Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
01/2012
01/25/2012CN102332307A Test system and method for single event effect of SRAM (System Random Access Memory) type FPGA (Field Programmable Gate Array)
01/25/2012CN102332306A Embedded static random access memory (SRAM) test structure and test method based on institute of electrical and electronics engineers (IEEE) 1500
01/25/2012CN102332288A Memory circuit and method for reading data by applying same
01/24/2012US8103940 Programming error correction code into a solid state memory device with varying bits per cell
01/24/2012US8103938 Increasing the effectiveness of error correction codes and operating multi-level memory systems by using information about the quality of the stored data
01/24/2012US8103936 System and method for data read of a synchronous serial interface NAND
01/24/2012US8103934 High speed memory error detection and correction using interleaved (8,4) LBCs
01/24/2012US8103922 Error detection in precharged logic
01/24/2012US8103921 Fully-buffered dual in-line memory module with fault correction
01/24/2012US8103920 Memory system configured by using a nonvolatile semiconductor memory
01/24/2012US8103919 Circuit for and method of repairing defective memory
01/24/2012US8103918 Clock control during self-test of multi port memory
01/24/2012US8103917 Circuit and method for correcting skew in a plurality of communication channels for communicating with a memory device, memory controller, system and method using the same, and memory test system and method using the same
01/24/2012US8103899 Nonvolatile memory system
01/24/2012US8103841 Non-volatile memory and method with non-sequential update block management
01/19/2012WO2012009103A2 Method and apparatus for training a memory signal via an error signal of a memory
01/19/2012WO2011113034A3 Ldpc erasure decoding for flash memories
01/19/2012US20120017139 Information recording and reproducing apparatus
01/19/2012US20120017138 Adaptive Flash Interface
01/19/2012US20120017038 Non-Volatile Memory And Method With Control Data Management
01/19/2012US20120014197 Semiconductor device and test method thereof
01/19/2012US20120014189 Semiconductor memory device and test method thereof
01/19/2012DE102010031282A1 Verfahren zum Überwachen eines Datenspeichers A method for monitoring a data memory
01/18/2012EP2002446B1 Method for operating a memory unit comprising the marking of memory blocks that are identified as defective
01/18/2012CN202120623U Embedded static random access memory (SRAM) testing structure based on institute of electrical and electronic engineers (IEEE) 1500
01/18/2012CN101552032B Method and device for constructing a high-speed solid state memory disc by using higher-capacity DRAM to join in flash memory medium management
01/17/2012US8099652 Non-volatile memory and methods with reading soft bits in non uniform schemes
01/17/2012US8099651 Subsystem and method for encoding 64-bit data nibble error correct and cyclic-redundancy code (CRC) address error detect for use in a 76-bit memory module
01/17/2012US8099640 Shared diagnosis method for an integrated electronic system including a plurality of memory units
01/17/2012US8099639 Failure analysis method, failure analysis system, and memory macro system
01/17/2012US8099638 Apparatus and methods for tuning a memory interface
01/12/2012WO2012006160A1 Detection of word-line leakage in memory arrays: current based approach
01/12/2012WO2012005993A1 Detection of broken word-lines in memory arrays
01/12/2012WO2011109713A3 Error detecting/correcting code enhanced self-checked/corrected/timed nanoelectronic circuits
01/12/2012US20120011409 Devices, methods, and apparatuses for detection, sensing, and reporting functionality for semiconductor memory
01/12/2012US20120008442 Semiconductor device and method of testing the same
01/12/2012US20120008441 Semiconductor memory device and test method thereof
01/12/2012US20120008434 Semiconductor system and device, and method for controlling refresh operation of stacked chips
01/12/2012DE19753423B4 Automatische Leistungsabsenkschaltung für Halbleiterspeichervorrichtung Automatic Leistungsabsenkschaltung for the semiconductor memory device
01/11/2012EP2404240A2 Memory block management
01/11/2012CN102317803A Testing device, testing method, and phase shifter
01/11/2012CN102314951A Current detection method
01/11/2012CN102314950A Programmable test engine (PCDTE) for emerging memory technologies
01/10/2012US8095853 Digital memory with fine grain write operation
01/10/2012US8095852 Data recorder
01/10/2012US8095851 Storage subsystem capable of adjusting ECC settings based on monitored conditions
01/10/2012US8095836 Time-based techniques for detecting an imminent read failure in a memory array
01/10/2012US8095835 Error scanning in flash memory
01/10/2012US8095834 Macro and command execution from memory array
01/10/2012US8095832 Method for repairing memory and system thereof
01/10/2012CA2570401C System and method for testing a data storage device without revealing memory content
01/05/2012WO2011109413A3 Repairable io in an integrated circuit
01/05/2012US20120005559 Apparatus and method for managing a dram buffer
01/05/2012US20120002495 Memory system, memory test system and method of testing memory system and memory test system
01/05/2012US20120002494 Test mode control circuit in semiconductor memory device and test mode entering method thereof
01/05/2012US20120002491 Test signal generating device, semiconductor memory apparatus using the same and multi-bit test method thereof
01/05/2012US20120002471 Memory Bit Redundant Vias
01/04/2012CN102306504A Sample collecting method and method for predicting health condition of copying equipment
01/04/2012CN102306503A Method and system for detecting false capacity memory
01/04/2012CN101644993B Nand flash memory simulator
01/04/2012CN101419837B Storage device and method for status information access of the storage device
01/04/2012CN101377959B Selection method and device for restoring redundant bit line
01/04/2012CN101308706B Data writing method and error correction encoding and decoding method suitable for flash memory
01/04/2012CN101241751B Semiconductor device and method of testing semiconductor device
01/03/2012US8091008 Data read-out circuit in semiconductor memory device and method of data reading in semiconductor memory device
01/03/2012US8091000 Disabling portions of memory with defects
01/03/2012US8090999 Memory media characterization for development of signal processors
01/03/2012US8090998 Method and apparatus for managing disc defects using updateable DMA, and disc thereof
12/2011
12/29/2011WO2011160957A1 Isolation of faulty links in a transmission medium
12/29/2011WO2011106262A3 Hierarchical memory architecture
12/29/2011WO2011100444A3 Memory dies, stacked memories, memory devices and methods
12/29/2011US20110320891 Driving Method of Electronic Device
12/29/2011US20110318911 Nonvolatile memory cell comprising a reduced height vertical diode
12/28/2011EP2399260A1 Dynamic random access memory (dram) refresh
12/28/2011CN102301428A 存储器装置、存储器管理装置及存储器管理方法 Memory device, memory management means and memory management methods
12/28/2011CN102301427A 分析来自具有有限耐久性和/或保持性的存储器设备的监视数据信息 Analysis of data from monitoring have limited durability and / or retention of memory devices
12/28/2011CN102298974A 自适应新型内存匹配数据选通脉冲的方法 Adaptive matched new memory data strobe method
12/28/2011CN102298973A 抗辐射故障保护型存储装置及其抗辐射故障保护方法 Rad fault protection type storage device and anti-radiation failsafe method
12/28/2011CN102298972A 快闪记忆体的资料读取方法 Flash memory data reading method
12/28/2011CN102298966A 非易失性存储器设备、系统及编程方法 Non-volatile memory devices, systems and programming methods
12/28/2011CN101644995B 多层控制多闪存装置、存储装置和数据分割固态硬盘 Multi-layer multi-flash control device, data storage means and dividing SSDs
12/27/2011US8086939 XOR circuit, RAID device capable of recovering a plurality of failures and method thereof
12/27/2011US8086938 Method for processing noise interference
12/27/2011US8086937 Method for erasure coding data across a plurality of data stores in a network
12/27/2011US8086936 Performing error correction at a memory device level that is transparent to a memory channel
12/27/2011US8086919 Controller having flash memory testing functions, and storage system and testing method thereof
12/27/2011US8086918 High-speed serial transfer device test data storage medium and device
12/27/2011US8086917 Methods for characterizing device variation in electronic memory circuits
12/27/2011US8086916 System and method for running test and redundancy analysis in parallel
12/27/2011US8086915 Memory controller with loopback test interface
12/27/2011US8086914 Storing data to multi-chip low-latency random read memory device using non-aligned striping
12/27/2011US8086913 Methods, apparatus, and systems to repair memory
12/27/2011US8085610 SRAM and testing method of SRAM
12/27/2011US8085609 Nonvolatile semiconductor memory and method for detecting leakage defects of the same
12/27/2011US8085056 Circuit for testing internal voltage of semiconductor memory apparatus
12/22/2011WO2011159806A2 Apparatus, system, and method for providing error correction
12/22/2011WO2011159805A2 Apparatus, system, and method for providing error correction
12/22/2011WO2011158821A1 Semiconductor device and manufacturing method for semiconductor device
12/22/2011WO2011157568A1 Method of protecting a configurable memory against permanent and transient errors and related device
12/22/2011US20110314347 Memory error detecting apparatus and method
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