Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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01/25/2012 | CN102332307A Test system and method for single event effect of SRAM (System Random Access Memory) type FPGA (Field Programmable Gate Array) |
01/25/2012 | CN102332306A Embedded static random access memory (SRAM) test structure and test method based on institute of electrical and electronics engineers (IEEE) 1500 |
01/25/2012 | CN102332288A Memory circuit and method for reading data by applying same |
01/24/2012 | US8103940 Programming error correction code into a solid state memory device with varying bits per cell |
01/24/2012 | US8103938 Increasing the effectiveness of error correction codes and operating multi-level memory systems by using information about the quality of the stored data |
01/24/2012 | US8103936 System and method for data read of a synchronous serial interface NAND |
01/24/2012 | US8103934 High speed memory error detection and correction using interleaved (8,4) LBCs |
01/24/2012 | US8103922 Error detection in precharged logic |
01/24/2012 | US8103921 Fully-buffered dual in-line memory module with fault correction |
01/24/2012 | US8103920 Memory system configured by using a nonvolatile semiconductor memory |
01/24/2012 | US8103919 Circuit for and method of repairing defective memory |
01/24/2012 | US8103918 Clock control during self-test of multi port memory |
01/24/2012 | US8103917 Circuit and method for correcting skew in a plurality of communication channels for communicating with a memory device, memory controller, system and method using the same, and memory test system and method using the same |
01/24/2012 | US8103899 Nonvolatile memory system |
01/24/2012 | US8103841 Non-volatile memory and method with non-sequential update block management |
01/19/2012 | WO2012009103A2 Method and apparatus for training a memory signal via an error signal of a memory |
01/19/2012 | WO2011113034A3 Ldpc erasure decoding for flash memories |
01/19/2012 | US20120017139 Information recording and reproducing apparatus |
01/19/2012 | US20120017138 Adaptive Flash Interface |
01/19/2012 | US20120017038 Non-Volatile Memory And Method With Control Data Management |
01/19/2012 | US20120014197 Semiconductor device and test method thereof |
01/19/2012 | US20120014189 Semiconductor memory device and test method thereof |
01/19/2012 | DE102010031282A1 Verfahren zum Überwachen eines Datenspeichers A method for monitoring a data memory |
01/18/2012 | EP2002446B1 Method for operating a memory unit comprising the marking of memory blocks that are identified as defective |
01/18/2012 | CN202120623U Embedded static random access memory (SRAM) testing structure based on institute of electrical and electronic engineers (IEEE) 1500 |
01/18/2012 | CN101552032B Method and device for constructing a high-speed solid state memory disc by using higher-capacity DRAM to join in flash memory medium management |
01/17/2012 | US8099652 Non-volatile memory and methods with reading soft bits in non uniform schemes |
01/17/2012 | US8099651 Subsystem and method for encoding 64-bit data nibble error correct and cyclic-redundancy code (CRC) address error detect for use in a 76-bit memory module |
01/17/2012 | US8099640 Shared diagnosis method for an integrated electronic system including a plurality of memory units |
01/17/2012 | US8099639 Failure analysis method, failure analysis system, and memory macro system |
01/17/2012 | US8099638 Apparatus and methods for tuning a memory interface |
01/12/2012 | WO2012006160A1 Detection of word-line leakage in memory arrays: current based approach |
01/12/2012 | WO2012005993A1 Detection of broken word-lines in memory arrays |
01/12/2012 | WO2011109713A3 Error detecting/correcting code enhanced self-checked/corrected/timed nanoelectronic circuits |
01/12/2012 | US20120011409 Devices, methods, and apparatuses for detection, sensing, and reporting functionality for semiconductor memory |
01/12/2012 | US20120008442 Semiconductor device and method of testing the same |
01/12/2012 | US20120008441 Semiconductor memory device and test method thereof |
01/12/2012 | US20120008434 Semiconductor system and device, and method for controlling refresh operation of stacked chips |
01/12/2012 | DE19753423B4 Automatische Leistungsabsenkschaltung für Halbleiterspeichervorrichtung Automatic Leistungsabsenkschaltung for the semiconductor memory device |
01/11/2012 | EP2404240A2 Memory block management |
01/11/2012 | CN102317803A Testing device, testing method, and phase shifter |
01/11/2012 | CN102314951A Current detection method |
01/11/2012 | CN102314950A Programmable test engine (PCDTE) for emerging memory technologies |
01/10/2012 | US8095853 Digital memory with fine grain write operation |
01/10/2012 | US8095852 Data recorder |
01/10/2012 | US8095851 Storage subsystem capable of adjusting ECC settings based on monitored conditions |
01/10/2012 | US8095836 Time-based techniques for detecting an imminent read failure in a memory array |
01/10/2012 | US8095835 Error scanning in flash memory |
01/10/2012 | US8095834 Macro and command execution from memory array |
01/10/2012 | US8095832 Method for repairing memory and system thereof |
01/10/2012 | CA2570401C System and method for testing a data storage device without revealing memory content |
01/05/2012 | WO2011109413A3 Repairable io in an integrated circuit |
01/05/2012 | US20120005559 Apparatus and method for managing a dram buffer |
01/05/2012 | US20120002495 Memory system, memory test system and method of testing memory system and memory test system |
01/05/2012 | US20120002494 Test mode control circuit in semiconductor memory device and test mode entering method thereof |
01/05/2012 | US20120002491 Test signal generating device, semiconductor memory apparatus using the same and multi-bit test method thereof |
01/05/2012 | US20120002471 Memory Bit Redundant Vias |
01/04/2012 | CN102306504A Sample collecting method and method for predicting health condition of copying equipment |
01/04/2012 | CN102306503A Method and system for detecting false capacity memory |
01/04/2012 | CN101644993B Nand flash memory simulator |
01/04/2012 | CN101419837B Storage device and method for status information access of the storage device |
01/04/2012 | CN101377959B Selection method and device for restoring redundant bit line |
01/04/2012 | CN101308706B Data writing method and error correction encoding and decoding method suitable for flash memory |
01/04/2012 | CN101241751B Semiconductor device and method of testing semiconductor device |
01/03/2012 | US8091008 Data read-out circuit in semiconductor memory device and method of data reading in semiconductor memory device |
01/03/2012 | US8091000 Disabling portions of memory with defects |
01/03/2012 | US8090999 Memory media characterization for development of signal processors |
01/03/2012 | US8090998 Method and apparatus for managing disc defects using updateable DMA, and disc thereof |
12/29/2011 | WO2011160957A1 Isolation of faulty links in a transmission medium |
12/29/2011 | WO2011106262A3 Hierarchical memory architecture |
12/29/2011 | WO2011100444A3 Memory dies, stacked memories, memory devices and methods |
12/29/2011 | US20110320891 Driving Method of Electronic Device |
12/29/2011 | US20110318911 Nonvolatile memory cell comprising a reduced height vertical diode |
12/28/2011 | EP2399260A1 Dynamic random access memory (dram) refresh |
12/28/2011 | CN102301428A 存储器装置、存储器管理装置及存储器管理方法 Memory device, memory management means and memory management methods |
12/28/2011 | CN102301427A 分析来自具有有限耐久性和/或保持性的存储器设备的监视数据信息 Analysis of data from monitoring have limited durability and / or retention of memory devices |
12/28/2011 | CN102298974A 自适应新型内存匹配数据选通脉冲的方法 Adaptive matched new memory data strobe method |
12/28/2011 | CN102298973A 抗辐射故障保护型存储装置及其抗辐射故障保护方法 Rad fault protection type storage device and anti-radiation failsafe method |
12/28/2011 | CN102298972A 快闪记忆体的资料读取方法 Flash memory data reading method |
12/28/2011 | CN102298966A 非易失性存储器设备、系统及编程方法 Non-volatile memory devices, systems and programming methods |
12/28/2011 | CN101644995B 多层控制多闪存装置、存储装置和数据分割固态硬盘 Multi-layer multi-flash control device, data storage means and dividing SSDs |
12/27/2011 | US8086939 XOR circuit, RAID device capable of recovering a plurality of failures and method thereof |
12/27/2011 | US8086938 Method for processing noise interference |
12/27/2011 | US8086937 Method for erasure coding data across a plurality of data stores in a network |
12/27/2011 | US8086936 Performing error correction at a memory device level that is transparent to a memory channel |
12/27/2011 | US8086919 Controller having flash memory testing functions, and storage system and testing method thereof |
12/27/2011 | US8086918 High-speed serial transfer device test data storage medium and device |
12/27/2011 | US8086917 Methods for characterizing device variation in electronic memory circuits |
12/27/2011 | US8086916 System and method for running test and redundancy analysis in parallel |
12/27/2011 | US8086915 Memory controller with loopback test interface |
12/27/2011 | US8086914 Storing data to multi-chip low-latency random read memory device using non-aligned striping |
12/27/2011 | US8086913 Methods, apparatus, and systems to repair memory |
12/27/2011 | US8085610 SRAM and testing method of SRAM |
12/27/2011 | US8085609 Nonvolatile semiconductor memory and method for detecting leakage defects of the same |
12/27/2011 | US8085056 Circuit for testing internal voltage of semiconductor memory apparatus |
12/22/2011 | WO2011159806A2 Apparatus, system, and method for providing error correction |
12/22/2011 | WO2011159805A2 Apparatus, system, and method for providing error correction |
12/22/2011 | WO2011158821A1 Semiconductor device and manufacturing method for semiconductor device |
12/22/2011 | WO2011157568A1 Method of protecting a configurable memory against permanent and transient errors and related device |
12/22/2011 | US20110314347 Memory error detecting apparatus and method |