Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
03/2012
03/27/2012US8145832 Non-volatile memory devices and control and operation thereof
03/27/2012US8144534 Methods and memory devices for repairing memory cells
03/22/2012WO2012012711A4 Apparatus and method for testing one-time-programmable memory
03/22/2012US20120072806 Semiconductor memory device
03/22/2012US20120072805 Memory storage device, memory controller thereof, and method thereof for generating log likelihood ratio
03/22/2012US20120072804 Data read-out circuit in semiconductor memory device and method of data reading in semiconductor memory device
03/22/2012US20120072796 Memory controller with automatic error detection and correction
03/22/2012US20120072794 Non-volatile memory (nvm) with imminent error prediction
03/22/2012US20120072793 Registers with Full Scan Capability
03/22/2012US20120072792 Memory tester and compiler which matches a test program
03/22/2012US20120072791 Debugger Based Memory Dump Using Built in Self Test
03/22/2012US20120072790 On-Chip Memory Testing
03/22/2012US20120072789 Memory built-in self test (mbist) circuitry configured to facilitate production of pre-stressed integrated circuits and methods
03/22/2012US20120072788 Integrated circuit with memory built-in self test (mbist) circuitry having enhanced features and methods
03/22/2012US20120072786 Use of hashing function to distinguish random and repeat errors in a memory system
03/22/2012US20120072153 Technique for determining performance characteristics of electronic devices and systems
03/22/2012US20120069691 Block repair scheme
03/22/2012US20120069690 Semiconductor integrated circuit and control method
03/22/2012US20120069689 Built-in self repair for memory
03/22/2012US20120069688 Implementing single bit redundancy for dynamic sram circuit with any bit decode
03/22/2012DE10340917B4 Verfahren und Vorrichtung zum Überprüfen von Ausgangssignalen einer integrierten Schaltung Method and device for checking of output signals of an integrated circuit
03/22/2012DE102006040821B4 Verfahren und Vorrichtung zum Überprüfen von Ausgangssignalen einer integrierten Schaltung Method and device for checking of output signals of an integrated circuit
03/21/2012CN1965372B Methods and apparatus for interfacing between test system and memory
03/21/2012CN1779864B Method and device for verifying initialized state of nonvolatile memory device
03/21/2012CN1767069B Nonvolatile memory devices and methods of verifying data in nonvolatile memory devices
03/21/2012CN1440554B Method for performing write and read operations in passive matrix memmory, and apparatus for performing method
03/21/2012CN102385936A Hamming code based method for carrying out fault tolerance on static RAM multiple bit upset
03/21/2012CN102385935A 半导体存储器件 The semiconductor memory device
03/21/2012CN102385934A Method and apparatus for bit cell repair
03/21/2012CN102385933A Aging test device for memory
03/21/2012CN102385835A Bi-directional scan driver and display device using the same
03/21/2012CN101796497B Memory refresh device and memory refresh method
03/21/2012CN101154459B Nonvolatile semiconductor memory device
03/20/2012US8140943 Parity insertion for inner architecture
03/20/2012US8140942 System, method and storage medium for providing fault detection and correction in a memory subsystem
03/20/2012US8140939 Flash error correction
03/20/2012US8140938 Semiconductor memory device and error correction method thereof
03/20/2012US8140937 Memory initialization time reduction
03/20/2012US8140932 Data interleaving circuit and method for vectorized turbo decoder
03/20/2012US8140921 System for elevator electronic safety device
03/20/2012US8139327 Semiconductor integrated circuit
03/15/2012WO2012032775A1 Method of checking resistance change non-volatile memory device, and resistance change non-volatile memory device
03/15/2012WO2012031489A1 Method for testing data retention characteristics of resistive random access memory device
03/15/2012US20120063248 Low cost comparator design for memory bist
03/15/2012US20120063226 Small unit internal verify read in a memory device
03/15/2012DE10203570B4 Verfahren zur Überprüfung elektrischer Verbindungen zwischen einem Speichermodul und einem Halbleiterspeicherbaustein Method for checking electrical connections between a memory module and a semiconductor memory device
03/14/2012CN102376371A Method for testing semiconductor memory device
03/14/2012CN101488369B Interface circuit for BCH code controller
03/14/2012CN101217060B Systems and methods for identifying fault memory element
03/13/2012US8136024 Optional memory error checking
03/13/2012US8136017 Multi-layer semiconductor memory device comprising error checking and correction (ECC) engine and related ECC method
03/13/2012US8136014 Non-volatile semiconductor memory device
03/13/2012US8136000 Test mode for multi-chip integrated circuit packages
03/13/2012US8134880 Semiconductor integrated circuit
03/08/2012US20120060058 Testing of non stuck-at faults in memory
03/08/2012US20120057420 Semiconductor memory and method for testing the same
03/08/2012US20120057419 Semiconductor memory device and method of operating the same
03/08/2012US20120057415 Nonvolatile memory device
03/08/2012US20120057413 Semiconductor memory apparatus and test method thereof
03/08/2012US20120057411 Latch Based Memory Device
03/07/2012CN101447227B Flash memory device and programming method thereof
03/07/2012CN101123123B Semiconductor memory device capable of changing ecc code length
03/07/2012CN101060006B Systems, methods, and apparatuses for using the same memory type to support an error check mode and a non-error check mode
03/06/2012US8132077 Unidirectional error code transfer for both read and write data transmitted via bidirectional data link
03/06/2012US8132063 Semiconductor device
03/06/2012US8132062 Non-volatile memory system with self test capability
03/06/2012US8132061 Repair bits for a low voltage cache
03/06/2012US8130574 Error detection on programmable logic resources
03/06/2012US8130573 Semiconductor memory device capable of optimizing signal transmission power and power initializing method thereof
03/06/2012US8130572 Low power memory array column redundancy mechanism
03/06/2012US8130549 Apparatus and method for detecting over-programming condition in multistate memory device
03/06/2012US8130228 System and method for processing low density parity check codes using a deterministic caching apparatus
03/01/2012WO2012027291A2 System and method of reference cell testing
03/01/2012WO2012025960A1 Semiconductor memory device
03/01/2012US20120054566 Dram memory controller with built-in self test and methods for use therewith
03/01/2012US20120054565 System and method for testing integrated circuits
03/01/2012US20120054564 Method and apparatus to test memory using a regeneration mechanism
03/01/2012US20120051166 Self-repair integrated circuit and repair method
03/01/2012US20120051165 Redundancy control circuit and memory device including the same
03/01/2012US20120051164 Memory cell, methods of manufacturing memory cell, and memory device having the same
03/01/2012US20120051163 Semiconductor memory device and operating method thereof
03/01/2012US20120051162 Method and apparatus for bit cell repair
03/01/2012US20120051154 Fuse circuit, fuse array, semiconductor memory device and method of manufacturing semiconductor device
02/2012
02/29/2012EP2423922A1 Dram memory controller with built-in self test and methods for use therewith
02/29/2012CN101483064B Method for adaptive detecting configuration by SDRAM
02/29/2012CN101105972B Semiconductor memory, controller and method for operating semiconductor memory
02/28/2012US8127206 System and method for wireless communication of uncompressed video having reed-solomon code error concealment
02/28/2012US8127205 Error correction code generation method and memory control device
02/28/2012US8127203 Method, data processing apparatus and wireless device
02/28/2012US8127202 Use of alternative value in cell detection
02/28/2012US8127201 Nonvolatile semiconductor memory and method of access evaluation to the same
02/28/2012US8127200 Flash memory device and system with randomizing for suppressing errors
02/28/2012US8127191 Control method for semiconductor integrated circuit and semiconductor integrated circuit
02/28/2012US8127185 Memory devices and methods for managing error regions
02/28/2012US8127184 System and method including built-in self test (BIST) circuit to test cache memory
02/28/2012US8127069 Memory device including self-ID information
02/28/2012US8126674 Memory-daughter-card-testing method and apparatus
02/23/2012US20120047411 Determining data valid windows in a system and method for testing an integrated circuit device
02/23/2012US20120047410 Storage device, circuit board, liquid reservoir and system
02/23/2012US20120047409 Systems and methods for generating dynamic super blocks
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