| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 02/23/2012 | US20120047408 Systems and methods for memory management |
| 02/23/2012 | US20120044755 System and Method of Reference Cell Testing |
| 02/22/2012 | EP2421004A1 Method and device for testing memory |
| 02/22/2012 | CN101582294B 一种解决sram模块闩锁问题与增强sram模块可靠性的方法 A method of solving the problem sram modules latches and enhanced reliability sram module |
| 02/21/2012 | US8122329 Methods of operating memory devices using error correction and rereading techniques |
| 02/21/2012 | US8122322 System and method of storing reliability data |
| 02/21/2012 | US8122321 Methods of data handling |
| 02/21/2012 | US8122320 Integrated circuit including an ECC error counter |
| 02/21/2012 | US8122319 Page-based failure management for flash memory |
| 02/21/2012 | US8122310 Input buffer, test switches and switch control with serial I/O |
| 02/21/2012 | US8122308 Securely clearing an error indicator |
| 02/21/2012 | US8122307 One time programmable memory test structures and methods |
| 02/21/2012 | US8122306 Test circuit for supporting concurrent test mode in a semiconductor memory |
| 02/21/2012 | US8122304 JTAG controlled self-repair after packaging |
| 02/21/2012 | US8122303 Data structure for flash memory and data reading/writing method thereof |
| 02/21/2012 | US8121740 Feeder automation for an electric power distribution system |
| 02/21/2012 | US8120977 Test method for nonvolatile memory device |
| 02/21/2012 | US8120976 Line defect detection circuit for detecting weak line |
| 02/21/2012 | US8120965 Data storage device and data read method |
| 02/16/2012 | WO2012021053A1 Method of configuring built in self test of memory |
| 02/16/2012 | WO2012020488A1 Semiconductor storage device |
| 02/16/2012 | WO2011106262A4 Hierarchical memory architecture |
| 02/16/2012 | US20120042220 Low-cost design for register file testability |
| 02/16/2012 | US20120039140 Fuse circuit and semiconductor memory device including the same |
| 02/16/2012 | US20120039138 Asynchronous pipelined memory access |
| 02/15/2012 | EP2417603A2 Analyzing monitor data information from memory devices having finite endurance and/or retention |
| 02/15/2012 | EP2106610B1 Memory system |
| 02/15/2012 | EP2035938B1 Improving reliability, availability, and serviceability in a memory device |
| 02/15/2012 | CN102354537A Method and system for testing chip of phase change memory |
| 02/15/2012 | CN102354536A Test interface structure, test circuit and test method |
| 02/15/2012 | CN102354535A Logical unit multiplexing system |
| 02/15/2012 | CN102354534A Method for detecting connection fault in memory and memory capable of being detected |
| 02/15/2012 | CN102354533A Test interface structure, test circuit and test method |
| 02/15/2012 | CN102354531A Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance |
| 02/15/2012 | CN102354527A Method of reducing response time of solid state storage system |
| 02/15/2012 | CN101425334B 一种实现nor flash坏块管理的方法及其控制电路 A method for implementing nor flash bad block management and its control circuit |
| 02/14/2012 | US8117601 Internal test and manipulation of an application |
| 02/14/2012 | US8117519 Memory apparatus and method using erasure error correction to reduce power consumption |
| 02/14/2012 | US8117510 Circuits, architectures, apparatuses, systems, methods, algorithms, software and firmware for using reserved cells to indicate defect positions |
| 02/14/2012 | US8117509 Memory control circuit, semiconductor integrated circuit, and verification method of nonvolatile memory |
| 02/14/2012 | US8117483 Method to calibrate start values for write leveling in a memory system |
| 02/14/2012 | US8117381 Adaptive deterministic grouping of blocks into multi-block units |
| 02/14/2012 | US8117004 Testing module, testing apparatus and testing method |
| 02/14/2012 | US8116156 Semiconductor memory device |
| 02/09/2012 | US20120036369 Memory identification code generation method, management method, controller, and storage system |
| 02/09/2012 | US20120036314 Memory devices having programmable elements with accurate operating parameters stored thereon |
| 02/09/2012 | US20120033516 Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device |
| 02/09/2012 | US20120033515 Semiconductor memory device |
| 02/09/2012 | US20120033490 Generating a Non-Reversible State at a Bitcell Having a First Magnetic Tunnel Junction and a Second Magnetic Tunnel Junction |
| 02/09/2012 | DE102011017634A1 Signalleitung zum Anzeigen eines Schreibfehlers in einem Speicher Signal line to display a clerical error in a memory |
| 02/08/2012 | EP2416354A1 Semiconductor integrated circuit and power source voltage control method |
| 02/08/2012 | CN102347084A Adjustment method, adjustment device and test system of reference unit threshold voltage |
| 02/08/2012 | CN102347083A Safe memory storage by internal operation verification |
| 02/08/2012 | CN102347082A Flash bad block reuse method for sound recording/video recording device |
| 02/08/2012 | CN102347081A Method for calibrating phase of DQS (bidirectional data strobe) delay for DDR (double data rate) controller and apparatus thereof |
| 02/08/2012 | CN102347068A Semiconductor system and data training method thereof |
| 02/07/2012 | US8112700 Nanoscale interconnection interface |
| 02/07/2012 | US8112699 Error detecting/correcting scheme for memories |
| 02/07/2012 | US8112693 Error control code apparatuses and methods of using the same |
| 02/07/2012 | US8112692 Flash memory device error correction code controllers and related methods and memory systems |
| 02/07/2012 | US8112682 Method and device for bad-block testing |
| 02/07/2012 | US8112681 Method and apparatus for handling fuse data for repairing faulty elements within an IC |
| 02/07/2012 | US8111551 Nonvolatile semiconductor memory device having protection function for each memory block |
| 02/07/2012 | US8110775 Systems and methods for distinguishing reflections of multiple laser beams for calibration for semiconductor structure processing |
| 02/02/2012 | WO2012013049A1 Method and system for detecting mendacious capacity memory |
| 02/02/2012 | WO2011130025A3 Test architecture including cyclical cache chains, selective bypass scan chain segments, and blocking circuitry |
| 02/02/2012 | US20120030531 Safe Memory Storage By Internal Operation Verification |
| 02/02/2012 | US20120030530 Deterministic data verification in storage controller |
| 02/02/2012 | US20120030527 Semiconductor memory device |
| 02/02/2012 | US20120026817 Low Cost Testing and Sorting of Integrated Circuits |
| 02/02/2012 | US20120026816 Defective memory block identification in a memory device |
| 02/02/2012 | US20120026815 Semiconductor device and method of testing the same |
| 02/02/2012 | US20120026809 Multi-bit test circuit of semiconductor memory apparatus |
| 02/02/2012 | DE102011108933A1 Sichere Speicherung durch interneBetriebssicherstellung Secure storage by internal fail-safe position |
| 02/01/2012 | CN102339650A Memory bank testing device and method |
| 02/01/2012 | CN102339649A System, device and method for repairing integrated circuit embedded memory |
| 02/01/2012 | CN102339648A Error-detection/error-correction verification module detection method and device |
| 02/01/2012 | CN102339647A Detection method and apparatus for error checking and correcting (ECC) check module |
| 02/01/2012 | CN102339646A Detector for discontinuous type layer identification numbers of three-dimensional (3D) chips and method thereof |
| 02/01/2012 | CN102339641A Error checking and correcting verification module and data reading-writing method thereof |
| 02/01/2012 | CN101268521B 具有位寄存层的半导体存储装置及其驱动方法 The semiconductor memory device having a storage layer and the bit driving method |
| 01/31/2012 | US8108841 Minimizing interaction costs among components of computer programs |
| 01/31/2012 | US8108755 Method and apparatus of correcting error data caused by charge loss within non-volatile memory device |
| 01/31/2012 | US8108750 Raid 3+3 |
| 01/31/2012 | US8108744 Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces |
| 01/31/2012 | US8108741 Semiconductor memory device having mount test circuits and mount test method thereof |
| 01/31/2012 | US8108740 Method for operating a memory device |
| 01/31/2012 | US8108739 High-speed testing of integrated devices |
| 01/31/2012 | US8108735 Error correcting memory access means and method |
| 01/26/2012 | WO2012012720A1 Built-in self test for one-time-programmable memory |
| 01/26/2012 | WO2012012711A1 Apparatus and method for testing one-time-programmable memory |
| 01/26/2012 | WO2012012369A2 Fast parallel test of sram arrays |
| 01/26/2012 | WO2012012241A2 Bulk transfer of storage devices using manual loading |
| 01/26/2012 | US20120020175 Method and system for processing a repair address in a semiconductor memory apparatus |
| 01/26/2012 | DE10228560B4 Dünnfilmmagnetspeichervorrichtung mit einer Datenlesestromeinstellungsfunktion Thin film magnetic memory device having a data read current setting function |
| 01/25/2012 | CN1996035B Device with programmable scan chain for use in multi-chip assembly |
| 01/25/2012 | CN102332311A FPGA (Field Programmable Gate Array)-based single event effect test method for NAND FLASH device |
| 01/25/2012 | CN102332310A FPGA (Field Programmable Gate Array)-based single event effect test system for NAND FLASH device |
| 01/25/2012 | CN102332309A DRAM (Dynamic Random Access Memory) source synchronization test method and circuit |
| 01/25/2012 | CN102332308A Method for debugging memory interface circuit on line |