| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
|---|
| 05/12/2010 | CN1949396B Repairing circuit in semiconductor memory device |
| 05/12/2010 | CN1870178B Semiconductor device |
| 05/12/2010 | CN1612265B 半导体存储设备 The semiconductor memory device |
| 05/12/2010 | CN1381847B 半导体存储器装置 The semiconductor memory device |
| 05/12/2010 | CN101101795B Non-volatile memory array |
| 05/11/2010 | US7716563 Method and apparatus for the efficient implementation of a totally general convolutional interleaver in DMT-based xDSL systems |
| 05/11/2010 | US7716559 Method for lost packet reconstruction and device for carrying out said method |
| 05/11/2010 | US7716555 Data backup method and memory device |
| 05/11/2010 | US7716542 Programmable memory built-in self-test circuit and clock switching circuit thereof |
| 05/11/2010 | US7716541 Test apparatus and electronic device for generating test signal to a device under test |
| 05/11/2010 | US7716540 Standalone data storage device electromagnetic interference test setup and procedure |
| 05/11/2010 | US7715259 Word line driving circuit and method of testing a word line using the word line driving circuit |
| 05/11/2010 | US7715258 Retention test system and method for resistively switching memory devices |
| 05/11/2010 | US7715243 Storage device employing a flash memory |
| 05/06/2010 | WO2010048711A1 Data mirroring in serial -connected memory system |
| 05/06/2010 | WO2010005791A3 Data collection and compression in a solid state storage device |
| 05/06/2010 | US20100115352 Method for evaluating sram memory cell and computer readable recording medium which records evaluation program of sram memory cell |
| 05/06/2010 | US20100115351 Data storage apparatus, data storage controller, and related automated testing method |
| 05/06/2010 | US20100115217 Data mirroring in serial-connected memory system |
| 05/06/2010 | US20100110812 Semiconductor device |
| 05/06/2010 | US20100110811 Semiconductor memory device |
| 05/06/2010 | US20100110810 Semiconductor memory device and system |
| 05/06/2010 | US20100110809 Semiconductor memory device and system with redundant element |
| 05/06/2010 | US20100110808 Semiconductor memory device and control method thereof |
| 05/06/2010 | US20100110807 Bitline Leakage Detection in Memories |
| 05/06/2010 | US20100110786 Nonvolatile memory device, memory system including the same, and memory test system |
| 05/06/2010 | US20100110745 Switched interface stacked-die memory architecture |
| 05/06/2010 | DE102008053993A1 Portable data carrier i.e. chip card, testing method, involves performing testing of characteristics of data carrier, and utilizing starting time as defined start time point, where starting time lies after event triggering write operation |
| 05/05/2010 | CN1934455B Test device and test method |
| 05/05/2010 | CN1822208B Full-stress testable memory device having an open bit line architecture and method of testing the same |
| 05/05/2010 | CN1771565B Semiconductor memory and operation method of semiconductor memory |
| 05/05/2010 | CN1538459B Semiconductor storage device |
| 05/05/2010 | CN1521760B Film magnetic memory device having programmed element |
| 05/05/2010 | CN101084556B Non-volatile memory and method with improved sensing |
| 05/05/2010 | CN101006520B Non-volatile semiconductor device and method for automatically correcting non-volatile semiconductor device erase operation failure |
| 05/04/2010 | US7712014 Synchronizing clock and aligning signals for testing electronic devices |
| 05/04/2010 | US7711998 Test circuit arrangement |
| 05/04/2010 | US7710801 Circuitry and method for an at-speed scan test |
| 05/04/2010 | US7710764 Semiconductor memory cells with shared p-type well |
| 05/04/2010 | US7710705 Method and apparatus providing final test and trimming for a power supply controller |
| 05/04/2010 | US7710140 Methods and apparatus for testing electronic circuits |
| 04/29/2010 | WO2010047912A1 Method for selectively retrieving column redundancy data in memory device |
| 04/29/2010 | WO2010047870A1 Two-phase clock-stalling technique for error detection and error correction |
| 04/29/2010 | US20100107036 Error correction in multiple semiconductor memory units |
| 04/29/2010 | US20100107022 Bad page marking strategy for fast readout in memory |
| 04/29/2010 | US20100107021 Semiconductor memory device |
| 04/29/2010 | US20100103761 Memory devices having redundant arrays for repair |
| 04/29/2010 | US20100103750 Antifuse replacement determination circuit and method of semiconductor memory device |
| 04/29/2010 | US20100103743 Flash memory device and method of testing the flash memory device |
| 04/29/2010 | US20100103712 Memory test device and methods thereof |
| 04/29/2010 | DE102008011103B4 Vorrichtung und Verfahren zum Testen elektronischer Bauelemente Apparatus and method for testing electronic components |
| 04/29/2010 | DE102006059743B4 Verfahren zum Trimmen eines Parameters eines Halbleiter-Bauelements A method for trimming a parameter of a semiconductor device |
| 04/28/2010 | EP2179421A1 Programmable diagnostic memory module |
| 04/28/2010 | EP2179420A1 Memory device with reduced buffer current during power-down mode |
| 04/28/2010 | CN1846278B Integrated circuit and a method of cache remapping |
| 04/28/2010 | CN1674144B Semiconductor memory device and reading out method for redundancy remedial address |
| 04/28/2010 | CN1670853B Encoding apparatus |
| 04/28/2010 | CN1658171B Faster write operations to nonvolatile memory by manipulation of frequently accessed sectors |
| 04/28/2010 | CN1491417B Programmable switch element and method for programming the transistor to programmable switch |
| 04/27/2010 | US7707484 Test apparatus and test method with features of adjusting phase difference between data and reference clock and acquiring adjusted data |
| 04/27/2010 | US7707481 System and method for efficient uncorrectable error detection in flash memory |
| 04/27/2010 | US7707473 Integrated testing apparatus, systems, and methods |
| 04/27/2010 | US7707472 Method and apparatus for routing efficient built-in self test for on-chip circuit blocks |
| 04/27/2010 | US7707469 Memory test system including semiconductor memory device suitable for testing an on-die termination, and method thereof |
| 04/27/2010 | US7707468 System and method for electronic testing of multiple memory devices |
| 04/27/2010 | US7707467 Input/output compression and pin reduction in an integrated circuit |
| 04/27/2010 | US7707466 Shared latch for memory test/repair and functional operations |
| 04/27/2010 | US7707380 Memories, method of storing data in memory and method of determining memory cell sector quality |
| 04/27/2010 | US7706199 Circuit and method for parallel test of memory device |
| 04/27/2010 | US7706198 Multi-chip and repairing method based on remaining redundancy cells |
| 04/27/2010 | US7706197 Storage device and control method of storage device |
| 04/27/2010 | US7705600 Voltage stress testing of core blocks and regulator transistors |
| 04/22/2010 | WO2010043245A1 Method for backing up an anchor block in flash memories |
| 04/22/2010 | US20100100794 Method and controller for data access in a flash memory |
| 04/22/2010 | US20100097872 Wafer test trigger signal generating circuit of a semiconductor memory apparatus, and a wafer test circuit using the same |
| 04/22/2010 | US20100097871 Redundant memory array for replacing memory sections of main memory |
| 04/22/2010 | US20100097073 Methods And Apparatus For Testing Electronic Circuits |
| 04/22/2010 | DE10020554B4 Halbleiterspeicherbauelement mit Spaltenauswahlschaltung und Aufbauverfahren hierfür A semiconductor memory device comprising column selection circuit structure and method therefor |
| 04/21/2010 | CN1652250B Redundancy relieving circuit |
| 04/21/2010 | CN101697490A Decoding method applied to Reed-Solomon code-based ECC module |
| 04/21/2010 | CN101697285A Method and system for debugging hardware of memory device |
| 04/21/2010 | CN101047021B Method for calibration of memory devices, and apparatus thereof |
| 04/20/2010 | US7703090 Patch un-installation |
| 04/20/2010 | US7702993 Data recording method for optical disk drive |
| 04/20/2010 | US7702989 Systems and methods for generating erasure flags |
| 04/20/2010 | US7702987 Apparatus and method for processing data of an optical disk |
| 04/20/2010 | US7702984 High volume testing for USB electronic data flash cards |
| 04/20/2010 | US7702976 Integration of LBIST into array BISR flow |
| 04/20/2010 | US7702975 Integration of LBIST into array BISR flow |
| 04/20/2010 | US7702974 TAP time division multiplexing with scan test |
| 04/20/2010 | US7702973 Modified defect scan over sync mark/preamble field |
| 04/20/2010 | US7702972 Method and apparatus for SRAM macro sparing in computer chips |
| 04/20/2010 | US7702970 Method and apparatus for deinterleaving interleaved data stream in a communication system |
| 04/20/2010 | US7702969 Methods for the generation of S-random interleavers for turbo decoders with a parallel structure |
| 04/20/2010 | US7702968 Efficient multi-symbol deinterleaver |
| 04/20/2010 | US7702967 Method for monitoring an internal control signal of a memory device and apparatus therefor |
| 04/20/2010 | US7702964 Compression of data traces for an integrated circuit with multiple memories |
| 04/20/2010 | US7702819 External storage subsystem |
| 04/20/2010 | US7701789 Semiconductor device |
| 04/20/2010 | US7701788 Apparatus and method for selectively configuring a memory device using a bi-stable relay |