| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 01/22/2009 | US20090024885 Semiconductor integrated circuit and test system thereof |
| 01/22/2009 | US20090024882 Method for monitoring an internal control signal of a memory device and apparatus therefor |
| 01/22/2009 | US20090024879 Disk array device, parity data generating circuit for raid and galois field multiplying circuit |
| 01/22/2009 | US20090022000 Semiconductor storage device and test method therefor |
| 01/22/2009 | US20090021999 Semiconductor device |
| 01/22/2009 | US20090021996 Memory Circuit, Memory Component, Data Processing System and Method of Testing a Memory Circuit |
| 01/22/2009 | US20090021993 Semiconductor memory device |
| 01/22/2009 | US20090021981 Nonvolatile memory device including circuit formed of thin film transistors |
| 01/22/2009 | DE102007033053A1 Speicherschaltung, Speicherbauteil, Datenverarbeitungssystem und Verfahren zum Testen einer Speicherschaltung Memory circuit memory device, data processing system and method for testing a memory circuit |
| 01/22/2009 | DE10147138B4 Verfahren zur Integration von imperfekten Halbleiterspeichereinrichtungen in Datenverarbeitungsvorrichtungen Method for the integration of imperfect semiconductor memory devices in data processing devices |
| 01/21/2009 | CN101350226A Method for verifying whether detection result of detection device is correct or not |
| 01/21/2009 | CN100454547C Semiconductor memory element and its lifetime operation starting device |
| 01/21/2009 | CN100454436C Semiconductor memory device |
| 01/21/2009 | CN100454423C Method and system for managing shortage position in data storage medium |
| 01/20/2009 | US7480841 Semiconductor integrated circuit which properly executes an operational test of a circuit under test in the semiconductor integrated circuit |
| 01/20/2009 | US7480195 Internal data comparison for memory testing |
| 01/20/2009 | US7479694 Membrane 3D IC fabrication |
| 01/15/2009 | WO2009009303A2 Data storage with an outer block code and a stream-based inner code |
| 01/15/2009 | WO2009009302A2 Error recovery storage along a nand-flash string |
| 01/15/2009 | WO2009008080A1 Semiconductor device |
| 01/15/2009 | WO2009008079A1 Semiconductor memory device and system |
| 01/15/2009 | WO2009008078A1 Semiconductor memory device and system |
| 01/15/2009 | WO2009008031A1 Semiconductor memory and system |
| 01/15/2009 | US20090019341 Dynamic memory architecture employing passive expiration of data |
| 01/15/2009 | US20090019218 Non-Volatile Memory And Method With Non-Sequential Update Block Management |
| 01/15/2009 | US20090019217 Non-Volatile Memory And Method With Memory Planes Alignment |
| 01/15/2009 | US20090019210 Nonvolatile memory apparatus |
| 01/15/2009 | US20090016130 Memory device and method of testing a memory device |
| 01/15/2009 | US20090016129 Design structure for increasing fuse programming yield |
| 01/15/2009 | US20090016122 Dual word line or floating bit line low power sram |
| 01/15/2009 | US20090016115 Testing non-volatile memory devices for charge leakage |
| 01/15/2009 | DE102008031288A1 Speichervorrichtung und Verfahren zum Testen einer Speichervorrichtung Memory device and method for testing a memory device |
| 01/15/2009 | DE102007032560A1 Semiconductor component e.g. ROM, solder contact and/or contact ball checking system, has medium for supplying mechanical load to solder contacts, and bristles arranged such that load results through touch/friction |
| 01/15/2009 | DE102007029752A1 Semiconductor component testing method for semiconductor memory element such as function memory element, involves renewing selected digital value, and comparing levels of data signals produced in response to renewed selected digital value |
| 01/14/2009 | EP2015311A1 Semiconductor memory system for flash memory |
| 01/14/2009 | EP2015310A2 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 01/14/2009 | EP2015308A1 Oscillation device, method of oscillation, and memory device |
| 01/14/2009 | EP2015089A1 Tester, circuit, and electronic device |
| 01/14/2009 | EP1388150B1 Integrated circuit with self-test device for an embedded non-volatile memory and related test method |
| 01/14/2009 | CN201181590Y Test module and test system |
| 01/14/2009 | CN101345090A Memory element test method |
| 01/14/2009 | CN100452240C Multi-port memory device having serial i/o interface |
| 01/14/2009 | CN100452236C Semiconductor memory |
| 01/14/2009 | CN100452227C Method and apparatus for picking absolute time data of prerecording ditch groove |
| 01/14/2009 | CN100451668C Memory bus checking procedure |
| 01/13/2009 | US7478308 Error-correction memory architecture for testing production |
| 01/13/2009 | US7478307 Method for improving un-correctable errors in a computer system |
| 01/13/2009 | US7478306 Method of detecting error location, and error detection circuit, error correction circuit, and reproducing apparatus using the method |
| 01/13/2009 | US7478302 Signal integrity self-test architecture |
| 01/13/2009 | US7478292 Structure and method for detecting errors in a multilevel memory device with improved programming granularity |
| 01/13/2009 | US7478291 Memory array repair where repair logic cannot operate at same operating condition as array |
| 01/13/2009 | US7478290 Testing DRAM chips with a PC motherboard attached to a chip handler by a solder-side adaptor board with an advanced-memory buffer (AMB) |
| 01/13/2009 | US7478289 System and method for improving the yield of integrated circuits containing memory |
| 01/13/2009 | US7478288 Method and apparatus for recording data on and reproducing data from a recording medium and the recording medium |
| 01/13/2009 | US7478287 Semiconductor integrated circuit and electronic device |
| 01/13/2009 | US7478165 Data carousel receiving and caching |
| 01/13/2009 | US7477557 256 Meg dynamic random access memory |
| 01/13/2009 | US7477556 256 Meg dynamic random access memory |
| 01/13/2009 | US7477222 Redundancy shift register circuit for driver circuit in active matrix type liquid crystal display device |
| 01/13/2009 | US7477091 Defect tolerant redundancy |
| 01/08/2009 | US20090010085 Semiconductor integrated circuit device and redundancy method thereof |
| 01/08/2009 | US20090010078 Semiconductor memory device |
| 01/08/2009 | DE102007031492A1 Method for testing integrated circuit, involves receiving and evaluating switching characteristic of integrated circuit, particularly switch-on characteristic |
| 01/07/2009 | EP2012324A1 Compression of data traces for an integrated circuit with multiple memories |
| 01/07/2009 | EP1218821B1 Improved memory integrity for meters |
| 01/07/2009 | CN101339812A Storage apparatus reading method, system and storage apparatus test apparatus |
| 01/07/2009 | CN101339811A Build-in self-test method of memory |
| 01/07/2009 | CN100449651C Memory system having fast and slow data reading mechanisms |
| 01/07/2009 | CN100449650C Test structure for a single-sided buried strap dram memory cell data array |
| 01/07/2009 | CN100449645C Dynamic semiconductor memory device |
| 01/06/2009 | US7475327 Optical disc recording and reproducing apparatus |
| 01/06/2009 | US7475326 Error detection and correction method and system for memory devices |
| 01/06/2009 | US7475324 Encoding apparatus for storing data to disk |
| 01/06/2009 | US7475316 System, method and storage medium for providing a high speed test interface to a memory subsystem |
| 01/06/2009 | US7475300 Test circuit and test method |
| 01/06/2009 | US7474576 Repairing Advanced-Memory Buffer (AMB) with redundant memory buffer for repairing DRAM on a fully-buffered memory-module |
| 01/06/2009 | US7474575 Apparatus for testing a memory of an integrated circuit |
| 01/06/2009 | US7474573 Semiconductor memory device capable of writing different data in cells coupled to one word line during burn-in test |
| 01/06/2009 | US7474564 Non-volatile memory device capable of changing increment of program voltage according to mode of operation |
| 01/06/2009 | US7474550 Dynamic RAM-and semiconductor device |
| 01/02/2009 | DE102008030408A1 System und Verfahren zum Adressieren von Fehlern in einer Mehrchipspeichervorrichtung System and method of addressing errors in a multi-chip memory device |
| 01/02/2009 | DE102007029371A1 Verfahren zum Verbergen defekter Speicherzellen und Halbleiterspeicher A method for hiding defective memory cells and semiconductor memory |
| 01/01/2009 | US20090006914 Semiconductor integrated circuit and method of detecting fail path thereof |
| 01/01/2009 | US20090006913 Semiconductor memory device having test address generating circuit and test method thereof |
| 01/01/2009 | US20090006912 Semiconductor memory device having burn-in test mode and method for driving the same |
| 01/01/2009 | US20090006911 Data replacement processing method |
| 01/01/2009 | US20090003104 Test circuit and method for use in semiconductor memory device |
| 01/01/2009 | US20090003102 Method for testing semiconductor memory device |
| 01/01/2009 | US20090003101 Apparatus and method of setting test mode in semiconductor integrated circuit |
| 01/01/2009 | US20090003100 Semiconductor memory device and method of inputting addresses therein |
| 01/01/2009 | US20090003099 Memory test mode for charge retention testing |
| 01/01/2009 | US20090003098 Method for Hiding Defective Memory Cells and Semiconductor Memories |
| 01/01/2009 | US20090003088 Semiconductor memory device |
| 01/01/2009 | US20090003046 Memory with dynamic redundancy configuration |
| 01/01/2009 | US20090002041 Method for improving stability and lock time for synchronous circuits |
| 12/31/2008 | WO2009002364A1 Systems and methods for adapting parameters to increase throughput during laser-based wafer processing |
| 12/31/2008 | WO2009001426A1 Semiconductor device |
| 12/31/2008 | WO2007043042A3 Method of error correction in mbc flash memory |
| 12/31/2008 | EP2008283A2 Non-volatile memory and method with redundancy data buffered in data latches for defective locations |
| 12/31/2008 | EP1634301B1 Apparatus for measuring current in sensing a memory cell |