Patents
Sitemap › G11 - Information storage › G11C - Static stores › G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
06/2012
06/28/2012US20120163106 Refresh control circuit and method for semiconductor memory device
06/28/2012US20120163105 Semiconductor storage device
06/28/2012DE102011085989A1 Verfahren und Vorrichtung zum Ausführen von parallelen Speicherlese- und Speicherschreiboperationen A method and apparatus for performing parallel memory read and memory write operations
06/27/2012EP2469539A1 Analog sensing of memory cells in a solid-state memory device
06/27/2012CN102522123A Method for increasing read-write test efficiency of storage equipment by utilizing data generator module
06/27/2012CN102522122A Testing method and testing device
06/27/2012CN102522121A Solid state disk and automatic restoration method thereof
06/27/2012CN102522120A Dictionary coding compression method without storage of dictionary
06/27/2012CN102522108A Redundancy substitution method of memory
06/27/2012CN101540201B Testing method and device for multi-bank flash-memory
06/26/2012US8209587 System and method for eliminating zeroing of disk drives in RAID arrays
06/26/2012US8209572 Testing embedded memories in an integrated circuit
06/26/2012US8209571 Valid-transmission verifying circuit and a semiconductor device including the same
06/26/2012US8208325 Semiconductor device, semiconductor package and memory repair method
06/26/2012US8208324 Semiconductor memory device that can relief defective address
06/26/2012US8208303 Semiconductor memory device having memory block configuration
06/21/2012WO2012081733A1 Semiconductor storage device
06/21/2012WO2012081732A1 Semiconductor storage device and method of controlling the same
06/21/2012US20120159286 Data transmission device, memory control device, and memory system
06/21/2012US20120159284 Semiconductor memory device capable of transferring various types of data
06/21/2012US20120155203 Semiconductor memory device, method of testing the same and system of testing the same
06/21/2012US20120155202 Defective memory cell address storage circuit and redundancy control circuit including the same
06/21/2012US20120155192 Semiconductor memory devices and methods of testing the same
06/20/2012CN102509561A SRAM (system random access memory) type FPGA (field programmable gate array) configuration area simulated fault injection method
06/20/2012CN102508730A Non-volatile memory module, memory processing system and memory management method thereof
06/20/2012CN101055761B Semiconductor storage device
06/19/2012US8205139 Method for lock-free clustered erasure coding and recovery of data across a plurality of data stores in a network
06/19/2012US8205137 Apparatus for the reliability of host data stored on fibre channel attached storage subsystems
06/19/2012US8205136 Fault tolerant encoding of directory states for stuck bits
06/19/2012US8205133 Error corrector with a high use efficiency of a memory
06/19/2012US8203897 Semiconductor device capable of suppressing a coupling effect of a test-disable transmission line
06/14/2012WO2012078397A2 Memory device on the fly crc mode
06/14/2012US20120151299 Embedded DRAM having Low Power Self-Correction Capability
06/14/2012US20120151287 Memory-Module Extender Card for Visually Decoding Addresses from Diagnostic Programs and Ignoring Operating System Accesses
06/14/2012US20120147685 Semiconductor storage device
06/14/2012DE19655033B9 Halbleitereinrichtung Semiconductor device
06/13/2012EP1864291B1 Method and apparatus for incorporating block redundancy in a memory array
06/13/2012CN102496390A Method and device for testing DDR2 data effective window
06/13/2012CN102496389A Control circuit for reading timing sequence
06/13/2012CN102496388A Method for examining memory code of printed circuit board
06/13/2012CN101533677B Method for arranging memory, controller, and nonvolatile memory system
06/13/2012CN101071631B Method and device for multiple banks read and data compression for back end test
06/13/2012CN101042931B Semiconductor storage device
06/12/2012US8201055 Semiconductor memory device
06/12/2012US8201054 Fault-tolerant method and apparatus for updating compressed read-only file systems
06/12/2012US8201053 Dynamic electronic correction code feedback to extend memory device lifetime
06/12/2012US8201052 Data processing method of decoding coded data and data processor for the same
06/12/2012US8201035 Testing system and method thereof
06/12/2012US8201034 Memory device and related testing method
06/12/2012US8201033 Memory having an ECC system
06/12/2012US8201032 Generalized BIST for multiport memories
06/12/2012US8200925 Data mirroring in serial-connected memory system
06/07/2012WO2012075330A2 Apparatus, system, and method for matching patterns with an ultra fast check engine
06/07/2012WO2012075329A2 Apparatus, system, and method for matching patterns with an ultra fast check engine based on flash cells
06/07/2012US20120144271 Decoding encoded data containing integrated data and header protection
06/07/2012US20120144263 Methods of data handling
06/07/2012US20120144252 Storage control apparatus and storage control method
06/07/2012US20120140541 Memory built-in self test scheme for content addressable memory array
06/06/2012EP1720172B1 Semiconductor storage device and redundancy control method for semiconductor storage device
06/06/2012EP1543506B1 Method and apparatus for managing defective areas on write-once type optical disc
06/06/2012DE19655034B4 Testvorrichtung einer Halbleitereinrichtung The test device of a semiconductor device
06/06/2012DE19655033B4 Halbleitereinrichtung Semiconductor device
06/06/2012DE19609441B4 Zum gleichzeitigen Bestimmen eines Vielbittestmodus und eines speziellen Testmodus befähigte Halbleiterspeichereinrichtung For simultaneously determining a Vielbittestmodus and a special test mode enabled semiconductor memory device
06/06/2012DE102004017284B4 Integrierte Halbleiterschaltung und Verfahren zur Prüfung der integrierten Halbleiterschaltung A semiconductor integrated circuit and method for testing the semiconductor integrated circuit
06/06/2012CN102486939A Method and apparatus for testing joint test action group (JTAG) of memories
06/06/2012CN102486938A Method for rapid detection of memory and device
06/06/2012CN101533676B Method for enhancing debugger capacity of non-volatile memory
06/06/2012CN101159165B Nonvolatile memory device and method of operating the same
06/06/2012CN101136251B Degeneration technique for designing memory devices
06/06/2012CN101124639B System and method of accessing non-volatile computer memory
06/05/2012US8196018 Enhanced error identification with disk array parity checking
06/05/2012US8196017 Method for on-the-fly error correction in a content addressable memory(CAM) and device therefor
06/05/2012US8195993 Semiconductor integrated circuit device
06/05/2012US8195992 Processor-memory unit for use in system-in-package and system-in-module devices
06/05/2012US8193468 Methods and systems for precisely relatively positioning a waist of a pulsed laser beam and method and system for controlling energy delivered to a target structure
05/2012
05/31/2012WO2012070238A1 Nonvolatile memory element, production method therefor, nonvolatile memory unit, and design assistance method for nonvolatile memory element
05/31/2012US20120137185 Method and apparatus for performing a memory built-in self-test on a plurality of memory element arrays
05/31/2012US20120134224 Verifying multi-cycle self refresh operation of semiconductor memory device and testing the same
05/30/2012EP2457155A1 A lower energy comsumption and high speed computer without the memory bottleneck
05/30/2012CN202258379U Defective hard disk data erasing device
05/30/2012CN1988033B Multi-port semiconductor memory device having variable access paths and method therefor
05/30/2012CN102483957A 使用存储器控制器的鲁棒存储器链路测试 A memory using a memory controller Robust Link Test
05/30/2012CN102483955A Methods, devices, and systems for dealing with threshold voltage change in memory devices
05/30/2012CN102483697A A Lower Energy Comsumption And High Speed Computer Without The Memory Bottleneck
05/30/2012CN102483685A Multi-bank non-volatile memory system with satellite file system
05/30/2012CN102479558A Testing device
05/30/2012CN102479557A 带有冗余位及存储器元件表决电路的存储器阵列 A memory array with redundant bits and the memory elements of the voting circuit
05/30/2012CN102479556A 非易失性存储器件及其读取方法 A nonvolatile memory device and method for reading
05/30/2012CN102479555A 储存存储器的错误信息的装置和方法 Storage memory device and a method for error messages
05/30/2012CN102479554A Device and method for repair analysis
05/30/2012CN102479553A 有多个需要校准的模拟电路的专用集成电路 A plurality of analog circuits need to calibrate the ASIC
05/30/2012CN102479543A 验证半导体存储器器件的多周期自刷新操作及其测试 Verify semiconductor memory devices and multi-cycle test self-refresh operation
05/30/2012CN101261882B Nonvolatile semiconductor storage device, nonvolatile semiconductor storage system and method of managing of defective column in nonvolatile semiconductor storage system
05/29/2012US8190984 Memory and method for checking reading errors thereof
05/29/2012US8190983 Apparatus and methods for CRC error injection in a storage system
05/29/2012US8190974 Error detection and correction for external DRAM
05/29/2012US8190972 Error checking and correction overlap ranges
05/29/2012US8190971 Data processing system and method for operating a data processing system
05/29/2012US8190970 Probe-based data storage devices
05/29/2012US8190952 Bitmap cluster analysis of defects in integrated circuits
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