G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
09/2011
09/13/2011	US8020056 Memory channel with bit lane fail-over
09/13/2011	US8020055 Method and apparatus for testing the connectivity of a flash memory chip
09/13/2011	US8020054 Test apparatus and test method
09/13/2011	US8020053 On-line memory testing
09/13/2011	US8019941 Loosely coupled mass storage computer cluster having a set of data storage controllers interoperable for reading and writing data objects
09/13/2011	US8018025 Nonvolatile memory cell comprising a reduced height vertical diode
09/09/2011	WO2011109771A1 System and method of testing an error correction module
09/09/2011	WO2011109487A1 Method and apparatus for testing a memory device
09/09/2011	WO2011109309A1 Recalibration systems and techniques for electronic memory applications
09/08/2011	US20110219276 Apparatus and method for testing semiconductor integrated circuits, and a non-transitory computer-readable medium having a semiconductor integrated circuit testing program
09/08/2011	US20110219174 Non-Volatile Memory and Method with Phased Program Failure Handling
09/08/2011	US20110216614 Semiconductor device enabling refreshing of redundant memory cell instead of defective memory cell
09/07/2011	CN101350226B Method for verifying whether detection result of detection device is correct or not
09/06/2011	US8015473 Method, system, and apparatus for ECC protection of small data structures
09/06/2011	US8015472 Triple parity technique for enabling efficient recovery from triple failures in a storage array
09/06/2011	US8015471 Symbol rate hardware accelerator
09/06/2011	US8015470 Apparatus and method for decoding bursts of coded information
09/06/2011	US8015460 Test mode for parallel load of address dependent data to enable loading of desired data backgrounds
09/06/2011	US8015459 Semiconductor memory device and method of performing a memory operation
09/06/2011	US8015457 Redundancy circuit and semiconductor memory device
09/06/2011	US8015260 Encryption keys for multiple drive fault tolerance
09/06/2011	US8014192 Method and device to detect the likely onset of thermal relaxation in magnetic data storage devices
09/01/2011	WO2011106262A2 Hierarchical memory architecture
09/01/2011	WO2011104065A1 Method for checking the functionality of a memory element
08/2011
08/31/2011	CN201956074U 基于sas接口的存储系统中存储卡在位检测电路 Sas interface-based storage system to store the bit detection circuit card
08/31/2011	CN1835125B Method for recovering hardware in caching SMP computer system
08/31/2011	CN102169728A Magnetic field detecting device and methods of using the same
08/31/2011	CN102169727A Random walk based solid state disk abrasion balancing method
08/31/2011	CN101271733B Semiconductor memory device
08/30/2011	US8010876 Method of facilitating reliable access of flash memory
08/30/2011	US8010874 Triple parity technique for enabling efficient recovery from triple failures in a storage array
08/30/2011	US8010873 Systems and methods for efficient uncorrectable error detection in flash memory
08/30/2011	US8010872 Electronic controller
08/30/2011	US8010854 Method and circuit for brownout detection in a memory system
08/30/2011	US8010853 Semiconductor storage device and memory test circuit
08/30/2011	US8010852 Defect detection and handling for memory based on pilot cells
08/30/2011	US8010851 Testing module, testing apparatus and testing method
08/30/2011	US8010738 Techniques for obtaining a specified lifetime for a data storage device
08/30/2011	US8009493 Semiconductor memory apparatus and test method thereof
08/30/2011	US8008700 Non-volatile memory cell with embedded antifuse
08/25/2011	WO2011102126A1 Non-volatile semiconductor memory device and electronic device
08/25/2011	US20110209012 Method and apparatus for optimizing address generation for simultaneously running proximity-based BIST algorithms
08/25/2011	US20110209011 Method for error test, recordation and repair
08/25/2011	US20110205820 Semiconductor device
08/25/2011	US20110205819 Redundancy data storage circuit, redundancy data control method and repair determination circuit of semiconductor memory
08/25/2011	US20110205796 Nonvolatile memory device and system performing repair operation for defective memory cell
08/25/2011	US20110205794 Nonvolatile semiconductor memory device having protection function for each memory block
08/25/2011	DE102010002309A1 Verfahren zur Überprüfung der Funktionsfähigkeit eines Speicherelements Method for checking the operability of a memory element
08/24/2011	EP2359372A1 Error detection method and a system including one or more memory devices
08/24/2011	CN102165533A Semiconductor memory device
08/24/2011	CN102163465A Nonvolatile memory device and system performing repair operation for defective memory cell
08/24/2011	CN102163464A Systems and methods for data recovery
08/24/2011	CN102163463A Double coin search method for reducing BCH (broadcast channel) decoding delay
08/24/2011	CN102163462A 半导体存储设备 The semiconductor memory device
08/24/2011	CN102163461A Method for improving yield and reading reliability of electrically erasable programmable read-only memory (EEPROM)
08/24/2011	CN102163460A Frequency-based approach for detection and classification of hard-disc defect regions
08/24/2011	CN102163459A Burning device using universal serial bus (USB) interface
08/24/2011	CN101079322B Multi-bit memory device and memory system
08/23/2011	US8006167 System for decoding coded data with PLL
08/23/2011	US8006166 Programming error correction code into a solid state memory device with varying bits per cell
08/23/2011	US8006165 Memory controller and semiconductor memory device
08/23/2011	US8006164 Memory cell supply voltage control based on error detection
08/23/2011	US8006147 Error detection in precharged logic
08/23/2011	US8006146 Test apparatus and test method for testing a plurality of devices under test
08/23/2011	US8006145 Semiconductor integrated circuit device
08/23/2011	US8006144 Memory testing
08/23/2011	US8006143 Semiconductor memory device and semiconductor memory device test method
08/23/2011	US8004914 Method of testing nonvolatile memory device
08/23/2011	US8004912 Block redundancy implementation in hierarchical rams
08/18/2011	WO2011100444A2 Memory dies, stacked memories, memory devices and methods
08/18/2011	WO2011100244A1 System and method to select a reference cell
08/18/2011	WO2011062825A3 Bit-replacement technique for dram error correction
08/18/2011	US20110199845 Redundancy circuits and operating methods thereof
08/18/2011	US20110199836 Bit-line sense amplifier, semiconductor memory device having the same, and method of testing bit-line micro-bridge defect
08/18/2011	US20110199811 Non-volatile semiconductor memory device and method of controlling non-volatile semiconductor memory device
08/18/2011	DE102004044150B4 Verbesserte künstliche Alterung von Chips mit Speicher Improved artificial aging of chips with memory
08/17/2011	EP2356658A1 System and method for recovering solid state drive data
08/17/2011	EP2356572A2 Replacing defective memory blocks in response to external addresses
08/17/2011	CN1791943B Test of RAM address decoder for resistive open defects
08/17/2011	CN102157206A Memory with redundant circuit and method for providing redundant circuit for memory
08/17/2011	CN102157205A Method for testing fault of multiposition memorizer inlaid in FPGA
08/17/2011	CN101159169B Method and electronic device of end of life prediction of flash memory
08/16/2011	US8001444 ECC functional block placement in a multi-channel mass storage device
08/16/2011	US8001443 Data storage apparatus, data storage controller, and related automated testing method
08/16/2011	US8001442 Data-processing system for measurement devices
08/16/2011	US8001441 Nonvolatile memory with modulated error correction coding
08/16/2011	US8001439 Integrated circuit testing module including signal shaping interface
08/16/2011	US8001438 Measuring bridge-fault coverage for test patterns within integrated circuits
08/16/2011	US8001434 Memory board with self-testing capability
08/16/2011	US8001432 Uninitialized memory detection using error correction codes and built-in self test
08/16/2011	US8000160 Semiconductor device and cell plate voltage generating apparatus thereof
08/16/2011	US8000159 Semiconductor memory device having memory block configuration
08/16/2011	US8000143 Nonvolatile memory device including circuit formed of thin film transistors
08/16/2011	US8000133 Thin film magnetic memory device capable of conducting stable data read and write operations
08/11/2011	US20110197108 Memory card and memory controller
08/11/2011	US20110197101 Semiconductor device and test method thereof
08/11/2011	US20110194367 Systems, memories, and methods for refreshing memory arrays
08/11/2011	US20110194360 Semiconductor device and method of detecting abnormality on semiconductor device
08/11/2011	US20110194345 Nonvolatile semiconductor storage device including failure detection circuit and method of detecting failure on nonvolatile semiconductor storage device
08/11/2011	US20110194325 Error detection in a content addressable memory (cam)

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