Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
02/2009
02/18/2009CN101369465A Semiconductor device employing logic chip
02/18/2009CN101369464A Nonvolatile memory device and system, and method of operating the same
02/18/2009CN101369463A Flash memory detection classification method
02/18/2009CN101369462A Dynamic compensation method and device used for flawed flash memory
02/18/2009CN101369461A U disk repairing method
02/18/2009CN101369453A Flash memory device and method of controlling flash memory device
02/18/2009CN100463103C Semiconductor device producing system and method
02/18/2009CN100462932C Low powered backup and repair structure of static random access memory
02/17/2009US7493549 Electronic circuits assembly comprising at least one memory with error correcting means
02/17/2009US7493534 Memory error ranking
02/17/2009US7493533 Delay detecting apparatus of delay element in semiconductor device and method thereof
02/17/2009US7492683 Information recording method, information recording system, drive control unit, and semiconductor integrated circuit for recording information on a recording medium having a volume space
02/17/2009US7492660 Flash EEprom system
02/12/2009WO2009020845A1 Enhanced write abort mechanism for non-volatile memory
02/12/2009US20090044077 Flash memory system having encrypted error correction code and encryption method for flash memory system
02/12/2009US20090044076 Memory access system
02/12/2009US20090044074 Ofdm receiving apparatus and ofdm receiving method
02/12/2009US20090044062 Method of testing a memory module and hub of the memory module
02/12/2009US20090044061 Structure and method for detecting errors in a multilevel memory device with improved programming granularity
02/12/2009US20090043952 Moving sectors within a block of information in a flash memory mass storage architecture
02/12/2009US20090040888 Method and apparatus for generating the wobble clock signal
02/12/2009US20090040852 Semiconductor Device and System
02/12/2009US20090040851 Semiconductor memory, test method of semiconductor memory and system
02/12/2009US20090040850 Semiconductor memory, test method of semiconductor memory and system
02/12/2009US20090040827 Flash memory device for remapping bad blocks and bad block remapping method
02/12/2009US20090040825 Novel row redundancy scheme in a multichip integrated memory
02/12/2009DE19950347B4 Mustergenerator für Halbleiterprüfsysteme Pattern generator for semiconductor test systems
02/11/2009EP1849162A4 A single chip having a magnetoresistive memory
02/11/2009CN201194167Y Inclined slide type storage card test device
02/11/2009CN101366182A A nand flash memory controller exporting a nand interface
02/11/2009CN101366009A Data processing system and a method for the operation thereof
02/11/2009CN101364448A Redundancy scheme in memory
02/11/2009CN100461304C Test patterns to insure read signal integrity of dynamic random access memory in high speed data transfer
02/11/2009CN100461296C Semiconductor memory device, test circuit and test method
02/10/2009US7490283 Pipelined data relocation and improved chip architectures
02/10/2009US7490274 Method and apparatus for masking known fails during memory tests readouts
02/10/2009US7490260 Method and apparatus for reconfigurable memory
02/10/2009US7489604 Write-once type optical disc, and method and apparatus for managing defective areas on write-once type optical disc
02/10/2009US7489571 Semiconductor device for switching a defective memory cell bit of data to replacement data on the output data line
02/10/2009US7489564 256 Meg dynamic random access memory
02/10/2009US7489153 Semiconductor memory device
02/05/2009WO2009018093A1 Cell deterioration warning apparatus and method
02/05/2009WO2009017991A1 Devices, methods, and apparatuses for detection, sensing and reporting functionality for semiconductor memory
02/05/2009WO2009016715A1 Testing apparatus, testing method, and manufacturing method of device
02/05/2009US20090037784 Semiconductor memory device having mount test circuits and mount test method thereof
02/05/2009US20090037767 Nonvolatile memory system
02/05/2009US20090037651 Non-Volatile Memory and Method with Phased Program Failure Handling
02/05/2009US20090037644 System and Method of Storing Reliability Data
02/05/2009US20090034354 Method, system, and apparatus for voltage sensing and reporting
02/05/2009US20090034109 Disk drive apparatus and media defect detection method
02/05/2009DE102008030858A1 Speicher mit dynamischer Redundanzkonfigurierung Memory with dynamic Redundanzkonfigurierung
02/05/2009DE102004030543B4 Magnetspeicher/Resistiver Speicher mit einem Kalibrierungssystem Magnetic storage / Resistive memory with a calibration system
02/04/2009CN101361140A Test device
02/04/2009CN101361137A Method and apparatus for recording high-speed input data into a matrix of memory devices
02/04/2009CN101359513A Detection of address decoder faults
02/04/2009CN101359512A Detector method and apparatus for external memory
02/04/2009CN100459129C Semiconductor product with semiconductor substrate and testing structure, and method
02/04/2009CN100458980C Reliable storage method for financial tax control data
02/04/2009CN100458977C Apparatus and method for adaptive controlling flash storage interface reading and writing speed
02/04/2009CN100458743C Method and device for storing detecting information of memory
02/04/2009CN100458735C Method for managing storage data
02/04/2009CN100458717C Method for testing and/or operating memory and device with the memory
02/04/2009CN100458711C Data pickup processing method for logic analyzer and apparatus thereof
02/03/2009US7487428 Fully-buffered memory-module with error-correction code (ECC) controller in serializing advanced-memory buffer (AMB) that is transparent to motherboard memory controller
02/03/2009US7487427 Interface workbench for high volume data buffering and connectivity
02/03/2009US7487414 Parallel bit test circuits for testing semiconductor memory devices and related methods
02/03/2009US7487413 Memory module testing apparatus and method of testing memory modules
02/03/2009US7486578 Test method for ferroelectric memory
02/03/2009US7486549 Thin film magnetic memory device having redundant configuration
02/03/2009US7485571 Method of making an integrated circuit
01/2009
01/29/2009WO2009013832A1 Backup line assignment device, memory saving device, backup line assignment method, memory manufacturing method, and program
01/29/2009US20090031199 File download and streaming system
01/29/2009US20090031194 Error-detecting and correcting fpga architecture
01/29/2009US20090027982 Semiconductor memory and test system
01/29/2009US20090027981 Method of testing data paths in an electronic circuit
01/29/2009US20090027980 Semiconductor memory
01/29/2009US20090027076 Device and method for testing integrated circuit dice in an integrated circuit module
01/29/2009DE102008030824A1 Speicheranordnung und Prüfung Memory configuration and testing
01/28/2009EP1200963B1 Testing rambus memories
01/28/2009CN101354906A Flash memory controller for solid hard disk
01/27/2009US7484162 Method and apparatus for monitoring an electronic control system
01/27/2009US7484144 Testing embedded memory in an integrated circuit
01/27/2009US7484143 System and method for providing testing and failure analysis of integrated circuit memory devices
01/27/2009US7484142 System and method for testing a memory for a memory failure exhibited by a failing memory
01/27/2009US7484141 Semiconductor device capable of performing test at actual operating frequency
01/27/2009US7484140 Memory having variable refresh control and method therefor
01/27/2009US7484138 Method and system for improving reliability of memory device
01/27/2009US7484135 Semiconductor device having a mode of functional test
01/27/2009US7484065 Selective memory allocation
01/27/2009US7484064 Method and apparatus for signaling between devices of a memory system
01/27/2009US7483322 Ring oscillator row circuit for evaluating memory cell performance
01/27/2009US7483320 Data input/output method of semiconductor memory device and semiconductor memory device for the same
01/27/2009US7482644 Integrated semiconductor memory and method for electrically stressing an integrated semiconductor memory
01/22/2009WO2009012209A1 Analog sensing of memory cells in a solid-state memory device
01/22/2009WO2009012204A1 Refresh of non-volatile memory cells based on fatigue conditions
01/22/2009WO2009011052A1 Memory refresh device and memory refresh method
01/22/2009US20090024905 Combined distortion estimation and error correction coding for memory devices
01/22/2009US20090024904 Refresh of non-volatile memory cells based on fatigue conditions
01/22/2009US20090024887 Semiconductor storage device, data write method and data read method
01/22/2009US20090024886 System and Method for Predicting lwarx and stwcx Instructions in Test Pattern Generation and Simulation for Processor Design Verification and Validation
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