| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
|---|
| 03/11/2009 | CN100468349C Method of testing memory |
| 03/10/2009 | US7502985 Method of detecting and correcting errors for a memory and corresponding integrated circuit |
| 03/10/2009 | US7502977 Method and apparatus for reconfigurable memory |
| 03/10/2009 | US7502976 Testing embedded memories in an integrated circuit |
| 03/10/2009 | US7502276 Method and apparatus for multi-word write in domino read SRAMs |
| 03/10/2009 | US7502269 Semiconductor memory device capable of controlling drivability of overdriver |
| 03/10/2009 | US7502268 Voltage control apparatus and method of controlling voltage using the same |
| 03/10/2009 | US7502264 On-chip EE-PROM programming waveform generation |
| 03/05/2009 | WO2009028051A1 Memory test method and memory tester |
| 03/05/2009 | WO2009028037A1 System, relay device, tester, and manufacturing method for device |
| 03/05/2009 | WO2009026696A1 Daisy-chain memory configuration and usage |
| 03/05/2009 | WO2009009302A3 Error recovery storage along a nand-flash string |
| 03/05/2009 | US20090063934 Multi-channel memory system including error correction decoder architecture with efficient area utilization |
| 03/05/2009 | US20090063918 Apparatus and method for detecting word line leakage in memory devices |
| 03/05/2009 | US20090063917 Semiconductor integrated circuit |
| 03/05/2009 | US20090063916 Method for self-test and self-repair in a multi-chip package environment |
| 03/05/2009 | US20090063915 Managing purgeable memory objects using purge groups |
| 03/05/2009 | US20090063913 Semiconductor integrated circuit |
| 03/05/2009 | US20090063912 Method and Apparatus for Implementing SRAM Cell Write Performance Evaluation |
| 03/05/2009 | US20090063887 Memory module with termination component |
| 03/05/2009 | US20090059706 Sram active write assist method for improved operational margins |
| 03/05/2009 | US20090059705 Sram having active write assist for improved operational margins |
| 03/05/2009 | US20090059699 Semiconductor memory device and its test method |
| 03/05/2009 | US20090059698 Method for testing memory |
| 03/05/2009 | US20090059697 Method and apparatus for implementing sram cell write performance evaluation |
| 03/05/2009 | US20090059696 Multi-port memory device |
| 03/05/2009 | US20090059695 Semiconductor memory device and block management method of the same |
| 03/05/2009 | US20090059684 Method and Apparatus for Storing Data in a Write-Once Non-Volatile Memory |
| 03/05/2009 | US20090059682 Semiconductor memory device having antifuse circuitry |
| 03/05/2009 | US20090059647 Semiconductor storage device |
| 03/05/2009 | DE102007041608A1 Prober zum Testen von Bauelementen Prober for testing components |
| 03/05/2009 | CA2695396A1 Daisy-chain memory configuration and usage |
| 03/04/2009 | EP2030114A1 Transparent test method and scan flip-flop |
| 03/04/2009 | EP1588380B1 Method for the recognition and/or correction of memory access errors and electronic circuit arrangement for carrying out said method |
| 03/04/2009 | CN101379566A Repair bits for low voltage cache |
| 03/04/2009 | CN101377960A Apparatus and method for detecting word line leakage in memory devices |
| 03/04/2009 | CN101377959A Selection method and device for restoring redundant bit line |
| 03/04/2009 | CN101377958A Method for monitoring flash memory wiping/writing performance |
| 03/04/2009 | CN101377957A Device and method for reading and writing memory chip |
| 03/04/2009 | CN100466108C Method and apparatus for measuring current a in sensing a memory cell |
| 03/04/2009 | CN100466107C Circuit and method for testing embedded random-access memory circuits |
| 03/04/2009 | CN100466102C Content addressable memory (CAM) with error checking and correction (ECC) capability |
| 03/03/2009 | US7500171 Memory circuit |
| 03/03/2009 | US7500160 System and method for testing a data storage device without revealing memory content |
| 03/03/2009 | US7500081 Power-up implementation for block-alterable memory with zero-second erase time |
| 03/03/2009 | US7499362 Techniques for storing accurate operating current values |
| 03/03/2009 | US7498838 Hardware and software programmable fuses for memory repair |
| 02/26/2009 | WO2009026364A1 Threshold voltage digitizer for array of programmable threshold transistors |
| 02/26/2009 | WO2009024423A1 Programmable diagnostic memory module |
| 02/26/2009 | US20090055714 Optimizing the size of memory devices used for error correction code storage |
| 02/26/2009 | US20090055713 Ecc control circuits, multi-channel memory systems including the same, and related methods of operation |
| 02/26/2009 | US20090055401 Loosely Coupled Mass Storage Computer Cluster |
| 02/26/2009 | US20090052264 Refresh characteristic testing circuit and method for testing refresh using the same |
| 02/26/2009 | US20090052263 Write driving circuit |
| 02/26/2009 | US20090052249 Semiconductor memory device having memory block configuration |
| 02/26/2009 | US20090052248 Flash memory array system including a top gate memory cell |
| 02/26/2009 | US20090052247 Fuse circuit and flash memory device having the same |
| 02/26/2009 | DE10335708B4 Hub-Baustein zum Anschließen von einem oder mehreren Speicherbausteinen Hub module for connecting one or more storage devices |
| 02/26/2009 | DE102008039070A1 Halbleiterprüfvorrichtung Semiconductor testing |
| 02/26/2009 | DE102005025216B4 Hub eines Speichermoduls und Verfahren zum Testen eines Speichermoduls unter Verwendung des Hubs Hub of a memory module and method for testing a memory module using the stroke |
| 02/25/2009 | CN101375346A Strobe technique for test of digital signal timing |
| 02/25/2009 | CN101373641A Memory and one bit reading error detection method |
| 02/25/2009 | CN101373640A Flash memory apparatus and method for error correction |
| 02/25/2009 | CN101373639A Memory time sequence measuring circuit and test method thereof |
| 02/25/2009 | CN100464376C Self-examining device and method of ROM |
| 02/24/2009 | US7496823 Hardware based memory scrubbing |
| 02/24/2009 | US7496822 Apparatus and method for responding to data retention loss in a non-volatile memory unit using error checking and correction techniques |
| 02/24/2009 | US7496819 Custom logic BIST for memory controller |
| 02/24/2009 | US7496817 Method for determining integrity of memory |
| 02/24/2009 | US7496811 Storage medium reproducing apparatus, storage medium reproducing method, and computer program product for reading information from storage medium |
| 02/24/2009 | US7496810 Semiconductor memory device and its data writing method |
| 02/24/2009 | US7496809 Integrated scannable interface for testing memory |
| 02/24/2009 | US7496808 Parallel bit test circuit in semiconductor memory device and associated method |
| 02/24/2009 | US7496806 Method of and apparatus for managing disc defects using temporary defect management information (TDFL) and temporary defect management information (TDDS), and disc having the TDFL and TDDS |
| 02/24/2009 | US7495978 Semiconductor device and memory circuit including a redundancy arrangement |
| 02/24/2009 | US7495977 Memory system having high-speed row block and column redundancy |
| 02/24/2009 | US7495976 Repairing integrated circuit memory arrays |
| 02/24/2009 | US7495975 Memory system including on-die termination unit having inductor |
| 02/24/2009 | CA2471523C Write-once type optical disc, and method and apparatus for managing defective areas on write-once type optical disc |
| 02/19/2009 | WO2009023024A1 Memory device with reduced buffer current during power-down mode |
| 02/19/2009 | WO2009009303A3 Data storage with an outer block code and a stream-based inner code |
| 02/19/2009 | US20090049455 Command interface systems and methods |
| 02/19/2009 | US20090049365 System and method for providing error correction and detection in a memory system |
| 02/19/2009 | US20090049351 Method for Creating a Memory Defect Map and Optimizing Performance Using the Memory Defect Map |
| 02/19/2009 | US20090049350 Error correction code (ecc) circuit test mode |
| 02/19/2009 | US20090049349 Semiconductor device using logic chip |
| 02/19/2009 | US20090049348 Semiconductor storage device |
| 02/19/2009 | US20090046526 Word line driving circuit and method of testing a word line using the word line driving circuit |
| 02/19/2009 | US20090046525 Wafer burn-in test circuit |
| 02/19/2009 | US20090046524 Multi-column decoder stress test circuit |
| 02/19/2009 | US20090046523 Semiconductor memory device and control method thereof |
| 02/19/2009 | US20090046049 Redundancy shift register circuit for driver circuit in active matrix type liquid crystal display device |
| 02/19/2009 | DE10115293B4 Verfahren zum Kennzeichnen eines integrierten Schaltkreises und integrierter Schaltkreis Method for marking an integrated circuit and integrated circuit |
| 02/18/2009 | EP2026356A2 Method for creating a memory defect map and optimizing performance using the memory defect map |
| 02/18/2009 | EP2026355A2 System and method for implementing a memory defect map |
| 02/18/2009 | EP2026354A1 Apparatus and methods for tuning a memory interface |
| 02/18/2009 | EP2026209A2 System and method for using a memory mapping function to map memory defects |
| 02/18/2009 | EP2026081A1 Test device and test method |
| 02/18/2009 | EP1702338B1 Robust data duplication and improved update method in a multibit non-volatile memory |
| 02/18/2009 | CN101369466A High-performance internal memory test module |