| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 04/02/2009 | DE102007011801B4 Schaltung zum Erzeugen eines Fehlercodierungsdatenblocks, Vorrichtung mit der Schaltung, Vorrichtung zum Erzeugen eines Fehlercodierungsdatenblocks Circuit for generating an error coding data blocks, the device comprising circuit means for generating a coding error data block |
| 04/01/2009 | EP2043105A1 Copying method for NAND flash memory |
| 04/01/2009 | EP1634299B1 Integrity control for data stored in a non-volatile memory |
| 04/01/2009 | CN101399090A Holding jaw mechanism, test socket mechanism and storage module positioning device |
| 04/01/2009 | CN101399089A Error rapidly removing method for HSM fault |
| 04/01/2009 | CN101399088A Column redundancy RAM for dynamic bit replacement in flash memory |
| 04/01/2009 | CN101399087A Built-in self-testing circuit and clock switching circuit of programmable memory |
| 04/01/2009 | CN101399075A Electronic data flash memory card with flash memory bad block management |
| 04/01/2009 | CN100474457C Test method for a semiconductor memory |
| 04/01/2009 | CN100474456C Integrated circuit devices having improved duty cycle correction and methods of operating the same |
| 04/01/2009 | CN100474454C Multiple trip point fuse latch device and test method of the fuse |
| 04/01/2009 | CN100474447C Semiconductor memory device |
| 04/01/2009 | CN100474446C Semiconductor memory device |
| 04/01/2009 | CN100474442C Fault removing circuit for storage and power control method thereof |
| 04/01/2009 | CN100474439C Electric resistance cross-point memory, recalibration testing method, and self-calibration electric resistance cross-point memory array chip |
| 04/01/2009 | CN100474434C Integrated circuit memory devices and operating methods configured to output data bits at a lower rate |
| 03/31/2009 | US7512872 Test apparatus and test method |
| 03/31/2009 | US7512865 Method for controlling read velocity in a disk device |
| 03/31/2009 | US7512864 System and method of accessing non-volatile computer memory |
| 03/31/2009 | US7512847 Method for estimating and reporting the life expectancy of flash-disk memory |
| 03/31/2009 | US7512846 Method and apparatus of defect areas management |
| 03/31/2009 | US7512845 Semiconductor memory device and method for stacking reference data |
| 03/31/2009 | US7512024 High-speed memory device easily testable by low-speed automatic test equipment and input/output pin control method thereof |
| 03/31/2009 | US7512009 Method for programming a reference cell |
| 03/31/2009 | CA2211654C Fault tolerant nfs server system and mirroring protocol |
| 03/26/2009 | WO2009039462A1 Method and system for reporting on a primary circuit structure of an integrated circuit (ic) using a secondary circuit structure of the ic |
| 03/26/2009 | US20090083592 Semicondcutor device, memory system and control method of the semiconductor device |
| 03/26/2009 | US20090083591 Method and Apparatus For Recording High-Speed Input Data Into a Matrix of Memory Devices |
| 03/26/2009 | US20090080273 Semiconductor memory device having redundancy memory block and cell array structure thereof |
| 03/26/2009 | DE102006029169B4 Speicherbaustein mit veränderbarer Spaltenselektionsdauer Memory module with variable length column selection |
| 03/25/2009 | EP1535131B1 System and method for self-testing and repair of memory modules |
| 03/25/2009 | CN101395675A At-speed multi-port memory array test method and apparatus |
| 03/25/2009 | CN101395674A Method and apparatus for testing data steering logic for data storage having independently addressable subunits |
| 03/25/2009 | CN101393776A Method for prolonging life of multi-layered unit flash memory |
| 03/25/2009 | CN100472667C Method for detecting electronic magnetic disc |
| 03/25/2009 | CN100472666C Apparatus and method for testing semiconductor memory device |
| 03/25/2009 | CN100472633C Method for creating defect management information in an recording medium, and apparatus and medium based on said method |
| 03/24/2009 | US7509566 Flash memory |
| 03/24/2009 | US7509561 Parity checking circuit for continuous checking of the parity of a memory cell |
| 03/24/2009 | US7509560 Mechanism for adjacent-symbol error correction and detection |
| 03/24/2009 | US7509547 System and method for testing of interconnects in a programmable logic device |
| 03/24/2009 | US7509545 Method and system for testing memory modules |
| 03/24/2009 | US7509544 Data repair and synchronization method of dual flash read only memory |
| 03/24/2009 | US7509543 Circuit and method for error test, recordation, and repair |
| 03/24/2009 | US7509532 Robotic memory-module tester using adapter cards for vertically mounting PC motherboards |
| 03/24/2009 | US7509227 High-speed digital multiplexer |
| 03/24/2009 | US7508776 Controlling method and device for data transmission |
| 03/19/2009 | WO2009033397A1 Method for accessing data in flash memory and data accessing controller |
| 03/19/2009 | US20090077436 Method for recording memory parameter and method for optimizing memory |
| 03/19/2009 | US20090077435 Testing device, testing method, computer program product, and recording medium |
| 03/19/2009 | US20090077434 Status of overall health of nonvolatile memory |
| 03/19/2009 | US20090077432 Semiconductor Memory Device |
| 03/19/2009 | US20090073789 Method and apparatus for testing a memory device |
| 03/19/2009 | US20090073788 Repairing Advanced-Memory Buffer (AMB) with Redundant Memory Buffer for Repairing DRAM on a Fully-Buffered Memory-Module |
| 03/19/2009 | US20090073778 Semiconductor memory device |
| 03/19/2009 | DE10249605B4 Halbleiterspeicherbauelement und Testverfahren The semiconductor memory device and test method |
| 03/18/2009 | EP2035938A2 Improving reliability, availability, and serviceability in a memory device |
| 03/18/2009 | CN101390212A One-time programmable crosspoint memory with a diode as an antifuse |
| 03/18/2009 | CN101389970A Dual-path, multimode sequential storage element |
| 03/18/2009 | CN101388256A Controller and method for generating an ecc code for a memory device |
| 03/18/2009 | CN101388255A Solid hard disk using method and apparatus |
| 03/18/2009 | CN101388254A Storage device test method |
| 03/18/2009 | CN100470683C Method for implementing dynamic storage error static detecting of embedded system |
| 03/18/2009 | CN100470656C Method and apparatus for generating oscillating clock signal |
| 03/18/2009 | CN100470496C Lane testing with variable mapping |
| 03/17/2009 | US7506311 Test tool for application programming interfaces |
| 03/17/2009 | US7506236 Techniques for operating semiconductor devices |
| 03/17/2009 | US7506231 Wrapper testing circuits and method thereof for system-on-a-chip |
| 03/17/2009 | US7506227 Integrated circuit with embedded identification code |
| 03/17/2009 | US7506226 System and method for more efficiently using error correction codes to facilitate memory device testing |
| 03/17/2009 | US7506225 Scanned memory testing of multi-port memory arrays |
| 03/17/2009 | US7506224 Failure recovering method and recording apparatus |
| 03/17/2009 | US7506220 Method of de-interleaving interleaved data samples sequences, and associated system |
| 03/17/2009 | US7505880 Analysis method, program for performing the method, and information processing apparatus |
| 03/17/2009 | US7505339 Static semiconductor memory device allowing simultaneous writing of data into a plurality of memory cells |
| 03/17/2009 | US7505337 Method and apparatus for repairing a shorted tunnel device |
| 03/12/2009 | WO2009032945A1 Storage subsystem capable of adjusting ecc settings based on monitored conditions |
| 03/12/2009 | WO2009032891A1 Memory controller self-calibration for removing systemic influence |
| 03/12/2009 | WO2009032747A1 Reducing the impact of interference during programming |
| 03/12/2009 | WO2009032457A1 Low power ternary content-addressable memory (tcam) |
| 03/12/2009 | WO2008134454A3 Accessing metadata with an external host |
| 03/12/2009 | US20090070656 Memory system with error correction decoder architecture having reduced latency and increased throughput |
| 03/12/2009 | US20090070654 Design Structure For A Processor System With Background Error Handling Feature |
| 03/12/2009 | US20090070643 System and Method for Testing a Large Memory Area During Processor Design Verification and Validation |
| 03/12/2009 | US20090070642 System and method of dynamically mapping out faulty memory areas |
| 03/12/2009 | US20090070529 Data protection after possible write abort or erase abort |
| 03/12/2009 | US20090067269 Memory column redundancy scheme |
| 03/12/2009 | US20090067250 Memory devices with page buffer having dual registers and method of using the same |
| 03/12/2009 | US20090067235 Test circuit and method for multilevel cell flash memory |
| 03/11/2009 | EP1518181B1 Method and apparatus for optimizing timing for a multi-drop bus |
| 03/11/2009 | CN201207295Y Memory card test device |
| 03/11/2009 | CN201207245Y Memory like heat source apparatus |
| 03/11/2009 | CN101383191A Bus signal analysis tool for Flash storage chip |
| 03/11/2009 | CN101383190A Flash memory loss equalizing algorithm applied in solid hard disk |
| 03/11/2009 | CN101383189A Method for testing memory |
| 03/11/2009 | CN100468578C Semiconductor device and method for testing semiconductor device |
| 03/11/2009 | CN100468573C Semiconductor storage apparatus |
| 03/11/2009 | CN100468572C Memory device |
| 03/11/2009 | CN100468565C Magnetic random access memory |
| 03/11/2009 | CN100468367C Solid state storage unit safety storage system and method |