Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
07/2009
07/01/2009EP1779251B1 Memory command delay balancing in a daisy-chained memory topology
07/01/2009CN101473383A Memory equipment with error correction capability and high efficiency part words write operation
07/01/2009CN101471143A Apparatus for testing memory device
07/01/2009CN101471142A Semiconductor integrated circuit device which has first chip and second chip accessed via the first chip and test method thereof
07/01/2009CN101471141A Methods for performing fail test, block management, erasing and programming in a nonvolatile memory device
07/01/2009CN101471140A Semiconductor memory having segmented row repair
07/01/2009CN100508073C Flash storage data access method
06/2009
06/30/2009US7555699 Storage control circuit, and method for address error check in the storage control circuit
06/30/2009US7555684 Circuit for and a method of generating an interleaver address
06/30/2009US7555644 System and method for operating system image provisioning in a utility computing environment
06/30/2009US7554879 Apparatus for testing a nonvolatile memory and a method thereof
06/25/2009WO2009079476A1 Redundant bit patterns for column defects coding
06/25/2009WO2009079457A1 Adapting word line pulse widths in memory systems
06/25/2009WO2009079175A2 Self-timed error correcting code evaluation system and method
06/25/2009US20090164872 Prediction and prevention of uncorrectable memory errors
06/25/2009US20090164871 Semiconductor Memory Devices that are Configured to Analyze Read Failures and Related Methods of Operating Such Devices
06/25/2009US20090164857 Testing embedded circuits with the aid of a separate supply voltage
06/25/2009US20090164856 System and method for input/output characterization
06/25/2009US20090164855 Method for scrubbing storage in a computer memory
06/25/2009US20090164724 System and control method for hot swapping of memory modules configured in a ring bus
06/25/2009US20090164712 Flash memory
06/25/2009US20090161459 Dynamic Random Access Memory With Low-Power Refresh
06/25/2009US20090161458 Circuit and method for testing multi-device systems
06/25/2009US20090161457 Semiconductor storage device having redundancy area
06/25/2009US20090161431 Built-in self-repair method for nand flash memory and system thereof
06/25/2009US20090161430 Bit map control of erase block defect list in a memory
06/25/2009US20090161429 Dynamic column redundancy replacement
06/25/2009US20090161415 Integrated circuit for setting a memory cell based on a reset current distribution
06/25/2009CA2709424A1 Adapting word line pulse widths in memory systems
06/24/2009EP1766632B1 System and method for testing a data storage device without revealing memory content
06/24/2009CN101465166A Semiconductor device
06/24/2009CN100505107C Test apparatus, phase adjusting method and memory controller
06/24/2009CN100505106C Non-volatile redundancy address memory
06/23/2009US7552413 System and computer program for verifying performance of an array by simulating operation of edge cells in a full array model
06/23/2009US7552378 Semiconductor device improving error correction processing rate
06/23/2009US7552370 Application specific distributed test engine architecture system and method
06/23/2009US7552369 Semiconductor device and method for testing semiconductor device
06/23/2009US7552368 Systems and methods for simultaneously testing semiconductor memory devices
06/23/2009US7552272 Automated wear leveling in non-volatile storage systems
06/23/2009US7551499 Semiconductor memory device capable of performing low-frequency test operation and method for testing the same
06/23/2009US7551484 Non-volatile memory and method with reduced source line bias errors
06/23/2009US7550985 Methods of testing memory devices
06/23/2009US7550805 Stress-controlled dielectric integrated circuit
06/18/2009WO2009076023A2 Forward error correction of an error acknowledgement command protocol
06/18/2009US20090158126 Efficient interference cancellation in analog memory cell arrays
06/18/2009US20090158125 Recording/reproducing apparatus and recording/reproducing method
06/18/2009US20090158104 Method and apparatus for memory ac timing measurement
06/18/2009US20090158103 Test apparatus and test method
06/18/2009US20090158102 Methods, devices, and systems for experiencing reduced unequal testing degradation
06/18/2009US20090158101 Adapting Word Line Pulse Widths in Memory Systems
06/18/2009US20090158087 Semiconductor integrated circuit with memory repair circuit
06/18/2009US20090154273 Memory including a performance test circuit
06/18/2009US20090154272 Fuse apparatus for controlling built-in self stress and control method thereof
06/18/2009US20090154271 Semiconductor memory device and method for testing the same
06/18/2009US20090154270 Failing address register and compare logic for multi-pass repair of memory arrays
06/18/2009US20090154269 Managing redundant memory in a voltage island
06/18/2009US20090154245 Nonvolatile semiconductor storage device
06/17/2009EP2070088A2 Nonvolatile resistive memories, latch circuits, and operation circuits having scalable two-terminal nanotube switches
06/17/2009EP2069939A1 End of life recovery and resizing of memory cards
06/17/2009CN101458971A Test system and method for built-in memory
06/17/2009CN101458970A Circuit board test clamp
06/17/2009CN101458969A Semiconductor memory system and wear-leveling method thereof
06/17/2009CN101458968A Method and device for obtaining disabled binary digit distribution information in non-volatile memory
06/17/2009CN100501877C Full detecting design method for inlaid flash memory of simplified base pin
06/17/2009CN100501876C Memory and method for soft defect detection in a memory
06/17/2009CN100501690C Embedded micro computer unit (MCU) using a memory emulation module and a method of testing the same
06/16/2009US7549109 Memory circuit, such as a DRAM, comprising an error correcting mechanism
06/16/2009US7549099 Testing apparatus and testing method
06/16/2009US7549098 Redundancy programming for a memory device
06/16/2009US7549097 Semiconductor integrated circuit device and method of testing the same
06/16/2009US7549093 Method for changing a depth of an interleaver device or de-interleaver device and corresponding interleaver device and de-interleaver device
06/16/2009US7549081 Processor array
06/16/2009US7549013 Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices
06/16/2009US7548461 Soft errors handling in EEPROM devices
06/11/2009WO2009073346A2 Data parallel production and consumption
06/11/2009US20090150749 Digital data coding and recording apparatus, and method of using the same
06/11/2009US20090150730 Test apparatus for data storage device and test method for data storage device
06/11/2009US20090150728 High speed serial trace protocol for device debug
06/11/2009US20090147609 Techniques for configuring memory systems using accurate operating parameters
06/11/2009US20090147601 Non-volatile memory structure
06/11/2009US20090147600 Apparatus and method for repairing a semiconductor memory
06/11/2009US20090147599 Column/Row Redundancy Architecture Using Latches Programmed From A Look Up Table
06/11/2009US20090147598 Integrated circuits and methods to compensate for defective memory in multiple layers of memory
06/10/2009EP2067144A2 Nonvolatile memory with soft-input soft-output (siso) decoder, statistical unit and adaptive operation
06/10/2009EP2067143A2 Memory with cell population distribution assisted read margining
06/10/2009DE19823485B4 Schaltung für eine Halbleiterspeichervorrichtung zum Feststellen eines Adresssignalübergangs Circuit for a semiconductor memory device for detecting an address signal transition
06/10/2009CN100499124C Semiconductor device
06/10/2009CN100498976C Method and its circuit for correcting fast flashing EEPROM overerase
06/09/2009US7546516 System and method for forward error correction
06/09/2009US7546515 Method of storing downloadable firmware on bulk media
06/09/2009US7546514 Chip correct and fault isolation in computer memory systems
06/09/2009US7546506 DRAM stacked package, DIMM, and semiconductor manufacturing method
06/09/2009US7546505 Built in self test transport controller architecture
06/09/2009US7546497 Semiconductor memory device and data write and read method thereof
06/09/2009US7546495 Method and device for managing defective storage units on a record carrier
06/09/2009US7546491 Semiconductor memory device with standby current failure judging function and method for judging standby current failure
06/09/2009US7546440 Non-volatile memory devices and control and operation thereof
06/09/2009US7546436 Storage device with SCSI formatting
06/09/2009US7545691 Measuring circuit for qualifying a memory located on a semiconductor device
06/04/2009WO2009070635A1 Analog access circuit for validating chalcogenide memory cells
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