| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 05/13/2009 | EP2058820A1 Semiconductor memory having segmented row repair |
| 05/13/2009 | EP2057636A2 Method for testing a static random access memory |
| 05/13/2009 | CN101430937A Semiconductor memory device |
| 05/13/2009 | CN101430935A Detection method for over-erasing memory unit in flash memory |
| 05/13/2009 | CN101430929A Method and device for irreversibly programming and reading nonvolatile memory cells |
| 05/13/2009 | CN100487818C Method for analyzing storage volume of portable storage device |
| 05/13/2009 | CN100487817C Management of defective blocks in non-volatile memory system |
| 05/13/2009 | CN100487470C Semiconductor device and testing method thereof |
| 05/12/2009 | US7533323 Adaptive archival format |
| 05/12/2009 | US7533322 Method and system for performing function-specific memory checks within a vehicle-based control system |
| 05/12/2009 | US7533321 Fault tolerant encoding of directory states for stuck bits |
| 05/12/2009 | US7533310 Semiconductor memory test device and method thereof |
| 05/12/2009 | US7533309 Testing memories using algorithm selection |
| 05/12/2009 | US7533308 Semiconductor test system |
| 05/12/2009 | US7532526 Method and system for testing address lines |
| 05/12/2009 | US7532525 Semiconductor memory device for decreasing the total number of data transfer lines |
| 05/12/2009 | US7532031 Hardware and software programmable fuses for memory repair |
| 05/12/2009 | CA2350242C Improved memory integrity for meters |
| 05/07/2009 | WO2009058148A1 Mram testing |
| 05/07/2009 | WO2009058140A1 Systematic error correction for multi-level flash memory |
| 05/07/2009 | WO2009058125A2 Method and apparatus for testing a memory device |
| 05/07/2009 | WO2009038331A3 Recording method of optical recording medium |
| 05/07/2009 | WO2008026203A3 Estimation of non-linear distortion in memory devices |
| 05/07/2009 | WO2007064781A3 Microprocessor memory management |
| 05/07/2009 | US20090116323 Scanned memory testing of multi-port memory arrays |
| 05/07/2009 | US20090116322 Semiconductor memory device having wafer burn-in test mode |
| 05/07/2009 | US20090116321 Apparatus and method for detection of address decoder open faults |
| 05/07/2009 | US20090116320 Methods and Apparatus for Screening Bit Line of a SRAM |
| 05/07/2009 | US20090116319 Redundancy program circuit and methods thereof |
| 05/07/2009 | US20090116317 Block repair apparatus and method thereof |
| 05/07/2009 | US20090116316 Semiconductor device and semiconductor memory device |
| 05/07/2009 | US20090116300 Semiconductor memory device |
| 05/07/2009 | US20090116297 Redundancy program circuit and methods thereof |
| 05/07/2009 | US20090115442 Semiconductor integrated circuit and electronic device |
| 05/06/2009 | EP1486983B1 Magnetic storage device using ferromagnetic tunnel junction element |
| 05/06/2009 | EP1368812B1 Circuit and method for test and repair |
| 05/06/2009 | CN201233727Y High speed memory apparatus based on RAM device |
| 05/06/2009 | CN101427323A System and method for reading non-volatile computer memory |
| 05/06/2009 | CN101425343A Block repair apparatus and method thereof |
| 05/06/2009 | CN101425342A Access method for NAND Flash redundant code |
| 05/06/2009 | CN101425341A Semiconductor device including anti-fuse circuit, and method of writing address to anti-fuse circuit |
| 05/06/2009 | CN101425337A Storage method and apparatus for flash memory data |
| 05/06/2009 | CN101425334A Method for implementing NOR FLASH bad block management and control circuit thereof |
| 05/06/2009 | CN100485930C 半导体器件 Semiconductor devices |
| 05/06/2009 | CN100485809C Dual mode high voltage power supply for providing increased speed in programming during testing of low voltage non-volatile memories |
| 05/05/2009 | US7530006 Data recording and reproducing device and method utilizing iterative decoding technique |
| 05/05/2009 | US7530005 Storage device |
| 05/05/2009 | US7530004 Error correction apparatus using forward and reverse threshold functions |
| 05/05/2009 | US7530003 Permuting MTR code with ECC without need for second MTR code |
| 05/05/2009 | US7529989 Testing apparatus and testing method |
| 05/05/2009 | US7529988 Storage of descriptive information in user defined fields of failure bitmaps in integrated circuit technology development |
| 05/05/2009 | US7529987 Integrity control for data stored in a non-volatile memory |
| 05/05/2009 | US7529986 Semiconductor device and testing method for same |
| 05/05/2009 | US7529985 Memory size allocation device and method for interleaving |
| 05/05/2009 | US7529144 Hierarchical semiconductor memory device capable of carrying out a disturb refresh test on a memory array basis |
| 05/05/2009 | US7529142 Data processing device with a WOM memory |
| 05/05/2009 | US7529141 Asynchronous, high-bandwidth memory component using calibrated timing elements |
| 04/30/2009 | WO2009054651A1 Multiply apparatus for semiconductor test partern signal |
| 04/30/2009 | WO2009054272A1 Memory system |
| 04/30/2009 | WO2006052321A3 System and method of reading non-volatile computer memory |
| 04/30/2009 | US20090113546 Memory system for sensing attack |
| 04/30/2009 | US20090113259 Memory cell programming |
| 04/30/2009 | US20090109774 Test method and semiconductor device |
| 04/30/2009 | US20090109773 Semiconductor device and refresh method |
| 04/30/2009 | US20090109766 Efficient sense command generation |
| 04/30/2009 | US20090109763 Semiconductor memory device and method of defective cell test |
| 04/30/2009 | US20090109756 Memory device with variable trim setting |
| 04/30/2009 | US20090108393 Semiconductor Device With a Plurality of Ground Planes |
| 04/29/2009 | EP2053747A1 Circuit architecure for radiation resilience |
| 04/29/2009 | EP2005203A4 Power supply testing architecture |
| 04/29/2009 | EP1974354B1 Method and apparatus for recording high-speed input data into a matrix of memory devices |
| 04/29/2009 | EP1629506B1 Test of ram address decoder for resistive open defects |
| 04/29/2009 | CN101421797A Non-volatile memory and method with redundancy data buffered in remote buffer circuits |
| 04/29/2009 | CN101419844A Flash memory simulating device and main control module evaluation method for the flash |
| 04/29/2009 | CN101419843A Flash memory recognition method, recognition device and chip controller |
| 04/29/2009 | CN101419842A Loss equalizing method, apparatus and system for hard disc |
| 04/29/2009 | CN101419837A Storage device and method for status information access of the storage device |
| 04/29/2009 | CN101419834A Average abrasion method and controller using the method |
| 04/29/2009 | CN100483559C Semiconductor integrated circuit and its check method |
| 04/29/2009 | CN100483558C Memory independent on testing group function and system for replacing fault stored word |
| 04/29/2009 | CN100483557C Circuit and method for test and repair |
| 04/29/2009 | CN100483552C Automated wear leveling in non-volatile storage systems |
| 04/29/2009 | CN100483550C Special-purpose redundant circuit for different operations in internal memory device and its operation method |
| 04/29/2009 | CN100483548C EEPROM array with flash-like core |
| 04/28/2009 | US7526713 Low power cost-effective ECC memory system and method |
| 04/28/2009 | US7526702 Method and system for testing a random access memory (RAM) device having an internal cache |
| 04/28/2009 | US7526699 Method for creating a built-in self test (BIST) table for monitoring a monolayer deposition (MLD) system |
| 04/28/2009 | US7526697 Memory test circuit and method |
| 04/28/2009 | US7526690 Semiconductor device-testing apparatus |
| 04/28/2009 | US7526689 Testing address lines of a memory controller |
| 04/28/2009 | US7526688 Parallel bit testing device and method |
| 04/28/2009 | US7526684 Deterministic preventive recovery from a predicted failure in a distributed storage system |
| 04/28/2009 | US7526597 Buffered memory having a control bus and dedicated data lines |
| 04/28/2009 | US7525871 Semiconductor integrated circuit |
| 04/28/2009 | US7525856 Apparatus and method to manage external voltage for semiconductor memory testing with serial interface |
| 04/28/2009 | US7525852 Nonvolatile memory |
| 04/23/2009 | WO2009052513A1 Digital memory with fine grain write operation |
| 04/23/2009 | WO2009051917A1 Providing error correction to unwritten pages and for identifying unwritten pages in flash memory |
| 04/23/2009 | WO2007030808A3 Limited use data storing device |
| 04/23/2009 | WO2007021962A3 Methods and apparatus for programming secure data into programmable and irreversible cells |