Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
10/2009
10/20/2009US7607055 Semiconductor memory device and method of testing the same
10/20/2009US7606091 Method for non-volatile memory with reduced erase/write cycling during trimming of initial programming voltage
10/20/2009US7606090 Redundancy program circuit and methods thereof
10/20/2009US7605700 RFID tag data retention verification and refresh
10/20/2009US7605434 Semiconductor memory device to which test data is written
10/15/2009WO2009126812A1 Programmable memory repair scheme
10/15/2009US20090259896 Bad block identifying method for flash memory, storage system, and controller thereof
10/15/2009US20090259895 Semiconductor memory device parallel bit test circuits
10/15/2009US20090257300 Fuse information control device, semiconductor integrated circuit using the same, and control method thereof
10/15/2009US20090257297 Multi-chip semiconductor device providing enhanced redundancy capabilities
10/15/2009US20090257296 Programmable memory repair scheme
10/15/2009US20090257285 Semiconductor memory apparatus
10/14/2009CN101558452A Method and device for reconfiguration of reliability data in flash EEPROM storage pages
10/14/2009CN101556834A Semiconductor memory device and system using semiconductor memory device
10/14/2009CN100550206C A method and device for detecting the physical parameters of flash memory
10/14/2009CN100550197C Semiconductor memory
10/14/2009CN100550191C Universally accessible fully programmable memory built-in self-test (mbist) system and method
10/14/2009CN100550187C Accelerated life test of MRAM cells
10/13/2009US7603658 Application functionality for a test tool for application programming interfaces
10/13/2009US7603614 Method and system for indicating an executable as trojan horse
10/13/2009US7603610 Coding a video data stream with unequal error protection based activity
10/13/2009US7603603 Configurable memory architecture with built-in testing mechanism
10/13/2009US7603597 Tolerating memory errors by hot ejecting portions of memory
10/13/2009US7603596 Memory device capable of detecting its failure
10/13/2009US7603595 Memory test circuit and method
10/13/2009US7603593 Method for managing bad memory blocks in a nonvolatile-memory device, and nonvolatile-memory device implementing the management method
10/13/2009US7603592 Semiconductor device having a sense amplifier array with adjacent ECC
10/13/2009US7603516 Disk controller providing for the auto-transfer of host-requested-data from a cache memory within a disk memory system
10/13/2009US7602661 Semiconductor memory apparatus and method of controlling the same
10/13/2009US7602660 Redundancy circuit semiconductor memory device
10/13/2009US7602659 Memory device having shared fail-repairing circuit capable of repairing row or column fails in memory cell arrays of memory banks
10/13/2009US7602644 Memory devices with page buffer having dual registers and method of using the same
10/13/2009US7602171 System for testing memory modules using a rotating-type module mounting portion
10/08/2009WO2009124320A1 Apparatus, system, and method for bad block remapping
10/08/2009WO2009121165A1 Test circuit for an unprogrammed otp memory array
10/08/2009US20090254785 Test mode for parallel load of address dependent data to enable loading of desired data backgrounds
10/08/2009US20090254784 Semiconductor memory device and system using semiconductor memory device
10/08/2009US20090251978 Integration of lbist into array bisr flow
10/08/2009US20090251965 Nonvolatile memory device including circuit formed of thin film transistors
10/08/2009US20090251943 Test circuit for an unprogrammed otp memory array
10/08/2009US20090251121 Method and apparatus providing final test and trimming for a power supply controller
10/07/2009EP2106610A1 Memory system
10/07/2009CN101553879A Method and device for testing memory
10/07/2009CN101552032A Method and device for constructing a high-speed solid state memory disc by using higher-capacity DRAM to join in flash memory medium management
10/07/2009CN100547684C Non-volatile storage and its related limit voltage verification method and semiconductor device
10/06/2009US7600167 Flip-flop, shift register, and scan test circuit
10/06/2009US7600165 Error control coding method and system for non-volatile memory
10/06/2009US7600164 Interleaving/de-interleaving using compressed bit-mapping sequences
10/06/2009US7599236 In-circuit Vt distribution bit counter for non-volatile memory devices
10/06/2009US7599235 Memory correction system and method
10/06/2009US7599206 Non-volatile semiconductor storage device
10/06/2009US7598785 Apparatus and method for adjusting slew rate in semiconductor memory device
10/01/2009WO2009121022A2 Systems, methods, and apparatuses to save memory self-refresh power
10/01/2009US20090249169 Systems, methods, and apparatuses to save memory self-refresh power
10/01/2009US20090249140 Method for managing defect blocks in non-volatile memory
10/01/2009US20090249139 Unidirectional Error Code Transfer for Both Read and Write Data Transmitted via Bidirectional Data Link
10/01/2009US20090249138 Semiconductor memory apparatus for reducing bus traffic between NAND flash memory device and controller
10/01/2009US20090249137 Testing module, testing apparatus and testing method
10/01/2009US20090249136 Accessing sequential data in a microcontroller
10/01/2009US20090249134 De-interleaving mechanism involving a multi-banked llr buffer
10/01/2009US20090245009 256 Meg dynamic random access memory
10/01/2009US20090245001 Integrated circuit and method for testing the circuit
10/01/2009US20090245000 Semiconductor integrated circuit
10/01/2009US20090244999 Clock control during self-test of multi port memory
09/2009
09/30/2009CN101548337A Internally generating patterns for testing in an integrated circuit device
09/29/2009US7596739 Method and system for data replication
09/29/2009US7596729 Memory device testing system and method using compressed fail data
09/29/2009US7596728 Built-in self repair circuit for a multi-port memory and method thereof
09/24/2009WO2009116716A1 Encoding and/or decoding memory devices and methods thereof
09/24/2009WO2009116117A1 Semiconductor memoery, system, method for operating semiconductor memory, and method for manufacturing semiconductor memory
09/24/2009US20090241011 Memory device
09/24/2009US20090240448 Technique for determining performance characteristics of electronic devices and systems
09/24/2009US20090238018 Integrated circuit including Built-In Self Test circuit to test memory and memory test method
09/24/2009DE102008002237A1 Verfahren zum Prüfen einer nichtflüchtigen Speichervorrichtung A method of testing a non-volatile memory device
09/23/2009EP2104109A1 Nonvolatile resistive memories, latch circuits, and operation circuits having scalable two-terminal nanotube switches
09/23/2009EP2104108A1 Nonvolatile resistive memories, latch circuits, and operation circuits having scalable two-terminal nanotube switches
09/23/2009EP2102869A1 Circuit and method for testing multi-device systems
09/23/2009EP1586098B1 Multiple trip point fuse latch device and test method of the fuse
09/23/2009CN101540205A Method for scanning flash memory
09/23/2009CN101540204A Method for scanning flash memory medium
09/23/2009CN101540203A Method for changing operation program in real time
09/23/2009CN101540202A Method and system for quickly screening flash memory medium
09/23/2009CN101540201A Testing method and device for multi-bank flash-memory
09/23/2009CN101540197A Design method of emptying CTIA reading circuit of photo memory unit
09/23/2009CN101540192A Method and device for preventing data loss in reflow process
09/22/2009US7594157 Memory system with backup circuit and programming method
09/22/2009US7594148 Apparatus and method for testing semiconductor memory device
09/22/2009US7594147 Method and apparatus for recording data on and reproducing data from a recording medium and the recording medium
09/22/2009US7594088 System and method for an asynchronous data buffer having buffer write and read pointers
09/22/2009US7594051 Storage apparatus
09/22/2009US7593966 Method and apparatus for server share migration and server recovery using hierarchical storage management
09/22/2009US7593246 Low cost high density rectifier matrix memory
09/17/2009WO2009112354A1 Methods for making a stack of memory circuits and for addressing a memory circuit, and corresponding stack and device
09/17/2009US20090235145 Memory device repair apparatus, systems, and methods
09/17/2009US20090235131 Method and apparatus for processing failures during semiconductor device testing
09/17/2009US20090235129 Apparatus and method for hybrid detection of memory data
09/17/2009US20090235017 Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices
09/17/2009US20090231947 Semiconductor integrated circuit having address control circuit
09/17/2009US20090231933 Semiconductor memory device with signal aligning circuit
09/17/2009US20090231903 Ferroelectric memory and method for testing the same
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