Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
06/2010
06/08/2010US7733720 Method and system for determining element voltage selection control values for a storage device
06/08/2010US7733719 Method and system of analyzing failure in semiconductor integrated circuit device
06/08/2010US7733697 Programmable NAND memory
06/08/2010US7733692 Thin film magnetic memory device capable of conducting stable data read and write operations
06/03/2010WO2010062940A1 Resizable cache memory
06/03/2010WO2010062655A2 Error correction in multiple semiconductor memory units
06/03/2010US20100138705 Standalone data storage device electromagnetic interference test setup and procedure
06/03/2010US20100135093 Operating voltage tuning method for static random access memory
06/03/2010US20100135092 Circuit and method for testing multi-device systems
06/03/2010US20100135091 Semiconductor memory devices having redundancy arrays
06/03/2010US20100133651 Semiconductor structure processing using multiple laterally spaced laser beam spots with joint velocity profiling
06/02/2010EP2192494A1 Method and apparatus for coordinating memory operations among diversely-located memory components
06/02/2010CN1795393B Signal integrity self-test architecture
06/02/2010CN101719383A Method for testing flash memory chips
06/02/2010CN101308702B Data structure suitable for flash memory and data writing and reading method thereof
06/02/2010CN101086899B Method and system for improving reliability of memory device
06/02/2010CN101075482B Semiconductor memory and method for testing the same
06/01/2010US7730384 Method and apparatus for evaluating performance of a read channel
06/01/2010US7730383 Structure and method for detecting errors in a multilevel memory device with improved programming granularity
06/01/2010US7730379 Method and apparatus for error code correction
06/01/2010US7730372 Device and method for testing integrated circuit dice in an integrated circuit module
06/01/2010US7730371 Testing device, testing method, computer program product, and recording medium
06/01/2010US7730370 Apparatus and method for disk read checking
06/01/2010US7730369 Method for performing memory diagnostics using a programmable diagnostic memory module
06/01/2010US7730368 Method, system and computer-readable code for testing of flash memory
06/01/2010US7730001 Computer system program and method to characterize each of a plurality of objects used at runtime to determine a lowest cost property among a plurality of potential alternative properties for each of said objects minimizing total cost of interaction among components during program execution
06/01/2010US7729157 Semiconductor storage device
05/2010
05/27/2010WO2010059255A1 Memory efficient check of raid information
05/27/2010WO2010059173A1 System and method for recovering solid state drive data
05/27/2010WO2010058441A1 Test equipment, test method, and program
05/27/2010WO2010039896A3 Volatile memory elements with soft error upset immunity
05/27/2010US20100131828 System-on-a-chip storing chip data and/or security data and method of processing chip data and/or security data for a device
05/27/2010US20100131827 Memory device with internal signap processing unit
05/27/2010US20100131812 Resizable Cache Memory
05/27/2010US20100131810 System and method for implementing a stride value for memory testing
05/27/2010US20100131809 Apparatus and methods for generating row-specific reading thresholds in flash memory
05/27/2010US20100131808 Method For Testing Memory
05/27/2010US20100128544 Bit line bridge detecting method in semiconductor memory device
05/27/2010US20100128540 Semiconductor memory apparatus and test circuit therefor
05/27/2010US20100128538 Data receiving circuit
05/27/2010DE10132241B4 Verfahren und Vorrichtung zum Testen von Halbleiterbauelementen A method and apparatus for testing semiconductor devices
05/26/2010EP2189986A1 Delay adjustment device, semiconductor device and delay adjustment method
05/26/2010EP2188812A2 Circuit arrangement and method for data processing
05/26/2010CN201489836U Device for manually testing micro USB flash disk
05/26/2010CN1886804B Data retention indicator for magnetic memories
05/26/2010CN1869721B Chip information managing method, chip information managing system, and chip information managing program
05/26/2010CN1856842B Memory device
05/26/2010CN1581360B 逻辑电路和半导体集成电路 A logic circuit and a semiconductor integrated circuit
05/26/2010CN1534783B Semiconductor storage device
05/26/2010CN101714412A Test system for memory and related storage module
05/26/2010CN101714411A Secure memory interface
05/26/2010CN101714399A A memorizer interface and operation method thereof
05/26/2010CN101714398A High performance pulsed storage circuit
05/26/2010CN101714397A Correction of single event upset error within sequential storage circuitry of an integrated circuit
05/25/2010US7725806 Method and infrastructure for recognition of the resources of a defective hardware unit
05/25/2010US7725805 Method and information apparatus for improving data reliability
05/25/2010US7725795 Load generating apparatus and load testing method
05/25/2010US7725789 Apparatus for efficiently loading scan and non-scan memory elements
05/25/2010US7725783 Method and apparatus for repeatable drive strength assessments of high speed memory DIMMs
05/25/2010US7725782 Linked random access memory (RAM) interleaved pattern persistence strategy
05/25/2010US7725781 Repair techniques for memory with multiple redundancy
05/25/2010US7725780 Enabling memory redundancy during testing
05/25/2010US7725778 Semiconductor integrated circuit and electronic device
05/25/2010US7725205 Apparatus and methods for providing a homogenous I/O interface for controlling a heterogenous mixture of hardware I/O systems
05/25/2010US7724592 Internal data comparison for memory testing
05/25/2010US7724591 Semiconductor memory device and local input/output division method
05/25/2010US7724572 Integrated circuit having a non-volatile memory cell transistor as a fuse device
05/20/2010US20100125772 Error correcting controller, flash memory chip system, and error correcting method thereof
05/20/2010US20100125767 Method for testing reliability of solid-state storage medium
05/20/2010US20100125766 Semiconductor integrated circuit and method for controlling semiconductor integrated circuit
05/20/2010US20100125765 Uninitialized memory detection using error correction codes and built-in self test
05/20/2010US20100124133 Replacing defective memory blocks in response to external addresses
05/20/2010US20100124132 Replacing defective columns of memory cells in response to external addresses
05/19/2010CN1979690B Built-in type self-test starting method and system
05/19/2010CN101710237A Equipment production flow using flash memory as storage medium
05/19/2010CN101202115B Method for implementing test mode of embedded non-volatility memory chip
05/19/2010CN101136252B Repair circuitry and method for preventing electrical fuse from being burned during static discharge testing
05/19/2010CN101009141B Semiconductor memory device
05/19/2010CN101004954B Method and apparatus for increasing yield in a memory circuit
05/18/2010USRE41337 Synchronous test mode initialization
05/18/2010US7721182 Soft error protection in individual memory devices
05/18/2010US7721174 Full-speed BIST controller for testing embedded synchronous memories
05/18/2010US7721166 Method for managing defect blocks in non-volatile memory
05/18/2010US7721165 External storage device and memory access control method thereof
05/18/2010US7721164 Method and apparatus for improved storage area network link integrity testing
05/18/2010US7721163 JTAG controlled self-repair after packaging
05/18/2010US7721135 Method of timing calibration using slower data rate pattern
05/18/2010US7719920 Synchronous global controller for enhanced pipelining
05/18/2010US7719908 Memory having read disturb test mode
05/18/2010US7719907 Test circuit for semiconductor memory device
05/13/2010US20100122146 Error correction for flash memory
05/13/2010US20100122131 Semiconductor memory device and testing method therefor
05/13/2010US20100122130 Semiconductor Memory Device Supporting Read Data Bus Inversion Function and Method of Testing the Semiconductor Memory Device
05/13/2010US20100122129 Method for testing storage apparatus and system thereof
05/13/2010US20100122128 Test interface for memory elements
05/13/2010US20100118613 Method of erasing data in flash memory device
05/13/2010US20100118586 Ferroelectric memory
05/12/2010EP2183749A1 Enhanced write abort mechanism for non-volatile memory
05/12/2010EP2183748A1 Daisy-chain memory configuration and usage
05/12/2010DE112008000991T5 Verfahren und Vorrichtung zum Testen eines Seitendecoders Method and apparatus for testing a decoder side
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