| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 09/09/2008 | US7422914 Fabrication method of semiconductor integrated circuit device |
| 09/04/2008 | WO2008106095A1 Apparatus, method, system of nand defect management |
| 09/04/2008 | WO2008104234A1 Built-in self testing of a flash memory |
| 09/04/2008 | US20080215955 Semiconductor storage device |
| 09/04/2008 | US20080215952 Hybrid flash memory device, memory system, and method controlling errors |
| 09/04/2008 | US20080215946 Semiconductor integrated circuit and memory test method |
| 09/04/2008 | US20080215944 Built-In Self Test (BIST) Architecture having Distributed Interpretation and Generalized Command Protocol |
| 09/04/2008 | US20080215939 Semiconductor memory device with fail-bit storage unit and method for parallel bit testing |
| 09/04/2008 | US20080215938 Memory device and related testing method |
| 09/04/2008 | US20080215937 Remote bist for high speed test and redundancy calculation |
| 09/04/2008 | US20080215930 Flash memory with multi-bit read |
| 09/04/2008 | US20080212383 Circuit and method for parallel test of memory device |
| 09/04/2008 | DE102007021535A1 Verfahren zum Testen einer integrierten Schaltung, Verfahren zum Ermitteln defekter Widerstandsänderungszellen, Testvorrichtung sowie Computerprogramm A method for testing an integrated circuit, A method for detecting defective resistance change cells, test device and computer program |
| 09/04/2008 | DE102007009878A1 Vorrichtung und Verfahren zum Durchführen eines Tests von Halbleiter-Bauelementen mit optischer Schnittstelle Apparatus and method for performing a test of semiconductor devices with optical interface |
| 09/03/2008 | EP1415305B1 Duty-cycle-efficient sram cell test |
| 09/03/2008 | CN101256844A Internal memory testing device and method |
| 09/03/2008 | CN101256843A Hybrid flash memory device, memory system, and method controlling errors |
| 09/03/2008 | CN101256842A Ecc controller for use in flash memory device and memory system including the same |
| 09/03/2008 | CN101256841A Parallel bit test apparatus and parallel bit test method capable of reducing test time |
| 09/03/2008 | CN101256840A Method for verifying non-volatilization memory circuit function |
| 09/03/2008 | CN101256839A Verification process of a flash memory |
| 09/03/2008 | CN101256835A Device for testing and loading content of FLASH memory product |
| 09/03/2008 | CN101256824A Semiconductor integrated circuit |
| 09/03/2008 | CN100416706C Method and circuitry for identifying weak bits in an MRAM |
| 09/03/2008 | CN100416697C Storage apparatus capable of prolixity displacement and high-speed reading-out |
| 09/03/2008 | CN100416545C Processor array |
| 09/03/2008 | CN100416288C System and method for accessing one or more electronic circuits |
| 09/02/2008 | US7421667 System and method for enabling a vendor mode on an integrated circuit |
| 09/02/2008 | US7421640 Method and apparatus for providing error correction capability to longitudinal position data |
| 09/02/2008 | US7421639 Information storage medium on which drive data is recorded, and method of recording information on the information storage medium |
| 09/02/2008 | US7421636 Semiconductor memory device having a test control circuit |
| 09/02/2008 | US7421630 Apparatus and methods for testing memory devices |
| 09/02/2008 | US7421629 Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure |
| 09/02/2008 | US7421547 Storage system and storage control method without requiring formatting of storage device |
| 09/02/2008 | US7421364 Integrated circuit device having a test circuit to measure AC characteristics of internal memory macro |
| 09/02/2008 | US7420860 Semiconductor memory having a dummy signal line connected to dummy memory cell |
| 09/02/2008 | US7420848 Method, system, and circuit for operating a non-volatile memory array |
| 09/02/2008 | US7420841 Memory device and method for transforming between non-power-of-2 levels of multilevel memory cells and 2-level data bits |
| 09/02/2008 | US7420361 Method for improving stability and lock time for synchronous circuits |
| 08/28/2008 | WO2008103793A1 Input/output compression and pin reduction in an integrated circuit |
| 08/28/2008 | WO2008083131A3 Method for programming with initial programming voltage based on trial |
| 08/28/2008 | WO2007136977B1 Methods and apparatus for testing delay locked loops and clock skew |
| 08/28/2008 | US20080209303 Error Detection/Correction Method |
| 08/28/2008 | US20080209284 Input/output compression and pin reduction in an integrated circuit |
| 08/28/2008 | US20080209283 Shared latch for memory test/repair and functional operations |
| 08/28/2008 | US20080205174 Semiconductor memory device and test method thereof |
| 08/28/2008 | US20080205173 Method and System for Testing an Integrated Circuit |
| 08/28/2008 | US20080205151 Non-Volatile Memory Device and Method of Driving the Same |
| 08/28/2008 | US20080205143 Nonvolatile semiconductor memory device having protection function for each memory block |
| 08/28/2008 | US20080204067 Synchronous semiconductor device, and inspection system and method for the same |
| 08/28/2008 | DE102008009880A1 Leistungseinsparungen für Speicher mit Fehlerkorrekturmodus Power savings for memory with error correction mode |
| 08/28/2008 | DE102008005863A1 Verfahren zum Reparieren eines Halbleiterspeicherbauelements und Halbleiterspeicherbauelement A method of repairing a semiconductor memory device and semiconductor memory device |
| 08/28/2008 | DE102007006508A1 Mikrocontroller mit Speicher-Trace-Modul Microcontroller with memory trace module |
| 08/28/2008 | DE10119142B4 Halbleiterbaustein mit einer Vorrichtung zum Reparieren von fehlerhaften Adressen A semiconductor device with a device for repairing defective addresses |
| 08/27/2008 | EP1960930A2 Microprocessor memory management |
| 08/27/2008 | EP1521974B1 Electronic circuit with test unit for testing interconnects |
| 08/27/2008 | CN101253576A Apparatus and method for repairing a semiconductor memory |
| 08/27/2008 | CN101252021A Storing apparatus and operating method thereof |
| 08/27/2008 | CN100414648C Semiconductor device |
| 08/27/2008 | CN100414647C Method for detecting FCASH inner unit |
| 08/26/2008 | US7418651 File download and streaming system |
| 08/26/2008 | US7418646 Integrated circuit using wireless communication to store and/or retrieve data and/or check data |
| 08/26/2008 | US7418638 Semiconductor memory device and method for testing memory cells using several different test data patterns |
| 08/26/2008 | US7418637 Methods and apparatus for testing integrated circuits |
| 08/26/2008 | US7418436 Information processing apparatus, memory management apparatus, memory management method, and information processing method |
| 08/26/2008 | US7417908 Semiconductor storage device |
| 08/26/2008 | US7417838 Semiconductor integrated circuit |
| 08/26/2008 | US7417814 Magnetic recording device |
| 08/21/2008 | WO2008100602A1 Embedded architecture with serial interface for testing flash memories |
| 08/21/2008 | WO2008100495A1 Method and system of fast clearing of memory using a built-in self-test circuit |
| 08/21/2008 | WO2008099861A1 Testing apparatus and testing method |
| 08/21/2008 | WO2008099502A1 Tester |
| 08/21/2008 | WO2007081661A3 Method and system usable in sensor networks for handling memory faults |
| 08/21/2008 | US20080201626 Power savings for memory with error correction mode |
| 08/21/2008 | US20080201625 Error correction system and method |
| 08/21/2008 | US20080201622 Non-Volatile Memory Device Manufacturing Process Testing Systems and Methods Thereof |
| 08/21/2008 | US20080201621 Test apparatus |
| 08/21/2008 | US20080201620 Method and system for uncorrectable error detection |
| 08/21/2008 | US20080198675 Semiconductor device including a plurality of memory units and method of testing the same |
| 08/21/2008 | US20080198646 Nonvolatile memory device using resistance material |
| 08/21/2008 | DE112006002469T5 Rekonfigurierbare Speicherblockredundanz zum Reparieren defekter Ein-/Ausgabe-Leitungen Reconfigurable memory block redundancy for repairing defective I / O lines |
| 08/21/2008 | DE112006001810T5 Integrierte Speicherkern - und Speicherschnittstellenschaltung Integrated memory core - and memory interface circuit |
| 08/21/2008 | DE10334520B4 Verfahren und Vorrichtung zur Fehlerkorrektur bei einem digitalen Speicher Method and apparatus for error correction in a digital memory |
| 08/21/2008 | DE102005060086B4 Mess-Verfahren für einen Halbleiterspeicher, und Halbleiterspeicher Measuring method for a semiconductor memory, and semiconductor memory |
| 08/21/2008 | DE10127194B4 Verfahren und Vorrichtung zum Ausblenden von nicht funktionstüchtigen Speicherzellen Method and device for hiding the functional memory cells |
| 08/21/2008 | DE10125029B4 Verwendung einer Halbleitervorrichtung mit Nebenschaltung im Kerf-Bereich und Verfahren Use of a semiconductor device having sub-circuit in the kerf area and procedures |
| 08/21/2008 | DE10120670B4 Verfahren zur Reparatur von Hardwarefehlern in Speicherbausteinen A method for repair of hardware failures in memory modules |
| 08/20/2008 | EP1959456A1 Test device and test method |
| 08/20/2008 | EP1959455A1 Testing apparatus and method |
| 08/20/2008 | CN101246749A Method for automatically recognizing EEPROM paging size and writing in EEPROM |
| 08/20/2008 | CN101246748A Semiconductor memory device for byte-based masking operation and method of generating parity data |
| 08/20/2008 | CN101246742A Electronic device and its data transmission method |
| 08/20/2008 | CN101246741A System, device, method and packaging structure using flaw memory |
| 08/20/2008 | CN101246738A Memory system with backup circuit and programming method |
| 08/20/2008 | CN100412979C Method and apparatus for error code correction |
| 08/19/2008 | US7415730 Microcomputer and test method therefore |
| 08/19/2008 | US7415686 Memory timing model with back-annotating |
| 08/19/2008 | US7415654 Data integrity checking |
| 08/19/2008 | US7415653 Method and apparatus for vectored block-level checksum for file system data integrity |
| 08/19/2008 | US7415642 Method for creating defect management information in an recording medium, and apparatus and medium based on said method |