G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
06/2011
06/09/2011	DE10126878B4 Halbleitervorrichtung Semiconductor device
06/08/2011	EP2330591A1 Closed-loop soft error rate sensitivity control
06/08/2011	CN1934655B Method for detecting delay fault in semiconductor memories and test circuit
06/08/2011	CN102089828A Data collection and compression in a solid state storage device
06/08/2011	CN102087882A Closed-loop soft error rate sensitivity control
06/08/2011	CN102087881A Supporting scan functions within memories
06/08/2011	CN101091223B Bias application method of storage and storage device
06/08/2011	CN101015023B Cross-point ferroelectric memory that reduces the effects of bit line to word line shorts
06/07/2011	US7958432 Verification of non volatile storage storing preserved unneeded data
06/07/2011	US7958431 Method for interleaving data in a communication device
06/07/2011	US7958430 Flash memory device and method
06/07/2011	US7958415 Semiconductor integrated circuit and method of detecting fail path thereof
06/07/2011	US7958414 Enhancing security of internal memory
06/07/2011	US7958413 Method and system for memory testing and test data reporting during memory testing
06/07/2011	US7958412 System and method for on-board timing margin testing of memory modules
06/07/2011	US7958411 Memory system and control method thereof
06/07/2011	US7958410 Method for shifting a phase of a clock signal and memory chip using the same
06/07/2011	US7958409 Method for recording memory parameter and method for optimizing memory
06/07/2011	US7955906 Methods and systems for thermal-based laser processing a multi-material device
06/07/2011	US7955905 Methods and systems for thermal-based laser processing a multi-material device
06/03/2011	WO2011064754A1 Solid-state storage system with parallel access of multiple flash/pcm devices
06/02/2011	US20110131458 Method and system for evaluating effects of signal phase difference on a memory system
06/02/2011	US20110131457 Semiconductor memory testing device and method of testing semiconductor using the same
06/02/2011	US20110131446 Semiconductor device and data processing system including the same
06/02/2011	US20110128806 Semiconductor integrated circuit test method and semiconductor integrated circuit
06/02/2011	US20110128805 Test circuit, nonvolatile semiconductor memory appratus using the same, and test method
06/02/2011	US20110128804 Test circuit, semiconductor memory apparatus using the same, and test method of the semiconductor memory apparatus
06/02/2011	US20110128787 Ripple programming of memory cells in a nonvolatile memory
06/01/2011	EP2062265B1 Non-volatile memory and method for reduced erase/write cycling during trimming of initial programming voltage
06/01/2011	EP1728254B1 Method for detecting resistive bridge defects in the global data bus of semiconductor memories
06/01/2011	CN201853496U Performance detector for chip of memory
06/01/2011	CN102084430A Method and apparatus for repairing high capacity/high bandwidth memory devices
06/01/2011	CN102081973A Test circuit for EEPROM device and test method thereof
06/01/2011	CN102081972A Test circuit for EEPROM device and test method thereof
06/01/2011	CN102081971A Method for adjusting memory signal phases
06/01/2011	CN102081970A Method and device for processing error correction and solid-state hard disc equipment
06/01/2011	CN101065809B Sram test method and SRAM test arrangement to detect weak cells
05/2011
05/31/2011	US7954042 Check testing of an address decoder
05/31/2011	US7954039 Memory card and memory controller
05/31/2011	US7954038 Fault detection
05/31/2011	US7954037 Method for recovering from errors in flash memory
05/31/2011	US7954021 Solid state drive with flash sparing
05/31/2011	US7954020 Method and apparatus for testing a circuit
05/31/2011	US7954019 Flash storage device and method and system for testing the same
05/31/2011	US7954018 Analysis techniques for multi-level memory
05/31/2011	US7954017 Multiple embedded memories and testing components for the same
05/31/2011	US7954016 Efficient multi-symbol deinterleaver
05/31/2011	US7953914 Clearing interrupts raised while performing operating system critical tasks
05/31/2011	US7952925 Nonvolatile semiconductor memory device having protection function for each memory block
05/26/2011	WO2011062825A2 Bit-replacement technique for dram error correction
05/26/2011	WO2011061796A1 Receiving apparatus, testing apparatus, receiving method and testing method
05/26/2011	US20110126081 Request-command encoding for reduced-data-rate testing
05/26/2011	US20110126079 Multi-channel memory apparatus and method thereof
05/26/2011	US20110122718 Low Cost Testing and Sorting for Integrated Circuits
05/26/2011	US20110122717 Replacing defective columns of memory cells in response to external addresses
05/26/2011	US20110122716 Dynamic random access memory device and method of determining refresh cycle thereof
05/26/2011	US20110122715 Redundant memory array for replacing memory sections of main memory
05/25/2011	EP1911038B1 Apparatus and method for repairing a semiconductor memory
05/25/2011	EP1815339B1 Transparent error correcting memory that supports partial-word write
05/25/2011	CN102077104A Testing device and testing method
05/25/2011	CN102074274A Method for detecting errors of and automatically resetting encryption chip in encryption card
05/25/2011	CN102074273A Memory total ionizing dose experimenting clamp, and experimenting and testing method thereof
05/25/2011	CN102074272A Semiconductor device
05/24/2011	US7949933 Semiconductor integrated circuit device
05/24/2011	US7949929 Controller and storage device having the same
05/24/2011	US7949928 Semiconductor memory device and data error detection and correction method of the same
05/24/2011	US7949913 Method for creating a memory defect map and optimizing performance using the memory defect map
05/24/2011	US7949912 System and method of securing data stored in a memory
05/24/2011	US7949911 Method for testing storage apparatus and system thereof
05/24/2011	US7949910 Memory system and control method thereof
05/24/2011	US7949909 Address controlling in the MBIST chain architecture
05/24/2011	US7949908 Memory repair system and method
05/24/2011	US7949792 Encoding a TCP offload engine within FCP
05/24/2011	US7948912 Semiconductor integrated circuit with test mode
05/19/2011	US20110119564 Flash memory device and memory system comprising same
05/19/2011	US20110119538 Dynamically Replicated Memory
05/19/2011	US20110119537 Pattern generator
05/19/2011	US20110119531 Architecture, System And Method For Compressing Repair Data In An Integrated Circuit (IC) Design
05/19/2011	US20110116333 Memory test apparatus and testing method
05/19/2011	US20110116332 Memory device with test mechanism
05/19/2011	US20110116315 Nonvolatile Semiconductor Memory Device
05/18/2011	CN1499532B Hybrid realization of error correcting code in non-volatile memory
05/18/2011	CN102067240A Semiconductor memory device
05/18/2011	CN102066963A Method and apparatus for securing digital information on an integrated circuit during test operating modes
05/18/2011	CN102063943A Nand闪存参数自动检测系统 Nand Flash parameter automatic detection system
05/18/2011	CN102063940A Nonvolatile memory and memory system
05/17/2011	US7945841 System and method for continuous logging of correctable errors without rebooting
05/17/2011	US7945826 Test apparatus and test method
05/17/2011	US7945825 Recovery while programming non-volatile memory (NVM)
05/17/2011	US7945824 Processor-memory unit for use in system-in-package and system-in-module devices
05/17/2011	US7945823 Programmable address space built-in self test (BIST) device and method for fault detection
05/17/2011	US7945822 Storing data to multi-chip low-latency random read memory device using non-aligned striping
05/17/2011	US7945759 Non-volatile memory and method with phased program failure handling
05/17/2011	US7944765 Programmable logic device with built in self test
05/12/2011	US20110113296 Method of testing a memory module and hub of the memory module
05/12/2011	US20110113295 Support element office mode array repair code verification
05/12/2011	US20110113280 Circuit and method for efficient memory repair
05/12/2011	US20110110167 Integrated circuit
05/12/2011	US20110110164 Trim circuit and semiconductor memory device comprising same
05/12/2011	US20110109362 Circuit for controlling an enabling time of an internal control signal according to an operating frequency of a memory device and the method thereof

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