| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 04/07/2011 | DE102004047330B4 Integrierter Halbleiterspeicher Integrated semiconductor memory |
| 04/06/2011 | EP2306462A1 Semiconductor memory device and its early-warning system and method |
| 04/06/2011 | EP2306321A1 Increasing memory performance in flash memory devices by performing simultaneous write operation to multiple devices |
| 04/06/2011 | CN102007546A Three-terminal multiple-time programmable memory bitcell and array architecture |
| 04/06/2011 | CN102005251A Method for testing a memory |
| 04/06/2011 | CN102005250A Quasi-cyclic low-density parity check code decoder and decoding method |
| 04/06/2011 | CN101339812B Storage apparatus test apparatus |
| 04/06/2011 | CN101308707B Sorting machine for memory IC detection |
| 04/06/2011 | CN101236791B Method, circuit and apparatus for multi-segment SRAM |
| 04/05/2011 | US7921341 System and method for reproducing memory error |
| 04/05/2011 | US7921340 Nonvolatile memory device, nonvolatile memory system, and defect management method for nonvolatile memory device |
| 04/05/2011 | US7920438 Semiconductor memory device having the operating voltage of the memory cell controlled |
| 04/05/2011 | CA2532766C Data storage array |
| 03/31/2011 | WO2011036817A1 Magnetic memory |
| 03/31/2011 | US20110078521 Transition fault testing for a von-volatile memory |
| 03/31/2011 | US20110075498 Semiconductor memory apparatus and test method using the same |
| 03/30/2011 | EP2301038A1 Programmable memory repair scheme |
| 03/30/2011 | EP2300909A1 Secure random number generator |
| 03/30/2011 | CN1637930B Storage circuit, semiconductor device, and electronic apparatus |
| 03/30/2011 | CN101996689A Memory errors processing method |
| 03/30/2011 | CN101996688A Method for controlling flash memory applying variable error correction code capacity |
| 03/30/2011 | CN101996687A Built-in system test method of multiple static random access memory (SRAM) based on scanning test |
| 03/30/2011 | CN101996686A Data storage device and method for writing test data into memory |
| 03/30/2011 | CN101996685A Error control method of storage management data and error controller |
| 03/30/2011 | CN101458963B Off-line copy method for E2PROM |
| 03/30/2011 | CN101419844B Flash memory simulating device and main control module evaluation method for the flash |
| 03/30/2011 | CN101419834B Average abrasion method and controller using the method |
| 03/30/2011 | CN101095060B Adaptive memory calibration using bins |
| 03/29/2011 | US7917831 Optimization of storage device accesses in RAID systems |
| 03/29/2011 | US7916826 Diagnostic method and apparatus for non-destructively observing latch data |
| 03/29/2011 | US7916564 Multi-chip semiconductor device providing enhanced redundancy capabilities |
| 03/24/2011 | US20110072333 Control method for flash memory based on variable length ecc |
| 03/24/2011 | US20110072323 Supporting scan functions within memories |
| 03/24/2011 | US20110072209 Processing Diagnostic Requests for Direct Block Access Storage Devices |
| 03/23/2011 | EP2297742A1 Apparatus, system, and method for detecting and replacing failed data storage |
| 03/23/2011 | EP2297741A1 Memory efficient check of raid information |
| 03/23/2011 | CN1542841B Memory circuit and its writing-in method |
| 03/23/2011 | CN101989709A One-touch clamp for testing internal memory module |
| 03/23/2011 | CN101989466A Device and method for data interception and time sequence drifting detection of interface of synchronous dynamic random access memory |
| 03/23/2011 | CN101989465A Circuit and method for solving pressureproof problem during using of testing Pad |
| 03/23/2011 | CN101989464A Memory test method and external tester |
| 03/23/2011 | CN101430935B Detection method for over-erasing memory unit in flash memory |
| 03/23/2011 | CN101414482B Error detection method and system for CDRW |
| 03/22/2011 | US7913148 Disk controller methods and apparatus with improved striping, redundancy operations and interfaces |
| 03/22/2011 | US7913147 Method and apparatus for scrubbing memory |
| 03/22/2011 | US7913139 Semiconductor device |
| 03/22/2011 | US7913130 Multi-sample read circuit having test mode of operation |
| 03/22/2011 | US7913129 Method of testing data paths in an electronic circuit |
| 03/22/2011 | US7913126 Semiconductor memory device and method of testing same |
| 03/22/2011 | US7913125 BISR mode to test the redundant elements and regular functional memory to avoid test escapes |
| 03/22/2011 | US7913122 System and method for on-board diagnostics of memory modules |
| 03/22/2011 | US7913061 Non-volatile memory and method with memory planes alignment |
| 03/22/2011 | US7911012 Flexible and elastic dielectric integrated circuit |
| 03/22/2011 | US7910398 Phase-change memory device and method of manufacturing the same |
| 03/17/2011 | WO2011030410A1 Memory device |
| 03/17/2011 | US20110066903 Dynamic random access memory having internal built-in self-test with initialization |
| 03/17/2011 | US20110066902 System and method of reading data using a reliability measure |
| 03/17/2011 | US20110066900 Non-volatile memory device and programming method thereof |
| 03/17/2011 | US20110063919 Memory kink checking |
| 03/17/2011 | US20110063918 Identifying at-risk data in non-volatile storage |
| 03/17/2011 | US20110063909 Nonvolatile semiconductor memory and method of testing the same |
| 03/17/2011 | US20110063886 Semiconductor memory device and driving method of the same |
| 03/16/2011 | EP2296152A1 Semiconductor device having test circuit |
| 03/16/2011 | EP2294581A1 A system for distributing available memory resource |
| 03/16/2011 | EP2294580A1 Memory system with redundant data storage and error correction |
| 03/16/2011 | EP1924914B1 Data processing system and a method for the operation thereof |
| 03/15/2011 | US7908535 Scan testable register file |
| 03/15/2011 | US7908530 Memory module and on-line build-in self-test method thereof for enhancing memory system reliability |
| 03/15/2011 | US7908529 Flash memory |
| 03/15/2011 | US7908527 Semiconductor integrated circuit and redundancy method thereof |
| 03/15/2011 | US7908435 Disk controller providing for the auto-transfer of host-requested-data from a cache memory within a disk memory system |
| 03/15/2011 | US7908427 Non-volatile memory devices and control and operation thereof |
| 03/15/2011 | US7908426 Moving sectors within a block of information in a flash memory mass storage architecture |
| 03/15/2011 | US7907460 Error detection on programmable logic resources |
| 03/10/2011 | WO2011028798A1 Flexible word-line pulsing for stt-mram |
| 03/10/2011 | WO2011028235A1 Methods, devices, and systems for dealing with threshold voltage change in memory devices |
| 03/10/2011 | US20110060967 Systems and Methods for Re-Designating Memory Regions as Error Code Corrected Memory Regions |
| 03/10/2011 | US20110060961 Memory controller method and system compensating for memory cell data losses |
| 03/10/2011 | US20110060952 Semiconductor integrated circuit |
| 03/10/2011 | US20110058434 Semiconductor integrated circuit |
| 03/09/2011 | EP2293196A1 Non-volatile memory and method with non-sequential update block management |
| 03/09/2011 | EP2291667A1 Method and apparatus for securing digital information on an integrated circuit during test operating modes |
| 03/08/2011 | USRE42202 Circuit for controlling an enabling time of an internal control signal according to an operating frequency of a memory device and the method thereof |
| 03/08/2011 | US7904791 Information recording medium to which extra ECC is applied, and method and apparatus for managing the information recording medium |
| 03/08/2011 | US7904790 Flash memory device error correction code controllers and related methods and memory systems |
| 03/08/2011 | US7904789 Techniques for detecting and correcting errors in a memory device |
| 03/08/2011 | US7904786 Assisted memory system |
| 03/08/2011 | US7904783 Soft-input soft-output decoder for nonvolatile memory |
| 03/08/2011 | US7904767 Semiconductor memory testing device and method of testing semiconductor using the same |
| 03/08/2011 | US7904766 Statistical yield of a system-on-a-chip |
| 03/08/2011 | US7904765 Test apparatus and test method |
| 03/08/2011 | US7904764 Memory lifetime gauging system, method and computer program product |
| 03/08/2011 | US7904761 Method and apparatus for a discrete power series generator |
| 03/08/2011 | US7904635 Power cut data recovery and data management method for flash media |
| 03/08/2011 | US7903485 Integrated circuits and methods to compensate for defective non-volatile embedded memory in one or more layers of vertically stacked non-volatile embedded memory |
| 03/08/2011 | US7903483 Integrated circuit having memory with configurable read/write operations and method therefor |
| 03/08/2011 | US7903482 Semiconductor storage device and memory cell test method |
| 03/08/2011 | US7902853 Semiconductor device, semiconductor device testing method, and probe card |
| 03/03/2011 | US20110055647 Processor |
| 03/03/2011 | US20110055646 Fault diagnosis in a memory bist environment |