| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 06/04/2009 | US20090144677 Design Structure for a Circuit and Method to Measure Threshold Voltage Distributions in SRAM Devices |
| 06/04/2009 | US20090144600 Efficient re-read operations from memory devices |
| 06/04/2009 | US20090141577 Anti-fuse repair control circuit and semiconductor device including dram having the same |
| 06/04/2009 | US20090141573 System and Method for Better Testability of OTP Memory |
| 06/04/2009 | US20090141572 Voltage control apparatus and method of controlling voltage using the same |
| 06/04/2009 | US20090141544 Mram and Operation Method of the Same |
| 06/03/2009 | EP0882239B1 Assembly and method for testing integrated circuit devices |
| 06/03/2009 | CN101447234A Memory module and writing and reading method thereof |
| 06/03/2009 | CN101447233A System and method for better testability of OTP memory |
| 06/03/2009 | CN100495353C Data storage array |
| 06/02/2009 | US7543219 Recording and/or reproducing method, recording and/or reproducing apparatus, and computer readable recording medium storing program for performing the method |
| 06/02/2009 | US7543218 DVD decoding method and apparatus using selective po-correction |
| 06/02/2009 | US7543217 Method of determining suitability of a recording medium for being recorded to and/or reproduced from by an apparatus |
| 06/02/2009 | US7543216 Cyclic redundancy checking of a field programmable gate array having an SRAM memory architecture |
| 06/02/2009 | US7543215 Integrated apparatus for multi-standard optical storage media |
| 06/02/2009 | US7543200 Method and system for scheduling tests in a parallel test system |
| 06/02/2009 | US7543199 Test device |
| 06/02/2009 | US7543198 Test data reporting and analyzing using data array and related data analysis |
| 06/02/2009 | US7542857 Technique for determining performance characteristics of electronic devices and systems |
| 06/02/2009 | US7542359 Semiconductor memory |
| 05/28/2009 | WO2009065224A1 Data channel test apparatus and method thereof |
| 05/28/2009 | US20090138783 Content data recording apparatus and method |
| 05/28/2009 | US20090138754 Memory Errors |
| 05/28/2009 | US20090138646 Method and apparatus for signaling between devices of a memory system |
| 05/28/2009 | US20090135660 Apparatus, memory device and method of improving redundancy |
| 05/28/2009 | US20090135656 Non-volatile semiconductor memory device with dummy cells and method of programming the same |
| 05/28/2009 | DE102008056215A1 Sensitive data protection, during scanning, uses a secure reset signal with a combined scanning mode signal and system reset signal to reset a register |
| 05/27/2009 | EP2063432A1 Method for testing working memory |
| 05/27/2009 | EP2063428A2 Content data recording apparatus and method |
| 05/27/2009 | EP2062265A2 Non-volatile memory and method for reduced erase/write cycling during trimming of initial programming voltage |
| 05/27/2009 | CN101443852A Digital delay function for regulating data memory cell |
| 05/27/2009 | CN101441897A Probe card with optical transmitting unit and memory tester having the same |
| 05/27/2009 | CN101441896A Reliability, availability, and serviceability solutions for memory technology |
| 05/27/2009 | CN101441887A Semiconductor memory element and lifetime operation starting apparatus therefor |
| 05/27/2009 | CN100492546C Method for reading out defect information item of self integrated chip and integrated memory chip |
| 05/27/2009 | CN100492545C Memory bit line leakage repair |
| 05/27/2009 | CN100492539C Nonvolatile semiconductor memory device for writing multivalued data |
| 05/27/2009 | CN100492535C Bias voltage applying circuit and semiconductor memory device |
| 05/26/2009 | US7539924 Disk drive implementing data path protection by encoding large host blocks into sub blocks |
| 05/26/2009 | US7539923 Circuit and method of transmitting a block of data |
| 05/26/2009 | US7539912 Method and apparatus for testing a fully buffered memory module |
| 05/26/2009 | US7539911 Test mode for programming rate and precharge time for DRAM activate-precharge cycle |
| 05/26/2009 | US7539910 Memory module test system for memory module including hub |
| 05/26/2009 | US7539909 Distributed memory initialization and test methods and apparatus |
| 05/26/2009 | US7539905 Method of and apparatus for detecting an error in writing to persistent memory |
| 05/26/2009 | US7539896 Repairable block redundancy scheme |
| 05/26/2009 | US7539598 Semiconductor test apparatus and method thereof and multiplexer and method thereof |
| 05/26/2009 | CA2638421A1 Content data recording apparatus and method |
| 05/22/2009 | WO2009064791A2 Method and apparatus of automatically selecting error correction algorithms |
| 05/22/2009 | WO2009063533A1 Testing apparatus |
| 05/22/2009 | WO2009062655A1 Method for testing a main memory |
| 05/22/2009 | WO2009062280A1 Methods and systems for failure isolation and data recovery in a configuration of series-connected semiconductor devices |
| 05/21/2009 | US20090132891 Storage medium reproducing apparatus, storage medium reproducing method, and computer program product for reading information from storage medium |
| 05/21/2009 | US20090132876 Maintaining Error Statistics Concurrently Across Multiple Memory Ranks |
| 05/21/2009 | US20090132875 Method of correcting error of flash memory device, and, flash memory device and storage system using the same |
| 05/21/2009 | US20090132874 System and method for testing a data storage device without revealing memory content |
| 05/21/2009 | US20090132873 Method and System for Determining Element Voltage Selection Control Values for a Storage Device |
| 05/21/2009 | US20090129186 Self-diagnostic scheme for detecting errors |
| 05/21/2009 | US20090129185 Semiconductor circuits capable of self detecting defects |
| 05/21/2009 | US20090129184 Methods and systems for failure isolation and data recovery in a configuration of series-connected semiconductor devices |
| 05/21/2009 | US20090129183 Method and device for high speed testing of an integrated circuit |
| 05/21/2009 | US20090129182 Memory module with failed memory cell repair function and method thereof |
| 05/21/2009 | US20090129181 System and method for implementing row redundancy with reduced access time and reduced device area |
| 05/21/2009 | US20090129149 Nonvolatile semiconductor memory device for writing multivalued data |
| 05/20/2009 | EP2006859A9 Semiconductor memory |
| 05/20/2009 | EP1658618B1 Error detection and correction method and apparatus in a magneto-resistive random access memory |
| 05/20/2009 | DE10313365B4 Genauigkeitsbestimmung bei Bitleitungsspannungmessungen Accuracy in determination Bitleitungsspannungmessungen |
| 05/20/2009 | DE102007053464A1 Vorrichtung zum Reparieren und/oder Testen eines Speichergerätes Device for repairing and / or testing a memory device |
| 05/20/2009 | DE102006034754B4 Vorrichtung und Verfahren zum Testen eines Halbleiterbauelements und Eye-Mask-Generator Apparatus and method for testing a semiconductor device and Eye Mask Generator |
| 05/20/2009 | CN101436435A Electrical fuse self test and repair |
| 05/20/2009 | CN101436434A Nonvolatile memory device, system, and method providing fast program and read operations |
| 05/20/2009 | CN100490018C Semiconductor memory |
| 05/19/2009 | US7536627 Storing downloadable firmware on bulk media |
| 05/19/2009 | US7536619 RAM testing apparatus and method |
| 05/19/2009 | US7536614 Built-in-redundancy analysis using RAM |
| 05/19/2009 | US7536613 BIST address generation architecture for multi-port memories |
| 05/19/2009 | US7536612 Field spike monitor for MRAM |
| 05/19/2009 | US7536611 Hard BISR scheme allowing field repair and usage of reliability controller |
| 05/19/2009 | US7536610 Method for detecting resistive-open defects in semiconductor memories |
| 05/19/2009 | US7536267 Built-in self test for memory interconnect testing |
| 05/19/2009 | US7535780 Semiconductor memory device and redundancy method of the same |
| 05/19/2009 | US7535778 Semiconductor memory device with memory cells, each having bit registering layer in addition to a memory layer and method of driving the same |
| 05/19/2009 | US7535370 Removable memory media with integral indicator light |
| 05/14/2009 | WO2009061093A2 Storage array including a local clock buffer with programmable timing |
| 05/14/2009 | WO2009060495A1 Semiconductor memory device and method for controlling the same |
| 05/14/2009 | WO2008053472A3 Reading memory cells using multiple thresholds |
| 05/14/2009 | WO2007099579A9 Ram macro and timing generating circuit for same |
| 05/14/2009 | US20090125788 Hardware based memory scrubbing |
| 05/14/2009 | US20090125787 Operation Method of Mram |
| 05/14/2009 | US20090125786 Mechanism for Adjacent-Symbol Error Correction and Detection |
| 05/14/2009 | US20090125785 Pipelined Data Relocation and Improved Chip Architectures |
| 05/14/2009 | US20090125764 Data preserving method and data accessing method for non-volatile memory |
| 05/14/2009 | US20090125763 Programmable memory built-in self-test circuit and clock switching circuit thereof |
| 05/14/2009 | US20090125761 Method for controlling a DRAM |
| 05/14/2009 | US20090125760 Method and apparatus for safe parameterization in accordance with IEC 61508 SIL 1 to 3 or EN 954-1 Categories 1 to 4 |
| 05/14/2009 | US20090125726 Method and Apparatus of Providing the Security and Error Correction Capability for Memory Storage Devices |
| 05/14/2009 | US20090122667 Write-once type optical disc, and method and apparatus for managing defective areas an write-once type optical disc |
| 05/14/2009 | US20090122625 Semiconductor memory device having test circuit |
| 05/14/2009 | US20090122624 Semiconductor memory device |
| 05/14/2009 | DE102006004247B4 Konzept zum Testen einer integrierten Schaltungsanordnung Concept for testing an integrated circuit |