| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 10/02/2008 | DE102007015283A1 Testvorrichtung für Halbleiterbauelemente Test apparatus for semiconductor devices |
| 10/01/2008 | EP1974354A1 Method and apparatus for recording high-speed input data into a matrix of memory devices |
| 10/01/2008 | EP1745489B1 Compression of data traces for an integrated circuit with multiple memories |
| 10/01/2008 | EP1358678A4 Programmable memory address and decode circuits with ultra thin vertical body transistors |
| 10/01/2008 | CN101276645A Memory device employing three-level cells and related methods of managing |
| 10/01/2008 | CN101276213A System for testing electronic parts and control method thereof |
| 10/01/2008 | CN100423135C Nonvolatile semiconductor storage device and row-line short defect detection method |
| 10/01/2008 | CN100423134C Internal power supply voltage controller with two standard voltage generation circuit |
| 10/01/2008 | CN100423133C Integrated circuit containing SRAM memory and method of testing same |
| 10/01/2008 | CN100422757C Compact ate with timestamp system |
| 09/30/2008 | US7430705 Data recording and reproducing system, and data recording and reproducing method |
| 09/30/2008 | US7430703 Error correction for multiple word read |
| 09/30/2008 | US7430701 Methods and systems for generating error correction codes |
| 09/30/2008 | US7430695 Register file and its storage device |
| 09/30/2008 | US7430694 Memory BISR architecture for a slice |
| 09/30/2008 | US7430693 Data memory system |
| 09/30/2008 | US7430487 System and method for implementing a programmable DMA master with data checking utilizing a drone system controller |
| 09/30/2008 | US7430144 Semiconductor storage device |
| 09/30/2008 | US7429794 Multi-chip packaged integrated circuit device for transmitting signals from one chip to another chip |
| 09/25/2008 | US20080235641 Critical area computation of composite fault mechanisms using voronoi diagrams |
| 09/25/2008 | US20080235541 Method for testing a word line failure |
| 09/25/2008 | US20080235540 Test apparatus and electronic device |
| 09/25/2008 | US20080232181 Semiconductor memory device |
| 09/25/2008 | DE102007013338A1 Halbleiter-Bauelement und Vorrichtung zur elektrischen Kontaktierung von Halbleiter-Bauelementen Semiconductor device and apparatus for electrically contacting semiconductor devices |
| 09/25/2008 | DE102007013075A1 Testing method for testing integrated circuit, involves transferring one instruction by command pins and another instruction by part of address pin from test device to integrated circuit with clock rate lower than internal clock rate |
| 09/25/2008 | DE102007013069A1 Nicht-flüchtige Speichereinrichtung mit interner Teststeuereinheit und Verfahren zum Prüfen und Reparieren eines Zellenfeldes The non-volatile memory device with an internal test control unit and method for testing and repairing a cell array |
| 09/24/2008 | EP1500111B1 Flexible redundancy for memories |
| 09/24/2008 | CN101273414A Reconfigurable memory block redundancy to repair defective input/output lines |
| 09/24/2008 | CN101271733A Semiconductor memory device |
| 09/24/2008 | CN101271732A Method for testing a word line failure |
| 09/24/2008 | CN101271419A Random storage failure detecting and processing method, device and system |
| 09/24/2008 | CN100421185C Semiconductor storage device |
| 09/24/2008 | CN100421184C Memory device for pre-burning test and method therefor |
| 09/24/2008 | CN100421183C Method for verifying testing ROM |
| 09/24/2008 | CN100421180C Non-volatile semiconductor memory device and writing method therefor |
| 09/24/2008 | CN100421179C Delay circuit, ferroelectric memory device and electronic equipment |
| 09/24/2008 | CN100421177C Integrated memory circuit with redundant circuit and method for substituting memory zone |
| 09/24/2008 | CN100421176C Semiconductor integrated circuit device and method for testing the same |
| 09/24/2008 | CN100421175C Defect unit address programing circuit and method for programing defect unit address |
| 09/24/2008 | CN100421173C Storage circuit, semiconductor device, and electronic apparatus |
| 09/23/2008 | US7428692 Parallel precoder circuit |
| 09/23/2008 | US7428691 Data recovery from multiple failed data blocks and storage units |
| 09/23/2008 | US7428690 Packet communication apparatus |
| 09/23/2008 | US7428687 Memory controller method and system compensating for memory cell data losses |
| 09/23/2008 | US7428676 Boundary scan device |
| 09/23/2008 | US7428673 Test method for determining the wire configuration for circuit carriers with components arranged thereon |
| 09/23/2008 | US7428672 Apparatus and methods for testing memory devices |
| 09/23/2008 | US7428671 Memory module with test structure |
| 09/23/2008 | US7428670 Apparatus for managing disc defects using temporary defect management information and temporary defect management information, and disc having the temporary defect management information and temporary defect management information |
| 09/23/2008 | US7428662 Testing a data store using an external test unit for generating test sequence and receiving compressed test results |
| 09/23/2008 | US7428181 Semiconductor device with self refresh test mode |
| 09/23/2008 | US7428171 Non-volatile memory and method with improved sensing |
| 09/18/2008 | WO2008112609A1 Self-referencing redundancy scheme for a content addressable memory |
| 09/18/2008 | WO2008087082A9 Method and apparatus for recording data into a matrix of memory devices |
| 09/18/2008 | WO2008054987A3 Using no-refresh dram in error correcting code encoder and decoder implementations |
| 09/18/2008 | WO2007099579A8 Ram macro and timing generating circuit for same |
| 09/18/2008 | US20080229176 Method for fast ecc memory testing by software including ecc check byte |
| 09/18/2008 | US20080229173 Method and apparatus for error code correction |
| 09/18/2008 | US20080229164 Memory card and memory controller |
| 09/18/2008 | US20080229163 Test apparatus, test method and machine readable medium storing a program therefor |
| 09/18/2008 | US20080229162 Test apparatus and test method |
| 09/18/2008 | US20080229161 Memory products and manufacturing methods thereof |
| 09/18/2008 | US20080229144 Flexible row redundancy system |
| 09/18/2008 | US20080225615 Pulsed ring oscillator circuit for storage cell read timing evaluation |
| 09/18/2008 | US20080225614 Method and system for reducing volatile memory dram power budget |
| 09/18/2008 | US20080225598 Flash memory and method for checking status register by block unit |
| 09/18/2008 | US20080225597 Method of detecting an under program cell in a non-volatile memory device and method of programming the under program cell using the same |
| 09/18/2008 | US20080225582 Thin film magnetic memory device capable of conducting stable data read and write operations |
| 09/18/2008 | DE60035810T2 Flash-Speicher Flash memory |
| 09/18/2008 | DE102007011801A1 Schaltung zum Erzeugen eines Fehlercodierungsdatenblocks, System mit der Schaltung, Vorrichtung zum Erzeugen eines Fehlercodierungsdatenblocks, Schaltung zum Erzeugen eines Fehlercodierungsdatenblocks, Verfahren zum Erzeugen eines Fehlercodierungsdatenblocks Circuit for generating an error coding data block, the system having circuit means for generating an error data block coding, error coding circuit for generating a data block, error coding method for generating a data block |
| 09/17/2008 | CN201117296Y Embedded type memory built-in self-testing structure |
| 09/17/2008 | CN101268541A Test unit for improving semiconductor yield |
| 09/17/2008 | CN101268521A Semiconductor memory device having bit registering layer and method of driving the same |
| 09/17/2008 | CN101266840A A life prediction method for flash memory electronic products |
| 09/17/2008 | CN100419916C Electrical fuses memory grid with redundancy backup function and redundancy backup method thereof |
| 09/16/2008 | US7426686 System and method for verifying data integrity |
| 09/16/2008 | US7426683 Semiconductor memory device equipped with error correction circuit |
| 09/16/2008 | US7426675 Dynamic random access memory having at least two buffer registers and method for controlling such a memory |
| 09/16/2008 | US7426669 Circuit arrangement and method for driving electronic chips |
| 09/16/2008 | US7426663 Semiconductor integrated circuit and testing method thereof |
| 09/16/2008 | US7426148 Method and apparatus for identifying short circuits in an integrated circuit device |
| 09/12/2008 | WO2008107996A1 Tester |
| 09/11/2008 | US20080222491 Flash memory system for improving read performance and read method thereof |
| 09/11/2008 | US20080222490 Method, apparatus, and system for dynamic ecc code rate adjustment |
| 09/11/2008 | US20080222464 Structure for System for and Method of Performing High Speed Memory Diagnostics Via Built-In-Self-Test |
| 09/11/2008 | US20080222460 Memory test circuit |
| 09/11/2008 | US20080219070 Semiconductor memory device |
| 09/11/2008 | US20080219060 Device and method for internal voltage monitoring |
| 09/11/2008 | DE10035705B4 Verfahren zum Analysieren des Ersatzes fehlerhafter Zellen in einem Speicher und Speichertestvorrichtung mit einem Fehleranalysator, der von dem Verfahren Gebrauch macht A method for analyzing the replacement of defective cells in a memory and memory testing apparatus with a error analyzer, which makes use of the procedure |
| 09/10/2008 | EP1159629B1 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses |
| 09/10/2008 | CN201111933Y High-performance internal storage test module |
| 09/10/2008 | CN101261882A Nonvolatile semiconductor storage device, nonvolatile semiconductor storage system and method of managing of defective column in nonvolatile semiconductor storage system |
| 09/10/2008 | CN100418065C Accumulator with showing application progress and the method of showing application progress |
| 09/09/2008 | US7424691 Method for verifying performance of an array by simulating operation of edge cells in a full array model |
| 09/09/2008 | US7424663 Lowering voltage for cache memory operation |
| 09/09/2008 | US7424659 System-in-package and method of testing thereof |
| 09/09/2008 | US7424653 System and method for error capture and logging in computer systems |
| 09/09/2008 | US7424593 Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices |
| 09/09/2008 | US7424500 Random number generator with ring oscillation circuit |
| 09/09/2008 | US7423922 Defective block handling in a flash memory device |