Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
01/2011
01/05/2011CN101937724A Method for performing copy back operations and flash storage device
01/05/2011CN101937723A Semiconductor integrated circuit and method of saving and recovering its internal state
01/05/2011CN101937722A Memory device and relevant test method thereof
01/05/2011CN101937721A Method for testing memory device
01/05/2011CN101937720A Test system of high-speed dynamic random access memory
01/05/2011CN101937719A Method and apparatus for dealing with write errors when writing information data into flash memory devices
01/05/2011CN101937710A Method for managing device and solid state disk drive utilizing the same
01/04/2011US7865805 Multiple bit upset insensitive error detection and correction circuit for field programmable gate array based on static random access memory blocks
01/04/2011US7865804 System and method for enhanced error detection in memory peripherals
01/04/2011US7865788 Dynamic mask memory for serial scan testing
01/04/2011US7865787 Testing embedded circuits with the aid of a separate supply voltage
01/04/2011US7865786 Scanned memory testing of multi-port memory arrays
01/04/2011US7864890 Signal processing apparatus, signal processing method and storage system
01/04/2011US7864606 Method, device and system for regulating access to an integrated circuit (IC) device
01/04/2011US7864578 Semiconductor memory repairing a defective bit and semiconductor memory system
01/04/2011CA2280165C Occupancy sensor and method of operating same
12/2010
12/30/2010US20100332952 Flash Memory Controller and the Method Thereof
12/30/2010US20100332949 System and method of tracking error data within a storage device
12/30/2010US20100332942 Memory controller for NAND memory using forward error correction
12/30/2010US20100332926 Apparatus for formatting information storage medium
12/30/2010US20100332925 Semiconductor memory apparatus and method of testing the same
12/30/2010US20100332924 At-speed scan testing of memory arrays
12/30/2010US20100332922 Method for managing device and solid state disk drive utilizing the same
12/30/2010US20100332921 Fast data eye retraining for a memory
12/30/2010US20100332862 Systems, methods and devices for power control in memory devices storing sensitive data
12/30/2010US20100329055 Measuring electrical resistance
12/30/2010US20100329054 Memory Built-In Self-Characterization
12/30/2010US20100329053 Semiconductor memory device having a redundancy area
12/30/2010US20100329052 Word line defect detecting device and method thereof
12/30/2010US20100328985 Semiconductor device having plural circuit blocks laid out in a matrix form
12/29/2010EP2266116A2 Systems, methods, and apparatuses to save memory self-refresh power
12/29/2010CN101933098A Fault diagnosis in a memory bist environment using a linear feedback shift register
12/29/2010CN101931415A Encoding device and method, decoding device and method as well as error correction system
12/29/2010CN101930799A Non-volatile memory with error checking/correcting circuit and methods thereof for reading and writing data
12/29/2010CN101477492B Circulating rewriting flash memory equalization method used for solid state disk
12/28/2010US7861143 Method of data storage by encoding bit stream on surface
12/28/2010US7861142 Information recording disc, recording and/or reproducing device and method
12/28/2010US7861141 Method and device for error analysis of optical disc
12/28/2010US7861140 Memory system including asymmetric high-speed differential memory interconnect
12/28/2010US7861139 Programming management data for NAND memories
12/28/2010US7861138 Error correction in memory devices
12/28/2010US7859925 Anti-fuse latch self-test circuit and method
12/28/2010US7859924 Apparatus for controlling test mode of semiconductor memory
12/28/2010US7859923 Semiconductor memory device
12/28/2010US7859293 Semiconductor integrated circuit
12/23/2010WO2010148251A1 Static noise margin estimation
12/23/2010WO2010147827A1 Multi-bank non-volatile memory system with satellite file system
12/23/2010WO2010147246A1 Memory device and error control codes decoding method
12/23/2010WO2010146640A1 Semiconductor integrated circuit device and electronic equipment
12/23/2010WO2010115726A3 Analyzing monitor data information from memory devices having finite endurance and/or retention
12/23/2010US20100325522 Storage device, storage control device, data transfer intergrated circuit, and storage control method
12/23/2010US20100325497 Using fractional sectors for mapping defects in disk drives
12/23/2010US20100325478 Disk controller and disk control method
12/23/2010US20100324854 Memory-daughter-card-testing method and apparatus
12/23/2010US20100322024 Semiconductor memory, system, operating method of semiconductor memory, and manufacturing method of semiconductor memory
12/23/2010US20100322023 Semiconductor device and semiconductor device test method
12/22/2010EP2264714A1 Unit cell of nonvolatile memory device and nonvolatile memory device with the same
12/22/2010EP2179421B1 Programmable diagnostic memory module
12/22/2010CN1692452B Semiconductor device and method of controlling the semiconductor device
12/22/2010CN101925963A Adapting word line pulse widths in memory systems
12/22/2010CN101924299A One-touch popping device of memory module test socket
12/22/2010CN101923903A Method for detecting a fault-injection attack of a memory device and corresponding memory device
12/22/2010CN101923902A Error correcting codes for increased storage capacity in multilevel memory devices
12/22/2010CN101923897A Semiconductor integrated circuit and testing method for the same
12/22/2010CN101923512A Two-layer and three-layer flash-memory devices, intelligent storage switch and two-layer and three-layer controllers
12/22/2010CN101393776B Method for prolonging life of multi-layered unit flash memory
12/21/2010US7856588 Data allocation in memory chips
12/16/2010US20100318887 Data verification using checksum sidefile
12/16/2010US20100315887 Semiconductor memory device having physically shared data path and test device for the same
12/16/2010US20100315867 Solid-state memory device, data processing system, and data processing device
12/15/2010EP1262996B1 Semiconductor integrated circuit device
12/15/2010CN101916593A Memory test system
12/15/2010CN101916591A 半导体集成电路器件 The semiconductor integrated circuit device
12/15/2010CN101436435B Electrical fuse self test and repair
12/15/2010CN101388254B Storage device test method
12/15/2010CN101377958B Method for monitoring flash memory wiping/writing performance
12/14/2010US7853842 Semiconductor memory device with ZQ calibration
12/14/2010US7853841 Memory cell programming
12/14/2010US7853840 Semiconductor memory device and methods thereof
12/14/2010US7853838 Method and apparatus for handling failure in address line
12/14/2010US7853837 Memory controller and method for operating a memory controller having an integrated bit error rate circuit
12/14/2010US7852701 Circuits for and methods of determining a period of time during which a device was without power
12/14/2010US7852692 Memory operation testing
12/14/2010US7852691 Semiconductor memory device using dynamic data shift redundancy system and method of relieving failed area using same system
12/09/2010US20100313086 Test apparatus and test method
12/09/2010US20100313085 Semiconductor memory device, memory test method and computer program for designing program of semiconductor memory device
12/09/2010US20100309739 Semiconductor memory apparatus and probe test control circuit therefor
12/09/2010US20100309738 Semiconductor memory apparatus and test method thereof
12/09/2010US20100309707 Pcb circuit modification from multiple to individual chip enable signals
12/09/2010DE102010018766A1 Speichervorrichtung und Programmiersystem Memory device and programming system
12/08/2010CN1901093B Redundancy selector circuit for use in non-volatile memory device
12/08/2010CN1700356B Semiconductor memory
12/08/2010CN101911210A Multiply apparatus for semiconductor test partern signal
12/08/2010CN101908383A Test apparatus and test method
12/08/2010CN101908382A Data classification analyzing method and device for chip failure
12/08/2010CN101908379A Adjusting access of non-volatile semiconductor memory based on access time
12/08/2010CN101425342B Access method for NAND Flash redundant code
12/08/2010CN101156129B Method and system for storing logical data blocks into flash-blocks in multiple non-volatile memories which are connected to at least one common data I/O bus
12/08/2010CN101136253B Test method for semiconductor memory device and semiconductor memory device therefor
12/07/2010USRE41992 Methods and circuitry for built-in self-testing of content addressable memories
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