Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
02/2010
02/10/2010EP2150896A1 Method for memory management
02/10/2010CN101645310A Flash memory equipment, method and system for managing flash memory
02/10/2010CN101645309A Non-volatile storage device and control method thereof
02/10/2010CN100589208C Test circuit for multi-port memory device
02/10/2010CN100589203C Management of unusable block in non-volatile memory system
02/09/2010US7661056 Circuit arrangement for processing data
02/09/2010US7661054 Methods and arrangements to remap degraded storage blocks
02/09/2010US7661045 Method and system for enterprise memory management of memory modules
02/09/2010US7661044 Method, apparatus and program product to concurrently detect, repair, verify and isolate memory failures
02/09/2010US7661043 Test apparatus, and method of manufacturing semiconductor memory
02/09/2010US7661042 Low-power content-addressable-memory device
02/09/2010US7661041 Test circuit and method for multilevel cell flash memory
02/09/2010US7661040 Method of testing a sequential access memory plane and a corresponding sequential access memory semiconductor device
02/09/2010US7660181 Method of making non-volatile memory cell with embedded antifuse
02/09/2010US7660174 Semiconductor memory device having wafer burn-in test mode
02/09/2010US7660173 Semiconductor memory device and operating method with hidden write control
02/09/2010US7659542 Silicon plate, producing method thereof, and solar cell
02/04/2010WO2010013464A1 Testing device
02/04/2010WO2010013437A1 Controller with error correction function, recording device with error correction function, and system with error correction function
02/04/2010WO2010013306A1 Testing device, and testing method
02/04/2010US20100030949 Non-volatile memory devices and control and operation thereof
02/04/2010US20100027359 Memory test circuit which tests address access time of clock synchronized memory
02/04/2010US20100027354 Semiconductor memory device and method for testing same
02/04/2010US20100027333 Nonvolatile Semiconductor Memory Device
02/04/2010DE102009031310A1 Speichersystem, Leseverstärker, Verwendung und Verfahren zur Fehlerdetektion mittels Parity-Bits eines Blockcodes Storage system, sense amplifiers, use and method for error detection using parity bits of a block code
02/03/2010EP2149886A1 Protection of an electronic trigger circuit against fault injections
02/03/2010EP2149885A1 Integrated circuit and method for testing the circuit
02/03/2010CN101641747A Semiconductor memory device
02/03/2010CN101640074A Memory repair circuit and imitative dual-port static random access memory using same
02/03/2010CN100587848C Test device and test method
02/03/2010CN100587840C Memory device having delay locked loop
02/03/2010CN100587834C Memory and method for refreshing memory array
02/03/2010CN100587827C Method and device for recording digital data on digital general disc
02/02/2010US7657803 Memory controller with a self-test function, and method of testing a memory controller
02/02/2010US7657802 Data compression read mode for memory testing
02/02/2010US7657801 Test apparatus, program, and test method
02/02/2010US7657800 Semiconductor memory device and method of performing a memory operation
02/02/2010US7657798 Semiconductor integrated circuit and the same checking method
02/02/2010US7657784 Self-reparable semiconductor and method thereof
02/02/2010US7656730 Semiconductor memory device with a reference or dummy cell for testing
02/02/2010US7656729 Circuit and method for decoding column addresses in semiconductor memory apparatus
02/02/2010US7656728 Sense amplifier screen circuit and screen method thereof
02/02/2010US7656727 Semiconductor memory device and system providing spare memory locations
02/02/2010US7656726 Memory with improved BIST
01/2010
01/28/2010US20100023841 Memory system, sense amplifier, use, and method for error detection by means of parity bits of a block code
01/28/2010US20100023818 Multiple access test architecture for memory storage devices
01/28/2010US20100023817 Test system and method
01/28/2010US20100020616 Soft Errors Handling in EEPROM Devices
01/28/2010US20100020591 Adaptive Voltage Control for SRAM
01/28/2010DE10148521B4 Integrierter Speicher sowie Verfahren zum Betrieb eines integrierten Speichers und eines Speichersystems mit mehreren integrierten Speichern Integrated memory and method of operating an integrated memory and a memory system having a plurality of integrated memories
01/27/2010EP1643509B1 Semiconductor test device and control method thereof
01/27/2010CN101636794A Sharing routing of a test signal with an alternative power supply to combinatorial logic for low power design
01/27/2010CN100585742C Semiconductor memory device
01/27/2010CN100585739C Program verification for non-volatile memory
01/27/2010CN100585738C Methods and circuits for programming of a semiconductor memory cell and memory array
01/27/2010CN100585414C Apparatus for testing USB memory and method thereof
01/26/2010US7653863 Data storing method for a non-volatile memory cell array having an error correction code
01/26/2010US7653862 Error detection and correction for encoded data
01/26/2010US7653847 Methods and structure for field flawscan in a dynamically mapped mass storage device
01/26/2010US7653846 Memory cell bit valve loss detection and restoration
01/26/2010US7653845 Test algorithm selection in memory built-in self test controller
01/26/2010US7652941 Memory device
01/26/2010US7652290 Standby current erasion circuit of DRAM
01/21/2010US20100017665 Defective memory block identification in a memory device
01/21/2010US20100017664 Embedded flash memory test circuit
01/21/2010US20100017663 Data processing circuit and method
01/21/2010US20100014369 Method for testing a static random access memory
01/21/2010US20100014368 System that increases data eye widths
01/21/2010US20100014367 Memory repair circuit and repairable pseudo-dual port static random access memory
01/21/2010DE112007003412T5 Prüfgerät und elektronische Vorrichtung Instrument and electronic device
01/21/2010DE10216607B4 Halbleiterspeichervorrichtung A semiconductor memory device
01/20/2010CN101632131A Built-in self testing of a flash memory
01/20/2010CN101630535A Data processing circuit and method
01/20/2010CN101630534A Method and device for testing reliability of nonvolatile memories
01/20/2010CN100583301C Dynamic management approach for memory body
01/20/2010CN100583300C Semiconductor storage device
01/20/2010CN100583299C Repair control circuit of semiconductor memory device with reduced size
01/19/2010US7650558 Systems, methods, and apparatuses for using the same memory type for both error check and non-error check memory systems
01/19/2010US7650557 Memory scrubbing of expanded memory
01/19/2010US7650554 Method and an integrated circuit for performing a test
01/19/2010US7650551 Error detection and recovery within processing stages of an integrated circuit
01/19/2010US7650542 Method and system of using a single EJTAG interface for multiple tap controllers
01/19/2010US7650541 Memory block quality identification in a memory device
01/19/2010US7649790 Semiconductor memory device
01/19/2010US7649789 Semiconductor memory device with various delay values
01/14/2010WO2010004755A1 Testing device and testing method
01/14/2010WO2010004754A1 Testing device, testing method, and phase shifter
01/14/2010WO2010004664A1 Semiconductor memory device
01/14/2010WO2010003384A1 Semiconductor memory device and its early-warning system and method
01/14/2010WO2009065224A8 Data channel test apparatus and method thereof
01/14/2010US20100011276 Storage device for refreshing data pages of flash memory based on error correction code and method for the same
01/14/2010US20100011266 Program verify method for otp memories
01/14/2010US20100011261 Verifying Data Integrity of a Non-Volatile Memory System during Data Caching Process
01/14/2010US20100011260 Memory system
01/14/2010US20100008170 Semiconductor tester and testing method of semiconductor memory
01/14/2010US20100008160 Temperature sensor capable of reducing test mode time
01/14/2010US20100008157 Semiconductor memory device capable of detecting write completion at high speed
01/14/2010US20100008126 Three-dimensional memory device
01/14/2010US20100008125 Semiconductor memory device and redundancy method therefor
01/13/2010EP2143111A1 Sharing routing of a test signal with an alternative power supply to combinatorial logic for low power design
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