Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
11/2009
11/24/2009US7624316 Apparatus and method for testing removable flash memory devices
11/24/2009US7624315 Adapter card for connection to a data bus in a data processing unit and method for operating a DDR memory module
11/24/2009US7624313 TCAM BIST with redundancy
11/24/2009US7623399 Semiconductor memory for relieving a defective bit
11/19/2009WO2009140700A1 Apparatus, system, and method for detecting and replacing failed data storage
11/19/2009WO2009140612A1 Testing a memory device having field effect transistors subject to threshold voltage shifts caused by bias temperature instability
11/19/2009WO2009139101A1 Electronic equipment system and semiconductor integrated circuit controller
11/19/2009US20090287982 Correcting errors in longitudinal position (lpos) words
11/19/2009US20090287972 Test method for nonvolatile memory device
11/19/2009US20090287971 Method and apparatus for testing a random access memory device
11/19/2009US20090287956 Apparatus, system, and method for detecting and replacing failed data storage
11/19/2009US20090287362 Monitored burn-in test apparatus and monitored burn-in test method
11/19/2009US20090285043 Block Repair Scheme
11/18/2009EP1405316B1 Non-volatile memory and accelerated test method for address decoder by added modified dummy memory cells
11/18/2009EP1109321B9 One bit error correction method in a chain of bits
11/18/2009CN101582294A Method for solving problem of SRAM module latch and strengthening reliability of SRAM module
11/18/2009CN100561599C Method for verifying non-volatilization memory circuit function
11/18/2009CN100561597C Semiconductor memory device and method of testing semiconductor memory device
11/18/2009CN100561596C Method for accessing semiconductor memory device and electronic information apparatus using same
11/18/2009CN100561592C Semiconductor device
11/17/2009US7620876 Reducing false positives in configuration error detection for programmable devices
11/17/2009US7620875 Error correction code memory system with a small footprint and byte write operation
11/17/2009US7620860 System and method of dynamically mapping out faulty memory areas
11/17/2009US7619938 Repairing advanced-memory buffer (AMB) with redundant memory buffer for repairing DRAM on a fully-buffered memory-module
11/17/2009US7619937 Semiconductor memory device with reset during a test mode
11/17/2009US7619921 Nonvolatile semiconductor memory
11/12/2009WO2009136503A1 Memory test apparatus and testing method
11/12/2009US20090282317 Method of data storage by encoding bit stream on surface
11/12/2009US20090282302 Multi-Stage Data Processor With Signal Repeater
11/12/2009US20090279365 Non-volatile semiconductor memory system
11/12/2009US20090279357 Nonvolatile semiconductor storage device and method of testing the same
11/11/2009EP2115748A1 Apparatus, method, system of nand defect management
11/11/2009EP1620857B1 Enabling memory redundancy during testing
11/11/2009CN100559717C Method of detecting error location, and error detection circuit, error correction circuit using same
11/11/2009CN100559510C Semiconductor integrated circuit device
11/11/2009CN100559509C Verify code write-in method and write device thereof in BCH error correcting technology
11/11/2009CN100559508C Semiconductor memory device
11/11/2009CN100559501C Semiconductor storage device having effective and reliable redundancy process
11/11/2009CN100559477C Optical disc, and method and apparatus for managing defective areas on write-once type optical disc
11/10/2009US7617437 Error correction device and method thereof
11/10/2009US7617426 Verification method and apparatus
11/10/2009US7617425 Method for at-speed testing of memory interface using scan
11/10/2009US7617416 System, method, and apparatus for firmware code-coverage in complex system on chip
11/10/2009US7616630 Semiconductor memory device
11/10/2009US7616485 Semiconductor memory device having faulty cells
11/10/2009US7616484 Soft errors handling in EEPROM devices
11/10/2009US7616022 Circuit and method for detecting skew of transistors in a semiconductor device
11/10/2009US7615837 Lithography device for semiconductor circuit pattern generation
11/05/2009WO2009134518A1 Selectively performing a single cycle write operation with ecc in a data processing system
11/05/2009WO2009133553A1 Non-volatile multilevel memory with adaptive setting of reference voltage levels for program, verify and read
11/05/2009US20090274248 Method and apparatus for contention-free interleaving using a single memory
11/05/2009US20090273996 Memory testing system and memory module thereof
11/05/2009US20090273986 Non-Volatile Memory With Redundancy Data Buffered in Remote Buffer Circuits
11/05/2009DE102008021432A1 Device for testing semiconductor storage unit, comprises number of storage cells, which are controllable over internal lines, where test voltage is applied on internal line
11/03/2009US7613984 System and method for symmetric triple parity for failing storage devices
11/03/2009US7613982 Data processing apparatus and method for flash memory
11/03/2009US7613975 Predictive diagnosis of a data read system
11/03/2009US7613968 Device and method for JTAG test
11/03/2009US7613962 Semiconductor integrated circuit with full-speed data transition scheme for DDR SDRAM at internally doubled clock testing application
11/03/2009US7613961 CPU register diagnostic testing
11/03/2009US7613960 Semiconductor device test apparatus and method
11/03/2009US7613056 Semiconductor memory device
11/03/2009US7613046 Nonvolatile semiconductor memory device carrying out simultaneous programming of memory cells
10/2009
10/29/2009US20090271672 Probeless testing of pad buffers on wafer
10/29/2009US20090271670 Systems and Methods for Media Defect Detection Utilizing Correlated DFIR and LLR Data
10/29/2009US20090271669 High-Speed Testing of Integrated Devices
10/29/2009US20090271568 Flash memory system and data writing method thereof
10/29/2009US20090268534 Semiconductor memory device and test method thereof
10/29/2009US20090268530 Trigger Circuit of a Column Redundant Circuit and Related Column Redundant Device
10/28/2009CN101567221A Damaged memory unit address management method for SDRAM
10/28/2009CN101567220A Bad block identifying method, storage system and controller thereof for flash memory
10/28/2009CN101567218A Method for generating flash memory identification code
10/28/2009CN101567217A Flash memory safely writing method and data writing method
10/28/2009CN100555465C Memory system circuit for operating non-volatile memory system and method
10/28/2009CN100555457C Multi-input/output repair method of nand flash memory device and nand flash memory device thereof
10/28/2009CN100555447C Semiconductor storage device control method
10/27/2009US7610542 Semiconductor memory in which error correction is performed by on-chip error correction circuit
10/27/2009US7610541 Computer compressed memory system and method for storing and retrieving data in a processing system
10/27/2009US7610532 Serializer/de-serializer bus controller interface
10/27/2009US7610528 Configuring flash memory
10/27/2009US7610525 Defective memory block identification in a memory device
10/27/2009US7610524 Memory with test mode output
10/27/2009US7610523 Method and template for physical-memory allocation for implementing an in-system memory test
10/27/2009US7610521 Communication control system and method for supervising a failure
10/27/2009US7610519 Vector generation for codes through symmetry
10/27/2009US7609944 Copy protection of optical discs
10/27/2009US7609777 Maximum likelihood a posteriori probability detector
10/22/2009US20090265592 Memory device and test method thereof
10/22/2009US20090265591 Semiconductor integrated circuit device
10/22/2009US20090265588 System and method for running test and redundancy analysis in parallel
10/22/2009US20090262590 Semiconductor memory device
10/22/2009US20090262575 Thin film magnetic memory device capable of conducting stable data read and write operations
10/21/2009EP2109864A1 Method and device for testing memory
10/21/2009CN101562052A Storage equipment screening device and method
10/21/2009CN101562051A Flash memory medium scan method
10/21/2009CN101562050A Phase change memory dynamic resistance test and manufacturing methods
10/21/2009CN100552805C Method and circuit for enabling memory redundancy during testing
10/20/2009US7607068 Apparatus and method for generating a Galois-field syndrome
10/20/2009US7607067 Method and apparatus for accessing memory
10/20/2009US7607060 System and method for performing high speed memory diagnostics via built-in-self-test
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