| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 08/11/2011 | DE102011010116A1 Speicherverfälschungsdetektion in Motorsteuersystemen Memory corruption detection in motor control systems |
| 08/10/2011 | CN201927361U 一种可更换式内存测试座 One kind of removable memory test seat |
| 08/10/2011 | CN102150054A Testing device, testing method, circuit system, power supply device, power supply evaluation device, and method for emulating power supply environment |
| 08/10/2011 | CN102148062A Memory with self-testing function |
| 08/10/2011 | CN102147759A Method for processing offline of RAID hard disk |
| 08/10/2011 | CN101303898B Circuit and method for self repairing multiport memory |
| 08/09/2011 | US7996736 Bad page marking strategy for fast readout in memory |
| 08/09/2011 | US7996735 Semiconductor device |
| 08/09/2011 | US7996734 Memory having an ECC system |
| 08/09/2011 | US7995434 Method and apparatus for generating absolute time in pregroove data |
| 08/09/2011 | US7995417 Semiconductor memory circuit |
| 08/09/2011 | US7995408 Circuit for supplying a reference voltage in a semiconductor memory device for testing an internal voltage generator therein |
| 08/09/2011 | US7995407 Semiconductor memory device and control method thereof |
| 08/09/2011 | US7995374 Semiconductor memory device, method of manufacturing the same, and method of screening the same |
| 08/04/2011 | WO2011094211A2 Reducing latency in serializer-deserializer links |
| 08/04/2011 | WO2011094102A2 Data processing system having brown-out detection circuit |
| 08/04/2011 | WO2011092526A1 A driver for ddr2/3 memory interfaces |
| 08/04/2011 | US20110191530 Adaptive Deterministic Grouping of Blocks into Multi-Block Units |
| 08/04/2011 | US20110186631 Method for setting operating frequency of memory card and related card reading apparatus |
| 08/03/2011 | EP2351045A2 Error correction in multiple semiconductor memory units |
| 08/03/2011 | CN102142284A Memorizer test device for extensible sample memorizers |
| 08/03/2011 | CN102142283A Method for testing nonvolatile memory |
| 08/03/2011 | CN102142282A Method for identifying ECC verification algorithm of NAND Flash memory chip |
| 08/03/2011 | CN102142281A Device and method for carrying out fault online detection by using parity check codes |
| 08/02/2011 | US7992072 Management of redundancy in data arrays |
| 08/02/2011 | US7992071 Method for implementing error-correction codes in non-volatile memory |
| 08/02/2011 | US7992061 Method for testing reliability of solid-state storage medium |
| 08/02/2011 | US7992060 Apparatus, methods, and system of NAND defect management |
| 08/02/2011 | US7992059 System and method for testing a large memory area during processor design verification and validation |
| 08/02/2011 | US7992057 Write-once type optical disc, and method and apparatus for managing defective areas on write-once type optical disc |
| 08/02/2011 | US7990790 Write driver circuit of PRAM |
| 08/02/2011 | US7990788 Refresh characteristic testing circuit and method for testing refresh using the same |
| 08/02/2011 | US7990787 Memory compiler redundancy |
| 07/28/2011 | WO2011089835A1 Semiconductor memory device |
| 07/28/2011 | US20110185240 Embedded processor |
| 07/28/2011 | US20110185239 Semiconductor testing apparatus and method |
| 07/28/2011 | US20110182119 Apparatus, system, and method for determining a read voltage threshold for solid-state storage media |
| 07/28/2011 | US20110182113 Semiconductor memory device |
| 07/28/2011 | DE10235448B4 Eichverfahren und Speichersystem Calibration procedures and storage system |
| 07/27/2011 | EP1590810B1 Improved method for reading a non-volatile memory cell adjacent to an inactive region of a non-volatile memory cell array |
| 07/27/2011 | CN102136299A Method for preventing address data of LED decoding module from being lost |
| 07/27/2011 | CN102136298A Memory card testing method |
| 07/27/2011 | CN102135924A Fault tolerant data storage circuit |
| 07/27/2011 | CN102135859A Flash memory card used for transmitting differential data |
| 07/27/2011 | CN101320596B Bad block management method facing high-capacity FLASH solid memory |
| 07/26/2011 | US7987408 Data buffering method |
| 07/26/2011 | US7987407 Handling of hard errors in a cache of a data processing apparatus |
| 07/26/2011 | US7987402 Semiconductor memory device having burn-in test mode and method for driving the same |
| 07/26/2011 | US7987398 Reconfigurable device |
| 07/26/2011 | US7987362 Method and apparatus for using imperfections in computing devices for device authentication |
| 07/26/2011 | US7987331 Method and circuit for protection of sensitive data in scan mode |
| 07/26/2011 | US7986575 Semiconductor memory device and redundancy method therefor |
| 07/21/2011 | US20110179324 Testing apparatus and method for analyzing a memory module operating within an application system |
| 07/21/2011 | US20110179322 Nonvolatile memory device and related program verification circuit |
| 07/21/2011 | US20110179321 Information storage device and test method therefor |
| 07/21/2011 | US20110176377 Semiconductor memory device |
| 07/21/2011 | US20110176352 Nonvolatile memory cell operating by increasing order in polycrystalline semiconductor material |
| 07/21/2011 | DE10032122B4 Halbleiterspeicherbauelement mit Redundanzschaltkreis The semiconductor memory device with redundancy circuit |
| 07/20/2011 | EP2082399B1 Memory bus output driver of a multi-bank memory device and method therefor |
| 07/20/2011 | CN102129887A Test mode signal generation circuit and method of storage unit |
| 07/20/2011 | CN102129880A Three-dimensional chip selection sharing input package |
| 07/20/2011 | CN102129873A Data compression device and method for improving last-stage high-speed caching reliability of computer |
| 07/20/2011 | CN101067973B Fuse circuit for repair and detection of memory |
| 07/19/2011 | US7984361 Raid system and data recovery apparatus using galois field |
| 07/19/2011 | US7984360 Avoiding errors in a flash memory by using substitution transformations |
| 07/19/2011 | US7984358 Error-correction memory architecture for testing production errors |
| 07/19/2011 | US7984357 Implementing minimized latency and maximized reliability when data traverses multiple buses |
| 07/19/2011 | US7984353 Test apparatus, test vector generate unit, test method, program, and recording medium |
| 07/19/2011 | US7984345 Test apparatus and test method |
| 07/19/2011 | US7984344 Techniques for testing memory circuits |
| 07/19/2011 | US7983096 Semiconductor device including nonvolatile memory |
| 07/19/2011 | US7982466 Inspection method for semiconductor memory |
| 07/14/2011 | WO2011084215A1 Antifuse programmable memory array |
| 07/14/2011 | US20110170365 Row addressing |
| 07/13/2011 | EP1830366B1 Bias application method of storage and storage |
| 07/13/2011 | CN1799104B Integrity control for data stored in a non-volatile memory |
| 07/13/2011 | CN1681046B Flash memory |
| 07/13/2011 | CN102124527A Apparatus, system, and method for detecting and replacing failed data storage |
| 07/13/2011 | CN102122532A Method and system for testing accidental failure event of storage card |
| 07/12/2011 | US7979779 System and method for symmetric triple parity for failing storage devices |
| 07/12/2011 | US7979761 Memory test device and memory test method |
| 07/12/2011 | US7979760 Test system for conducting parallel bit test |
| 07/12/2011 | US7979759 Test and bring-up of an enhanced cascade interconnect memory system |
| 07/12/2011 | US7979758 Semiconductor memory device |
| 07/12/2011 | US7979757 Method and apparatus for testing high capacity/high bandwidth memory devices |
| 07/12/2011 | US7979755 Semiconductor integrated circuit device for display controller |
| 07/12/2011 | US7978754 Communication channel calibration with nonvolatile parameter store for recovery |
| 07/12/2011 | US7978550 Semiconductor memory |
| 07/12/2011 | US7978549 Fuse circuit and semiconductor memory device including the same |
| 07/12/2011 | US7978548 Block decoding circuits of semiconductor memory devices and methods of operating the same |
| 07/07/2011 | WO2011082070A2 Error correction in a stacked memory |
| 07/07/2011 | WO2011081843A2 Robust memory link testing using memory controller |
| 07/07/2011 | WO2011081811A2 Tamper resistant fuse design |
| 07/07/2011 | US20110167320 Flash memory |
| 07/07/2011 | US20110167308 Multi-site testing of computer memory devices and serial io ports |
| 07/07/2011 | US20110167307 Semiconductor memory and method for testing the same |
| 07/07/2011 | US20110167306 Semiconductor test apparatus |
| 07/07/2011 | US20110167204 Memory block identified by group of logical block addresses, storage device with movable sectors, and methods |
| 07/07/2011 | US20110164464 Semiconductor memory device and method of testing the same |
| 07/07/2011 | US20110164463 Structure and Method for Decoding Read Data-Bus With Column-Steering Redundancy |