| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 07/27/2010 | US7765454 Fault tolerant memory system |
| 07/27/2010 | US7765442 Memory device testable without using data and dataless test method |
| 07/27/2010 | US7765441 Methods and systems for detecting symbol erasures |
| 07/27/2010 | US7765080 System for testing smart cards and method for same |
| 07/27/2010 | US7764555 Leakage testing method for dynamic random access memory having a recess gate |
| 07/27/2010 | US7763948 Flexible and elastic dielectric integrated circuit |
| 07/22/2010 | US20100185906 Error correction capability adjustment of ldpc codes for storage device testing |
| 07/22/2010 | US20100185890 Synchronous global controller for enhanced pipelining |
| 07/22/2010 | US20100182859 Method and Apparatus for Testing a Memory Device |
| 07/22/2010 | US20100182857 Tester for semiconductor device and semiconductor device |
| 07/22/2010 | US20100181657 Nonvolatile memory cell comprising a reduced height vertical diode |
| 07/22/2010 | DE102004057819B4 Eingangsschaltung für eine integrierte Schaltung Input circuit for an integrated circuit |
| 07/21/2010 | EP2208203A2 Method and apparatus for testing a memory device |
| 07/21/2010 | CN201532776U FIFO memory control circuit |
| 07/21/2010 | CN101785066A Programmable diagnostic memory module |
| 07/21/2010 | CN101783184A Double data rate 2 (DDR2) memory failure injecting tool and injecting method based on field programmable gate array (FPGA) |
| 07/21/2010 | CN101783183A Current-limiting circuit for testing performance indexes of resistive random access memory (RRAM) |
| 07/21/2010 | CN101783182A Detection circuit and detection device of resistance changing memory |
| 07/21/2010 | CN101783164A Method for accessing flash memory and relevant memory device |
| 07/21/2010 | CN101178941B Method for dynamically estimating memory body characteristic ineffective cause of defect |
| 07/20/2010 | US7761774 High speed CAM lookup using stored encoded key |
| 07/20/2010 | US7761773 Semiconductor device including a unique identifier and error correction code |
| 07/20/2010 | US7761772 Using no-refresh DRAM in error correcting code encoder and decoder implementations |
| 07/20/2010 | US7761771 High reliability memory module with a fault tolerant address and command bus |
| 07/20/2010 | US7761770 Disk controller architecture to allow on-the-fly error correction and write disruption detection |
| 07/20/2010 | US7761754 Techniques for testing memory circuits |
| 07/20/2010 | US7761753 Memory channel with bit lane fail-over |
| 07/20/2010 | US7760600 Method for testing a burner and a rewriter disk |
| 07/20/2010 | US7760566 Semiconductor memory device for preventing supply of excess specific stress item and test method thereof |
| 07/20/2010 | US7760565 Wordline-to-bitline output timing ring oscillator circuit for evaluating storage array performance |
| 07/20/2010 | US7759970 Hardware and software programmable fuses for memory repair |
| 07/15/2010 | US20100180179 Protecting and migrating memory lines |
| 07/15/2010 | US20100180167 Electronic control apparatus |
| 07/15/2010 | US20100177579 Semiconductor memory device having faulty cells |
| 07/15/2010 | DE112007003637T5 System, Weitergabeeinrichtung, Prüfvorrichtung, und Herstellungsverfahren für eine Einheit System, forwarding device, testing device, and manufacturing method of a unit |
| 07/15/2010 | DE112007003602T5 Backup-Reihen-Zuordnungsvorrichtung, Speicher-Reparaturvorrichtung, Backup-Reihen-Zuordnungsverfahren, Speicher-Herstellungsverfahren und Programm Backup rows mapping device, memory repair device, backup series allocation method, memory manufacturing method and program |
| 07/15/2010 | DE102009055390A1 Vorrichtung und Verfahren zum Schreiben von Daten, die zu speichern sind, in einen vorbestimmten Speicherbereich Apparatus and method for writing data to be stored in a predetermined storage area |
| 07/14/2010 | CN201527800U Reliability flash memory device |
| 07/14/2010 | CN1892611B Reducing false positives in configuration error detection for programmable devices |
| 07/14/2010 | CN101777389A System and method for obtaining phase-change memory unit phase-change zone radius |
| 07/14/2010 | CN101777388A Method for obtaining phase-change memory phase-change resistance crystallization rate |
| 07/14/2010 | CN101777387A Redundancy program circuit and methods thereof |
| 07/13/2010 | US7757154 Magnetic disk control apparatus, magnetic disk apparatus, and method of correcting read error |
| 07/13/2010 | US7757153 Multi-bit memory device and memory system |
| 07/13/2010 | US7757152 Data corruption scrubbing for content addressable memory and ternary content addressable memory |
| 07/13/2010 | US7757145 Test method, integrated circuit and test system |
| 07/13/2010 | US7757135 Method and apparatus for storing and distributing memory repair information |
| 07/13/2010 | US7757134 Test apparatus for testing a memory and electronic device housing a circuit |
| 07/13/2010 | US7757133 Built-in self-test hardware and method for generating memory tests with arbitrary address sequences |
| 07/13/2010 | US7757132 Memory with an output register for test data and process for testing a memory and memory module |
| 07/13/2010 | US7757036 Storage control apparatus capable of analyzing volume information and a control method thereof |
| 07/13/2010 | US7755960 Memory including a performance test circuit |
| 07/13/2010 | US7755959 Semiconductor memory device with reduced number of channels for test operation |
| 07/13/2010 | US7755958 Semiconductor memory device and method thereof |
| 07/08/2010 | WO2010076966A2 Memory controller and memory management method |
| 07/08/2010 | WO2010075746A1 Nand flash state detecting device, system, electrical device and method |
| 07/08/2010 | US20100174955 Test and bring-up of an enhanced cascade interconnect memory system |
| 07/08/2010 | US20100172197 Three dimensional structure memory |
| 07/08/2010 | US20100172179 Spare Block Management of Non-Volatile Memories |
| 07/07/2010 | EP2204818A2 Enabling an integrated memory controller to transparently work with defective memory devices |
| 07/07/2010 | CN201522856U Device for carrying out on-line debugging to memory interface circuit |
| 07/07/2010 | CN1945747B Detecting method and system for storage unit |
| 07/07/2010 | CN101772807A ECC functional block placement in a multi-channel mass storage device |
| 07/07/2010 | CN101770817A Multi-interface memory verification system based on FPGA |
| 07/07/2010 | CN101770816A Resistive random access memory (RRAM) unit test system and switcher thereof |
| 07/07/2010 | CN101770815A Circuit and method for correcting skew in a plurality of communication channels for communicating with a memory device |
| 07/07/2010 | CN101770814A Flash memory, test method thereof and test system thereof |
| 07/07/2010 | CN101770813A Detection method for detecting interference phenomenon of adjacent blocks of non-volatile storage |
| 07/07/2010 | CN101770812A On-board test method for memory |
| 07/07/2010 | CN101149976B Internal signal monitoring device in semiconductor memory device and method for monitoring the same |
| 07/07/2010 | CN101055767B Test operation of multi-port memory device |
| 07/06/2010 | US7752527 Microcontroller and RAM |
| 07/06/2010 | US7752526 Nonvolatile memory apparatus and data processing system |
| 07/06/2010 | US7752518 System and method for increasing the extent of built-in self-testing of memory and circuitry |
| 07/06/2010 | US7752510 Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unit |
| 07/06/2010 | US7752509 Recording medium having spare area for defect management and information on defect management, and method of allocating spare area and method of managing defects |
| 07/06/2010 | US7751266 High performance read bypass test for SRAM circuits |
| 07/06/2010 | US7751265 Semiconductor device including a plurality of memory units and method of testing the same |
| 07/01/2010 | WO2010073523A1 Semiconductor integrated circuit |
| 07/01/2010 | US20100169726 Information processing system |
| 07/01/2010 | US20100169725 Memory module tester |
| 07/01/2010 | US20100169705 Backup line allocation apparatus, memory repairing apparatus, backup line allocation method, memory manufacturing method, and recording medium |
| 07/01/2010 | US20100165766 Semiconductor Memory Device |
| 07/01/2010 | US20100165765 Protection register for a non-volatile memory |
| 07/01/2010 | US20100165764 Memory device with reduced current leakage |
| 07/01/2010 | US20100165734 System and method for data recovery in a disabled integrated circuit |
| 07/01/2010 | US20100165717 Write driver circuit of pram |
| 07/01/2010 | US20100163756 Single event upset (SEU) testing system and method |
| 06/30/2010 | EP2202888A1 File download and streaming system |
| 06/30/2010 | EP2202753A1 Information processing system with longevity evaluation |
| 06/30/2010 | EP2201599A2 Reconfigurable connections for stacked semiconductor devices |
| 06/30/2010 | EP2201575A2 Fault diagnosis in a memory bist environment using a linear feedback shift register |
| 06/30/2010 | EP1990805B1 Ram macro and timing generating circuit for same |
| 06/30/2010 | EP1576445B1 Methods and apparatus for improved memory access |
| 06/30/2010 | CN101765889A Backup line assignment device, memory saving device, backup line assignment method, memory manufacturing method, and program |
| 06/30/2010 | CN101763906A Improved VXI bus multi-module carrier plate |
| 06/30/2010 | CN101763905A Method for testing memory bar by measuring pin resistance value of memory bar |
| 06/30/2010 | CN101763904A Nonvolatile memory device and method of operating the same |
| 06/30/2010 | CN101763903A Flash memory controller, error correction code controller therein, and the methods and systems thereof |
| 06/30/2010 | CN101763902A Method and device thereof for measuring storage device |