Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
05/2012
05/01/2012US8171379 Methods, systems and media for data recovery using global parity for multiple independent RAID levels
05/01/2012US8171377 System to improve memory reliability and associated methods
05/01/2012US8171356 Reducing writes, and estimating and displaying estimated remaining lifetime of non-volatile memories
05/01/2012US8171203 Faster write operations to nonvolatile memory using FSInfo sector manipulation
05/01/2012US8169843 Wafer test trigger signal generating circuit of a semiconductor memory apparatus, and a wafer test circuit using the same
04/2012
04/26/2012US20120102374 Storage device testing
04/26/2012US20120099389 Memory circuits, systems, and modules for performing dram refresh operations and methods of operating the same
04/25/2012EP2443543A1 Multi-bank non-volatile memory system with satellite file system
04/25/2012EP1570489B1 Zone boundary adjustment for defects in non-volatile memories
04/25/2012CN202205465U Circuit for testing DRAM (Dynamic Random Access Memory) source synchronization
04/25/2012CN1954390B 存储器单元的修复 Repair memory cell
04/25/2012CN102426861A Method and device for testing data valid window of double data rate-3 (DDR3)
04/25/2012CN102426860A 检测编程操作对临近存储单元干扰的方法 Programming operation to detect interference of adjacent memory cells
04/25/2012CN102426859A 检测读取速度受到干扰的方法和检测编程干扰的方法 Method of detection and detection program disturb disturbed read speed
04/25/2012CN102426858A 一种检测存储单元漏电流的方法及系统 Method and system for detecting the memory cell drain current
04/25/2012CN101427323B 读取非易失性计算机存储器的系统和方法 Reading system and method for a non-volatile computer memory
04/25/2012CN101067972B 一种存储器检错纠错编码电路及利用其读写数据的方法 A memory error detection and error correction coding circuit using its method of reading and writing data
04/24/2012US8166374 Digital transmission system with enhanced data multiplexing in VSB transmission system
04/24/2012US8166371 Semiconductor memory system and signal processing system
04/24/2012US8166370 Efficient RAID ECC controller for RAID systems
04/24/2012US8166369 Method for error processing in optical disk memories
04/24/2012US8166353 Memory management apparatus
04/24/2012US8165847 Implementing a programmable DMA master with write inconsistency determination
04/24/2012US8164966 Variable-loop-path ring oscillator test circuit and systems and methods utilizing same
04/19/2012WO2012051039A1 Facilitating error detection and recovery in a memory system
04/19/2012US20120096322 Semiconductor package
04/18/2012EP2442311A1 Offset compensation for sense amplifiers
04/18/2012CN102420017A 检测存储器记忆能力的方法 The ability to detect memory and memory
04/18/2012CN102420016A 一种应用于集成错误校验码的嵌入式存储器的内建修复分析方法 Built-in error checking code Applied to integrate embedded memory repair analysis
04/18/2012CN102420015A Method of detecting manufacturing defects in memory array and test device thereof
04/18/2012CN101366182B A nand flash memory controller exporting a nand interface
04/18/2012CN101310443B 半导体器件 Semiconductor devices
04/18/2012CN101165495B Method and apparatus for increasing clock frequency and data rate for semiconductor devices
04/17/2012US8161355 Automatic refresh for improving data retention and endurance characteristics of an embedded non-volatile memory in a standard CMOS logic process
04/17/2012US8161334 Externally maintained remap information
04/17/2012US8161333 Information processing system
04/17/2012US8159892 Nonvolatile memory device and method of testing the same
04/17/2012US8159891 Sensing characteristic evaluating apparatus for semiconductor device and method thereof
04/17/2012US8159890 Redundant memory array for replacing memory sections of main memory
04/12/2012WO2012012369A3 Fast parallel test of sram arrays
04/12/2012WO2012009103A3 Method and apparatus for training a memory signal via an error signal of a memory
04/11/2012CN102411995A 内容可寻址存储器存储单元匹配线的检测电路和方法 Content can detect circuit and method addressable memory storage units matching lines
04/11/2012CN102411994A 集成电路内置存储器的数据校验方法及装置 Data verification method and apparatus for integrated circuit built-in memory
04/11/2012CN102411993A 固态硬盘的测试方法和装置 Test method and apparatus for solid state drives
04/11/2012CN102411987A 存储器件及其自交织方法 Self-interleaving memory device and method
04/10/2012US8156406 Method and system for syndrome generation and data recovery
04/10/2012US8156403 Combined distortion estimation and error correction coding for memory devices
04/10/2012US8156402 Memory device with error correction capability and efficient partial word write operation
04/10/2012US8156397 Method and system for feedback of decoded data characteristics to a decoder in stored data access and decoding operations to assist in additional decoding operations
04/10/2012US8156393 Memory system
04/10/2012US8156391 Data controlling in the MBIST chain architecture
04/05/2012WO2012012241A3 Bulk transfer of storage devices using manual loading
04/05/2012WO2011159806A3 Apparatus, system, and method for providing error correction
04/05/2012WO2011159805A3 Apparatus, system, and method for providing error correction
04/05/2012WO2011150409A3 Solution for full speed, parallel dut testing
04/05/2012US20120084611 Apparatus, System, and Method for Bad Block Remapping
04/05/2012US20120084494 Memory for accessing multiple sectors of information substantially concurrently
04/05/2012US20120081983 Method of programming, erasing and repairing a memory device
04/05/2012US20120081965 Method of evaluating a semiconductor storage device
04/05/2012DE112008003990T5 Duale, unabhängige, nicht flüchtige Speichersysteme Dual, independent, non-volatile memory systems
04/05/2012DE102008002237B4 Verfahren zum Prüfen einer nichtflüchtigen Speichervorrichtung A method of testing a non-volatile memory device
04/04/2012EP1236207B1 Architecture with multi-instance redundancy implementation
04/04/2012CN102403045A 存储卡读写信号测试装置 Memory card reader signal testing device
04/04/2012CN102403044A Method for testing data retention characteristic of resistive random access memory device
04/04/2012CN102403043A 检测位错误率的电路与系统以及检测抖动容忍度的方法 Circuits and Systems detect bit error rate and method for detecting jitter tolerance
04/04/2012CN102403042A Latch based memory device
04/04/2012CN101740123B 存储器的数据保护方法 Data protection method memory
04/04/2012CN101521044B 存储器及其电压监控装置 Memory and voltage monitoring device
04/04/2012CN101419842B 硬盘的损耗均衡方法、装置及系统 Hard wear leveling method, apparatus and system
04/03/2012US8151167 Program processing device and program processing method
04/03/2012US8151166 Reduction of back pattern dependency effects in memory devices
04/03/2012US8151151 Tap time division multiplexing with scan test
04/03/2012US8151150 Data storage device and method for writing test data to a memory
04/03/2012US8151149 Semiconductor memory apparatus and method of testing the same
04/03/2012US8149645 Synchronous global controller for enhanced pipelining
04/03/2012US8149639 Test apparatus of semiconductor integrated circuit and method using the same
04/03/2012US8149637 Semiconductor device capable of being tested after packaging
03/2012
03/29/2012WO2012040375A1 Registers with full scan capability
03/29/2012WO2012039415A1 Semiconductor device and method for controlling same
03/29/2012US20120079351 Systems and Methods for Memory Devices
03/29/2012US20120079331 Memory system
03/29/2012US20120079330 Test device and test method for resistive random access memory and resistive random access memory device
03/29/2012US20120075944 Semiconductor device and manufacturing method thereof
03/29/2012US20120075943 Method and Apparatus for Memory Repair With Redundant Columns
03/29/2012US20120075942 Row address decoder and semiconductor memory device having the same
03/28/2012EP2434544A1 Integrated circuit
03/28/2012CN102394114A BCH code error correction method capable of adaptive error correction
03/28/2012CN102394113A Dynamic LDPC error correction code method for flash memory
03/28/2012CN102394112A Reliability, availability, and serviceability in a memory device
03/28/2012CN102394111A Method for testing consumable chip
03/28/2012CN101494089B Detection method and detection system for semiconductor device main bit line failure
03/28/2012CN101447234B Memory module and writing and reading method thereof
03/27/2012US8145978 RAID array auto-initialization (RAAI) method
03/27/2012US8145977 Methods and apparatus for providing error correction to unwritten pages and for identifying unwritten pages in flash memory
03/27/2012US8145965 Test apparatus for testing a device under test and device for receiving a signal
03/27/2012US8145961 Fast ECC memory testing by software including ECC check byte
03/27/2012US8145960 Storage of data in data stores having some faulty storage locations
03/27/2012US8145959 Systems and methods for measuring soft errors and soft error rates in an application specific integrated circuit
03/27/2012US8145958 Integrated circuit and method for testing memory on the integrated circuit
03/27/2012US8145957 Using fractional sectors for mapping defects in disk drives
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