G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation

Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
12/2011
12/22/2011	US20110310686 Method and Circuit for Configuring Memory Core Integrated Circuit Dies with Memory Interface Integrated Circuit Dies
12/22/2011	US20110310685 Memory module including parallel test apparatus
12/21/2011	CN1941167B 具有串行输入/输出接口的多端口存储器装置 Multi-port memory device has a serial input / output interface
12/21/2011	CN1755837B 冗余程序电路及其方法 Redundancy program circuit and method
12/21/2011	CN102292778A 用于管理错误区域的存储器装置及方法 Memory device and method for managing errors area
12/21/2011	CN102290106A 一种相变存储单元阵列的测试装置 A phase change memory cell array test apparatus
12/21/2011	CN102290088A 存储器及其冗余替代方法 Memory and redundant alternative
12/21/2011	CN101499317B 存储器装置以及数据读取方法 Memory means and a data reading method
12/21/2011	CN101083131B 寄存器堆元件和电路以及操作寄存器堆电路的方法 Method and circuit element register file and operating the register file circuit
12/20/2011	US8082482 System for performing error correction operations in a memory hub device of a memory module
12/20/2011	US8082476 Program verify method for OTP memories
12/15/2011	US20110307761 Memory cell supply voltage control based on error detection
12/15/2011	US20110307747 Memory testing system
12/14/2011	EP2395513A1 Memory device, memory management device, and memory management method
12/14/2011	EP2394272A2 Stacked-die memory systems and methods for training stacked-die memory systems
12/14/2011	EP2006859B1 Semiconductor memory
12/14/2011	CN1745432B 非易失性集成电路存储装置和以错误恢复来操作所述装置的方法 Non-volatile integrated circuit memory device and a method to recover the error operating the apparatus
12/14/2011	CN102280142A 存储器检测方法 Memory detection method
12/13/2011	US8078942 Register error correction of speculative data in an out-of-order processor
12/13/2011	US8078941 Memory system, memory system controller, and a data processing method in a host apparatus
12/13/2011	US8078940 Non-volatile semiconductor memory device
12/13/2011	US8078939 Interleaving redundancy apparatus and method
12/13/2011	US8078938 Semiconductor memory, semiconductor memory system, and error correction method for semiconductor memory
12/13/2011	US8078937 Memory-module controller, memory controller and corresponding memory arrangement, and also method for error correction
12/13/2011	US8078797 Increasing the memory performance of flash memory devices by writing sectors simultaneously to multiple flash memory devices
12/13/2011	US8077532 Small unit internal verify read in a memory device
12/13/2011	US8077531 Semiconductor integrated circuit including column redundancy fuse block
12/08/2011	US20110302477 Data Hardening to Compensate for Loss of Data Retention Characteristics in a Non-Volatile Memory
12/08/2011	US20110302470 Test mode for parallel load of address dependent data to enable loading of desired data backgrounds
12/08/2011	US20110302469 Nonvolatile semiconductor memory device
12/08/2011	US20110302468 Memory system and method of accessing a semiconductor memory device
12/08/2011	US20110302467 Memory test system with advance features for completed memory system
12/08/2011	US20110299349 Margin Testing of Static Random Access Memory Cells
12/08/2011	DE10332590B4 Zeilendecodierer in einem Flashspeicher sowie Löschverfahren für eine Flashspeiicherzelle in diesem Row decoder in a flash memory and an erasing method for Flashspeiicherzelle in this
12/08/2011	DE102004059411B4 Flash-Speichervorrichtung und Verfahren zur Steuerung derselben A flash memory device and method for controlling the same
12/07/2011	CN102272855A 存储器控制器及存储器管理方法 The memory controller and a memory management method
12/07/2011	CN102272854A 反熔丝可编程存储器阵列 Antifuse programmable memory array
12/07/2011	CN101002282B 半导体存储装置及其冗余方法 Semiconductor memory device and method for redundancy
12/06/2011	US8074218 Method and system for constructing virtual resources
12/06/2011	US8074149 Disk controller methods and apparatus with improved striping, redundancy operations and interfaces
12/06/2011	US8074148 Memory management method and controller for non-volatile memory storage device
12/06/2011	US8074130 Test apparatus
12/06/2011	US8074129 Memory apparatus and method and reduced pin count apparatus and method
12/06/2011	US8074128 Block management and replacement method, flash memory storage system and controller using the same
12/06/2011	US8072830 Logic embedded memory having registers commonly used by macros
12/01/2011	WO2011150409A2 Solution for full speed, parallel dut testing
12/01/2011	US20110296278 Memory device including memory controller
12/01/2011	US20110296260 Semiconductor device
12/01/2011	US20110296259 Testing memory arrays and logic with abist circuitry
12/01/2011	US20110292747 Semiconductor memory device
12/01/2011	US20110292745 Data transmission device
12/01/2011	US20110292741 Memory Apparatus and Associated Method
11/2011
11/30/2011	EP2389674A2 Memory devices and methods for managing error regions
11/30/2011	CN1495992B 用于开关磁阻电机的电路 For switched reluctance motor circuit
11/30/2011	CN101425337B 一种闪存数据存储方法和装置 One kind of flash data storage method and apparatus
11/29/2011	US8069385 Programmable built-in self-test architecture
11/29/2011	US8069384 Scanning reassigned data storage locations
11/29/2011	US8069382 Memory cell programming
11/29/2011	US8069380 Method, system and computer-readable code to test flash memory
11/29/2011	US8069379 Memory system with point-to-point request interconnect
11/29/2011	US8069377 Integrated circuit having memory array including ECC and column redundancy and method of operating the same
11/29/2011	US8068113 Display control semiconductor integrated circuit
11/24/2011	WO2011146193A1 Monitoring memory module parameters in high performance computers
11/24/2011	WO2011116056A3 Modeling of cell delay change for electronic design automation
11/24/2011	US20110289385 Data input / output control device and semiconductor memory device system
11/23/2011	EP1952290B1 Probabilistic error correction in multi-bit-per-cell flash memory
11/23/2011	CN102257573A Error detection method and a system including one or more memory devices
11/23/2011	CN102254572A Method for writing and simultaneously verifying nonvolatile memory unit
11/23/2011	CN101587744B Multi-level data redundancy method of large scale FLASH memory array
11/22/2011	US8065590 Disk controller methods and apparatus with improved striping, redundancy operations and interfaces
11/22/2011	US8065589 Semiconductor memory device
11/22/2011	US8065588 Formulaic flexible collision-free memory accessing for parallel turbo decoding with quadratic polynomial permutation (QPP) interleave
11/22/2011	US8065574 Soft error detection logic testing systems and methods
11/22/2011	US8065573 Method and apparatus for tracking, reporting and correcting single-bit memory errors
11/22/2011	US8065572 At-speed scan testing of memory arrays
11/22/2011	US8065571 Storage area network (SAN) link integrity tester
11/22/2011	US8064279 Structure and method for screening SRAMS
11/22/2011	US8064257 Semiconductor memory device having faulty cells
11/17/2011	WO2011143221A1 Memory device having a local current sink
11/17/2011	WO2011142966A1 Multi-bank read/write to reduce test-time in memories
11/17/2011	WO2011094211A3 Reducing latency in serializer-deserializer links
11/17/2011	WO2011081811A3 Tamper resistant fuse design
11/17/2011	US20110283153 Test apparatus, test module and test method
11/17/2011	US20110283054 Nonvolatile memory
11/17/2011	US20110280092 Multi-Bank Read/Write To Reduce Test-Time In Memories
11/17/2011	US20110280091 Memory repair systems and methods for a memory having redundant memory
11/17/2011	US20110280090 Semiconductor device and test method thereof
11/16/2011	EP1851635B1 Enabling special modes within a digital device
11/16/2011	EP1800323B1 LOW VOLTAGE PROGRAMMABLE eFUSE WITH DIFFERENTIAL SENSING SCHEME
11/16/2011	CN102243895A Method for measuring service life of unipolar resistor type memory
11/16/2011	CN101377960B Apparatus and method for detecting word line leakage in memory devices
11/15/2011	US8060806 Estimation of non-linear distortion in memory devices
11/15/2011	US8060799 Hub, memory module, memory system and methods for reading and writing to the same
11/15/2011	US8060798 Refresh of non-volatile memory cells based on fatigue conditions
11/15/2011	US8060688 Method and device for reconfiguration of reliability data in flash EEPROM storage pages
11/15/2011	US8059479 Test circuit for an unprogrammed OTP memory array
11/15/2011	US8059478 Low cost testing and sorting for integrated circuits
11/15/2011	US8059477 Redundancy circuit of semiconductor memory
11/15/2011	US8059476 Control component for controlling a delay interval within a memory component
11/10/2011	WO2011081843A3 Robust memory link testing using memory controller

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