Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2010
12/07/2010US7849383 Systems and methods for reading nonvolatile memory using multiple reading schemes
12/07/2010US7849382 Memory control circuit, nonvolatile storage apparatus, and memory control method
12/07/2010US7849381 Method for copying data in reprogrammable non-volatile memory
12/07/2010US7849373 Method of testing a memory module and hub of the memory module
12/07/2010US7849372 Write-once recording medium and defective area management method and apparatus for write-once recording medium
12/07/2010US7848165 Methods of operating phase-change random access memory devices
12/02/2010US20100306626 Methods of data handling
12/02/2010US20100306622 Memory system and data transfer method
12/02/2010US20100306605 Apparatus and Method for Manufacturing a Multiple-Chip Memory Device
12/02/2010US20100306604 Method and circuit for brownout detection in a memory system
12/02/2010US20100306582 Method of operating nonvolatile memory device
12/02/2010US20100302888 Dynamic random access memory device and inspection method thereof
12/02/2010US20100302887 Semiconductor device
12/02/2010US20100302866 Method of testing for a leakage current between bit lines of nonvolatile memory device
12/02/2010US20100302841 Phase change memory apparatus and test circuit therefor
12/02/2010US20100302833 Semiconductor device having nonvolatile memory element and manufacturing method thereof
12/02/2010US20100302828 Addressing circuit of semiconductor memory device and addressing method therefor
12/01/2010CN101903956A Self-timed error correcting code evaluation system and method
12/01/2010CN101901634A USB memory testing sorter
12/01/2010CN101901633A Production scheme for mobile storage device
12/01/2010CN101901632A Monitoring circuit and monitoring method for monitoring voltage of bit line
12/01/2010CN101901631A Phase change memory apparatus and test circuit therefor
12/01/2010CN101901629A Nonvolatile memory protecting system and method
12/01/2010CN101901589A Image processing system and sampling phase correction method of memory device
11/2010
11/30/2010US7844888 Electronic device, method for operating an electronic device, memory circuit and method of operating a memory circuit
11/30/2010US7844880 Error correction for flash memory
11/30/2010US7844879 Method and system for error correction in flash memory
11/30/2010US7844878 Dynamic electronic correction code feedback to extend memory device lifetime
11/30/2010US7844868 System and method for implementing a stride value for memory testing
11/30/2010US7844867 Combined processor access and built in self test in hierarchical memory systems
11/30/2010US7843748 Test apparatus of semiconductor integrated circuit and method using the same
11/30/2010US7843747 System and method for better testability of OTP memory
11/30/2010US7843746 Method and device for redundancy replacement in semiconductor devices using a multiplexer
11/25/2010US20100299577 Intersymbol interference encoding in a solid state drive
11/25/2010US20100296353 Semiconductor device
11/25/2010US20100296352 Memory controller for detecting read latency, memory system and test system having the same
11/25/2010US20100296339 Nonvolatile semiconductor memory device having protection function for each memory block
11/25/2010US20100296329 Differential Plate Line Screen Test for Ferroelectric Latch Circuits
11/24/2010EP2253965A2 Method and system to measure and represent the measured value of a limit in terms of another measurement in a signal measurement system
11/24/2010EP2253015A1 An integrated circuit with a memory matrix with a delay monitoring column
11/24/2010EP2252998A1 Methods for making a stack of memory circuits and for addressing a memory circuit, and corresponding stack and device
11/24/2010CN201655340U Heating device for memory chip test device
11/24/2010CN201655339U Memory detection equipment
11/24/2010CN201655338U Insert-pull device for memory bar detection equipment
11/24/2010CN201655337U FPGA debugging circuit and TV set with the same
11/24/2010CN201655336U Serial flash debugging circuit based on FPGA and television set with same
11/24/2010CN201655335U Chip identification device and system thereof
11/24/2010CN101896978A Forward error correction of an error acknowledgement command protocol
11/24/2010CN101894591A Linear feedback shift register (LFSR)-based random test device for external storage interface
11/24/2010CN101894590A Coding and decoding method, device and equipment for storage data error correction
11/24/2010CN101894585A Non-volatile semiconductor memory circuit with improved resistance distribution
11/23/2010US7840878 Systems and methods for data-path protection
11/23/2010US7840877 Mass storage system and method
11/23/2010US7840876 Power savings for memory with error correction mode
11/23/2010US7840875 Convolutional coding methods for nonvolatile memory
11/23/2010US7840870 Apparatus for accessing and transferring optical data
11/23/2010US7840867 Iterative n-dimensional decoding
11/23/2010US7840860 Double DRAM bit steering for multiple error corrections
11/23/2010US7839709 Semiconductor memory device having I/O unit
11/23/2010US7839708 Semiconductor apparatus and testing method using different internal voltages to output binary signals
11/23/2010US7839707 Fuses for memory repair
11/23/2010US7839685 Soft errors handling in EEPROM devices
11/18/2010US20100293420 Cache coherent support for flash in a memory hierarchy
11/18/2010US20100293418 Memory device, data transfer control device, data transfer method, and computer program product
11/18/2010US20100293324 Direct logical block addressing flash memory mass storage architecture
11/18/2010US20100290299 Semiconductor chip and method of repair design of the same
11/18/2010US20100290298 Fuse circuit and redundancy circuit
11/18/2010US20100290297 Semiconductor Memory Device
11/18/2010US20100290296 Semiconductor memory device
11/18/2010US20100290288 Nonvolatile memory device and method of testing the same
11/18/2010US20100288996 Memory arrays including memory levels that share conductors, and methods of forming such memory arrays
11/18/2010DE102005042790B4 Integrierte Schaltungsanordnung und Verfahren zum Betrieb einer solchen Integrated circuit arrangement and method for operating such a
11/18/2010CA2708593A1 Redundancy system for non-volatile memory
11/17/2010EP2003652B1 Semiconductor memory and test system
11/17/2010CN101887760A Fuse circuit and redundancy circuit
11/17/2010CN101887759A Disabling faulty flash memory dies
11/17/2010CN101887758A Emulation verification method of nonvolatile memory
11/16/2010US7836380 Destination indication to aid in posted write buffer loading
11/16/2010US7836379 Method for computing buffer ECC
11/16/2010US7836378 System to detect and identify errors in control information, read data and/or write data
11/16/2010US7836377 Semiconductor memory device
11/16/2010US7836376 Method and apparatus for encoding blocks of data with a blocks oriented code and for decoding such blocks with a controllable latency decoding, in particular for a wireless communication system of the WLAN or WPAN type
11/16/2010US7836374 Memory controller method and system compensating for memory cell data losses
11/16/2010US7836372 Memory controller with loopback test interface
11/16/2010US7836364 Circuits, architectures, apparatuses, systems, methods, algorithms, software and firmware for using reserved cells to indicate defect positions
11/16/2010US7836362 Circuits and methods for repairing defects in memory devices
11/16/2010US7835206 Semiconductor memory device capable of relieving defective bits found after packaging
11/11/2010WO2010129127A2 A runtime programmable bist for testing a multi-port memory device
11/11/2010WO2010128068A1 Method for protecting electronic circuits, and device and system implementing the method
11/11/2010US20100287426 Memory checking system and method
11/11/2010US20100287425 Method for testing a memory device, as well as a control device having means for testing a memory
11/11/2010US20100284234 Memory control method and memory control device
11/11/2010US20100284233 Semiconductor memory device
11/11/2010US20100284218 Superlattice device, manufacturing method thereof, solid-state memory including superlattice device, data processing system, and data processing device
11/11/2010DE10300532B4 System mit mindestens einer Test-Sockel-Vorrichtung zum Testen von Halbleiter-Bauelementen System with at least one test-socket device for testing of semiconductor devices
11/11/2010DE10233642B4 Fehlerkorrektur-Kodierung und -Dekodierung in einer Festkörper-Speicherungsvorrichtung Error correction encoding and decoding in a solid state storage device
11/11/2010DE102009002786A1 Verfahren zum Test eines Speichers sowie Steuervorrichtung mit Mitteln für einen Speichertest A method of testing a memory and control apparatus having means for a memory test
11/11/2010DE102004025975B4 Phasenänderungsspeicherbauelement und Programmierverfahren Phase change memory device and programming method
11/10/2010EP2248264A1 Chien search device and chien search method
11/10/2010EP2248028A1 Semiconductor storage device, method of controlling the same, and error correction system
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