Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
06/2010
06/30/2010CN101763901A On-wafer self-test and self-repair method
06/29/2010US7747927 Method for adapting a memory system to operate with a legacy host originally designed to operate with a different memory system
06/29/2010US7747926 Methods and apparatus for a memory device with self-healing reference bits
06/29/2010US7747925 Apparatus and method for error correction code striping
06/29/2010US7747924 Method and apparatus for copying copy protected optical discs
06/29/2010US7747915 System and method for improving the yield of integrated circuits containing memory
06/29/2010US7747914 Memory diagnosis test circuit and test method using the same
06/29/2010US7747913 Correcting intermittent errors in data storage structures
06/29/2010US7747912 Semiconductor memory device capable of arbitrarily setting the number of memory cells to be tested and related test method
06/29/2010US7747911 Self verification of non-volatile memory
06/29/2010US7746712 Semiconductor memory device including post package repair control circuit and post package repair method
06/24/2010WO2010070739A1 Method and device for memory cell diagnosis
06/24/2010WO2010069045A1 Error detection method and a system including one or more memory devices
06/24/2010US20100162085 Solid-state storage device including a high resolution analog-to-digital converter
06/24/2010US20100162084 Data error recovery in non-volatile memory
06/24/2010US20100162083 Flash memory controller, error correction code controller therein, and the methods and systems thereof
06/24/2010US20100162057 Method for Detecting Disturb Phenomena between Neighboring Blocks in Non-volatile Memory
06/24/2010US20100162056 Semiconductor device
06/24/2010US20100157704 Semiconductor memory device that can relief defective address
06/24/2010US20100157703 Embedded Memory Repair
06/24/2010US20100157656 Resistance change memory
06/23/2010EP2198430A1 Storage subsystem capable of adjusting ecc settings based on monitored conditions
06/23/2010CN1767053B Semiconductor storage device and method of testing thereof
06/23/2010CN101755307A Refresh of non-volatile memory cells based on fatigue conditions
06/23/2010CN101755305A Analog sensing of memory cells in a solid-state memory device
06/23/2010CN101752013A Testing device
06/23/2010CN101752012A Error correcting controller, flash memory chip system thereof and error correcting method
06/23/2010CN101752011A Data storage method used for multichannel non-volatile solid storage device
06/23/2010CN101752010A Flash memory controller and method for setting the error correction capacity of flesh memory
06/23/2010CN101752009A Adjusting method for operating voltage of SRAM (static random access memory)
06/23/2010CN101752008A Method for testing reliability of solid-state storage media
06/23/2010CN101752007A 数据管理方法 Data management
06/23/2010CN101751981A Method for protecting the safety of storing data in flash memory storing device
06/22/2010US7743308 Method and system for wire-speed parity generation and data rebuild in RAID systems
06/22/2010US7743303 Defective memory block remapping method and system, and memory device and processor-based system using same
06/22/2010US7743302 Compressing test responses using a compactor
06/22/2010US7743293 System-in-package and method of testing thereof
06/22/2010US7743292 Apparatus and method for memory card testing
06/22/2010US7743291 Semiconductor memory device
06/22/2010US7743290 Status of overall health of nonvolatile memory
06/22/2010US7743287 Using SAM in error correcting code encoder and decoder implementations
06/22/2010US7742887 Identifying process and temperature of silicon chips
06/22/2010US7742359 Calibration circuit of a semiconductor memory device and method of operating the same
06/22/2010US7742334 Nonvolatile semiconductor memory device for writing multivalued data
06/17/2010WO2010068591A1 Semiconductor memory device and methods of performing a stress test on the semiconductor memory device
06/17/2010WO2010067847A1 Memory system
06/17/2010WO2010066207A1 Method for self-testing and self-repairing on chip
06/17/2010WO2010066098A1 Method and device for constructing high speed solid state storage disk with larger capacity dram involved in management of flash media
06/17/2010US20100153821 Solid-state memory with error correction coding
06/17/2010US20100153820 Memory with guard value dependent error correction
06/17/2010US20100153794 System and method for on-board timing margin testing of memory modules
06/17/2010US20100153793 Apparatus, methods, and system of nand defect management
06/17/2010US20100149894 Semiconductor memory device that can relief defective address
06/16/2010EP1991990B1 Method and apparatus for testing data steering logic for data storage having independently addressable subunits
06/16/2010CN1862500B System and method for storing data
06/16/2010CN1694180B Multiport memory device
06/16/2010CN101740138A Method and system for testing access time delay of memory
06/16/2010CN101740137A Method for testing memory
06/16/2010CN101740136A High-temperature test system
06/16/2010CN101740135A Error judging circuit and shared memory system
06/16/2010CN101740134A Flash memory dual-mode error correction code device and method thereof
06/16/2010CN101740133A Semiconductor memory device and method for operating the same
06/16/2010CN101740132A Early warning method for life service of solid state disc, solid state disc and early warning system
06/16/2010CN101740123A Data protection method of memory
06/16/2010CN101246742B Electronic device and its data transmission method
06/15/2010US7739698 Multiplatform API usage tool
06/15/2010US7739579 Storage system, control method, and program for enhancing reliability by storing data redundantly encoded
06/15/2010US7739578 Recording and/or reproducing method, recording and/or reproducing apparatus, and computer readable recording medium storing program for performing the method
06/15/2010US7739577 Data protection system
06/15/2010US7739563 Semiconductor integrated circuit and memory test method
06/15/2010US7739560 Nonvolatile semiconductor memory device and method of self-testing the same
06/15/2010US7739559 Semiconductor device and program data redundancy method therefor
06/15/2010US7739557 Method, system and program product for autonomous error recovery for memory devices
06/15/2010US7738293 Apparatus and method of memory programming
06/10/2010WO2010065689A1 System and method of determining memory access time of a memory
06/10/2010WO2010064312A1 Memory device and fault diagnosis method
06/10/2010US20100146229 Interleaver and de-interleaver for iterative code systems
06/10/2010US20100142302 Semiconductor memory device and testing method therefor
06/10/2010US20100142301 Semiconductor memory device and self refresh test method
06/10/2010US20100142300 Semiconductor Memory Device And Methods Of Performing A Stress Test On The Semiconductor Memory Device
06/10/2010US20100142299 Anti-fuse repair control circuit and semiconductor device including dram having the same
06/10/2010US20100142298 Memory compiler redundancy
06/10/2010US20100142289 Nonvolatile semiconductor memory and method for testing the same
06/10/2010US20100142272 Method and apparatus for testing the connectivity of a flash memory chip
06/10/2010US20100142269 Memory employing redundant cell array of multi-bit cells
06/10/2010US20100142251 Memory devices having programmable elements with accurate operating parameters stored thereon
06/10/2010US20100142250 Semiconductor memory and system
06/10/2010DE19823584B4 Halbleiterspeicherbauelement The semiconductor memory device
06/09/2010EP2193523A1 Nonvolatile memory with self recovery
06/09/2010CN1708905B Self-adjusting programmable on-chip clock aligner
06/09/2010CN101727989A NAND FLASH memory chip test system
06/09/2010CN101727366A Computer system for performing remote copy using journal
06/09/2010CN101145402B Flash memory card test method
06/09/2010CN101114530B Method and apparatus for accessing nonvolatile memory with read error by changing access reference current
06/08/2010US7734985 Systems, methods, and apparatuses for using the same memory type to support an error check mode and a non-error check mode
06/08/2010US7734980 Mitigating silent data corruption in a buffered memory module architecture
06/08/2010US7734967 Semiconductor memory device and testing method of the same
06/08/2010US7734966 Method and system for memory testing and test data reporting during memory testing
06/08/2010US7734964 Optical disc recording/reproducing apparatus
06/08/2010US7733751 Verification method and apparatus
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