Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
09/2009
09/17/2009US20090231901 Semiconductor integrated circuit for supporting a test mode
09/17/2009US20090231897 Multi-chip package
09/17/2009US20090230990 Hardware and software programmable fuses for memory repair
09/16/2009EP2100308A1 Method and semiconductor memory with a device for detecting addressing errors
09/16/2009CN101536110A Error correction device and methods thereof
09/16/2009CN101536109A Method of error correction in MBC flash memory
09/16/2009CN101533677A Method for arranging memory, controller, and nonvolatile memory system
09/16/2009CN101533676A Method for enhancing debugger capacity of non-volatile memory
09/16/2009CN101533675A Scanning and management method for flash memory medium
09/16/2009CN101533673A Method of testing a non-volatile memory device
09/16/2009CN101533670A Method and memory device realizing loss balance of memory device
09/16/2009CN101533357A A memory processing method and a system
09/16/2009CN100541666C Nonvolatile semiconductor memory device
09/16/2009CN100541655C Semiconductor memory device
09/16/2009CN100541646C Calibration circuit of a semiconductor memory device and method of operation the same
09/15/2009US7590919 Apparatus, method and computer program product for reading information stored in storage medium, and storage medium for storing information based on charge amount
09/15/2009US7590903 Re-configurable architecture for automated test equipment
09/15/2009US7590900 Flip flop circuit & same with scan function
09/15/2009US7590899 Processor memory array having memory macros for relocatable store protect keys
09/15/2009US7589554 I/O interface circuit of intergrated circuit
09/11/2009WO2009110124A1 Chien search device and chien search method
09/10/2009US20090228762 Inforamtion Precessing Apparatus and Non-Volatile Semiconductor Memory Drive
09/10/2009US20090228748 Method to automatically determine host to LUN (logical unit number) path availability for multi path attached storage systems
09/10/2009US20090225611 Method of testing nonvolatile memory device
09/10/2009US20090225610 Integrated circuit that selectively outputs subsets of a group of data bits
09/10/2009US20090225598 Method apparatus, and system providing adjustable memory page configuration
09/10/2009US20090225586 Semiconductor memory device
09/10/2009DE112007002276T5 Halbleiter-Prüfeinrichtung und Verfahren zum Prüfen eines Halbleiter-Speichers A semiconductor test apparatus and method for testing a semiconductor memory
09/09/2009EP2099031A1 Methods for manufacturing a stack of memory circuits and for addressing a memory circuit, corresponding stack and device
09/09/2009CN101529526A Method for estimating and reporting the life expectancy of flash-disk memory
09/09/2009CN101529525A Probabilistic error correction in multi-bit-per-cell flash memory
09/09/2009CN101529524A Limited use data storing device
09/09/2009CN101527172A Detection system and method for dynamic random access memory capacity
09/09/2009CN101527171A Method for controlling flash memory of multichannel parallel error correction and device
09/09/2009CN101527162A Card slot type flash memory hard disk
09/09/2009CN100538912C Apparatus and method to visually indicate the status of a data storage device
09/09/2009CN100538911C Semiconductor memory device
09/09/2009CN100538910C Memory cell test device and method
09/09/2009CN100538885C Circuit and method for changing page length in semiconductor memory
09/09/2009CN100538880C 半导体存储器件 The semiconductor memory device
09/09/2009CN100538879C Semiconductor memory device with improved saving rate for defective chips
09/09/2009CN100538869C Memory having variable refresh control and method therefor
09/09/2009CN100538675C Hub, memory module, memory system and methods for reading and writing to the same
09/08/2009US7587656 Method and apparatus for detecting and correcting errors in stored information
09/08/2009US7587655 Method of transferring signals between a memory device and a memory controller
09/08/2009CA2323100C State copying method for software update
09/03/2009WO2009107267A1 Semiconductor storage device, method of controlling the same, and error correction system
09/03/2009WO2009107172A1 External i/o signal and dram refresh signal re-synchronization method and its circuit
09/03/2009US20090222703 Information Processing Apparatus and Nonvolatile Semiconductor Memory Drive
09/03/2009US20090222702 Method for Operating a Memory Device
09/03/2009US20090219775 Semiconductor memory device
09/03/2009US20090219774 Semiconductor memory device and parallel test method of the same
09/03/2009US20090219773 Integrated Circuit, Method for Acquiring Data and Measurement System
09/03/2009US20090219772 Three dimensional structure memory
09/03/2009US20090219743 Three dimensional structure memory
09/03/2009US20090219742 Three dimensional structure memory
09/02/2009EP1900104A4 Apparatus and method for channel interleaving in communications system
09/02/2009CN101521044A Memorizer and voltage monitoring equipment thereof
09/02/2009CN101521041A Control circuit system based on nand gate structure memory
09/02/2009CN100536031C Random storage failure detection processing method and its system
09/01/2009US7584403 Information storage medium on which drive data is recorded, and method of recording information on the information storage medium
09/01/2009US7584402 Data storage format for encoding a bit stream on or in a surface
09/01/2009US7584391 Smart verify for multi-state memories
09/01/2009US7584390 Method and system for alternating between programs for execution by cells of an integrated circuit
09/01/2009US7584384 Method and apparatus for enabling and disabling a test mode of operation of an electronic memory device without additional interconnects or commands
08/2009
08/27/2009WO2009104843A1 Memory device and memory data reading method
08/27/2009WO2009064791A3 Method and apparatus of automatically selecting error correction algorithms
08/27/2009US20090217135 Method, system, and computer program product for address generation checking
08/27/2009US20090217112 AC ABIST Diagnostic Method, Apparatus and Program Product
08/27/2009US20090217111 Evaluation method and evaluation system for semiconductor storage device
08/27/2009US20090213672 Logic embedded memory having registers commonly used by macros
08/27/2009US20090213671 Circuit and method for controlling redundancy in semiconductor memory apparatus
08/27/2009US20090213670 Asynchronous, high-bandwidth memory component using calibrated timing elements
08/27/2009US20090213639 Resistance change memory device
08/27/2009US20090213634 Stacked memory and fuse chip
08/27/2009DE19964475B4 Verfahren und Vorrichtung zum Löschen von Daten nach Ablauf Method and apparatus for deleting data after
08/27/2009DE10301458B4 Speicherbaustein und zugehöriges Lösch-, Programmier- und Rückkopierverfahren Memory module and associated erase, program and copyback process
08/27/2009DE102008011103A1 Method for testing electronic component, involves generating test sequence and supplying test sequence to electronic component, where error detection is carried out by comparing response signal with predetermined threshold
08/27/2009DE10038664B4 Halbleiterspeicher mit Redundanz-Schaltung für Wortleitungen A semiconductor memory comprising redundancy circuit for the word lines
08/26/2009EP2092530A1 Method and device for reconfiguration of reliability data in flash eeprom storage pages
08/26/2009EP2092529A1 Embedded memory repair on the basis of fuse burn state machine and a fus download state machine
08/26/2009CN101517656A Memory with cell population distribution assisted read margining
08/26/2009CN101515479A Method for increasing test coverage of scan chain and device thereof
08/26/2009CN100533600C Apparatus and method for identifying synchronous memory controller based on field programmable gate array
08/26/2009CN100533599C Method for testing semiconductor chips using register sets
08/26/2009CN100533597C Apparatus and method for using fuse to store PLL configuration data
08/26/2009CN100533593C Semiconductor device and testing method for same
08/26/2009CN100533585C Method for monitoring an internal control signal of a memory device and apparatus therefor
08/26/2009CN100533378C Information processing device and method, momery management device and method
08/25/2009US7581154 Method and apparatus to lower operating voltages for memory arrays using error correcting codes
08/25/2009US7581153 Memory with embedded error correction codes
08/25/2009US7580320 Multi-port memory device
08/25/2009US7580302 Parallel threshold voltage margin search for MLC memory application
08/20/2009WO2009101568A1 An integrated circuit with a memory matrix with a delay monitoring column
08/20/2009WO2009101516A1 Three-terminal multiple-time programmable memory bitcell and array architecture
08/20/2009WO2009079175A3 Self-timed error correcting code evaluation system and method
08/20/2009WO2009039316A3 Fault diagnosis in a memory bist environment using a linear feedback shift register
08/20/2009US20090210758 Method for reducing data error when flash memory storage device using copy back command
08/20/2009US20090207680 Method for the allocation of addresses in the memory cells of a rechargeable energy accumulator
08/20/2009US20090207678 Memory writing interference test system and method thereof
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