Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
08/2010
08/19/2010WO2010093441A1 Automatic refresh for improving data retention and endurance characteristics of an embedded non-volatile memory in a standard cmos logic process
08/19/2010WO2010076966A3 Memory controller and memory management method
08/19/2010US20100211837 Semiconductor test system with self-inspection of memory repair analysis
08/19/2010US20100211836 Failure analysis method, failure analysis system, and memory macro system
08/19/2010US20100211835 Method for testing a memory device
08/19/2010US20100211834 Data integrity in memory controllers and methods
08/19/2010US20100208537 Dynamic random access memory (dram) refresh
08/19/2010US20100208536 Structure and Methods for Measuring Margins in an SRAM bit
08/19/2010US20100208510 Semiconductor memory device and method of operating the same
08/18/2010CN1841334B Storage control circuit, and method for address error check in the storage control circuit
08/18/2010CN101809673A Nonvolatile memory with self recovery
08/18/2010CN101807437A Automatic scanning and sorting system and automatic scanning method for flash memories
08/18/2010CN101807428A Memory circuit
08/17/2010US7779335 Enhanced error identification with disk array parity checking
08/17/2010US7779334 Memory having an ECC system
08/17/2010US7779333 Semiconductor memory having embedded microcomputer with ECC function
08/17/2010US7779316 Method of testing memory array at operational speed using scan
08/17/2010US7779315 Semiconductor memory device having a single input terminal to select a buffer and method of testing the same
08/17/2010US7779314 System and related method for chip I/O test
08/17/2010US7779312 Built-in redundancy analyzer and method for redundancy analysis
08/17/2010US7779311 Testing and recovery in a multilayer device
08/17/2010US7779277 Power control for a plurality of internal power supply circuits of a semiconductor integrated circuit
08/17/2010US7778001 Integrated circuit protected against short circuits and operating errors following the passage on an ionizing radiation
08/12/2010WO2010090746A1 Management of over-erasure in nand-based nor-type flash memory
08/12/2010WO2010090390A1 Memory device, memory management device, and memory management method
08/12/2010WO2010062655A3 Error correction in multiple semiconductor memory units
08/12/2010US20100205508 Redundant Data in Storage Medium
08/12/2010US20100205490 Input/output compression and pin reduction in an integrated circuit
08/12/2010US20100205489 Jtag controlled self-repair after packaging
08/12/2010US20100205394 Semiconductor storage device and control method thereof
08/12/2010US20100202228 Nonvolatile semiconductor storage device, nonvolatile semiconductor storage system and method of managing of defective column in nonvolatile semiconductor storage system
08/12/2010US20100202219 Burn-in methods for static random access memories and chips
08/12/2010US20100202203 Data restoration method for a non-volatile memory
08/12/2010US20100202186 Semiconductor memory device, method of manufacturing the same, and method of screening the same
08/11/2010CN1897512B Error correcting apparatus
08/11/2010CN101802923A Enhanced write abort mechanism for non-volatile memory
08/11/2010CN101800084A Data protection method of programmable device based on cyclic redundancy check
08/11/2010CN101290807B Simulating method of circuit stability of static random access memory
08/10/2010USRE41499 High-speed error correcting apparatus with efficient data transfer
08/10/2010US7774685 HDD sector format with reduced vulnerability to defects and burst errors
08/10/2010US7774684 Reliability, availability, and serviceability in a memory device
08/10/2010US7774683 Erasure pointer error correction
08/10/2010US7774682 Processing configuration data frames
08/10/2010US7774681 Data protection system
08/10/2010US7774680 Data protection system
08/10/2010US7774661 Register read mechanism
08/10/2010US7774660 Flexible row redundancy system
08/10/2010US7774576 Direct logical block addressing flash memory mass storage architecture
08/10/2010US7773441 Memory malfunction prediction system and method
08/10/2010US7773437 Design structure for improved memory column redundancy scheme
08/05/2010WO2010066207A8 Method for self-testing and self-repairing on chip
08/05/2010US20100199150 Data Storage In Analog Memory Cell Arrays Having Erase Failures
08/05/2010US20100199148 System and Method for Constructing Multi-Write Error Correcting Code
08/05/2010US20100199146 Storage system, storage controller and method for controlling storage system
08/05/2010US20100199135 Method, system and computer-readable code to test flash memory
08/05/2010US20100199134 Determining sector status in a memory device
08/05/2010US20100195426 Semiconductor memory device and method of testing the same
08/05/2010US20100195425 Semiconductor device, semiconductor package and memory repair method
08/05/2010US20100195424 Semiconductor memory device
08/05/2010US20100195418 Semiconductor memory device and system
08/05/2010US20100195411 Semiconductor memory device and fail bit detection method in semiconductor memory device
08/05/2010US20100195396 Semiconductor memory device and self-test method of the same
08/05/2010US20100195384 System and method to read data subject to a disturb condition
08/05/2010US20100195382 Thin film magnetic memory device capable of conducting stable data read and write operations
08/05/2010US20100195377 Semiconductor memory apparatus and method of testing the same
08/04/2010EP2214317A1 Apparatus and method for channel interleaving in communications system
08/04/2010EP2212889A1 Multiply apparatus for semiconductor test pattern signal
08/04/2010EP2212787A1 Adjustable test pattern results latency
08/04/2010EP2003653B1 Test device and test method
08/04/2010EP1456757B1 Penalty free address decoding scheme
08/04/2010CN101796589A Memory controller self-calibration for removing systemic influence
08/04/2010CN101796497A Memory refresh device and memory refresh method
08/04/2010CN101794625A Memory system, memory test system and method thereof
08/04/2010CN101794624A Failure diagnosis of serial addressing memory module of personable computer mainboard
08/04/2010CN101794623A Error correction device of storage device and method thereof
08/04/2010CN101794622A Data scanning method and device for storage device
08/04/2010CN101794621A Method for manufacturing memory module by using defect list of electrically-erasable programmable read-only memory
08/04/2010CN101794198A Systems and methods for improving the performance of non-volatile memory operations
08/04/2010CN101271419B Random storage failure detecting and processing method, device and system
08/04/2010CN101055768B Semiconductor memory device
08/03/2010US7770082 Semiconductor integrated circuit and test method therefor
08/03/2010US7770080 Using neighborhood functions to extract logical models of physical failures using layout based diagnosis
08/03/2010US7770079 Error scanning in flash memory
08/03/2010US7770077 Using cache that is embedded in a memory hub to replace failed memory cells in a memory subsystem
08/03/2010US7770076 Multi-platter disk drive controller and methods for synchronous redundant data operations
08/03/2010US7768852 Precharge control circuit in semiconductor memory apparatus
08/03/2010US7768850 System for bitcell and column testing in SRAM
08/03/2010US7768849 Semiconductor memory device capable of optimizing signal transmission power and power initializing method thereof
08/03/2010US7768848 On-chip characterization of noise-margins for memory arrays
08/03/2010US7767499 Method to form upward pointing p-i-n diodes having large and uniform current
07/2010
07/29/2010WO2010085647A2 Memory devices and methods for managing error regions
07/29/2010WO2010084539A1 Semiconductor memory
07/29/2010US20100192041 Memory devices and methods for managing error regions
07/29/2010US20100191902 Storage device employing a flash memory
07/29/2010US20100188886 Implementing Enhanced SRAM Stability and Enhanced Chip Yield With Configurable Wordline Voltage Levels
07/28/2010CN101789270A Memory bank test equipment
07/28/2010CN101789269A Data recovery in solid state memory devices
07/28/2010CN101789268A Memory device and operation method thereof
07/28/2010CN101789267A Measuring method of intrinsic threshold voltage of nonvolatile memory
07/27/2010US7765455 Semiconductor memory device
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