G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
10/2011
10/13/2011	WO2011082070A3 Error correction in a stacked memory
10/13/2011	US20110249510 Embedded storage apparatus and test method thereof
10/13/2011	US20110249480 Nonvolatile memory device
10/12/2011	EP2374134A2 Spare block management in non-volatile memories
10/12/2011	CN1853241B Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance
10/12/2011	CN102214486A Hybrid self-test circuit structure
10/12/2011	CN101060008B Multi-port memory device with serial input/output interface and control method thereof
10/11/2011	US8037381 Error detection, documentation, and correction in a flash memory device
10/11/2011	US8037380 Verifying data integrity of a non-volatile memory system during data caching process
10/11/2011	US8037379 Prediction of impact on post-repair yield resulting from manufacturing process modification
10/11/2011	US8037378 Automatic test entry termination in a memory device
10/11/2011	US8037376 On-chip failure analysis circuit and on-chip failure analysis method
10/11/2011	US8037372 Apparatus and method for testing setup/hold time
10/11/2011	US8036055 Semiconductor storage device
10/11/2011	US8036054 Semiconductor memory device with improved sensing margin
10/11/2011	US8036053 Semiconductor memory device capable of suppressing a coupling effect of a test-disable transmission line
10/11/2011	US8035945 Method and apparatus providing final test and trimming for a power supply controller
10/06/2011	US20110246841 Storing apparatus
10/06/2011	US20110246712 Method and apparatus for interfacing with heterogeneous dual in-line memory modules
10/06/2011	US20110242919 Precharge Voltage Supplying Circuit
10/06/2011	US20110242918 Global line sharing circuit of semiconductor memory device
10/06/2011	US20110242917 Semiconductor memory device and method for operating the same
10/05/2011	CN102208213A Error correction mechanisms for flash memories
10/05/2011	CN102208212A Error correction method, memory controller and memory storage system
10/05/2011	CN102207908A Systems and methods for efficient data storage
10/05/2011	CN101452742B Method for improving SRAM matching degree
10/05/2011	CN101154465B Nonvolatile semiconductor memory device
10/05/2011	CN101145136B Processor memory array having memory macros and its protecting method
10/04/2011	US8032816 Apparatus and method for distinguishing temporary and permanent errors in memory modules
10/04/2011	US8032815 Semiconductor memory device
10/04/2011	US8032814 Writing and reading of data in probe-based data storage devices
10/04/2011	US8032804 Systems and methods for monitoring a memory system
10/04/2011	US8032803 Semiconductor integrated circuit and test system thereof
10/04/2011	US8032802 Storage device, memory, terminal, server, server-client system, storage medium, and control device
10/04/2011	US8032783 Memory apparatus which provides notification of memory capacity
10/04/2011	US8032694 Direct logical block addressing flash memory mass storage architecture
10/04/2011	US8031544 Semiconductor memory device with three-dimensional array and repair method thereof
10/04/2011	US8031536 Storage device employing a flash memory
09/2011
09/29/2011	WO2011118114A1 Non-volatile storage device and memory controller
09/29/2011	WO2011116454A1 Composite semiconductor memory device with error correction
09/29/2011	US20110239065 Run-time testing of memory locations in a non-volatile memory
09/29/2011	US20110239064 Management of a non-volatile memory based on test quality
09/29/2011	US20110239062 Semiconductor device
09/29/2011	US20110239061 Systems and methods for retrieving data
09/29/2011	US20110238894 Non-Volatile Memory Devices and Control and Operation Thereof
09/29/2011	US20110235727 Communication channel calibration with nonvolatile parameter store for recovery
09/29/2011	US20110235447 Low power memory array column redundancy mechanism
09/29/2011	US20110235403 Method and apparatus managing worn cells in resistive memories
09/29/2011	US20110235388 Nonvolatile semiconductor storage device
09/29/2011	CA2791931A1 Composite semiconductor memory device with error correction
09/28/2011	EP2368186A2 Data error recovery in non-volatile memory
09/28/2011	CN1881475B System and method for memory element characterization
09/28/2011	CN1745434B Improved method for reading a non-volatile memory cell adjacent to an inactive region of a non-volatile memory cell array
09/28/2011	CN102203867A Volatile memory elements with soft error upset immunity
09/28/2011	CN102201268A Device and method for increasing the test efficiency of chip
09/28/2011	CN102201267A Platform system for realizing circuit verification of Nandflash flash memory controller based on FPGA (Field Programmable Gate Array) and method thereof
09/28/2011	CN102201266A 半导体存储器装置 The semiconductor memory device
09/28/2011	CN102201265A Detection of hard-disc defect regions using soft decisions
09/28/2011	CN102201264A Amplitude-based approach for detection and classification of hard-disc defect regions
09/28/2011	CN101458965B Method for reading nonvolatile memory at power-on stage
09/28/2011	CN101447214B Multichip package
09/28/2011	CN101252021B Storing apparatus and operating method thereof
09/27/2011	US8028219 Interleaving scheme for an LDPC coded 16APSK system
09/27/2011	US8028218 Writing and reading of data in probe-based data storage devices
09/27/2011	US8028210 Semiconductor device
09/27/2011	US8028207 Early memory test
09/27/2011	US8027394 Reducing data stream jitter during deinterleaving
09/22/2011	WO2011116056A2 Modeling of cell delay change for electronic design automation
09/22/2011	WO2011115485A1 Generic march element based memory built-in self test
09/22/2011	US20110231739 Composite semiconductor memory device with error correction
09/22/2011	US20110231718 Memory repair
09/22/2011	US20110231717 Semiconductor memory device
09/22/2011	US20110231716 Diagnosis flow for read-only memories
09/22/2011	US20110231143 System and method for controlling timing of output signals
09/22/2011	US20110228621 Semiconductor device and method for testing the same
09/22/2011	US20110228620 Testing method for semiconductor memory device
09/22/2011	US20110228612 Semiconductor memory and semiconductor memory test method
09/22/2011	US20110228581 Stacked memory device and method of repairing same
09/21/2011	EP1905044B1 Apparatus, system and method for accessing persistent files in non-execute-in-place flash memory
09/21/2011	CN1832050B Method for reliable contact of probe and nano-electrode of phase transformation memory device unit
09/21/2011	CN102197438A System and method for recovering solid state drive data
09/21/2011	CN102194527A Semiconductor memory device
09/21/2011	CN102194526A Detection system and detection method
09/20/2011	US8024643 Error correction for disk storage media
09/20/2011	US8024642 System and method for providing constrained transmission and storage in a random access memory
09/20/2011	US8024638 Apparatus and method for memory read-refresh, scrubbing and variable-rate refresh
09/20/2011	US8024629 Input/output compression and pin reduction in an integrated circuit
09/20/2011	US8024628 Apparatus and method for testing semiconductor memory device
09/20/2011	US8024627 Semiconductor memory device, operating method thereof, and compression test method thereof
09/20/2011	US8024626 Automation of fuse compression for an ASIC design system
09/20/2011	US8023350 Memory malfunction prediction system and method
09/20/2011	US8023348 Method and apparatus for testing a memory device
09/20/2011	US8023345 Iteratively writing contents to memory locations using a statistical model
09/15/2011	US20110225473 Read operation for non-volatile storage with compensation for coupling
09/15/2011	US20110225472 Reading memory cells using multiple thresholds
09/15/2011	US20110225471 Memory devices, testing systems and methods
09/14/2011	EP2365488A1 Apparatus and method for testing semiconductor integrated circuits, and a non-transitory computer-readable medium having a semiconductor integrated circuit testing program
09/14/2011	CN102184746A Storage performance testing system and method based on particle swarm optimization parameter
09/13/2011	US8020074 Method for auto-correction of errors in a RAID memory system
09/13/2011	US8020073 Dynamic memory architecture employing passive expiration of data

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