| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 05/12/2011 | DE102004025977B4 Flash-Speicherbaustein Flash memory device |
| 05/11/2011 | EP2319044A2 Memory system and method using stacked memory device dice, and system using the memory system |
| 05/11/2011 | CN201829197U Upright type test equipment for electronic assemblies |
| 05/11/2011 | CN1519573B Integrated circuit device including scan test circuit and methods of testing same |
| 05/11/2011 | CN102057442A Selectively performing a single cycle write operation with ECC in a data processing system |
| 05/11/2011 | CN102054536A Device for testing DP (Dual Port) SRAM (Static Random Access Memory) by utilizing ALPG tester |
| 05/11/2011 | CN102053886A Memory detection method under non uniform memory access environment |
| 05/11/2011 | CN101471132B Search performance test method and system for content-addressing memory |
| 05/11/2011 | CN101174472B Screening method for defected memory cell |
| 05/10/2011 | US7941729 Data storage device and error processing method in its read processing |
| 05/10/2011 | US7941714 Parallel bit test apparatus and parallel bit test method capable of reducing test time |
| 05/10/2011 | US7941713 Programmable self-test for random access memories |
| 05/10/2011 | US7941712 Method for error test, recordation and repair |
| 05/10/2011 | US7940593 Method and apparatus for verification of a gate oxide fuse element |
| 05/10/2011 | US7940587 Semiconductor memory device and test method thereof |
| 05/10/2011 | US7940586 Semiconductor memory device |
| 05/10/2011 | US7940585 Multi-column decoder stress test circuit |
| 05/10/2011 | US7940583 Semiconductor memory device, control method therefor, and method for determining repair possibility of defective address |
| 05/10/2011 | US7940582 Integrated circuit that stores defective memory cell addresses |
| 05/05/2011 | US20110107161 Threshold voltage techniques for detecting an imminent read failure in a memory array |
| 05/05/2011 | US20110107160 Time-based techniques for detecting an imminent read failure in a memory array |
| 05/05/2011 | US20110103165 Self-refresh test circuit of semiconductor memory apparatus |
| 05/05/2011 | US20110103164 Semiconductor memory device and method for performing data compression test of the same |
| 05/05/2011 | US20110103163 Multi-bit test control circuit |
| 05/05/2011 | DE112004002678B4 Elektrisch programmierbares 2-Transistoren-Sicherungselement mit einfacher Polysiliziumschicht und elektrisch programmierbare Transistor-Sicherungszelle Electrically programmable 2-transistor fuse element with simple polysilicon layer and electrically programmable fuse transistor cell |
| 05/04/2011 | CN1637952B Data strobe circuit using clock signal |
| 05/04/2011 | CN101286356B Non-volatile memorizer process fluctuation control method |
| 05/04/2011 | CN101169975B Memory test method |
| 05/03/2011 | US7937737 Field qualification of disk drives in consumer electronics devices |
| 05/03/2011 | US7937647 Error-detecting and correcting FPGA architecture |
| 05/03/2011 | US7937646 Reading method and apparatus for an information recording medium and spare area allocation thereof |
| 05/03/2011 | US7937645 Semiconductor memory |
| 05/03/2011 | US7937633 Semiconductor device using logic chip |
| 05/03/2011 | US7937632 Design structure and apparatus for a robust embedded interface |
| 05/03/2011 | US7937631 Method for self-test and self-repair in a multi-chip package environment |
| 05/03/2011 | US7937630 Semiconductor memory and method for testing the same |
| 05/03/2011 | US7937629 Semiconductor memory apparatus having noise generating block and method of testing the same |
| 05/03/2011 | US7937628 Method and system for a non-volatile memory with multiple bits error correction and detection for improving production yield |
| 05/03/2011 | US7936623 Universal structure for memory cell characterization |
| 05/03/2011 | US7936622 Defective bit scheme for multi-layer integrated memory device |
| 05/03/2011 | US7936589 Adaptive voltage control for SRAM |
| 04/28/2011 | WO2011019794A3 Method and apparatus for addressing actual or predicted failures in a flash-based storage system |
| 04/28/2011 | US20110099460 Non-Volatile Memory And Method With Post-Write Read And Adaptive Re-Write To Manage Errors |
| 04/28/2011 | US20110099438 Methods of Cell Population Distribution Assisted Read Margining |
| 04/28/2011 | US20110099417 Memory Device and Method for Repairing a Semiconductor Memory |
| 04/28/2011 | US20110096615 Memory devices having redundant arrays for repair |
| 04/28/2011 | DE10341537B4 Halbleiterspeichervorrichtung und Testverfahren desselben unter Verwendung eines Zeilenkomprimierungstestmodus A semiconductor memory device and test method thereof using a row compression test mode |
| 04/28/2011 | DE102010037290A1 Speichersysteme und Verfahren zur Erfassung einer Verteilung von instabilen Speicherzellen Memory systems and methods for detecting a distribution of memory cells unstable |
| 04/28/2011 | DE102006039473B4 Datenspeichersystem und Verfahren zum Übertragen von Daten in einen Datenspeicher The data storage system and method for transferring data in a data memory |
| 04/28/2011 | DE102006027381B4 Integrierte Speichervorrichtung, Verfahren zum Testen einer integrierten Speichervorrichtung und eine elektronische Komponente Integrated memory device, method for testing an integrated storage device and an electronic component |
| 04/28/2011 | DE102004025422B4 Resistiver Kreuzpunktspeicher Resistive cross point memory |
| 04/27/2011 | CN102034556A Scan chain-based method for testing memory |
| 04/27/2011 | CN102034555A On-line error correcting device for fault by parity check code and method thereof |
| 04/27/2011 | CN102034554A Method for enhancing chip burn-in scanning efficiency |
| 04/27/2011 | CN102034552A Memory device and data processing method applied by same |
| 04/27/2011 | CN102034551A Efuse devices, correction methods thereof, and methods for operating efuse devices |
| 04/27/2011 | CN102034545A Nonvolatile memory with page copy capability and method thereof |
| 04/27/2011 | CN102033160A Silicon wafer-level frequency testing method |
| 04/26/2011 | US7934250 Method and apparatus for using performance and stress testing on computing devices for device authentication |
| 04/26/2011 | US7934143 Parity insertion for inner architecture |
| 04/26/2011 | US7934133 Detector of abnormal destruction of memory sectors |
| 04/26/2011 | US7933159 Semiconductor memory device and system with redundant element |
| 04/26/2011 | US7933158 Nonvolatile memory |
| 04/21/2011 | WO2011019602A3 Controller and method for providing read status and spare block management information in a flash memory system |
| 04/21/2011 | US20110090751 Systems and methods for efficiently repairing dynamic random-access memory having marginally failing cells |
| 04/21/2011 | US20110090605 Semiconductor integrated circuit |
| 04/20/2011 | EP2311043A2 Method and apparatus for repairing high capacity/high bandwidth memory devices |
| 04/20/2011 | CN102027549A Testing a memory device having field effect transistors subject to threshold voltage shifts caused by bias temperature instability |
| 04/20/2011 | CN102027548A Non-volatile multilevel memory with adaptive setting of reference voltage levels for program, verify and read |
| 04/20/2011 | CN102024502A Flash device testing method and device as well as board and network equipment |
| 04/20/2011 | CN102024501A Memory system and control method for the same |
| 04/20/2011 | CN102024497A Method for storing data and storage device |
| 04/19/2011 | US7930615 Memory device with error correction capability and preemptive partial word write operation |
| 04/19/2011 | US7930612 Error detection and correction scheme for a memory device |
| 04/19/2011 | US7930602 Method and system for performing a double pass NTH fail bitmap of a device memory |
| 04/19/2011 | US7930601 AC ABIST diagnostic method, apparatus and program product |
| 04/19/2011 | US7930592 Enabling memory redundancy during testing |
| 04/19/2011 | US7929362 Integrated semiconductor memory with distributor line for redundant data lines |
| 04/14/2011 | US20110087935 Dram testing method |
| 04/14/2011 | US20110087934 Test apparatus and test method |
| 04/14/2011 | US20110084679 Method and apparatus providing final test and trimming for a power supply controller |
| 04/14/2011 | DE102007050430B4 Verfahren für das Steuern eines Speicherzugriffs A method for controlling a memory access, |
| 04/14/2011 | DE102006023232B4 Plasmaprozessleistungsversorgungssystem mit ereignisgesteuerter Datenspeicherung und Verfahren dazu Plasma process power supply system with event-driven data storage and method thereof |
| 04/13/2011 | EP2308057A2 Data collection and compression in a solid state storage device |
| 04/13/2011 | CN201796608U Storage device quality detector |
| 04/13/2011 | CN102013274A Self-test circuit and method for storage |
| 04/13/2011 | CN101409108B Average abrasion method and controller using the same |
| 04/13/2011 | CN101388256B Controller and method for generating Low-level error-correction code for a memory device |
| 04/12/2011 | US7925960 Memory and method for checking reading errors thereof |
| 04/12/2011 | US7925951 Scan circuitry controlled switch connecting buffer output to test lead |
| 04/12/2011 | US7925939 Pre-code device, and pre-code system and pre-coding method thererof |
| 04/12/2011 | US7925938 Structure and method of repairing SDRAM by generating slicing table of fault distribution |
| 04/12/2011 | US7925937 Apparatus for testing embedded memory read paths |
| 04/12/2011 | US7925936 Memory device with non-uniform programming levels |
| 04/12/2011 | US7925623 Method and apparatus for integrating primary data storage with local and remote data protection |
| 04/12/2011 | US7924640 Method for memory cell characterization using universal structure |
| 04/12/2011 | US7924639 Nonvolatile memory device using resistance material |
| 04/12/2011 | US7924589 Row redundancy for content addressable memory having programmable interconnect structure |
| 04/07/2011 | DE19782077B4 Verfahren und Vorrichtung zum Korrigieren eines Mehrpegelzellenspeichers durch Verwendung fehlerlokalisierender Codes Method and apparatus for correcting a multi-level cell memory by using codes fehlerlokalisierender |
| 04/07/2011 | DE102006011706B4 Halbleiter-Bauelement, sowie Halbleiter-Bauelement-Test-Verfahren A semiconductor device, and semiconductor device testing method |