Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
04/2010
04/20/2010CA2649002C A program verify method for otp memories
04/15/2010US20100095186 Reprogramming non volatile memory portions
04/15/2010US20100095168 Embedded processor
04/15/2010US20100091596 Solid state drive systems and methods of reducing test times of the same
04/15/2010US20100091595 Integrated circuit with control circuit for performing retention test
04/15/2010US20100091594 Semiconductor memory for disconnecting a bit line from sense amplifier in a standby period and memory system including the semiconductor memory
04/15/2010US20100091593 Semiconductor memory device including signal controller connected between memory blocks
04/15/2010US20100091567 Test Circuit and Method for Multilevel Cell Flash Memory
04/15/2010US20100091539 Solid state device products, intermediate solid state devices, and methods of manufacturing and testing the same
04/15/2010DE112007003512T5 Speicherbauelement mit Fehlerkorrekturfähigkeit und effizienter Teilwort-Schreiboperation Memory device with error correction capability and efficient partial word write operation
04/15/2010DE102008050057A1 Multi-chip memory element i.e. dynamic RAM, has chip including group of code pads to impress individual identification i.e. binary code, for concerned chip by external engagement of group of code pads
04/15/2010DE102005046981B4 Speicher und Verfahren zum Verbessern der Zuverlässigkeit eines Speichers mit einem benutzten Speicherbereich und einem unbenutzten Speicherbereich Memory and method for improving the reliability of a memory having a memory area used and an unused storage area
04/14/2010EP2175372A2 Computer apparatus and processor diagnostic method
04/14/2010EP1473628B1 Information processing apparatus, memory management apparatus, memory management method, and information processing method
04/14/2010CN201438374U Encrypted mobile memory device
04/14/2010CN1933027B Method and system for nand-flash identification
04/14/2010CN1396599B Semiconductor memory device for reading data and error correction in refresh operating procedure
04/14/2010CN101694781A Efficient BCH decoding and error correcting circuit
04/14/2010CN101071640B Method for verifying flash memory devices
04/13/2010US7698608 Using a single bank of efuses to successively store testing data from multiple stages of testing
04/13/2010US7698607 Repairing microdisplay frame buffers
04/13/2010US7698515 Information storage medium, recording/reproducing apparatus, and recording/reproducing method
04/13/2010US7698087 Semiconductor integrated circuit and testing method of same
04/13/2010US7697355 Semiconductor memory and system with matching characteristics of signal supplied to a dummy signal line and a real signal line
04/13/2010US7697354 Integrated circuit memory device responsive to word line/bit line short-circuit
04/08/2010WO2010039896A2 Volatile memory elements with soft error upset immunity
04/08/2010WO2010038823A1 Screening method employed in magnetoresistive storage device, and magnetoresistive storage device
04/08/2010WO2010038630A1 Semiconductor memory device
04/08/2010US20100088576 Magnetic disk controller and method
04/08/2010US20100088564 Semiconductor ic incorporating a co-debugging function and test system
04/08/2010US20100088558 Computer apparatus
04/08/2010US20100085825 Stacked device remapping and repair
04/08/2010US20100085820 Semiconductor memory device
04/08/2010DE102009047875A1 Speicherreparatur Memory repair
04/08/2010DE102008026568A1 Semiconductor component for testing error correction-functionality during accessing dynamic RAM in e.g. notebook, has bit error circuit including modifying circuit as part of modifying unit, which controllably modifies access data
04/08/2010DE102007031492B4 Verfahren zum Testen einer integrierten Schaltung, Vorrichtung zum Testen einer integrierten Schaltung, sowie integrierte Schaltung A method for testing an integrated circuit device for testing an integrated circuit, and integrated circuit
04/08/2010DE102006035076B4 Integrierter Halbleiterspeicher und Verfahren zum Betreiben eines integrierten Halbleiterspeichers Integrated semiconductor memory and method of operating an integrated semiconductor memory,
04/08/2010DE102006028483B4 Verfahren zum Zugreifen auf einen Speicher A method for accessing a memory
04/08/2010DE102004040484B4 Auswählen eines Schreibstroms einer magnetischen Speicherzelle Selecting a write current to a magnetic memory cell
04/07/2010EP2172941A1 Computer apparatus
04/07/2010CN201436662U Memory test device
04/07/2010CN101692351A Method and device for testing memory
04/06/2010US7694299 Composite task framework
04/06/2010US7694246 Test method for yielding a known good die
04/06/2010US7694205 Method and apparatus for providing a read channel having combined parity and non-parity post processing
04/06/2010US7694202 Providing memory test patterns for DLL calibration
04/06/2010US7694201 Semiconductor testing device having test result sending back to generate second data
04/06/2010US7694196 Self-diagnostic scheme for detecting errors
04/06/2010US7694195 System and method for using a memory mapping function to map memory defects
04/06/2010US7694194 Semiconductor device
04/06/2010US7694193 Systems and methods for implementing a stride value for accessing memory
04/06/2010US7692943 Semiconductor memory device layout comprising high impurity well tap areas for supplying well voltages to N wells and P wells
04/01/2010US20100083062 High performance pulsed storage circuit
04/01/2010US20100080074 Semiconductor memory device
04/01/2010US20100080073 Semiconductor memory
04/01/2010US20100080072 Methods and systems to write to soft error upset tolerant latches
04/01/2010US20100080043 Apparatus for the dynamic detection, selection and deselection of leaking decoupling capacitors
03/2010
03/31/2010EP2169558A1 Memory refresh device and memory refresh method
03/31/2010CN101689858A Semiconductor device
03/31/2010CN101689405A Systems and methods for adapting parameters to increase throughput during laser-based wafer processing
03/31/2010CN101685677A Flash memory detector and method thereof
03/30/2010US7689891 Method and system for handling stuck bits in cache directories
03/30/2010US7689883 Test control circuit and semiconductor memory device including the same
03/30/2010US7689881 Repair of memory hard failures during normal operation, using ECC and a hard fail identifier circuit
03/30/2010US7689880 Test apparatus, test method, analyzing apparatus and computer readable medium
03/30/2010US7689879 System and method for on-board timing margin testing of memory modules
03/30/2010US7689878 System and method for testing defects in an electronic circuit
03/30/2010US7689877 Method and system using checksums to repair data
03/30/2010US7689876 Real-time optimized testing of semiconductor device
03/30/2010US7688663 Anti-fuse repair control circuit and semiconductor device including DRAM having the same
03/30/2010US7688659 Semiconductor memory capable of testing a failure before programming a fuse circuit and method thereof
03/30/2010US7688657 Apparatus and method for generating test signals after a test mode is completed
03/30/2010US7688656 Integrated circuit memory having dynamically adjustable read margin and method therefor
03/30/2010US7688655 Semiconductor memory device and test method therefor
03/25/2010US20100077268 Apparatus and method for testing setup/hold time
03/25/2010US20100077266 Memory system and control method thereof
03/25/2010US20100074039 Semiconductor memory device and method for testing the same
03/25/2010US20100074031 Test mode signal generator for semiconductor memory and method of generating test mode signals
03/25/2010US20100073987 Semiconductor memory device and driving method of semiconductor memory device
03/25/2010DE102004040962B4 Schaltung und Verfahren zur Kompensation eines Signalversatzes und zugehöriger Speicherbaustein Circuit and method for compensating for a signal offset and the associated memory module
03/24/2010CN101681309A Error correcting method and computing element
03/24/2010CN101677023A Test mode signal generator for semiconductor memory and method of generating test mode signals
03/24/2010CN100595844C Semiconductor memory device
03/23/2010US7685499 XOR circuit, RAID device capable of recovering a plurality of failures and method thereof
03/23/2010US7685498 Digital broadcasting system and digital broadcast transmission and reception method
03/23/2010US7685482 Tap sampling at double rate
03/23/2010US7685481 Bitmap cluster analysis of defects in integrated circuits
03/23/2010US7685480 Content addressable memory having redundant row isolated noise circuit and method of use
03/23/2010US7684276 Techniques for configuring memory systems using accurate operating parameters
03/23/2010US7684269 Semiconductor memory device
03/23/2010US7684268 Semiconductor memory device
03/23/2010US7684266 Serial system for blowing antifuses
03/23/2010US7684265 Redundant cross point switching system and method
03/23/2010CA2447204C Error correction scheme for memory
03/18/2010WO2010029709A1 Testing device, testing method, circuit system, power supply device, power supply evaluation device, and method for emulating power supply environment
03/18/2010WO2010029597A1 Tester and circuit system
03/18/2010US20100070809 Repair bits for a low voltage cache
03/18/2010US20100067312 Semiconductor memory device and system including the same
03/18/2010US20100067294 Semiconductor memory device
03/18/2010DE112007003471T5 Prüfgerät Tester
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