN100363749C Scanning device of boundary |
| 01/22/2008 | US7322003 Information storage device |
| 01/22/2008 | US7322002 Erasure pointer error correction |
| 01/22/2008 | US7321998 Semiconductor integrated circuit having a number of data output pins capable of selectively providing output signals and test method thereof |
| 01/22/2008 | US7321997 Memory channel self test |
| 01/22/2008 | US7321991 Semiconductor memory device having advanced test mode |
| 01/22/2008 | US7321951 Method for testing flash memory power loss recovery |
| 01/22/2008 | US7321949 Memory device including self-ID information |
| 01/22/2008 | US7321518 Apparatus and methods for providing redundancy in integrated circuits |
| 01/22/2008 | US7321516 Biasing structure for accessing semiconductor memory cell storage elements |
| 01/17/2008 | US20080016434 Semiconductor integrated circuit device |
| 01/17/2008 | US20080016430 Memory controller and semiconductor memory device |
| 01/17/2008 | US20080016429 Data storage device and error correction method |
| 01/17/2008 | US20080016428 Semiconductor memory device and bit error detection method thereof |
| 01/17/2008 | US20080016419 Data compression read mode for memory testing |
| 01/17/2008 | US20080016418 Generalized bist for multiport memories |
| 01/17/2008 | US20080016417 Cell Supporting Scan-based Tests and With Reduced Time Delay in Functional Mode |
| 01/17/2008 | US20080016416 Autonomic Parity Exchange |
| 01/17/2008 | US20080016415 Evaluation system and method |
| 01/17/2008 | US20080016414 Low Cost High Density Rectifier Matrix Memory |
| 01/17/2008 | US20080016413 Raid 3 + 3 |
| 01/17/2008 | US20080016401 System and method for on-board diagnostics of memory modules |
| 01/17/2008 | US20080013390 Memory array architecture and method for high-speed distribution measurements |
| 01/17/2008 | US20080013389 Random access memory including test circuit |
| 01/17/2008 | US20080013388 Method and Apparatus for Wordline Redundancy Control of Memory in an Information Handling System |
| 01/17/2008 | US20080013366 Device and method having a memory array storing each bit in multiple memory cells |
| 01/17/2008 | US20080013364 Method of making non-volatile memory cell with embedded antifuse |
| 01/17/2008 | US20080013354 Low Cost High Density Rectifier Matrix Memory |
| 01/17/2008 | DE10344021B4 Nichtflüchtiger Speicherbaustein, Programmiervorrichtung und Programmierverfahren Non-volatile memory device programmer and programming methods |
| 01/17/2008 | DE102006038033A1 Speicherarray-Architektur und Verfahren zum schnellen Messen von einer Verteilung Memory array architecture and method for rapidly measuring a distribution |
| 01/16/2008 | EP1459323B1 Multi-mode synchronous memory device and method of operating and testing same |
| 01/16/2008 | EP1444700B1 Memory unit test |
| 01/16/2008 | CN201007923Y Highly effective graphics generating device aimed at FLASH |
| 01/16/2008 | CN101105980A Memory controller with a self-test function, and method of testing a memory controller |
| 01/16/2008 | CN101105979A Random access memory including test circuit |
| 01/16/2008 | CN101105977A Semiconductor memory device and manufacturing method thereof |
| 01/16/2008 | CN101105972A Semiconductor memory, controller and method for operating semiconductor memory |
| 01/16/2008 | CN100362575C Write-once type optical disc, and method and apparatus for managing defective areas on write-once type optical disc |
| 01/15/2008 | US7320100 Apparatus and method for memory with bit swapping on the fly and testing |
| 01/15/2008 | US7320096 System and method for testing memory at full bandwidth |
| 01/15/2008 | US7320047 System having a controller device, a buffer device and a plurality of memory devices |
| 01/15/2008 | US7320012 Method and apparatus for file management |
| 01/15/2008 | US7319935 System and method for analyzing electrical failure data |
| 01/15/2008 | US7319628 Semiconductor memory and method for manufacturing the same |
| 01/15/2008 | US7319624 Memory built in self test circuit and method for generating a hardware circuit comprising the routing boxes thereof |
| 01/15/2008 | US7319603 Semiconductor memory device layout comprising high impurity well tap areas for supplying well voltages to N wells and P wells |
| 01/10/2008 | WO2008005944A2 Systems and methods for alignment of laser beam (s) for semiconductor link processing |
| 01/10/2008 | WO2008005695A2 Memory device with speculative commands to memory core |
| 01/10/2008 | WO2008004226A2 Method of error correction in a multi-bit-per-cell flash memory |
| 01/10/2008 | WO2007047199A3 Error detection and correction in data transmission packets |
| 01/10/2008 | US20080010581 Method of error correction in a multi-bit-per-cell flash memory |
| 01/10/2008 | US20080010580 Redundancy for storage data structures |
| 01/10/2008 | US20080010567 Memory testing |
| 01/10/2008 | US20080010566 Disabling portions of memory with non-deterministic errors |
| 01/10/2008 | US20080008016 Semiconductor memory device |
| 01/10/2008 | US20080008015 Architecture, System and Method for Compressing Repair Data in an Integrated Circuit (IC) Design |
| 01/10/2008 | US20080008010 High bandwidth datapath load and test of multi-level memory cells |
| 01/10/2008 | DE19724277B4 Interne Quellenspannungserzeugungsschaltung Internal source voltage generating circuit |
| 01/09/2008 | EP1875477A2 Memory having a portion that can be switched between use as data and use as error correction code (ecc) |
| 01/09/2008 | CN101101795A Non-volatile memory array |
| 01/09/2008 | CN101101794A Memory testing |
| 01/09/2008 | CN100361231C Semiconductor circuit and method for testing, monitoring and application-near setting of a semiconductor circuit |
| 01/09/2008 | CN100361090C Method and apparatus for a modified parity check |
| 01/08/2008 | US7318190 Storage device parity computation |
| 01/08/2008 | US7318183 Data storing method of dynamic RAM and semiconductor memory device |
| 01/08/2008 | US7318181 ROM-based controller monitor in a memory device |
| 01/08/2008 | US7318175 Memory modeling circuit with fault toleration |
| 01/08/2008 | US7318169 Fault tolerant computer |
| 01/08/2008 | US7317652 Semiconductor device, nonvolatile semiconductor memory, system including a plurality of semiconductor devices or nonvolatile semiconductor memories, electric card including semiconductor device or nonvolatile semiconductor memory, and electric device with which this electric card can be used |