| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 03/17/2010 | CN101673580A Methods of detecting a shift in the threshold voltage for a nonvolatile memory cell |
| 03/17/2010 | CN101673227A Memory bit error generating device |
| 03/16/2010 | US7681247 Anti-theft system and method for semiconductor devices and other electronic components |
| 03/16/2010 | US7681111 Disk array device, parity data generating circuit for RAID and Galois field multiplying circuit |
| 03/16/2010 | US7681109 Method of error correction in MBC flash memory |
| 03/16/2010 | US7681107 Semiconductor device |
| 03/16/2010 | US7681106 Error correction device and methods thereof |
| 03/16/2010 | US7681104 Method for erasure coding data across a plurality of data stores in a network |
| 03/16/2010 | US7681096 Semiconductor integrated circuit, BIST circuit, design program of BIST circuit, design device of BIST circuit and test method of memory |
| 03/16/2010 | US7681095 Methods and apparatus for testing integrated circuits |
| 03/16/2010 | US7681094 Data recovery in a memory system using tracking cells |
| 03/16/2010 | US7679978 Scheme for screening weak memory cell |
| 03/16/2010 | US7679977 Semiconductor memory device and test method thereof |
| 03/16/2010 | US7679975 Semiconductor memory devices having redundancy arrays |
| 03/16/2010 | US7679974 Memory device having selectively decoupleable memory portions and method thereof |
| 03/11/2010 | WO2010026641A1 Test apparatus and test method |
| 03/11/2010 | WO2010002561A3 Method and apparatus for repairing high capacity/high bandwidth memory devices |
| 03/11/2010 | US20100064198 Stored data processing apparatus, storage apparatus, medium storing stored data processing program, and stored data processing method |
| 03/11/2010 | US20100064187 Bad block identification methods |
| 03/11/2010 | US20100064186 Methods, apparatus, and systems to repair memory |
| 03/11/2010 | US20100061168 Fuses for memory repair |
| 03/11/2010 | DE112008001032T5 Prüfgerät, Prüfverfahren und elektronische Vorrichtung Tester, test methods and electronic device |
| 03/10/2010 | EP1647031B1 Memory device and method of storing fail addresses of a memory cell |
| 03/10/2010 | CN201421721Y Flash memory tester |
| 03/10/2010 | CN101669174A Method and apparatus for testing page decoder |
| 03/10/2010 | CN101667463A Memory bit error generation device |
| 03/10/2010 | CN101667462A Repair module for memory, repair device using the same and method thereof |
| 03/09/2010 | US7676730 Method and apparatus for implementing error correction coding in a random access memory |
| 03/09/2010 | US7676729 Data corruption avoidance in DRAM chip sparing |
| 03/09/2010 | US7676728 Apparatus and method for memory asynchronous atomic read-correct-write operation |
| 03/09/2010 | US7676727 System and method for transmitting data in a motor vehicle |
| 03/09/2010 | US7676715 Integrated circuit with continuous testing of repetitive functional blocks |
| 03/09/2010 | US7676711 Test circuit for testing command signal at package level in semiconductor device |
| 03/09/2010 | US7676710 Error detection, documentation, and correction in a flash memory device |
| 03/09/2010 | US7676709 Self-test output for high-density BIST |
| 03/09/2010 | US7676708 Semiconductor integrated circuit with full-speed data transition scheme for DDR SDRAM at internally doubled clock testing application |
| 03/09/2010 | US7675790 Over driving pin function selection method and circuit |
| 03/04/2010 | US20100058145 Storage device and method of controlling storage device |
| 03/04/2010 | US20100058128 Shared diagnosis method for an integrated electronic system including a plurality of memory units |
| 03/04/2010 | US20100058126 Programmable Self-Test for Random Access Memories |
| 03/04/2010 | US20100054063 Semiconductor memory device, test method thereof and semiconductor device |
| 03/04/2010 | US20100054062 Static random access memory (SRAM) and test method of the SRAM having precharge circuit to precharge bit line |
| 03/04/2010 | US20100054061 Semiconductor memory device having bit test circuit with ignore function |
| 03/04/2010 | US20100052727 Synchronous semiconductor device, and inspection system and method for the same |
| 03/04/2010 | DE102008045196A1 Probe card for electrical connection of circuit point of test device with e.g. microprocessor, has coupling circuit comprising adjustable delay line for adjusting running time of signal path between probe and card connector |
| 03/04/2010 | DE10164914B4 Verifizierungsschaltungsanordnung Verification circuitry |
| 03/03/2010 | EP2159709A1 Error correcting method and computing element |
| 03/03/2010 | EP2159705A1 Cache memory device, arithmetic processing unit, and its control method |
| 03/03/2010 | EP1436815B1 Semiconductor memory cell and memory array using a breakdown phenomena in an ultra-thin dielectric |
| 03/03/2010 | CN101661799A Programmable self-test for random access memories |
| 03/03/2010 | CN100593215C Semiconductor storage device and semiconductor storage device control method |
| 03/02/2010 | US7673220 Flash memory device having single page buffer structure and related programming method |
| 03/02/2010 | US7673219 Cooperative relay networks using rateless codes |
| 03/02/2010 | US7673218 System for decoding bit stream printed on surface |
| 03/02/2010 | US7673217 Method of detecting data transmission errors in a CAN controller, and a CAN controller for carrying out the method |
| 03/02/2010 | US7673195 Circuits and methods for characterizing device variation in electronic memory circuits |
| 03/02/2010 | US7673194 Apparatus and method for initializing an integrated circuit device and activating a function of the device once an input power supply has reached a threshold voltage |
| 03/02/2010 | US7673193 Processor-memory unit for use in system-in-package and system-in-module devices |
| 03/02/2010 | US7670893 Membrane IC fabrication |
| 02/25/2010 | WO2010021632A1 Dual independent non volatile memory systems |
| 02/25/2010 | US20100046292 Non-volatile memory device and bad block remapping method |
| 02/25/2010 | US20100046265 Separate CAM Core Power Supply For Power Saving |
| 02/25/2010 | US20100045368 Semiconductor Integrated Circuit |
| 02/25/2010 | DE102004020546B4 Elektronische Speichervorrichtung und Verfahren zur Deaktivierung von redundanten Bit- oder Wortleitungen Electronic memory device and method for disabling redundant bit or word lines |
| 02/24/2010 | CN101656110A Method for testing write frequency |
| 02/24/2010 | CN100592427C Abrasion wear process method and device of data block |
| 02/24/2010 | CN100592426C Method for inspecting semiconductor memory |
| 02/23/2010 | US7669107 Method and system for increasing parallelism of disk accesses when restoring data in a disk array system |
| 02/23/2010 | US7669092 Apparatus, method, and system of NAND defect management |
| 02/23/2010 | US7669091 Apparatus and method for defect replacement |
| 02/23/2010 | US7669090 Apparatus and method for verifying custom IC |
| 02/18/2010 | WO2010018689A1 Test module and test method |
| 02/18/2010 | US20100042900 Write Failure Handling of MLC NAND |
| 02/18/2010 | US20100042880 Test apparatus and test method |
| 02/18/2010 | US20100042879 Method of memory build-in self-test |
| 02/18/2010 | US20100042878 Test apparatus and test method |
| 02/18/2010 | US20100039876 Functional Float Mode Screen to Test for Leakage Defects on SRAM Bitlines |
| 02/18/2010 | DE102008036690A1 Method for determining characteristic-parameter of part of read and/or write path, in computer system, involves determining characteristic parameter of part of read and/or write path using information that is read from memory cell |
| 02/17/2010 | EP2154687A2 Erased sector detection mechanisms |
| 02/17/2010 | CN101650976A Flash memory management device and flash memory management method |
| 02/17/2010 | CN101650975A Static random access memory ageing and screening method and chip ageing and screening method |
| 02/17/2010 | CN101650974A Storage device capable of self-detecting usage state and detecting method thereof |
| 02/17/2010 | CN100590745C Memory device detecting method |
| 02/17/2010 | CN100590739C 半导体集成电路器件 The semiconductor integrated circuit device |
| 02/16/2010 | US7664999 Real time testing using on die termination (ODT) circuit |
| 02/16/2010 | US7664998 Non-volatile memory and accelerated test method for address decoder by added modified dummy memory cells |
| 02/16/2010 | US7663950 Method for column redundancy using data latches in solid-state memories |
| 02/16/2010 | US7663949 Memory row architecture having memory row redundancy repair function |
| 02/16/2010 | US7663948 Dynamic random access memory (DRAM) for suppressing a short-circuit current |
| 02/16/2010 | US7663944 Semiconductor memory device and memory system using same |
| 02/16/2010 | US7663392 Synchronous semiconductor device, and inspection system and method for the same |
| 02/11/2010 | WO2010017015A1 Request-command encoding for reduced-data-rate testing |
| 02/11/2010 | US20100037121 Low power layered decoding for low density parity check decoders |
| 02/11/2010 | US20100037110 Automatic multicable electrical continuity tester |
| 02/11/2010 | US20100037109 Method for at-speed testing of memory interface using scan |
| 02/11/2010 | US20100037108 High-speed semiconductor memory test device |
| 02/11/2010 | US20100034038 Integrated circuit including selectable address and data multiplexing mode |
| 02/11/2010 | US20100034037 Semiconductor testing device and method of testing semiconductor memory |
| 02/11/2010 | US20100034034 Methods, circuits, and systems to select memory regions |
| 02/11/2010 | US20100034025 Non-volatile semiconductor storage system |