| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 08/20/2009 | US20090207673 Semiconductor integrated circuit with multi test |
| 08/20/2009 | US20090207671 Memory data detecting apparatus and method for controlling reference voltage based on error in stored data |
| 08/20/2009 | US20090207663 Flash Memory Devices Including Ready/Busy Control Circuits and Methods of Testing the Same |
| 08/20/2009 | DE102009000373A1 Programmierbarer Speicher mit Zuverlässigkeitsprüfung der gespeicherten Daten Programmable memory with reliability testing of stored data |
| 08/20/2009 | CA2714680A1 Simple non-autonomous peering environment watermarking, authentication and binding |
| 08/19/2009 | CN201293990Y Portable memory device |
| 08/19/2009 | CN101512669A Defective block isolation in a non-volatile memory system |
| 08/19/2009 | CN101512666A Non-volatile memory and method for linear estimation of initial programming voltage |
| 08/19/2009 | CN101512665A Non-volatile memory and method for reduced erase/write cycling during trimming of initial programming voltage |
| 08/19/2009 | CN101512661A Combined distortion estimation and error correction coding for memory devices |
| 08/19/2009 | CN101510448A Error detecting/correcting scheme for memories |
| 08/19/2009 | CN101510447A Redundancy circuit in semiconductor memory device |
| 08/19/2009 | CN101510446A Semiconductor device utilizing data mask and data outputting method using the same |
| 08/19/2009 | CN101510445A Method and apparatus for storing and reading bad block meter of memory |
| 08/19/2009 | CN100530440C Semiconductor device |
| 08/19/2009 | CN100530413C Non-volatile semiconductor memory, electronic card and electronic device |
| 08/18/2009 | US7577897 Data integrity inspection support method for disk devices, and data integrity inspection method for disk devices |
| 08/18/2009 | US7577885 Semiconductor integrated circuit, design support software system and automatic test pattern generation system |
| 08/18/2009 | US7577884 Memory circuit testing system, semiconductor device, and memory testing method |
| 08/18/2009 | US7577882 Semiconductor integrated circuit including memory macro |
| 08/18/2009 | US7577881 Method and apparatus for an interleaver |
| 08/18/2009 | US7577207 Bit labeling for amplitude phase shift constellation used with low density parity check (LDPC) codes |
| 08/13/2009 | WO2009073346A3 Data parallel production and consumption |
| 08/13/2009 | US20090204847 Repairable block redundancy scheme |
| 08/13/2009 | US20090204750 Direct logical block addressing flash memory mass storage architecture |
| 08/13/2009 | US20090201754 Semiconductor device having transmission control circuit |
| 08/13/2009 | US20090201753 Semiconductor memory device, control method therefor, and method for determining repair possibility of defective address |
| 08/13/2009 | US20090201752 Semiconductor memory device |
| 08/13/2009 | US20090201745 Semiconductor memory device |
| 08/13/2009 | DE10320625B4 On-Chip-Komprimierung von Ladungsverteilungsdaten On-chip compression of charge distribution data |
| 08/13/2009 | DE102005011874B4 Halbleiterspeicherbauelement und Verfahren zum Prüfen von Halbleiterspeicherbauelementen mit eingeschränktem Speicherbereich (Partial-Good-Memorys) The semiconductor memory device and method for testing semiconductor memory devices with limited memory area (partial Good-memories) |
| 08/12/2009 | EP2088675A2 Antifuse reroute of dies |
| 08/12/2009 | EP2088442A1 Parallel test circuit and method and semiconductor device |
| 08/12/2009 | EP1540510B1 Method and apparatus for managing data integrity of backup and disaster recovery data |
| 08/12/2009 | CN201289750Y Device compatible of multilayer unit and monolayer unit flash memory |
| 08/12/2009 | CN101506903A Method for testing a static random access memory |
| 08/12/2009 | CN101506902A Circuit arrangement and method for data processing |
| 08/12/2009 | CN101504923A Semiconductor device, its manufacturing method and its testing method |
| 08/11/2009 | US7574648 Semiconductor device |
| 08/11/2009 | US7574641 Probeless testing of pad buffers on wafer |
| 08/11/2009 | US7574637 Method and apparatus for optimized parallel testing and access of electronic circuits |
| 08/11/2009 | US7574636 Semiconductor memory device |
| 08/11/2009 | US7574635 Circuit for and method of testing a memory device |
| 08/11/2009 | US7574634 Real time testing using on die termination (ODT) circuit |
| 08/11/2009 | US7573778 Semiconductor memory device |
| 08/11/2009 | US7573766 Phase change random access memory and method of testing the same |
| 08/11/2009 | US7573762 One time programmable element system in an integrated circuit |
| 08/11/2009 | US7573761 Integrated electrical module with regular and redundant elements |
| 08/06/2009 | WO2009096136A1 Semiconductor memory device |
| 08/06/2009 | WO2009076023A3 Forward error correction of an error acknowledgement command protocol |
| 08/06/2009 | US20090199059 Semiconductor memory test device and method thereof |
| 08/06/2009 | US20090199058 Programmable memory with reliability testing of the stored data |
| 08/06/2009 | US20090199057 March DSS: Memory Diagnostic Test |
| 08/06/2009 | US20090199056 Memory diagnosis method |
| 08/06/2009 | US20090196113 Fuse circuit and semiconductor memory device including the same |
| 08/06/2009 | US20090196112 Block decoding circuits of semiconductor memory devices and methods of operating the same |
| 08/06/2009 | US20090196108 Semiconductor memory device and semiconductor memory device test method |
| 08/06/2009 | DE102008004456A1 Semiconductor component e.g. dynamic RAM, for use in electronic data processing system, has selection circuit designed such that circuit parts of component is supplied with supplying voltage or with test voltage |
| 08/06/2009 | DE102005045664B4 Integrierte Schaltung und Betriebsverfahren Integrated circuit and method of operation |
| 08/06/2009 | DE102005014460B4 Hochzuverlässiges Speicherelement mit verbesserter Verzögerungszeit Highly reliable memory element with improved delay time |
| 08/06/2009 | DE102005011859B4 Ein Entwurf eines dreifach redundanten Latches mit niedriger Verzögerungszeit A design of a triple redundant latches with low delay time |
| 08/05/2009 | EP1292952B8 Semiconductor memory having segmented row repair |
| 08/05/2009 | CN101501784A System and method for correcting errors in non-volatile memory using product codes |
| 08/05/2009 | CN101501783A Methods and apparatus for programming secure data into programmable and irreversible cells |
| 08/05/2009 | CN101499325A Non-volatile memory system and method with variable error correcting capability |
| 08/05/2009 | CN101499324A 半导体存储装置 The semiconductor memory device |
| 08/05/2009 | CN101499323A Memory module |
| 08/05/2009 | CN101499320A Semiconductor memory device with three-dimensional array and repair method thereof |
| 08/05/2009 | CN101499317A Memory device and data reading method |
| 08/05/2009 | CN101499316A Flash memory block management method and controller employing the same |
| 08/05/2009 | CN100524538C Testing apparatus and testing method |
| 08/05/2009 | CN100524537C Memory test circuit and method |
| 08/05/2009 | CN100524536C Semiconductor test apparatus and control method therefor |
| 08/05/2009 | CN100524535C Converting circuit for preventing from fault of correcting code |
| 08/05/2009 | CN100524532C System and method for multi-use eFuse macro |
| 08/05/2009 | CN100524521C Method and integrated circuit for operating fixed hydrocarbon memory device |
| 08/05/2009 | CN100524248C Nonvolatile memory system and management method for nonvolatile memory |
| 08/04/2009 | US7571379 Method and system for configuring registers in microcontrollers, and corresponding computer-program product |
| 08/04/2009 | US7571373 Post-transmission disk error correction |
| 08/04/2009 | US7571371 Parallel parity checking for content addressable memory and ternary content addressable memory |
| 08/04/2009 | US7571361 Recording method and optical disk recording device |
| 08/04/2009 | US7570526 Memory device and method of repairing the same |
| 07/30/2009 | WO2009093281A1 Memory testing device and testing method |
| 07/30/2009 | US20090193302 Semiconducrtor device |
| 07/30/2009 | US20090190426 Circuits, methods and design structures for adaptive repair of sram arrays |
| 07/30/2009 | US20090190423 Semiconductor memory and manufacturing method thereof |
| 07/30/2009 | US20090190422 Electronic fuses |
| 07/30/2009 | US20090190418 Semiconductor memory, method of controlling the semiconductor memory, and memory system |
| 07/30/2009 | US20090190407 Semiconductor memory device |
| 07/30/2009 | DE19860704B4 Verfahren zur Überprüfung zumindest eines Teils eines Halbleiterwafers mit einem Rasterelektronenmikroskop Method for checking at least a portion of a semiconductor wafer with a scanning electron microscope |
| 07/29/2009 | EP2082399A2 Memory bus output driver of a multi-bank memory device and method therefor |
| 07/29/2009 | EP1109321B1 One bit error correction method in a chain of bits |
| 07/29/2009 | CN101496110A Distortion estimation and cancellation in memory devices |
| 07/29/2009 | CN101494090A Memory access control method |
| 07/29/2009 | CN101494089A Detection method and detection system for semiconductor device main bit line failure |
| 07/29/2009 | CN101494088A Semiconductor integrated circuit device and method of testing same |
| 07/29/2009 | CN100521213C Integrated circuit self-testing method based on electric programmed three-D memory |
| 07/29/2009 | CN100520957C Memory equipment capable of being calibrated and calibrating method thereof |
| 07/28/2009 | US7568146 Semiconductor storage device and pseudo SRAM |
| 07/28/2009 | US7568141 Method and apparatus for testing embedded cores |