| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 04/23/2009 | WO2006101984A3 Internally generating patterns for testing in an integrated circuit device |
| 04/23/2009 | US20090106628 Safe command execution and error recovery for storage devices |
| 04/23/2009 | US20090106591 System and method for on-board diagnostics of memory modules |
| 04/23/2009 | US20090103402 Method and apparatus for generating absolute time in pregroove data |
| 04/23/2009 | US20090103380 System and method for data read of a synchronous serial interface nand |
| 04/23/2009 | US20090103379 Integrated circuit memory having dynamically adjustable read margin and method therefor |
| 04/23/2009 | US20090103376 Semiconductor memory device |
| 04/23/2009 | US20090103358 Reducing programming error in memory devices |
| 04/23/2009 | US20090103350 Method of Testing an Integrated Circuit, Method of Manufacturing an Integrated Circuit, and Integrated Circuit |
| 04/23/2009 | DE102007050611A1 Verfahren zum Testen einer integrierten Schaltung, Verfahren zum Herstellen einer integrierten Schaltung sowie integrierte Schaltung A method for testing an integrated circuit, A method for fabricating an integrated circuit, and integrated circuit |
| 04/22/2009 | EP1540478B1 Primary and remote data backup with nodal failover |
| 04/22/2009 | CN201226254Y Protection means for memory device |
| 04/22/2009 | CN101414489A Fault-tolerance memory and error-correction error-tolerance method |
| 04/22/2009 | CN101414488A Semiconductor device |
| 04/22/2009 | CN101414482A Error detection method and system for CDRW |
| 04/22/2009 | CN100481091C Method, module and system for dynamically updating each memory in fast photographing device |
| 04/22/2009 | CN100480996C Method and device for managing external memory updates for fault detection in redundant multithreading systems using speculative memory support |
| 04/22/2009 | CN100480719C Test apparatus |
| 04/21/2009 | US7523431 Semiconductor integrated circuit |
| 04/21/2009 | US7523381 Non-volatile memory with error detection |
| 04/21/2009 | US7523380 Methods and structures for providing programmable width and error correction in memory arrays in programmable logic devices |
| 04/21/2009 | US7523367 Method and apparatus to verify non-deterministic results in an efficient random manner |
| 04/21/2009 | US7523366 Storage efficient memory system with integrated BIST function |
| 04/21/2009 | US7523364 Double DRAM bit steering for multiple error corrections |
| 04/21/2009 | US7523249 Direct logical block addressing flash memory mass storage architecture |
| 04/21/2009 | US7523248 System having a controller device, a buffer device and a plurality of memory devices |
| 04/16/2009 | WO2009047841A1 Test device and test method |
| 04/16/2009 | WO2007132457A3 Combined distortion estimation and error correction coding for memory devices |
| 04/16/2009 | WO2007132453A3 Distortion estimation and cancellation in memory devices |
| 04/16/2009 | US20090100303 Adjustable test pattern results latency |
| 04/16/2009 | US20090100291 Memory device and method for repairing a semiconductor memory |
| 04/16/2009 | US20090097345 Method, device and system for regulating access to an integrated circuit (IC) device |
| 04/16/2009 | US20090097344 Semiconductor memory testing device and method of testing semiconductor using the same |
| 04/16/2009 | US20090097343 Method and system for testing address lines |
| 04/16/2009 | US20090097342 Built-in self repair circuit for a multi-port memory and method thereof |
| 04/16/2009 | US20090097335 Method and apparatus for redundant memory configuration in voltage island |
| 04/16/2009 | US20090097334 Semiconductor device |
| 04/16/2009 | DE102007049354A1 Verfahren zum Testen eines Adressbusses in einem logischen Baustein A method for testing an address bus in a logic chip |
| 04/15/2009 | EP1535284B1 Reference voltage generation for memory circuits |
| 04/15/2009 | CN101409111A Method for formatting/testing general sequence bus device |
| 04/15/2009 | CN101409110A Storage module for repairing defect storage unit cell and repairing method thereof |
| 04/15/2009 | CN101409109A System for testing and recording automation storage die set |
| 04/15/2009 | CN101409108A Average abrasion method and controller using the same |
| 04/15/2009 | CN100479067C Semiconductor memory device for build-in fault diagnosis |
| 04/15/2009 | CN100479066C Parity checking circuit for continuous checking of the party of a memory cell |
| 04/15/2009 | CN100478696C Method and system for feedback circulation detection on non-scanning storage element |
| 04/14/2009 | US7519894 Memory device with error correction code module |
| 04/14/2009 | US7519885 Monitoring a monolayer deposition (MLD) system using a built-in self test (BIST) table |
| 04/14/2009 | US7519882 Intelligent binning for electrically repairable semiconductor chips |
| 04/14/2009 | US7519881 Device and method for testing integrated circuit dice in an integrated circuit module |
| 04/14/2009 | US7519878 Obtaining test data for a device |
| 04/14/2009 | US7519877 Memory with test mode output |
| 04/14/2009 | US7519876 Memory card using flash memory and method of controlling the same |
| 04/14/2009 | US7519873 Methods and apparatus for interfacing between test system and memory |
| 04/14/2009 | US7519862 Software programmable verification tool having a single built-in self-test (BIST) module for testing and debugging multiple memory modules in a device under test (DUT) |
| 04/14/2009 | US7519788 System and method for an asynchronous data buffer having buffer write and read pointers |
| 04/14/2009 | US7518936 Semiconductor integrated circuit device and inspection method of the same |
| 04/14/2009 | US7518929 Nonvolatile semiconductor memory device for writing multivalued data |
| 04/14/2009 | US7518918 Method and apparatus for repairing embedded memory in an integrated circuit |
| 04/14/2009 | US7518242 Semiconductor testing device |
| 04/09/2009 | WO2009020969A3 Ecc functional block placement in a multi-channel mass storage device |
| 04/09/2009 | WO2007091263A3 Method for estimating and reporting the life expectancy of flash-disk memory |
| 04/09/2009 | WO2007046084A3 Probabilistic error correction in multi-bit-per-cell flash memory |
| 04/09/2009 | US20090094504 Semiconductor memory device |
| 04/09/2009 | US20090094493 Semiconductor memory device |
| 04/09/2009 | US20090091993 Semiconductor storage device and memory cell test method |
| 04/09/2009 | US20090091985 Input circuit of semiconductor memory apparatus and control method of the same |
| 04/08/2009 | EP2045817A1 Methods and apparatus for measuring current as In sensing a memory cell |
| 04/08/2009 | EP2003652A9 Semiconductor memory and test system |
| 04/08/2009 | EP1864291A4 Method and apparatus for incorporating block redundancy in a memory array |
| 04/08/2009 | EP1292952B1 Semiconductor memory having segmented row repair |
| 04/08/2009 | CN201219035Y Angle-adjustable slide rail type memory card test write-in apparatus |
| 04/08/2009 | CN201219033Y High-speed high-reliability electronic component memory device |
| 04/08/2009 | CN101405818A Semiconductor memory and test system |
| 04/08/2009 | CN101405817A Semi-conductor memory device |
| 04/08/2009 | CN101405816A Method for operating a memory unit |
| 04/08/2009 | CN101405815A Non-volatile memory and method with redundancy data buffered in data latches for defective locations |
| 04/08/2009 | CN101404185A Semiconductor memory device |
| 04/08/2009 | CN101404184A Semiconductor memory device |
| 04/08/2009 | CN101404183A Semiconductor storage device |
| 04/08/2009 | CN101404181A Apparatus and method with compatibility of multi-layer unit and single-layer unit flash memory |
| 04/08/2009 | CN100477014C Automatic bit fail mapping for embedded memories with clock multipliers |
| 04/08/2009 | CN100477013C Method for addressing individual memory devices on a memory module |
| 04/08/2009 | CN100477012C Method and system for defining a redundancy window around a particular column of a memory array |
| 04/08/2009 | CN100477009C NAND FLASH memory device |
| 04/08/2009 | CN100477001C Semiconductor storage device |
| 04/08/2009 | CN100476746C Integrated circuit with defect tolerant redundancy and measuring method thereof |
| 04/07/2009 | US7516363 System and method for on-board diagnostics of memory modules |
| 04/07/2009 | US7515491 Method for evaluating leakage effects on static memory cell access time |
| 04/07/2009 | US7514704 Phase-change memory device and method of manufacturing the same |
| 04/07/2009 | US7513590 Method of normality decision with regard to ink cartridge and printer actualizing the method |
| 04/02/2009 | WO2009042554A1 Nonvolatile memory with self recovery |
| 04/02/2009 | US20090089647 Digital data coding and recording apparatus, and method of using the same |
| 04/02/2009 | US20090089646 Semiconductor storage device |
| 04/02/2009 | US20090089633 Semiconductor Testing Apparatus and Method |
| 04/02/2009 | US20090089632 Memory Sense Scan Circuit And Test Interface |
| 04/02/2009 | US20090089631 Memory diagnosis apparatus |
| 04/02/2009 | US20090089482 Dynamic metablocks |
| 04/02/2009 | US20090086558 Multi-port memory device with serial input/output interface |
| 04/02/2009 | US20090086531 Method and implementation of stress test for MRAM |