Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
---|
11/24/2009 | US7624316 Apparatus and method for testing removable flash memory devices |
11/24/2009 | US7624315 Adapter card for connection to a data bus in a data processing unit and method for operating a DDR memory module |
11/24/2009 | US7624313 TCAM BIST with redundancy |
11/24/2009 | US7623399 Semiconductor memory for relieving a defective bit |
11/19/2009 | WO2009140700A1 Apparatus, system, and method for detecting and replacing failed data storage |
11/19/2009 | WO2009140612A1 Testing a memory device having field effect transistors subject to threshold voltage shifts caused by bias temperature instability |
11/19/2009 | WO2009139101A1 Electronic equipment system and semiconductor integrated circuit controller |
11/19/2009 | US20090287982 Correcting errors in longitudinal position (lpos) words |
11/19/2009 | US20090287972 Test method for nonvolatile memory device |
11/19/2009 | US20090287971 Method and apparatus for testing a random access memory device |
11/19/2009 | US20090287956 Apparatus, system, and method for detecting and replacing failed data storage |
11/19/2009 | US20090287362 Monitored burn-in test apparatus and monitored burn-in test method |
11/19/2009 | US20090285043 Block Repair Scheme |
11/18/2009 | EP1405316B1 Non-volatile memory and accelerated test method for address decoder by added modified dummy memory cells |
11/18/2009 | EP1109321B9 One bit error correction method in a chain of bits |
11/18/2009 | CN101582294A Method for solving problem of SRAM module latch and strengthening reliability of SRAM module |
11/18/2009 | CN100561599C Method for verifying non-volatilization memory circuit function |
11/18/2009 | CN100561597C Semiconductor memory device and method of testing semiconductor memory device |
11/18/2009 | CN100561596C Method for accessing semiconductor memory device and electronic information apparatus using same |
11/18/2009 | CN100561592C Semiconductor device |
11/17/2009 | US7620876 Reducing false positives in configuration error detection for programmable devices |
11/17/2009 | US7620875 Error correction code memory system with a small footprint and byte write operation |
11/17/2009 | US7620860 System and method of dynamically mapping out faulty memory areas |
11/17/2009 | US7619938 Repairing advanced-memory buffer (AMB) with redundant memory buffer for repairing DRAM on a fully-buffered memory-module |
11/17/2009 | US7619937 Semiconductor memory device with reset during a test mode |
11/17/2009 | US7619921 Nonvolatile semiconductor memory |
11/12/2009 | WO2009136503A1 Memory test apparatus and testing method |
11/12/2009 | US20090282317 Method of data storage by encoding bit stream on surface |
11/12/2009 | US20090282302 Multi-Stage Data Processor With Signal Repeater |
11/12/2009 | US20090279365 Non-volatile semiconductor memory system |
11/12/2009 | US20090279357 Nonvolatile semiconductor storage device and method of testing the same |
11/11/2009 | EP2115748A1 Apparatus, method, system of nand defect management |
11/11/2009 | EP1620857B1 Enabling memory redundancy during testing |
11/11/2009 | CN100559717C Method of detecting error location, and error detection circuit, error correction circuit using same |
11/11/2009 | CN100559510C Semiconductor integrated circuit device |
11/11/2009 | CN100559509C Verify code write-in method and write device thereof in BCH error correcting technology |
11/11/2009 | CN100559508C Semiconductor memory device |
11/11/2009 | CN100559501C Semiconductor storage device having effective and reliable redundancy process |
11/11/2009 | CN100559477C Optical disc, and method and apparatus for managing defective areas on write-once type optical disc |
11/10/2009 | US7617437 Error correction device and method thereof |
11/10/2009 | US7617426 Verification method and apparatus |
11/10/2009 | US7617425 Method for at-speed testing of memory interface using scan |
11/10/2009 | US7617416 System, method, and apparatus for firmware code-coverage in complex system on chip |
11/10/2009 | US7616630 Semiconductor memory device |
11/10/2009 | US7616485 Semiconductor memory device having faulty cells |
11/10/2009 | US7616484 Soft errors handling in EEPROM devices |
11/10/2009 | US7616022 Circuit and method for detecting skew of transistors in a semiconductor device |
11/10/2009 | US7615837 Lithography device for semiconductor circuit pattern generation |
11/05/2009 | WO2009134518A1 Selectively performing a single cycle write operation with ecc in a data processing system |
11/05/2009 | WO2009133553A1 Non-volatile multilevel memory with adaptive setting of reference voltage levels for program, verify and read |
11/05/2009 | US20090274248 Method and apparatus for contention-free interleaving using a single memory |
11/05/2009 | US20090273996 Memory testing system and memory module thereof |
11/05/2009 | US20090273986 Non-Volatile Memory With Redundancy Data Buffered in Remote Buffer Circuits |
11/05/2009 | DE102008021432A1 Device for testing semiconductor storage unit, comprises number of storage cells, which are controllable over internal lines, where test voltage is applied on internal line |
11/03/2009 | US7613984 System and method for symmetric triple parity for failing storage devices |
11/03/2009 | US7613982 Data processing apparatus and method for flash memory |
11/03/2009 | US7613975 Predictive diagnosis of a data read system |
11/03/2009 | US7613968 Device and method for JTAG test |
11/03/2009 | US7613962 Semiconductor integrated circuit with full-speed data transition scheme for DDR SDRAM at internally doubled clock testing application |
11/03/2009 | US7613961 CPU register diagnostic testing |
11/03/2009 | US7613960 Semiconductor device test apparatus and method |
11/03/2009 | US7613056 Semiconductor memory device |
11/03/2009 | US7613046 Nonvolatile semiconductor memory device carrying out simultaneous programming of memory cells |
10/29/2009 | US20090271672 Probeless testing of pad buffers on wafer |
10/29/2009 | US20090271670 Systems and Methods for Media Defect Detection Utilizing Correlated DFIR and LLR Data |
10/29/2009 | US20090271669 High-Speed Testing of Integrated Devices |
10/29/2009 | US20090271568 Flash memory system and data writing method thereof |
10/29/2009 | US20090268534 Semiconductor memory device and test method thereof |
10/29/2009 | US20090268530 Trigger Circuit of a Column Redundant Circuit and Related Column Redundant Device |
10/28/2009 | CN101567221A Damaged memory unit address management method for SDRAM |
10/28/2009 | CN101567220A Bad block identifying method, storage system and controller thereof for flash memory |
10/28/2009 | CN101567218A Method for generating flash memory identification code |
10/28/2009 | CN101567217A Flash memory safely writing method and data writing method |
10/28/2009 | CN100555465C Memory system circuit for operating non-volatile memory system and method |
10/28/2009 | CN100555457C Multi-input/output repair method of nand flash memory device and nand flash memory device thereof |
10/28/2009 | CN100555447C Semiconductor storage device control method |
10/27/2009 | US7610542 Semiconductor memory in which error correction is performed by on-chip error correction circuit |
10/27/2009 | US7610541 Computer compressed memory system and method for storing and retrieving data in a processing system |
10/27/2009 | US7610532 Serializer/de-serializer bus controller interface |
10/27/2009 | US7610528 Configuring flash memory |
10/27/2009 | US7610525 Defective memory block identification in a memory device |
10/27/2009 | US7610524 Memory with test mode output |
10/27/2009 | US7610523 Method and template for physical-memory allocation for implementing an in-system memory test |
10/27/2009 | US7610521 Communication control system and method for supervising a failure |
10/27/2009 | US7610519 Vector generation for codes through symmetry |
10/27/2009 | US7609944 Copy protection of optical discs |
10/27/2009 | US7609777 Maximum likelihood a posteriori probability detector |
10/22/2009 | US20090265592 Memory device and test method thereof |
10/22/2009 | US20090265591 Semiconductor integrated circuit device |
10/22/2009 | US20090265588 System and method for running test and redundancy analysis in parallel |
10/22/2009 | US20090262590 Semiconductor memory device |
10/22/2009 | US20090262575 Thin film magnetic memory device capable of conducting stable data read and write operations |
10/21/2009 | EP2109864A1 Method and device for testing memory |
10/21/2009 | CN101562052A Storage equipment screening device and method |
10/21/2009 | CN101562051A Flash memory medium scan method |
10/21/2009 | CN101562050A Phase change memory dynamic resistance test and manufacturing methods |
10/21/2009 | CN100552805C Method and circuit for enabling memory redundancy during testing |
10/20/2009 | US7607068 Apparatus and method for generating a Galois-field syndrome |
10/20/2009 | US7607067 Method and apparatus for accessing memory |
10/20/2009 | US7607060 System and method for performing high speed memory diagnostics via built-in-self-test |