Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2008
12/04/2008US20080301525 Data refresh apparatus and data refresh method
12/04/2008US20080301508 Semiconductor memory defect analysis method and defect analysis system
12/04/2008US20080301507 System and Method for Repairing a Memory
12/04/2008US20080298148 Semiconductor memory device and test method therefor
12/04/2008US20080298147 Semiconductor memory
12/04/2008US20080298146 Memory redundance circuit techniques
12/04/2008US20080298144 Semiconductor Memory Device Capable of Confirming a Failed Address and a Method Therefor
12/03/2008EP1997112A1 Adjusting a digital delay function of a data memory unit
12/03/2008CN100440473C Fabrication method of semiconductor integrated circuit device
12/03/2008CN100440383C External storing performance testing method and apparatus
12/03/2008CN100440382C Semiconductor integrated circuit device
12/03/2008CN100440381C Automatic variable timing structure for recovering writing using low speed tester
12/02/2008US7461327 Digital data coding apparatus, DVD recording apparatus, and method of using the same
12/02/2008US7461320 Memory system and method having selective ECC during low power refresh
12/02/2008US7461316 Multi-strobe generation apparatus, test apparatus and adjustment method
12/02/2008US7461306 Output data compression scheme using tri-state
12/02/2008US7460419 Nonvolatile semiconductor storing device and block redundancy saving method
12/02/2008US7460414 Semiconductor device
12/02/2008US7460399 Flash EEprom system
12/02/2008US7460384 Low cost high density rectifier matrix memory
11/2008
11/27/2008WO2008143815A1 Memory device and method for repairing a neighborhood of rows in a memory array using a patch table
11/27/2008WO2008142743A1 Testing device
11/27/2008WO2008141616A1 Method for memory management
11/27/2008WO2008100529A3 Pilot placement for non-volatile memory
11/27/2008US20080294952 Test apparatus and device
11/27/2008US20080294951 Methods and devices for testing computer memory
11/27/2008US20080294950 Double dram bit steering for multiple error corrections
11/27/2008US20080294949 Memory access system
11/27/2008US20080293167 Fabrication method of semiconductor integrated circuit device
11/27/2008US20080291763 Memory device
11/27/2008US20080291761 Burn-in test apparatus
11/27/2008DE102007009878B4 Vorrichtung und Verfahren zum Durchführen eines Tests von Halbleiter-Bauelementen mit optischer Schnittstelle Apparatus and method for performing a test of semiconductor devices with optical interface
11/26/2008EP1994535A1 Format transformation of test data
11/26/2008EP1800323A4 LOW VOLTAGE PROGRAMMABLE eFUSE WITH DIFFERENTIAL SENSING SCHEME
11/26/2008EP1509921A4 Content addressable memory (cam) with error checking and correction
11/26/2008CN201156432Y Control circuit implementing NOR FLASH bad block management
11/26/2008CN101313366A Semiconductor testing apparatus and semiconductor memory testing method
11/26/2008CN100437834C Test for weak SRAM cells
11/26/2008CN100437833C Calibrating method and memory system
11/26/2008CN100437832C Fail analysis device
11/26/2008CN100437527C Memory device with built-in test function and method for controlling the same
11/25/2008US7458005 System and method for providing adjustable read margins in a semiconductor memory
11/25/2008US7458004 Semiconductor storage device
11/25/2008US7457997 Apparatus and method for detecting over-programming condition in multistate memory device
11/25/2008US7457996 Semiconductor integrated circuit capable of testing with small scale circuit configuration
11/25/2008US7457187 Design structure for in-system redundant array repair in integrated circuits
11/25/2008US7457179 Semiconductor memory device, system and method of testing same
11/25/2008US7457178 Trimming of analog voltages in flash memory devices
11/25/2008US7457177 Random access memory including circuit to compress comparison results
11/20/2008WO2008139606A1 Testing apparatus
11/20/2008US20080288840 Probeless testing of pad buffers on wafer
11/20/2008US20080288836 Semiconductor integrated circuit capable of testing with small scale circuit configuration
11/20/2008US20080288835 Test method, integrated circuit and test system
11/20/2008US20080288834 Verification of memory consistency and transactional memory
11/20/2008US20080285366 Test apparatus, program, and test method
11/20/2008US20080285365 Memory device for repairing a neighborhood of rows in a memory array using a patch table
11/20/2008US20080285358 Method and circuit for stressing upper level interconnects in semiconductor devices
11/20/2008US20080285347 Non-volatile memory devices and systems including bad blocks address re-mapped and methods of operating the same
11/20/2008US20080285185 Semiconductor integrated circuit
11/20/2008US20080284837 Methods and systems for therma-based laser processing a multi-material device
11/20/2008DE102008022218A1 Verfahren und Schaltung zum Belasten von Zwischenverbindungen auf oberer Ebene bei Halbleiterbauelementen Method and circuit for biasing of upper level interconnects in semiconductor devices
11/20/2008DE10123582B4 Mustergenerator für ein Halbleiterprüfsystem sowie Verfahren zur Prüfmustererzeugung Pattern generator for a semiconductor test system and method for test pattern generation
11/19/2008EP1993101A2 Measuring threshold voltage distribution in memory using an aggregate characteristic
11/19/2008EP1991990A2 Method and apparatus for testing data steering logic for data storage having independently addressable subunits
11/19/2008CN101310443A Semiconductor device
11/19/2008CN101310442A Semi-conductor device
11/19/2008CN101310343A Memory diagnosis device
11/19/2008CN101310342A Test apparatus and test method
11/19/2008CN101308707A Sorting machine for memory IC detection
11/19/2008CN101308706A Data writing method and error correction encoding and decoding method suitable for flash memory
11/19/2008CN101308702A Data structure suitable for flash memory and data writing and reading method thereof
11/19/2008CN100435242C Method of recovering overerased bits in a memory device
11/19/2008CN100435239C Fuse circuit
11/19/2008CN100435116C Non-volatile memory and method with memory planes alignment
11/19/2008CN100435115C Non-volatile memory and method with non-sequential update block management
11/19/2008CN100435104C Device for testing storage modular
11/18/2008US7454688 Information recording disc, recording and/or reproducing device and method
11/18/2008US7454687 Method and infrastructure for recognition of the resources of a defective hardware unit
11/18/2008US7454686 Apparatus and method to check data integrity when handling data
11/18/2008US7454678 Scan stream sequencing for testing integrated circuits
11/18/2008US7454673 Apparatus, system, and method for accessing persistent files in non-execute-in-place flash memory
11/18/2008US7454672 Semiconductor memory device testable with a single data rate and/or dual data rate pattern in a merged data input/output pin test mode
11/18/2008US7454671 Memory device testing system and method having real time redundancy repair analysis
11/18/2008US7454670 Data management apparatus and method of flash memory
11/18/2008US7454663 Method and circuitry for debugging/updating ROM
11/18/2008US7454662 Integrated memory having a circuit for testing the operation of the integrated memory, and method for operating the integrated memory
11/18/2008US7453973 Diagnostic method and apparatus for non-destructively observing latch data
11/18/2008US7453747 Active compensation for operating point drift in MRAM write operation
11/18/2008US7453728 Data storage system with enhanced reliability with respect to data destruction caused by reading-out of the data
11/18/2008US7453259 Loading a socket and/or adapter device with a semiconductor component
11/13/2008US20080282121 Integrated Circuit and Test Method
11/13/2008US20080282120 Memory structure, repair system and method for testing the same
11/13/2008US20080282119 Memory device and built in self-test method of the same
11/13/2008US20080282098 Semiconductor memory device and error correction method therof
11/13/2008US20080279023 Semiconductor integrated circuit with full-speed data transition scheme for DDR SDRSM at internally doubled clock testing application
11/13/2008US20080279022 Semiconductor device with self refresh test mode
11/13/2008US20080279021 Multi-wordline test control circuit and controlling method thereof
11/13/2008US20080279020 Semiconductor memory device
11/13/2008US20080279010 Flash memory device and program method thereof
11/13/2008US20080279004 Charge-Trapping Memory Device and Methods for its Manufacturing and Operation
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